Advances in X-Ray Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 1468476335
Total Pages : 554 pages
Book Rating : 4.4/5 (684 download)

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Book Synopsis Advances in X-Ray Analysis by : Gavin R. Mallett

Download or read book Advances in X-Ray Analysis written by Gavin R. Mallett and published by Springer Science & Business Media. This book was released on 2013-11-21 with total page 554 pages. Available in PDF, EPUB and Kindle. Book excerpt: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 : 9780306381027
Total Pages : 353 pages
Book Rating : 4.3/5 (81 download)

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Book Synopsis Advances in X-Ray Analysis by : William M. Mueller

Download or read book Advances in X-Ray Analysis written by William M. Mueller and published by Springer. This book was released on 1995-12-31 with total page 353 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.

Advances in X-ray Spectroscopy

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Publisher : Pergamon
ISBN 13 :
Total Pages : 460 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Advances in X-ray Spectroscopy by : Yvette Cauchois

Download or read book Advances in X-ray Spectroscopy written by Yvette Cauchois and published by Pergamon. This book was released on 1982 with total page 460 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in X-Ray Spectroscopy covers topics relevant to the advancement of X-ray spectroscopy technology. The book is a collection of papers written by specialists in X-ray spectroscopy and pays tribute to the scientific work of Prof. Yvette Cauchois. The text is organized into four parts. Part I covers the analysis of X-ray transitions between atomic levels and relativistic theories of X-ray emission satellites and electron BremsStrahlung. Part II reviews the means provided by X-ray spectroscopy for the determination of the electronic structure of solids, while Part III discusses methods of ...

Advances in X-ray Analysis

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ISBN 13 :
Total Pages : 792 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Advances in X-ray Analysis by :

Download or read book Advances in X-ray Analysis written by and published by . This book was released on 1994 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in X-Ray Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 1461399661
Total Pages : 582 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Advances in X-Ray Analysis by : Charles Barrett

Download or read book Advances in X-Ray Analysis written by Charles Barrett and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 582 pages. Available in PDF, EPUB and Kindle. Book excerpt: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

Advances in x-ray analysis

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ISBN 13 :
Total Pages : 628 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Advances in x-ray analysis by : Charles Sanborn Barrett

Download or read book Advances in x-ray analysis written by Charles Sanborn Barrett and published by . This book was released on 1986 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in X-ray Absorption Fine Structure Analysis

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Publisher :
ISBN 13 : 9781925823882
Total Pages : 400 pages
Book Rating : 4.8/5 (238 download)

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Book Synopsis Advances in X-ray Absorption Fine Structure Analysis by : Zhongrui (jerry) Li

Download or read book Advances in X-ray Absorption Fine Structure Analysis written by Zhongrui (jerry) Li and published by . This book was released on 2020-11-15 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD). This book may serve as a reference book for researchers and technicians taking up synchrotron radiation application research and postgraduates majoring in the X-ray absorption spectroscopy field. It will provide the beginners with all the necessary information in the field of XAFS. Also, experienced users active in particular subfields of XAFS spectroscopies will learn in this book about the enormous potential of XAFS for other applications in physics, chemistry, biology, materials science and engineering, geo- and environmental science, etc. For more details, please visit https: //centralwestpublishing.com s book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD).

Advances in X-ray Analysis

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Publisher :
ISBN 13 :
Total Pages : 480 pages
Book Rating : 4.:/5 (867 download)

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Book Synopsis Advances in X-ray Analysis by : William M. Mueller

Download or read book Advances in X-ray Analysis written by William M. Mueller and published by . This book was released on 1963 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 : 9781475791129
Total Pages : 682 pages
Book Rating : 4.7/5 (911 download)

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Book Synopsis Advances in X-Ray Analysis by : Charles S. Barrett

Download or read book Advances in X-Ray Analysis written by Charles S. Barrett and published by Springer. This book was released on 2013-06-18 with total page 682 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 : 9781468478372
Total Pages : 558 pages
Book Rating : 4.4/5 (783 download)

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Book Synopsis Advances in X-Ray Analysis by : John B. Newkirk

Download or read book Advances in X-Ray Analysis written by John B. Newkirk and published by Springer. This book was released on 2012-06-12 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 :
Total Pages : 656 pages
Book Rating : 4.X/5 (2 download)

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Book Synopsis Advances in X-Ray Analysis by : Charles S Barrett

Download or read book Advances in X-Ray Analysis written by Charles S Barrett and published by Springer. This book was released on 1992 with total page 656 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fl

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 :
Total Pages : 504 pages
Book Rating : 4.X/5 (1 download)

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Book Synopsis Advances in X-Ray Analysis by : Camden R. Hubbard

Download or read book Advances in X-Ray Analysis written by Camden R. Hubbard and published by Springer. This book was released on 1983-06-01 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt: At the Denver X-Ray Conference, the topic for the plenary lectures alternates annually between x-ray diffraction and x-ray fluorescence. This year is a "diffraction" year, and the theme is accuracy in powder diffraction. Instead of comprehensive cover age, such as was attempted at the Accuracy in Powder Diffraction Meeting held at the National Bureau of Standards in 1978, this meeting focuses on recent developments in measurement accuracy of two-theta and intensity. The focus on accuracy, from the practical point of view, is important in a wide range of x-ray diffraction measurements. Accu rate data improve our ability to identify phases in a mixture using the Powder Diffraction File. Improved accuracy is essential for better characterization of the lattice, crystallite size, strain and structure. Finally, the accuracy of quantitative analysis is of great concern in many laboratories. The five invited papers of the plenary session give a broad perspective of recent activity throughout the world on uses of more accurate data, on methods to achieve greater accuracy, and on fundamental factors affecting the accuracy. The scope of the conference, however, is much broader than that of the plenary session. The workshops lead off with many practical aspects of x-ray analysis. Many of the contributed papers expand on the theme of accuracy in x-ray powder diffraction. In particular, the s.ession on XRD quantitative phase analysis provides an exception al coverage of the limitations in quantitative analysis and of the techniques being employed to improve the results.

Advances in X-ray analysis. 19. [Proceedings of the Twenty-Fourth Annual Conference on Applications of X-Ray Analysis : held in Denver, August 6-8, 1975]

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Publisher :
ISBN 13 : 9780840313836
Total Pages : 783 pages
Book Rating : 4.3/5 (138 download)

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Book Synopsis Advances in X-ray analysis. 19. [Proceedings of the Twenty-Fourth Annual Conference on Applications of X-Ray Analysis : held in Denver, August 6-8, 1975] by : Conference on Applications of X-Ray Analysis

Download or read book Advances in X-ray analysis. 19. [Proceedings of the Twenty-Fourth Annual Conference on Applications of X-Ray Analysis : held in Denver, August 6-8, 1975] written by Conference on Applications of X-Ray Analysis and published by . This book was released on 1976 with total page 783 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 : 9781461360773
Total Pages : 0 pages
Book Rating : 4.3/5 (67 download)

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Book Synopsis Advances in X-Ray Analysis by : John V. Gilfrich

Download or read book Advances in X-Ray Analysis written by John V. Gilfrich and published by Springer. This book was released on 2012-11-05 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, "Impact of the PC in X-Ray Analysis," was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed.

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 : 9781461553786
Total Pages : 908 pages
Book Rating : 4.5/5 (537 download)

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Book Synopsis Advances in X-Ray Analysis by : John V. Gilfrich

Download or read book Advances in X-Ray Analysis written by John V. Gilfrich and published by Springer. This book was released on 2011-10-08 with total page 908 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sheraton Hotel, Colorado Springs, Colorado. The year 1995 was a special year for the X-ray analysis community, since it represented the 100th anniversary ofthe discovery ofX-rays by Wilhelm Roentgen. In commemoration of this event, the Plenary Session of the conference was entitled "THE ROENTGEN COMMEMORATIVE SESSION:1895-1995, "100 YEARS OF PROGRESS IN X-RA Y SCIENCE AND APPLICATIONS". It is interesting to note that while we celebrate 100 years ofthe use ofX-ray techniques in general, and about 80 years ofX-ray diffraction and spectroscopy in particular, the Denver X-ray Conference has been in place for about half ofthat time period! Like the X-ray methods it represents, the Denver Conference on Applications ofX-ray Analysis has grown and matured, has survived the rigors oftime, and today, provides the worlds' best annual forum for the exchange of experiences and developments in the various fields ofX-ray analysis. Imagine, when the Denver Conference started in 1951, there were no personal computer- in fact, there were no computers, period! There was no SEM, no microprobe, there were no Si(Li) detectors, no transistors, no synchrotrons, Hugo Rietveld was a child, and many members who regularly attend Denver Meetings today, weren't even born yet! As I write this foreword, a copy of volurne 1 of Advances in X-ray Analysis lays in front of me on my desk.

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 : 9781468486315
Total Pages : 0 pages
Book Rating : 4.4/5 (863 download)

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Book Synopsis Advances in X-Ray Analysis by : William M. Mueller

Download or read book Advances in X-Ray Analysis written by William M. Mueller and published by Springer. This book was released on 2012-12-06 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The original scope of the annual conference on industrial applications of x-ray analysis envisioned almost total participation by representatives from industrial laboratories_ These people were concerned with problems of an immediate nature and thus welcomed the opportunity to meet for a few days with associates from other laboratnries in order to discuss problems of a similar nature, as weH as to interchange information freely and rapidly_ Certainly, this was true during the first few years of the conference's existence. During the past few years, however, a rather subtle blending has occur red of representatives from industrial laboratories, universities, and manu facturers of x-ray equipment. Papers which deal with the fundamental as pects of some phase of x-ray research and which, in many cases, have no end or ultimate objective, are as eagerly received by the conferees as are papers which deal with a specific problem of immediate importance or a paper in which the la test equipment available is portrayed. In our opinion, this x-ray conference, while perhaps no longer slanted specificaHy toward industrial applications of x-ray techniques, does continue to serve the same purpose as a medium of interchange of the latest available information and at the same time provide an opportunity for basic researchers, applied researchers and manufacturing representatives to become acquainted with each other's problems.

Advances in X-Ray Analysis

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Publisher : Springer
ISBN 13 : 9781468474022
Total Pages : 376 pages
Book Rating : 4.4/5 (74 download)

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Book Synopsis Advances in X-Ray Analysis by : William M. Mueller

Download or read book Advances in X-Ray Analysis written by William M. Mueller and published by Springer. This book was released on 2012-10-20 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.