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Atom Probe Based Correlative Multi Microscopy For The Study Of Low Dimensional Semiconductors
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Book Synopsis Atom Probe-Based Correlative Multi-Microscopy for the Study of Low-Dimensional Semiconductors by : Lorenzo Mancini
Download or read book Atom Probe-Based Correlative Multi-Microscopy for the Study of Low-Dimensional Semiconductors written by Lorenzo Mancini and published by . This book was released on 2016 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis reports on the correlation of optical and structural properties of selected low dimensional semiconductor systems, obtained through the application of an original correlative multi-microscopy approach based on Atom Probe Tomography (APT), Scanning Transmission Electron Microscopy (STEM)/electron tomography and (time-resolved) micro-photoluminescence ((TR)PL).The analysis of nanoscale tip specimens with the three techniques aims to correlate the structural properties of single nanostructures imaged by STEM and/or APT, with their optical properties observed by optical spectroscopy. This correlation is performed within the framework of the effective mass approximation, using the APT (or STEM) 3-dimensional chemical mapping as input data for calculations, obtaining insight into the electron and hole spatial probability distributions in addition to the transition energies. In order to ensure the reliability of APT composition measurements required for performing effective mass simulations, a study of the biases affecting the measured compositions of four binary compounds (GaN, AlN, ZnO and MgO), two ternary alloys (InGaN and AlGaN) and one doped binary oxide (Tb:ZnO) was performed. A systematic analysis of the atomic fraction dependence of different atomic species on the experimental parameters allowed concluding that measured compositions of the studied binary compounds mostly depends on the surface field at which the evaporation process takes place, with an overestimation of the metallic element fraction at low field. This behavior can be explained in terms of preferential evaporationof metallic elements at high field and loss of neutral molecules at low field (evaporating as neutrals or formed by dissociation of molecular ions). The ternary compounds and doped ZnO reflect the behavior observed in binary compounds, but while for InGaN and AlGaN a good assessment of the site fractions of metallic elements is possible under suitable conditions of analysis, an unambiguous quantification of Tb content in ZnO could not be attained. A statistically correlative approach, for which APT, STEM and PL analyses are not performed on the same object, was applied for the analysis of GaAs/AlGaAs quantum dot (QD)-like structures self-assembled within coreshell nanowires and of a GaN/AlGaN multi-quantum well (QW) structure. Notwithstanding the statistical nature of the correlative study, this approach was able to prove in the former system the formation of quantum confining heterostructures from composition fluctuations within the AlGaAs barriers. For the latter, the structure of the layered system was correlated with both the temperature dependence of the PL signal intensity and the excitonic decay times issued by TRPL.. The application of the correlative multi-microscopy on optically active field emission tips prepared out of non-polar InGaN/GaN QWs extracted from the side facets of core-shell microwires and of a GaN/AlN Stranski-Krastanov QD system allowed respectively for the study of the effect of stacking faults on the optical properties of single QWs and for the assessment of the influence of QDs thickness fluctuations on transition energies, charge carriers localization, and biexciton-exciton cascade processes. The ensemble of these results not only provides a deep insight into the relationship between structural and functional properties of semiconductor heterostructures, but also constitutes the first step towards the development of an instrument that will allow performing simultaneously APT and PL analyses on optically active field emission tips. A prototype of this instrument has been developed and first optical spectroscopy results were obtained.
Book Synopsis Atom Probe Microscopy by : Baptiste Gault
Download or read book Atom Probe Microscopy written by Baptiste Gault and published by Springer Science & Business Media. This book was released on 2012-08-27 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Book Synopsis Atom Probe Tomography by : Williams Lefebvre
Download or read book Atom Probe Tomography written by Williams Lefebvre and published by Academic Press. This book was released on 2016-05-30 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials Written for both experienced researchers and new users Includes exercises, along with corrections, for users to practice the techniques discussed Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Book Synopsis Atom Probe Tomography by : Michael K. Miller
Download or read book Atom Probe Tomography written by Michael K. Miller and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Book Synopsis Correlative Transmission Electron Microscopy - Atom Probe Tomography by : Michael Herbig
Download or read book Correlative Transmission Electron Microscopy - Atom Probe Tomography written by Michael Herbig and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Atom Probe Tomography by : Michael K. Miller
Download or read book Atom Probe Tomography written by Michael K. Miller and published by Taylor & Francis US. This book was released on 2000-07-31 with total page 268 pages. Available in PDF, EPUB and Kindle. Book excerpt: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Book Synopsis Computational Materials Design by : Tetsuya Saito
Download or read book Computational Materials Design written by Tetsuya Saito and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book consists of ten chapters which outline a wide range of technologies from first-principle calculations to continuum mechanics, with applications to materials design and development. Written with a clear exposition, this book will be invaluable for engineers who want to learn about the modern technologies and techniques utilized in materials design.
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1988 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Annual Review written by 分子科学研究所 and published by . This book was released on 2003 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications of the National Bureau of Standards ... Catalog by : United States. National Bureau of Standards
Download or read book Publications of the National Bureau of Standards ... Catalog written by United States. National Bureau of Standards and published by . This book was released on 1984 with total page 450 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications by : United States. National Bureau of Standards
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1991 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Japanese Journal of Applied Physics by :
Download or read book Japanese Journal of Applied Physics written by and published by . This book was released on 2004 with total page 1098 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Atomic Layer Deposition for Semiconductors by : Cheol Seong Hwang
Download or read book Atomic Layer Deposition for Semiconductors written by Cheol Seong Hwang and published by Springer Science & Business Media. This book was released on 2013-10-18 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offering thorough coverage of atomic layer deposition (ALD), this book moves from basic chemistry of ALD and modeling of processes to examine ALD in memory, logic devices and machines. Reviews history, operating principles and ALD processes for each device.
Book Synopsis Nanocharacterisation by : John Hutchison
Download or read book Nanocharacterisation written by John Hutchison and published by Royal Society of Chemistry. This book was released on 2007-10-31 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in this book from leading teams across the globe provide an overview of the different microscopic techniques now in regular use for the characterisation of nanostructures. Essentially a handbook to all working in the field this indispensable resource provides a survey of microscopy based techniques with experimental procedures and extensive examples of state of the art characterisation methods including: Transmission Electron Microscopy, Electron Tomography, Tunneling Microscopy, Electron Holography, Electron Energy Loss Spectroscopy. This timely publication will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.
Book Synopsis Japanese Science and Technology by :
Download or read book Japanese Science and Technology written by and published by . This book was released on 1986 with total page 724 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Metals Abstracts Index written by and published by . This book was released on 1996 with total page 1634 pages. Available in PDF, EPUB and Kindle. Book excerpt:
