Reliability Physics Symposium 1988. 26th Annual Proceedings., International

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Book Synopsis Reliability Physics Symposium 1988. 26th Annual Proceedings., International by : Institute of Electrical and Electronics Engineers

Download or read book Reliability Physics Symposium 1988. 26th Annual Proceedings., International written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1988 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

26th Annual Proceedings Reliability Physics Symposium 1988

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (972 download)

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Book Synopsis 26th Annual Proceedings Reliability Physics Symposium 1988 by :

Download or read book 26th Annual Proceedings Reliability Physics Symposium 1988 written by and published by . This book was released on 1988 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Physics 1988

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ISBN 13 :
Total Pages : 279 pages
Book Rating : 4.:/5 (826 download)

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Book Synopsis Reliability Physics 1988 by : Calif.) International Reliability Physics Symposium (26th : 1988 : Monterey

Download or read book Reliability Physics 1988 written by Calif.) International Reliability Physics Symposium (26th : 1988 : Monterey and published by . This book was released on 1987 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt:

1988 IEEE International Reliability Physics Symposium Proceedings

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ISBN 13 :
Total Pages : 255 pages
Book Rating : 4.:/5 (913 download)

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Book Synopsis 1988 IEEE International Reliability Physics Symposium Proceedings by :

Download or read book 1988 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1988 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt:

26th annual proceedings

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ISBN 13 :
Total Pages : 255 pages
Book Rating : 4.:/5 (221 download)

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Book Synopsis 26th annual proceedings by : International Reliability Physics Symposium

Download or read book 26th annual proceedings written by International Reliability Physics Symposium and published by . This book was released on 1988 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Physics (26th Annual Proceedings 1988) Monterey, April 12-14, 1988

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Total Pages : 0 pages
Book Rating : 4.:/5 (14 download)

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Book Synopsis Reliability Physics (26th Annual Proceedings 1988) Monterey, April 12-14, 1988 by : Reliability Physics

Download or read book Reliability Physics (26th Annual Proceedings 1988) Monterey, April 12-14, 1988 written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Physics 1988

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ISBN 13 :
Total Pages : 255 pages
Book Rating : 4.:/5 (661 download)

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Book Synopsis Reliability Physics 1988 by :

Download or read book Reliability Physics 1988 written by and published by . This book was released on 1988 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Physics 1988

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ISBN 13 :
Total Pages : 255 pages
Book Rating : 4.:/5 (728 download)

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Book Synopsis Reliability Physics 1988 by : R. W. Thomas

Download or read book Reliability Physics 1988 written by R. W. Thomas and published by . This book was released on 1988 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Physics 1988

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ISBN 13 :
Total Pages : 255 pages
Book Rating : 4.:/5 (181 download)

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Book Synopsis Reliability Physics 1988 by :

Download or read book Reliability Physics 1988 written by and published by . This book was released on 1988 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt:

26th Annual Proceedings, Reliability Physics 1988

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Book Synopsis 26th Annual Proceedings, Reliability Physics 1988 by :

Download or read book 26th Annual Proceedings, Reliability Physics 1988 written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Assessments

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Publisher : CRC Press
ISBN 13 : 1498719201
Total Pages : 784 pages
Book Rating : 4.4/5 (987 download)

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Book Synopsis Reliability Assessments by : Franklin Richard Nash, Ph.D.

Download or read book Reliability Assessments written by Franklin Richard Nash, Ph.D. and published by CRC Press. This book was released on 2017-07-12 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.

Product Reliability, Maintainability, and Supportability Handbook

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Publisher : CRC Press
ISBN 13 : 9780849394577
Total Pages : 450 pages
Book Rating : 4.3/5 (945 download)

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Book Synopsis Product Reliability, Maintainability, and Supportability Handbook by : Michael Pecht

Download or read book Product Reliability, Maintainability, and Supportability Handbook written by Michael Pecht and published by CRC Press. This book was released on 1995-05-04 with total page 450 pages. Available in PDF, EPUB and Kindle. Book excerpt: This unique publication addresses the role of reliability, maintainability, and supportability in the life-cycle of a product, in the context of product effectiveness and worth. It emphasizes all aspects of producing an effective electrical or mechanical system. This is the only handbook available on this subject and the only book that is this comprehensive and informative. The Product Reliability, Maintainability, and Supportability Handbook examines the logistics, cost, and the physics of failure-topics never before found in a single volume on reliability. It describes the factors that affect product effectiveness and worth: performance, reliability, design effectiveness and margin for error, availability, affordability, use effectiveness, and logistic effectiveness. The handbook contains 13 in-depth chapters, opening with an introduction on product effectiveness and worth and concluding with reliability and maintainability data that can be combined with performance data to assess overall effectiveness of the product. The pages are filled with valuable information that can be easily and quickly put to practical use. Basic principles of the mathematical theory of probability and necessary background are provided. Concepts and basic theory of reliability in terms of probability and statistical inference are also given. Techniques for deriving probabilistic models from observational data as well as reliability models and associated validation techniques are detailed. Software and software reliability, quality, and safety are all covered, including the development life-cycle process and mechanisms by which software errors are introduced. The book presents design guidelines and techniques and the requirements for materials, manufacturing, and assembly. Learn how to analyze the reliability of redundant and fault-tolerant products. Use the methods for modeling and analyzing failures of repairable products that normally exhibit wearout characteristics. The Product Reliability, Maintainability, and Supportability Handbook also provides reliability improvement techniques to improve the competitiveness of existing products. The book includes helpful summaries and numerous problem sections to reinforce and test learned information. This reference source is the guide that professionals and technical managers should turn to when they need a comprehensive and detailed overview of everything that goes into producing systems and products that meet customer needs in an effective and timely manner.

Reliability and Failure of Electronic Materials and Devices

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Publisher : Academic Press
ISBN 13 : 0080575528
Total Pages : 759 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Reliability and Failure of Electronic Materials and Devices by : Milton Ohring

Download or read book Reliability and Failure of Electronic Materials and Devices written by Milton Ohring and published by Academic Press. This book was released on 2014-10-14 with total page 759 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Quality Conformance and Qualification of Microelectronic Packages and Interconnects

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Publisher : John Wiley & Sons
ISBN 13 : 9780471594369
Total Pages : 498 pages
Book Rating : 4.5/5 (943 download)

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Book Synopsis Quality Conformance and Qualification of Microelectronic Packages and Interconnects by : Michael Pecht

Download or read book Quality Conformance and Qualification of Microelectronic Packages and Interconnects written by Michael Pecht and published by John Wiley & Sons. This book was released on 1994-12-13 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: All packaging engineers and technologists who want to ensure thatthey give their customers the highest quality, most cost-effectiveproducts should know that the paradigm has shifted. It has shiftedaway from the MIL-STDs and other government standards and testprocedures that don't cost-effectively address potential failuremechanisms or the manufacturing processes of the product. It hasshifted decisively towards tackling the root causes of failure andthe appropriate implementation of cost-effective process controls,qualityscreens, and tests. This book's groundbreaking, science-based approach to developingqualification and quality assurance programs helps engineers reacha new level of reliability in today's high-performancemicroelectronics. It does this with powerful... * Techniques for identifying and modeling failure mechanismsearlier in the design cycle, breaking the need to rely on fielddata * Physics-of-failure product reliability assessment methods thatcan be proactively implemented throughout the design andmanufacture of the product * Process controls that decrease variabilities in the end productand reduce end-of-line screening and testing A wide range of microelectronic package and interconnectconfigurations for both single-and multi-chip modules is examined,including chip and wire-bonds, tape-automated (TAB), flip-TAB,flip-chip bonds, high-density interconnects, chip-on-board designs(COB), MCM, 3-D stack, and many more. The remaining packageelements, such as die attachment, case and lid, leads, and lid andlead seals are also discussed in detail. The product of a distinguished team of authors and editors, thisbook's guidelines for avoiding potential high-risk manufacturingand qualification problems, as well as for implementing ongoingquality assurance, are sure to prove invaluable to both studentsand practicing professionals. For the professional engineer involved in the design andmanufacture of products containing electronic components, here is acomprehensive handbook to the theory and methods surrounding theassembly of microelectronic and electronic components. The bookfocuses on computers and consumer electronic products with internalsubsystems that reflect mechanical design constraints, costlimitations, and aesthetic and ergonomic concerns. Taking a totalsystem approach to packaging, the book systematically examines:basic chip and computer architecture; design and layout;interassembly and interconnections; cooling scheme; materialsselection, including ceramics, glasses, and metals; stress,vibration, and acoustics; and manufacturing and assemblytechnology. 1994 (0-471-53299-1) 800 pp. INTEGRATED CIRCUIT, HYBRID, AND MULTICHIP MODULE PACKAGE DESIGNGUIDELINES: A Focus on Reliability --Michael Pecht This comprehensive guide features a uniquely organized time-phasedapproach to design, development, qualification, manufacture, andin-service management. It provides step-by-step instructions on howto define realistic system requirements, define the system usageenvironment, identify potential failure modes, characterizematerials and processes by the key control label factors, and useexperiment, step-stress, and accelerated methods to ensure optimumdesign before production begins. Topics covered include: detaileddesign guidelines for substrate...wire and wire, tape automated,and flip-chip bonding...element attachment and case, lead, lead andlid seals--incorporating dimensional and geometric configurationsof package elements, manufacturing and assembly conditions,materials selection, and loading conditions. 1993 (0-471-59446-6)454 pp.

IEEE International Reliability Physics Symposium Proceedings

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ISBN 13 :
Total Pages : 766 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis IEEE International Reliability Physics Symposium Proceedings by : International Reliability Physics Symposium

Download or read book IEEE International Reliability Physics Symposium Proceedings written by International Reliability Physics Symposium and published by . This book was released on 2004 with total page 766 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Proceedings

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ISBN 13 :
Total Pages : 256 pages
Book Rating : 4.3/5 (91 download)

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Download or read book Proceedings written by and published by . This book was released on 1995 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Proceedings

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ISBN 13 :
Total Pages : 433 pages
Book Rating : 4.:/5 (221 download)

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Book Synopsis Proceedings by :

Download or read book Proceedings written by and published by . This book was released on 1988 with total page 433 pages. Available in PDF, EPUB and Kindle. Book excerpt: