Radiation Effects in Semiconductors

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Publisher : CRC Press
ISBN 13 : 1439826951
Total Pages : 432 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Radiation Effects in Semiconductors by : Krzysztof Iniewski

Download or read book Radiation Effects in Semiconductors written by Krzysztof Iniewski and published by CRC Press. This book was released on 2018-09-03 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.

Radiation Effects in Advanced Semiconductor Materials and Devices

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 3662049740
Total Pages : 424 pages
Book Rating : 4.6/5 (62 download)

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Book Synopsis Radiation Effects in Advanced Semiconductor Materials and Devices by : C. Claeys

Download or read book Radiation Effects in Advanced Semiconductor Materials and Devices written by C. Claeys and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

Radiation Effects in Semiconductors and Semiconductor Devices

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1468490699
Total Pages : 280 pages
Book Rating : 4.4/5 (684 download)

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Book Synopsis Radiation Effects in Semiconductors and Semiconductor Devices by : V. S. Vavilov

Download or read book Radiation Effects in Semiconductors and Semiconductor Devices written by V. S. Vavilov and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability And Radiation Effects In Compound Semiconductors

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Author :
Publisher : World Scientific
ISBN 13 : 9814467650
Total Pages : 376 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis Reliability And Radiation Effects In Compound Semiconductors by : Allan H Johnston

Download or read book Reliability And Radiation Effects In Compound Semiconductors written by Allan H Johnston and published by World Scientific. This book was released on 2010-04-27 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

Ionizing Radiation Effects in Electronics

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Publisher : CRC Press
ISBN 13 : 1498722636
Total Pages : 410 pages
Book Rating : 4.4/5 (987 download)

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Book Synopsis Ionizing Radiation Effects in Electronics by : Marta Bagatin

Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by CRC Press. This book was released on 2018-09-03 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.

Integrated Circuit Design for Radiation Environments

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Publisher : John Wiley & Sons
ISBN 13 : 1118701852
Total Pages : 514 pages
Book Rating : 4.1/5 (187 download)

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Book Synopsis Integrated Circuit Design for Radiation Environments by : Stephen J. Gaul

Download or read book Integrated Circuit Design for Radiation Environments written by Stephen J. Gaul and published by John Wiley & Sons. This book was released on 2019-12-03 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today’s space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips. Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena. Describes the fundamentals of radiation environments and their effects on electronic components Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications Covers natural and man-made radiation environments, space systems and commercial terrestrial applications Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume Includes questions and answers for the reader to test their knowledge Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.

Ionizing Radiation Effects in MOS Devices and Circuits

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 9780471848936
Total Pages : 616 pages
Book Rating : 4.8/5 (489 download)

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Book Synopsis Ionizing Radiation Effects in MOS Devices and Circuits by : T. P. Ma

Download or read book Ionizing Radiation Effects in MOS Devices and Circuits written by T. P. Ma and published by John Wiley & Sons. This book was released on 1989-04-18 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.

Radiation Effects on Semiconductor Devices

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Publisher :
ISBN 13 :
Total Pages : 80 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Radiation Effects on Semiconductor Devices by : Los Alamos Scientific Laboratory

Download or read book Radiation Effects on Semiconductor Devices written by Los Alamos Scientific Laboratory and published by . This book was released on 1961 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Effects of Radiation on Electronic Systems

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Author :
Publisher : Springer
ISBN 13 : 9789401753579
Total Pages : 587 pages
Book Rating : 4.7/5 (535 download)

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Book Synopsis The Effects of Radiation on Electronic Systems by : George Messenger

Download or read book The Effects of Radiation on Electronic Systems written by George Messenger and published by Springer. This book was released on 2014-04-20 with total page 587 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Testing at the Speed of Light

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Publisher : National Academies Press
ISBN 13 : 030947082X
Total Pages : 89 pages
Book Rating : 4.3/5 (94 download)

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Book Synopsis Testing at the Speed of Light by : National Academies of Sciences, Engineering, and Medicine

Download or read book Testing at the Speed of Light written by National Academies of Sciences, Engineering, and Medicine and published by National Academies Press. This book was released on 2018-06-08 with total page 89 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

Handbook of Radiation Effects

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Author :
Publisher : OUP Oxford
ISBN 13 : 9780198507338
Total Pages : 640 pages
Book Rating : 4.5/5 (73 download)

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Book Synopsis Handbook of Radiation Effects by : Andrew Holmes-Siedle

Download or read book Handbook of Radiation Effects written by Andrew Holmes-Siedle and published by OUP Oxford. This book was released on 2002-01-17 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: New edition of this practical and educational handbook for engineer-designers and other professionals. It describes the electronic technology of the new millennium and the complex physical and engineering problems that occur when such equipment is exposed to radiation. The authors have an accumulated joint combined experience in the field of about 75 years, giving a broader blend of experience than any existing book in the field.

Ionizing Radiation Effects and Applications

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Author :
Publisher : BoD – Books on Demand
ISBN 13 : 9535139533
Total Pages : 188 pages
Book Rating : 4.5/5 (351 download)

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Book Synopsis Ionizing Radiation Effects and Applications by : Boualem Djezzar

Download or read book Ionizing Radiation Effects and Applications written by Boualem Djezzar and published by BoD – Books on Demand. This book was released on 2018-03-28 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt: The benefits of ionizing radiations have been largely demonstrated through many achievements of human life. Understanding the fundamental elementary interactions of ionizing radiations with material has allowed the development of various applications needed by different industries. This book draws some facets of their applications, such as hardening process for semiconductor devices, biomedical imaging by radiation luminescent quantum dots, hydrogen gas detection by Raman lidar sensor for explosion risk assessment, water and wastewater purification by radiation treatment for environment, doping by the neutron transmutation doping for the semiconductor industry, and polymerization by irradiation, which is useful for industries requiring resistant and protective coating. I wish the chapters of this book can provide some helpful information on ionizing radiation applications.

Ionizing Radiation Effects in MOS Oxides

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Publisher : World Scientific
ISBN 13 : 9789810233266
Total Pages : 192 pages
Book Rating : 4.2/5 (332 download)

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Book Synopsis Ionizing Radiation Effects in MOS Oxides by : Timothy R. Oldham

Download or read book Ionizing Radiation Effects in MOS Oxides written by Timothy R. Oldham and published by World Scientific. This book was released on 1999 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. The last such guide was Ionizing Radiation Effects in MOS Devices and Circuits, edited by Ma and Dressendorfer and published in 1989. While that book remains an authoritative reference in many areas, there has been a significant amount of more recent work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation. These same defects are also critical in many other areas of oxide reliability research. As a result of this work, the understanding of the basic physical mechanisms has evolved. This book summarizes the new work and integrates it with older work to form a coherent, unified picture. It is aimed primarily at specialists working on radiation effects and oxide reliability.

Semiconductor Detector Systems

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Publisher : OUP Oxford
ISBN 13 : 0191523658
Total Pages : 513 pages
Book Rating : 4.1/5 (915 download)

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Book Synopsis Semiconductor Detector Systems by : Helmuth Spieler

Download or read book Semiconductor Detector Systems written by Helmuth Spieler and published by OUP Oxford. This book was released on 2005-08-25 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor sensors patterned at the micron scale combined with custom-designed integrated circuits have revolutionized semiconductor radiation detector systems. Designs covering many square meters with millions of signal channels are now commonplace in high-energy physics and the technology is finding its way into many other fields, ranging from astrophysics to experiments at synchrotron light sources and medical imaging. This book is the first to present a comprehensive discussion of the many facets of highly integrated semiconductor detector systems, covering sensors, signal processing, transistors and circuits, low-noise electronics, and radiation effects. The diversity of design approaches is illustrated in a chapter describing systems in high-energy physics, astronomy, and astrophysics. Finally a chapter "Why things don't work" discusses common pitfalls. Profusely illustrated, this book provides a unique reference in a key area of modern science.

Rad-Hard Semiconductor Memories

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Publisher :
ISBN 13 : 9788770043779
Total Pages : 0 pages
Book Rating : 4.0/5 (437 download)

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Book Synopsis Rad-Hard Semiconductor Memories by : Cristiano Calligaro

Download or read book Rad-Hard Semiconductor Memories written by Cristiano Calligaro and published by . This book was released on 2024-10-21 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rad-hard Semiconductor Memories is intended for researchers and professionals interested in understanding how to design and make a preliminary evaluation of rad-hard semiconductor memories, making leverage on standard CMOS manufacturing processes available from different silicon foundries and using different technology nodes.In the first part of the book, a preliminary overview of the effects of radiation in space, with a specific focus on memories, will be conducted to enable the reader to understand why specific design solutions are adopted to mitigate hard and soft errors. The second part will be devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components with a specific focus on memories. The approach will follow a top-down scheme starting from RHBD at architectural level (how to build a rad-hard floor-plan), at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and at layout level (how to shape a layout to mitigate radiation effects).After the description of the mitigation techniques, the book enters in the core of the topic covering SRAMs (synchronous, asynchronous, single port and dual port) and PROMs (based on AntiFuse OTP technologies), describing how to design a rad-hard flash memory and fostering RHBD toward emerging memories like ReRAM. The last part will be a leap into emerging memories at a very early stage, not yet ready for industrial use in silicon but candidates to become an option for the next wave of rad-hard components. Technical topics discussed in the book include: ¿ Radiation effects on semiconductor components (TID, SEE)¿ Radiation Hardening by Design (RHBD) Techniques¿ Rad-hard SRAMs¿ Rad-hard PROMs¿ Rad-hard Flash NVMs¿ Rad-hard ReRAMs¿ Rad-hard emerging technologies

Semiconductor Devices in Harsh Conditions

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Publisher : CRC Press
ISBN 13 : 149874382X
Total Pages : 257 pages
Book Rating : 4.4/5 (987 download)

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Book Synopsis Semiconductor Devices in Harsh Conditions by : Kirsten Weide-Zaage

Download or read book Semiconductor Devices in Harsh Conditions written by Kirsten Weide-Zaage and published by CRC Press. This book was released on 2016-11-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity. With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.

Radiation Effects in Silicon Carbide

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Publisher : Materials Research Forum LLC
ISBN 13 : 1945291117
Total Pages : 172 pages
Book Rating : 4.9/5 (452 download)

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Book Synopsis Radiation Effects in Silicon Carbide by : A.A. Lebedev

Download or read book Radiation Effects in Silicon Carbide written by A.A. Lebedev and published by Materials Research Forum LLC. This book was released on 2017 with total page 172 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book reviews the most interesting research concerning the radiation defects formed in 6H-, 4H-, and 3C-SiC under irradiation with electrons, neutrons, and some kinds of ions. The electrical parameters that make SiC a promising material for applications in modern electronics are discussed in detail. Specific features of the crystal structure of SiC are considered. It is shown that, when wide-bandgap semiconductors are studied, it is necessary to take into account the temperature dependence of the carrier removal rate, which is a standard parameter for determining the radiation hardness of semiconductors. The carrier removal rate values obtained by irradiation of various SiC polytypes with n- and p-type conductivity are analyzed in relation to the type and energy of the irradiating particles. The influence exerted by the energy of charged particles on how radiation defects are formed and conductivity is compensated in semiconductors under irradiation is analyzed. Furthermore, the possibility to produce controlled transformation of silicon carbide polytype is considered. The involvement of radiation defects in radiative and nonradiative recombination processes in SiC is analyzed. Data are also presented regarding the degradation of particular SiC electronic devices under the influence of radiation and a conclusion is made regarding the radiation resistance of SiC. Lastly, the radiation hardness of devices based on silicon and silicon carbide are compared.