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The Error Latency Of Delay Faults In Combinational And Sequential Circuits
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Book Synopsis Testing and Diagnosis of VLSI and ULSI by : F. Lombardi
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Book Synopsis Dependable Computing - EDDC-3 by : Jan Hlavicka
Download or read book Dependable Computing - EDDC-3 written by Jan Hlavicka and published by Springer. This book was released on 2003-06-26 with total page 442 pages. Available in PDF, EPUB and Kindle. Book excerpt: The idea of creating the European Dependable Computing Conference (EDCC) was born at the moment when the Iron Curtain fell. A group of enthusiasts, who were pre viously involved in research and teaching in the ?eld of fault tolerant computing in different European countries, agreed that there is no longer any point in keeping pre viously independent activities apart and created a steering committee which took the responsibility for preparing the EDCC calendar and appointing the chairs for the in dividual conferences. There is no single European or global professional organization that took over the responsibility for this conference, but there are three national in terest groups that sent delegates to the steering committee and support its activities, especially by promoting the conference materials. As can be seen from these materi als, they are the SEE Working Group “Dependable Computing” (which is a successor organizationof AFCET)in France,theGI/ITG/GMATechnicalCommitteeonDepend ability and Fault Tolerance in Germany, and the AICA Working Group “Dependability of Computer Systems” in Italy. In addition, committees of several global professional organizations, such as IEEE and IFIP, support this conference. Prague has been selected as a conference venue for several reasons. It is an easily accessible location that may attract many visitors by its beauty and that has a tradition in organizing international events of this kind (one of the last FTSD conferences took place here).
Book Synopsis Principles of Testing Electronic Systems by : Samiha Mourad
Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
Download or read book Proceedings written by and published by . This book was released on 1989 with total page 1012 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory Publisher : ISBN 13 : Total Pages :26 pages Book Rating :4.F/5 ( download)
Book Synopsis The Error Latency of a Fault in a Sequential Digital Circuit by : Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Download or read book The Error Latency of a Fault in a Sequential Digital Circuit written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1974 with total page 26 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digest of Technical Papers written by and published by . This book was released on 1986 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Future of Test written by and published by . This book was released on 1985 with total page 1036 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Research on Integrated Systems by : Gaetano Borriello
Download or read book Research on Integrated Systems written by Gaetano Borriello and published by . This book was released on 1993 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the 1993 Symposium March 1416, 1993, Seattle, Washington Recent advances in microelectronic technologies have enabled new architectures and applications requiring highly integrated or large-scale systems. These proceedings from the conference formerly known as the conference on Advanced Research in VLSI describe original research on issues in building integrated systems "from the chips up." Topics include: Systems issues. VLSI architectures. Circuits and devices. New technologies. Design automation.
Book Synopsis LSI/VLSI Testability Design by : Frank F. Tsui
Download or read book LSI/VLSI Testability Design written by Frank F. Tsui and published by McGraw-Hill Companies. This book was released on 1987 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Asian Test Symposium written by and published by . This book was released on 2004 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Integration of Test with Design and Manufacturing by : IEEE Computer Society
Download or read book Integration of Test with Design and Manufacturing written by IEEE Computer Society and published by IEEE Computer Society Press. This book was released on 1987 with total page 1192 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Computer Systems Reliability by : T. Anderson
Download or read book Computer Systems Reliability written by T. Anderson and published by CUP Archive. This book was released on 1979-07-31 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 1999 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digest of Papers written by and published by . This book was released on 1975 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Journal of Nutrition written by and published by . This book was released on 1967 with total page 756 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. 7-42 include the Proceedings of the annual meeting of the American Institute of Nutrition, 1st-9th, 11th-14th, 1934-1942, 1947-1950 (1st-8th, 1934-1941, issued as supplements to the journal).
Download or read book 17th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
Download or read book FTCS-22 written by and published by . This book was released on 1992 with total page 564 pages. Available in PDF, EPUB and Kindle. Book excerpt:
