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The Application Of Time Of Flight Secondary Ion Mass Spectrometry Tof Sims To Forensic Glass Analysis And Questioned Document Examination
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Book Synopsis The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination by : John Denman
Download or read book The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination written by John Denman and published by . This book was released on 2007 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis The Practice of TOF-SIMS by : Alan M. Spool
Download or read book The Practice of TOF-SIMS written by Alan M. Spool and published by Momentum Press. This book was released on 2016-03-24 with total page 267 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.
Book Synopsis An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by : Sarah Fearn
Download or read book An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science written by Sarah Fearn and published by Morgan & Claypool Publishers. This book was released on 2015-10-16 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Book Synopsis Secondary Ion Mass Spectrometry by : Fred Stevie
Download or read book Secondary Ion Mass Spectrometry written by Fred Stevie and published by Momentum Press. This book was released on 2015-09-15 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Download or read book ToF-SIMS written by J. C. Vickerman and published by IM Publications. This book was released on 2013 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Book Synopsis Forensic Science E-Magazine by : Archana Singh
Download or read book Forensic Science E-Magazine written by Archana Singh and published by Archana Singh. This book was released on 2022-02-22 with total page 21 pages. Available in PDF, EPUB and Kindle. Book excerpt: Learning should never stop, and with each other's cooperation, we can share knowledge to anyone and everyone. That is why Forensicfield.blog is releasing a series of magazines on forensic science, the first of which is available. This is free of charge. This magazine offers articles authored by a variety of expert individuals, as well as quizzes and games.
Book Synopsis New Trends and Potentialities of ToF-SIMS in Surface Studies by : Jacek Grams
Download or read book New Trends and Potentialities of ToF-SIMS in Surface Studies written by Jacek Grams and published by Nova Publishers. This book was released on 2007 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.
Book Synopsis Application of Automated Expert Spectral Image Analysis (AXSIA) to Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) by : James A. Ohlhausen
Download or read book Application of Automated Expert Spectral Image Analysis (AXSIA) to Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) written by James A. Ohlhausen and published by . This book was released on 2004 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Application of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High Performance Depth Profiling of Semiconductor Materials by : Karsten Iltgen
Download or read book Application of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High Performance Depth Profiling of Semiconductor Materials written by Karsten Iltgen and published by . This book was released on 1997 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Time-of-flight Secondary Ion Mass Spectrometry by : Joanna Lee
Download or read book Time-of-flight Secondary Ion Mass Spectrometry written by Joanna Lee and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000 +; the need for validated and robust measurement protocols for difficult samples, such as those with significant micron scale surface topography; the lack of guidance on novel data analysis methods including multivariate analysis which have the potential to simplify many time-consuming and intensive analyses in industry; and the need to establish best practice to improve the accuracy of measurements. This thesis describes research undertaken to address the above challenges. Sample topography and field effects were evaluated experimentally using model conducting and insulating fibres and compared with computer simulations to provide recommendation to diagnose and reduce the effects. Two popular multivariate methods, principal component analysis (PCA) and multivariate curve resolution (MCR), were explored using mixed organic systems consisting of a simple polymer blend and complex hair fibres treated with a multi-component formulation to evaluate different multivariate and data preprocessing methods for the optimal identification, localisation and quantification of the chemical components. Finally, cluster ion beams C60 n+ and ArSOO-2S00 + were evaluated on an inorganic surface and an organic delta layer reference material respectively to elucidate the fundamental metrology of cluster ion sputtering and pave the way for their use in organic depth profiling. These studies provide the essential metrological foundation to address frontier issues in surface and nanoanalysis and extend the measurement capabilities ofToF-SIMS.
Book Synopsis Secondary Ion Mass Spectrometry by : Robert G. Wilson
Download or read book Secondary Ion Mass Spectrometry written by Robert G. Wilson and published by Wiley-Interscience. This book was released on 1989-11-16 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.
Book Synopsis Applications of Time-of-Flight and Orbitrap Mass Spectrometry in Environmental, Food, Doping, and Forensic Analysis by :
Download or read book Applications of Time-of-Flight and Orbitrap Mass Spectrometry in Environmental, Food, Doping, and Forensic Analysis written by and published by Elsevier. This book was released on 2016-06-02 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt: Applications of Time-of-Flight and Orbitrap Mass Spectrometry in Environmental, Food, Doping, and Forensic Analysis deals with the use of high-resolution mass spectrometry (MS) in the analysis of small organic molecules. Over the past few years, time-of-flight (ToF) and Orbitrap MS have both experienced tremendous growth in a great number of analytical sectors and are now well established in many laboratories where high requirements are placed on analytical performance. This book gives a head-to-head comparison of these two technologies that compete directly with each other. As users with hands-on experience in both techniques, the authors provide a balanced description of the strengths and weaknesses of both techniques. In the vast majority of cases, ToF-MS and Orbitrap-MS have been used for qualitative purposes, mainly identification of discrete molecular entities such as drug metabolites or transformation products of environmental contaminants. This paradigm is now changing as quantitative capabilities are increasingly being explored, as are non-target approaches for unbiased broad-scope screening. In view of the continuous innovation of high-resolution MS instrument manufacturers in designing and developing more powerful machines, technological advances in both hardware and software are considerable, with many novel applications. This book summarizes and analyzes these trends. The compilation of selected examples from diverse analytical fields will allow the readers to discover not only the potential of high-resolution MS in their sector, but also shows advances in other fields that rely on hi-res MS. - Provides comprehensive coverage of applications of time-of-flight and orbitrap mass spectrometry in environmental, food, doping, and forensic analysis - Explores a variety of specialized techniques, giving a balanced description of the strengths and weaknesses of each - Presents a general overview of imaging techniques within analysis
Book Synopsis Secondary Ion Mass Spectrometry by : J. C. Vickerman
Download or read book Secondary Ion Mass Spectrometry written by J. C. Vickerman and published by Oxford University Press, USA. This book was released on 1989 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Book Synopsis Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files by :
Download or read book Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files written by and published by . This book was released on 2007 with total page 43 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Optimization and Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for the Detection of Nanomaterials in Tissue Thin Sections by : Lothar Veith
Download or read book Optimization and Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for the Detection of Nanomaterials in Tissue Thin Sections written by Lothar Veith and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data by : Negar Shahrokhesfahani
Download or read book Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data written by Negar Shahrokhesfahani and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful tool for advanced surface analysis. It produces large data sets, which consist of mass spectra at each pixel at an imaged area. Many ToF SIMS instruments use a type of detector that suffers from two problems that lead to non-linearity in the measured sample properties: detector saturation and dead time. Linearity in this type of system is defined as the proportionality of the measured and true ion counts. Non-linearity can influence the interpretation of the data with methods such as multivariate analysis. "Detector saturation" happens when more than one ion arrives at the detector in the time interval related to one specific channel but the detector records only a single count. "Dead time" is when one event happens at a certain channel and the detector become insensitive to subsequent ions arriving within the dead time window. These problems both lead to under-counting of ions. In this thesis, we mainly focus on correcting for the dead time effects. Using extensive simulations, we first characterize the adverse effects of dead time on the output and evaluate quality of existing ways to "correct" for dead time effects. Then, we propose a novel method using the Maximum Likelihood Estimation (MLE) to estimate the true spectrum for the measured data. Specifically, we incorporate the statistical distribution of the dead time affected data in MLE, which leads to a new method for dead time correction.
Book Synopsis Application of Molecular Primary Ions for Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) of Organic Surfaces by : Dietmar Stapel
Download or read book Application of Molecular Primary Ions for Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) of Organic Surfaces written by Dietmar Stapel and published by . This book was released on 2000 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt:
