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Author : J. D. Hanawalt
Publisher :
ISBN 13 :
Total Pages : 108 pages
Book Rating : 4.:/5 (89 download)
Download or read book Applications of X-ray Analysis to the Study of Physical Problems written by J. D. Hanawalt and published by . This book was released on 1928 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Andreas Maier
Publisher : Springer
ISBN 13 : 3319965204
Total Pages : 263 pages
Book Rating : 4.3/5 (199 download)
Download or read book Medical Imaging Systems written by Andreas Maier and published by Springer. This book was released on 2018-08-02 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
Author : Yoshio Waseda
Publisher : Springer Science & Business Media
ISBN 13 : 3642166350
Total Pages : 320 pages
Book Rating : 4.6/5 (421 download)
Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author : William M. Mueller
Publisher : Springer
ISBN 13 : 9781468486339
Total Pages : 353 pages
Book Rating : 4.4/5 (863 download)
Download or read book Advances in X-Ray Analysis written by William M. Mueller and published by Springer. This book was released on 2013-10-10 with total page 353 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.
Author : Myeongkyu Lee
Publisher : CRC Press
ISBN 13 : 1315361973
Total Pages : 302 pages
Book Rating : 4.3/5 (153 download)
Download or read book X-Ray Diffraction for Materials Research written by Myeongkyu Lee and published by CRC Press. This book was released on 2017-03-16 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author : Gavin R. Mallett
Publisher : Springer
ISBN 13 : 9780306381096
Total Pages : 544 pages
Book Rating : 4.3/5 (81 download)
Download or read book Advances in X-Ray Analysis written by Gavin R. Mallett and published by Springer. This book was released on 1995-12-31 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Author : Gubicza, Jen?
Publisher : IGI Global
ISBN 13 : 1466658533
Total Pages : 359 pages
Book Rating : 4.4/5 (666 download)
Download or read book X-Ray Line Profile Analysis in Materials Science written by Gubicza, Jen? and published by IGI Global. This book was released on 2014-03-31 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author : William M. Mueller
Publisher : Springer
ISBN 13 : 9781468474039
Total Pages : 376 pages
Book Rating : 4.4/5 (74 download)
Download or read book Advances in X-Ray Analysis written by William M. Mueller and published by Springer. This book was released on 2012-04-18 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.
Author : George Lindenberg Clark
Publisher :
ISBN 13 :
Total Pages : 704 pages
Book Rating : 4.3/5 (91 download)
Download or read book Applied X-rays written by George Lindenberg Clark and published by . This book was released on 1940 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt: Part I: General physics and applications of x-radiation: Before and after the discovery by roentgen. X-ray tubes. High-tension equipment. The measurement of intensity (dosage). The measurement of quality (Wave length). X-ray spectra and atomic structure. Chemical analysis from x-ray spectra. The absorption and scattering of x-rays. Radiography. X-ray photochemistry. The biological effects of x-radiation. Part II: The x-ray analysis of the ultimate structures of materials: Crystallography and x-ray diffraction. The experimental x-ray methods of crystal analysis. The interpretation of diffraction patterns in terms of ultimate structure. The results of crystal analysis: elements and inorganic compounds. Crystal chemistry: fundamental generalizations from experimental data. The silicates. Minerals, soils, ceramics, cements. Alloys. The crystalline and molecular structures of organic compounds. The structure of glasses, liquids, and other colloidal and amorphous materials. The interpretation of diffraction patterns in terms of grain size, orientation, internal strain, and mechanical deformation. Practical applications of x-ray diffraction to problems of the metallurgical industry. Polymers-synthetic and natural materials with giant molecules.
Author : William M. Mueller
Publisher : Springer
ISBN 13 : 9781468486315
Total Pages : 0 pages
Book Rating : 4.4/5 (863 download)
Download or read book Advances in X-Ray Analysis written by William M. Mueller and published by Springer. This book was released on 2012-12-06 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.
Author : Jens Als-Nielsen
Publisher : John Wiley & Sons
ISBN 13 : 1119970156
Total Pages : 440 pages
Book Rating : 4.1/5 (199 download)
Download or read book Elements of Modern X-ray Physics written by Jens Als-Nielsen and published by John Wiley & Sons. This book was released on 2011-04-20 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: "The publication of Jens Als-Nielsen and Des McMorrow's Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation... a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics...." —Physics Today, 2002
Author : Janice P. L. Kenney
Publisher : Cambridge University Press
ISBN 13 : 1107070333
Total Pages : 429 pages
Book Rating : 4.1/5 (7 download)
Download or read book Analytical Geomicrobiology written by Janice P. L. Kenney and published by Cambridge University Press. This book was released on 2019-07-18 with total page 429 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive handbook outlining state-of-the-art analytical techniques used in geomicrobiology, for advanced students, researchers and professional scientists.
Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1461332737
Total Pages : 679 pages
Book Rating : 4.4/5 (613 download)
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author : M. Uda
Publisher : Springer Science & Business Media
ISBN 13 : 9781402035807
Total Pages : 328 pages
Book Rating : 4.0/5 (358 download)
Download or read book X-rays for Archaeology written by M. Uda and published by Springer Science & Business Media. This book was released on 2005-08-10 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: The application of X-rays to objects of archaeology and insights into construction and chemical composition in a non-destructive manner date back to the discovery of radiation. This book contains measurement data taken with portable XRF and XRD, and data taken with accelerating ion beams and synchrotron radiations, and with their explanation.
Author : Charles S. Barrett
Publisher : Springer
ISBN 13 : 9780306381126
Total Pages : 648 pages
Book Rating : 4.3/5 (811 download)
Download or read book Advances in X-Ray Analysis written by Charles S. Barrett and published by Springer. This book was released on 1969-06-01 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need. The interests covered by the papers at one of these conferences vary from year to year and as a whole cover a wide spread of topics. This is as it should be. Old problems that have been with us for many years are being attacked again with new and more effective tools, new problems are continually arising, and new methods of great power are being developed. These developments are occurring in each of the fields covered, as may readily be seen by a glance at this twelfth volume and other recent volumes of this series. It seems clear that the policy of having these conferences and these volumes cover a wide field rather than a single one such as, for example, structure determination, or fluorescence analysis, is a policy that meets with general approval and should be continued. I understand there is every intention to do so. C. S. Barrett It is customary to acknowledge in each volume the invited session chairmen of the three-day meeting. They and the sessions at which they presided (21-23 August 1968) were as follows: CRYSTALLOGRAPHY AND DIFFRACTION. C. S. Barrett, University of Chicago, Chicago, Illinois. METHODS AND THEIR APPLICATIONS. B. C. Giessen, Massachusetts Institute of Technology, Cambridge, Massachusetts.
Author : William M. Mueller
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (27 download)
Download or read book Advances in X-ray analysis. 7. Proceedings of the Twelfth Annual Conference on Applications of X-Ray Analysis : held August 7 - 9, 1963 written by William M. Mueller and published by . This book was released on 1964 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : William M. Mueller
Publisher : Springer
ISBN 13 : 9781468487848
Total Pages : 480 pages
Book Rating : 4.4/5 (878 download)
Download or read book Advances in X-Ray Analysis written by William M. Mueller and published by Springer. This book was released on 2012-06-19 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt: The torrential flow of technical information appearing in the world sources of literature is creating concern and apprehension among scientific people at all levels. It is extremely difficult to keep abreast of information flowing into a specific field. It is nearly impossible to transcend traditional confines of individual disciplines and put to effective use all pertinent information which stems from continuously increased trans disciplinary research. At the same time the researcher is faced with problems of in creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest. This is readily observed with X-ray analysis, where the chemist, physicist, metallurgist, and engineer are each faced with the solution of problems peculiar to specific disciplines but where solutions frequently correlate with the particular needs of the others. The Annual Conference on Applications of X-Ray Analysis and the subsequent Advances in X-Ray Analysis contribute to better understanding of multidisciplinary accomplishments; they are a ready source of information for the researcher who must undertake an abrupt change in emphasis for new objectives. The scope of this conference is broad--concerning itself, as it does, with latest developments in high-temperature and cryogenic techniques, phase equilibria, crystal structures, polymers, microprobes, and new developments in instrumentation.
