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Download or read book Design and Development of HOE-based Atomic Force Microscope with Translational and Angular Measurements written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : En-Te Hwu
Publisher : Edwin Hwu
ISBN 13 :
Total Pages : 136 pages
Book Rating : 4./5 ( download)
Download or read book Fundamentals of an Atomic Force Microscope Based on a Digital Versatile Disk Optical Pick-up Unit written by En-Te Hwu and published by Edwin Hwu. This book was released on 2014-04-30 with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt: A novel non-contact multiaxial astigmatic detection system (ADS) is designed and developed using the astigmatism as the measuring principle for the translational displacement, the angle, and their variations of a measured surface simultaneously. An optical pickup unit (OPU) of a commercial digital versatile disk (DVD) read only memory (ROM) drive can be used directly as an optical path mechanism in the above mentioned ADS, which can measure the translational and angular displacements accurately and simultaneously. The total linear detection range and the maximum measurement bandwidth of the ADS are 6 mm and 80MHz, respectively. The resolution of the translational displacement measurement is in sub-angstrom scale. For an operating frequency of 700 kHz, the noise floors of the translational and angular signals are below 0.8 pm/Hz1/2 and 0.4 mrad/ Hz1/2, respectively. The ADS can monitor the translational and two orthogonal angular displacements of a micro fabricated cantilever in atomic force microscopy (AFM). All the three, contact non-contact and tapping, modes can resolve the single atomic steps of the graphite surface, which indicates that atomic resolution is achievable with the ADS. The thermal noise spectra of the AFM probe can be clearly measured as well. Furthermore, the accuracy of scanning probe microscopy (SPM) depends not only on the measurement system itself, but also by the accuracy of the signal processing, which further depends on the physical and geometrical characteristics of the probe. The structure of the ADS is compact and stable. Besides the measurements through AFM probes, the ADS can be operated in profilometer mode. The CD surface and the CCD microlens are measured by this mode. The maximum scanning speed can reach up to 3.84×106 mm/s theoretically, almost one million times faster than that of a commercial SPM system. The ADS has a great potential for future development, the expansibility and the accuracy can evolve with the performance of future OPU. From the DVD OPU to higher resolution one, such as the OPU of the Blu-ray drive or high- definition (HD-DVD), can be integrated into the ADS as well. KEYWORDS: Astigmatism, ADS, Translational displacement, Angular displacement, SPM, AFM, Cantilever, Optical profilometer
Author : Iman Soltani Bozchalooi
Publisher :
ISBN 13 :
Total Pages : 227 pages
Book Rating : 4.:/5 (93 download)
Download or read book Design and Control of High-speed and Large-range Atomic Force Microscope written by Iman Soltani Bozchalooi and published by . This book was released on 2015 with total page 227 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis presents the design, control and instrumentation of a novel atomic force microscope (AFM). This AFM is capable of high-speed imaging while maintaining large out-of-plane and lateral scan ranges. The primary contributions of this thesis include the design and implementation of a high-speed and large-range AFM; design, implementation and control of a multi-actuated nano-positioner; development of a general direct data-based control design scheme for redundantly actuated nano-positioners; design and implementation of a non-linear amplitude demodulation method for tapping mode imaging; and development of a parameter estimation methodology for piezo actuator hysteresis modeling and compensation. Atomic force microscopes can provide nano-scale resolution images of sample surface topography in air, vacuum or in liquid. This instrument operates by scanning a micro-mechanical probe on a sample. A measurement of the probe-sample interaction is used to control the AFM scanner and also form a 3D image of the sample surface topography. The mechanical nature and the serial-point-collection bases of operation of this instrument significantly limits its speed and constrains its application to the study of static samples. Unlocking the high-speed performance capability of AFM enables study of dynamic nano-scale processes and opens up the possibility of novel scientific discoveries. Improving the speed performance of AFM however, should not compromise imaging range so that the instrument can accommodate imaging experiments with diverse lateral and out-of-plane scan range requirements. In addition to high-speed and large-range performance, instrument flexibility and ease of use are very important. An AFM should allow samples of different sizes, and provide a simple platform for setting up the imaging experiment. In this work all the components of the AFM are designed to meet these specifications. A multi-actuated scanner is designed and built that is composed of five nano-positioners with different range and bandwidth characteristics. Through redundant actuation this nano-positioner is capable of operating at high speeds and over large lateral and out-of-plane scan ranges. A general data-based compensator design methodology for the control of redundantly actuated nano-positioners is developed. In the proposed approach the compensators are obtained directly from the measured scanner actuator response, without any intermediate modeling. This feature makes updating or tuning the associated parameters easier. The flexibility of AFM control is maintained by designing these compensators auxiliary to a PID control unit. It is shown that in this form, a PID controller suffices to meet the needs of high-speed atomic force microscopy. This approach to control design is also used in the thesis to retroactively enhance existing AFMs operating on both flexure-based scanners and piezo-tubes. To improve the positioning accuracy of the scanner we proposed a more accurate parameter estimation scheme for the Maxwell model of hysteresis extended to the full hysteresis loop. Finally, to enable operation of AFMs with probe arrays in tapping mode a non-linear demodulation method based on the Teager Energy Operator is designed and implemented in both analog and digital forms. The main advantage of this technique is simplicity, enabling implementation of hundreds of these operators in digital form on FPGAs (Field Programmable Gate Arrays) or in ASIC (Application-Specific Integrated Circuit) form on AFM probe arrays for parallel sensing. The developments of this thesis form the bases for the design and implementation of a novel AFM. The implemented instrument is capable of high-speed imaging and simultaneously achieves 6 [mu]m out-of-plane and 120 [mu]m lateral scan ranges making it the largest range high-speed AFM reported to this date. This instrument also features a modular design with a laser spot size of 3.5 [mu]m compatible with small cantilevers, an optical view of the sample and probe for site selection and laser adjustment, a conveniently large (15 mm) waterproof sample stage that accommodates samples with various sizes and a data logging and plotting system with 20 MHz throughput for high resolution image acquisition at high imaging speeds. The designed AFM is used to visualize etching of calcite in a solution of sulfuric acid. Layer-by-layer dissolution along the crystalline lines in a low pH environment is observed in real time and the corresponding dissolution rate is estimated. The designed AFM is also used to visualize in real time the nucleation, growth and striping of copper on gold for the first time.
Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 0306448904
Total Pages : 468 pages
Book Rating : 4.3/5 (64 download)
Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 1994 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various symposium topics included application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments including new probe microscopies. The procee.
Author : Peter Eaton
Publisher : OUP Oxford
ISBN 13 : 0191576670
Total Pages : 256 pages
Book Rating : 4.1/5 (915 download)
Download or read book Atomic Force Microscopy written by Peter Eaton and published by OUP Oxford. This book was released on 2010-03-25 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 1475793251
Total Pages : 243 pages
Book Rating : 4.4/5 (757 download)
Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.
Author : Suchit Sharma
Publisher : GRIN Verlag
ISBN 13 : 3668588252
Total Pages : 21 pages
Book Rating : 4.6/5 (685 download)
Download or read book Scanning Tunneling Microscope and Atomic Force Microscopy written by Suchit Sharma and published by GRIN Verlag. This book was released on 2017-12-05 with total page 21 pages. Available in PDF, EPUB and Kindle. Book excerpt: Literature Review from the year 2015 in the subject Engineering - General, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical "touch" while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist’s lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations. The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide.
Author : S. Morita
Publisher : Springer Science & Business Media
ISBN 13 : 3642560199
Total Pages : 448 pages
Book Rating : 4.6/5 (425 download)
Download or read book Noncontact Atomic Force Microscopy written by S. Morita and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Author : Victor Bellitto
Publisher : BoD – Books on Demand
ISBN 13 : 9535104144
Total Pages : 272 pages
Book Rating : 4.5/5 (351 download)
Download or read book Atomic Force Microscopy written by Victor Bellitto and published by BoD – Books on Demand. This book was released on 2012-03-23 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
Download or read book Model Development and Control Design for Atomic Force Microscopy written by and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The development of energy-based models and model-based control designs necessary to achieve present and projected applications involving atomic force microscopy is investigated. Applications include real-time product diagnostics or monitoring of biological processes, nanoelectromechanical systems (NEMS) and employment of atomic force microscope (AFM) technology for spintronics. A crucial component in the AFM design is the piezoceramic (PZT)-based stage used to position the sample. Whereas PZT actuators provide the broadband and extremely high set point capabilities required by the AFM stages, they also exhibit frequency-dependent hysteresis and constitutive nonlinearities. To characterize the field-polarization relation in PZT, low-order macroscopic models are constructed based on a combination of energy analysis at the mesoscopic level along with stochastic homogenization techniques. To account for nonuniformity and inhomogeneities in the material, local coercive field values are assumed to be distributed. Due to interactions among the dipoles, the effective field is also assumed to be distributed. Previous work has employed specific functions to describe these distributions. However, the fact that these choices are not based on energy considerations, motivates the use of general densities. The dynamics of the actuator must be incorporated as well. A rod model is suitable for a stacked actuator whose cross-section is small compared to the length. The equation of motion for the rod can be derived using force balancing with boundary conditions determined from the fact that the rod is fixed at one end and pushes against the stage at the other. At low frequencies, the hysteresis and constitutive nonlinearities inherent in PZT can be accommodated through PID or robust control designs. However, at the higher frequencies required by the previously outlined applications, increasing noise-to-data ratios and diminishing high-pass characteristics of control filters preclude a.
Author : Ronald G Reifenberger
Publisher : World Scientific
ISBN 13 : 9814630373
Total Pages : 341 pages
Book Rating : 4.8/5 (146 download)
Download or read book Fundamentals Of Atomic Force Microscopy - Part I: Foundations written by Ronald G Reifenberger and published by World Scientific. This book was released on 2015-09-29 with total page 341 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Author : Tomasz Tański
Publisher : BoD – Books on Demand
ISBN 13 : 1789851696
Total Pages : 116 pages
Book Rating : 4.7/5 (898 download)
Download or read book Atomic-force Microscopy and Its Applications written by Tomasz Tański and published by BoD – Books on Demand. This book was released on 2019-01-30 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
Author : Arturo M. Baró
Publisher : John Wiley & Sons
ISBN 13 : 3527327584
Total Pages : 385 pages
Book Rating : 4.5/5 (273 download)
Download or read book Atomic Force Microscopy in Liquid written by Arturo M. Baró and published by John Wiley & Sons. This book was released on 2012-05-14 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
Author : Andrew Careaga Houck
Publisher :
ISBN 13 :
Total Pages : 97 pages
Book Rating : 4.:/5 (929 download)
Download or read book A Modular Atomic Force Microscope for Nanotechnology Research written by Andrew Careaga Houck and published by . This book was released on 2015 with total page 97 pages. Available in PDF, EPUB and Kindle. Book excerpt: The atomic force microscope (AFM) has become an essential tool in a wide range of fields, from materials science and semiconductor research to molecular biology. Various research efforts have enhanced the capabilities of this powerful instrument, which has enabled new insights into nanoscale phenomena. Despite decades of research, state-of-the-art AFMs are not widely utilized. In order to accelerate the proliferation and development of these instruments, a modular atomic force microscope is presented. The optical, mechanical, and instrumentation components of the AFM can all be easily exchanged. The instrument can be reconfigured for fundamentally different imaging tasks and can be used as a platform for continued research efforts. The optical beam deflection (OBD) setup can be configured for coaxial or off-axis detection for use with cantilevers of any size. A simple and low-cost design is presented, and an AFM is implemented based on the design. The instrument is tested in two different imaging configurations. First, a configuration for high-speed imaging with small cantilevers is used to image copper deposition on gold in contact mode in liquid. Second, a configuration for large cantilevers is used to visualize the mechanical properties of a polymer blend in tapping mode in air. The flexibility of the modular instrument is leveraged to develop a new capability for high-speed AFM. Multi-actuated and dual-actuated sample scanners have enhanced the high-speed performance of AFMs by combining multiple nanopositioners with different range and bandwidth characteristics. While this and other improvements have made AFM scanners effective for high-speed imaging, out-of-plane sensing has not been developed adequately. Out-of-plane sensing enhances the capability for quantitative in situ analysis by measuring changes in sample thickness during dynamic processes. This is especially useful in materials science and electrochemical applications, in which understanding of changes in bulk sample thickness is essential. A sensing methodology for high-speed dual-actuated out-of-plane positioning is presented. A silicon-type strain gauge is used to measure the displacement of the low frequency nanopositioner. A piezoelectric sensor is used to measure high-frequency displacement. The sensor is incorporated into a novel diaphragm flexure nanopositioner with annular piezoelectric actuator. Fusion of the two sensors for high-speed imaging tasks is discussed. Performance of the two sensors is evaluated, and further developments to integrate the sensing methodology into the modular atomic force microscope are discussed. Finally, the modular AFM is used in two dynamic nanoscale imaging tasks. High speed atomic force microscopy has enabled many novel discoveries across a range of applications, especially in biological fields. However, applications in materials science and electrochemistry have not been as thoroughly explored. First, electrochemical deposition of copper on gold during cyclic voltammetry (CV) trials is studied. Electrochemical data from a potentiostat during the CV trials collected in parallel with the AFM images to enrich the analysis. The effect of different initial surface conditions on deposition and stripping is observed. Second, calcite dissolution in low-pH environments is imaged. Dissolution processes in sulfuric and hydrochloric acid solutions are compared. It is apparent that the rhombohedral crystalline structure of the calcite clearly influences the dissolution kinetics in both cases. Erosion of thick calcite terraces is observed in both solutions. However, differences in the dissolution kinetics suggest that the anions play an important role in the process. Multi-actuated sample scanners are particularly well-suited for these two applications, as they involve rapid changes in features at the nanometer scale (e.g. calcite monolayer etch pits and copper nucleation sites) as well as the micron scale (e.g. calcite terraces and copper grains).
Author : J. Drelich
Publisher : CRC Press
ISBN 13 : 906764434X
Total Pages : 823 pages
Book Rating : 4.0/5 (676 download)
Download or read book Atomic Force Microscopy in Adhesion Studies written by J. Drelich and published by CRC Press. This book was released on 2005-10-01 with total page 823 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials. This volume is a comprehensive review of AFM techniques and their application in adhesion studies. It is intended for both researchers and students in engineering disciplines, physics and biology. Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.
Author : 廖先順
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (875 download)
Download or read book Design and Development of Atomic Force Microscope Systems for Liquid Environment written by 廖先順 and published by . This book was released on 2013 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 13 pages
Book Rating : 4.:/5 (742 download)
Download or read book Model Development and Control Design for High Speed Atomic Force Microscopy written by and published by . This book was released on 2004 with total page 13 pages. Available in PDF, EPUB and Kindle. Book excerpt: This paper addresses the development of energy-based models and model-based control designs necessary to achieve present and projected applications involving atomic force microscopy. The models are based on a combination of energy analysis at the mesoscopic level with stochastic homogenization techniques to construct low-order macroscopic models. Approximate model inverses are then employed as filters to linearize transducer responses for linear robust control design.
