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Download or read book QUANTITATIVE STUDY OF VACANCY DEFECTS IN QUENCHED PLATINUM BY FIELD ION MICROSCOPY AND ELECTRICAL RESISTIVITY. II. ANALYSIS AND INTERPRETATION. Report written by and published by . This book was released on 1972 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 730 pages
Book Rating : 4.:/5 (318 download)
Download or read book Nuclear Science Abstracts written by and published by . This book was released on 1972 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt: NSA is a comprehensive collection of international nuclear science and technology literature for the period 1948 through 1976, pre-dating the prestigious INIS database, which began in 1970. NSA existed as a printed product (Volumes 1-33) initially, created by DOE's predecessor, the U.S. Atomic Energy Commission (AEC). NSA includes citations to scientific and technical reports from the AEC, the U.S. Energy Research and Development Administration and its contractors, plus other agencies and international organizations, universities, and industrial and research organizations. References to books, conference proceedings, papers, patents, dissertations, engineering drawings, and journal articles from worldwide sources are also included. Abstracts and full text are provided if available.
Author : Arnold Stanley Berger
Publisher :
ISBN 13 :
Total Pages : 166 pages
Book Rating : 4.E/5 ( download)
Download or read book A Quantitative Study of Point Defects in Quenched Platinum by Field Ion Microscopy and Electrical Resistivity written by Arnold Stanley Berger and published by . This book was released on 1971 with total page 166 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1102 pages
Book Rating : 4.X/5 (4 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1973 with total page 1102 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 904 pages
Book Rating : 4.:/5 (31 download)
Download or read book STAR written by and published by . This book was released on 1973 with total page 904 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1352 pages
Book Rating : 4.3/5 (129 download)
Download or read book Government Reports Announcements written by and published by . This book was released on 1972 with total page 1352 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 838 pages
Book Rating : 4.F/5 ( download)
Download or read book Government Reports Announcements & Index written by and published by . This book was released on 1982 with total page 838 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1074 pages
Book Rating : 4.:/5 (319 download)
Download or read book Government Reports Index written by and published by . This book was released on 1972 with total page 1074 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. Energy Research and Development Administration
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ISBN 13 :
Total Pages : 756 pages
Book Rating : 4.3/5 (91 download)
Download or read book ERDA Energy Research Abstracts written by United States. Energy Research and Development Administration and published by . This book was released on 1976 with total page 756 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. Energy Research and Development Administration. Technical Information Center
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ISBN 13 :
Total Pages : 962 pages
Book Rating : 4.3/5 (129 download)
Download or read book ERDA Energy Research Abstracts written by United States. Energy Research and Development Administration. Technical Information Center and published by . This book was released on 1976 with total page 962 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Secondary Defects in Quenched Platinum written by and published by . This book was released on 1979 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The structure of secondary defects in two different platinum purities quenched under ultra high vacuum, has been studied by transmission electron microscopy. Faulted loops on (100) planes have been observed in both materials. In the less pure platinum, Pt B (but purer in terms of carbon content), the defects were observed after quenching, whereas in the purest one, Pt A (but less pure in terms of carbon content), the defects were formed after a long annealing. The Burgers vector of the loops formed after the quenching was a/3 100 and for loops formed during long annealings, was a/2 100, apparently. It was found that in Pt B the loop density increased and the loop size decreased as the quenching temperature was lowered. The same effect was produced by increasing the carbon content by a small amount. The loop formation was totally inhibited by adding a larger amount of carbon and also when the quenching was performed in poor vacuum (approx. 0.01 torr) or in air. The defects can be interpreted as pure vacancy loops heterogeneously nucleated at carbon atom clusters or, as plate like precipitates of carbon atoms and vacancies formed by a co-precipitation mechanism. The discussion of the experimental results obtained is based upon these two models.
Author : Maria Isabel Perez
Publisher :
ISBN 13 :
Total Pages : 124 pages
Book Rating : 4.:/5 (29 download)
Download or read book Secondary Defects in Quenched Platinum written by Maria Isabel Perez and published by . This book was released on 1979 with total page 124 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. Energy Research and Development Administration
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ISBN 13 :
Total Pages : 770 pages
Book Rating : 4.0/5 ( download)
Download or read book ERDA Energy Research Abstracts written by United States. Energy Research and Development Administration and published by . This book was released on 1976-10 with total page 770 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Total Pages : 1218 pages
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Download or read book Metals Abstracts written by and published by . This book was released on 1985 with total page 1218 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Total Pages : 682 pages
Book Rating : 4.3/5 (91 download)
Download or read book INIS Atomindex written by and published by . This book was released on 1995 with total page 682 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michael K. Miller
Publisher : Springer Science & Business Media
ISBN 13 : 1461542812
Total Pages : 247 pages
Book Rating : 4.4/5 (615 download)
Download or read book Atom Probe Tomography written by Michael K. Miller and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
