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Book Synopsis An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by : Sarah Fearn
Download or read book An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science written by Sarah Fearn and published by Morgan & Claypool Publishers. This book was released on 2015-10-16 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Download or read book ToF-SIMS written by J. C. Vickerman and published by IM Publications. This book was released on 2013 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Book Synopsis New Trends and Potentialities of ToF-SIMS in Surface Studies by : Jacek Grams
Download or read book New Trends and Potentialities of ToF-SIMS in Surface Studies written by Jacek Grams and published by Nova Publishers. This book was released on 2007 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.
Book Synopsis The Practice of TOF-SIMS by : Alan M. Spool
Download or read book The Practice of TOF-SIMS written by Alan M. Spool and published by Momentum Press. This book was released on 2016-03-24 with total page 181 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.
Book Synopsis Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry by : Danica Heller-Krippendorf
Download or read book Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry written by Danica Heller-Krippendorf and published by Springer Nature. This book was released on 2019-10-31 with total page 195 pages. Available in PDF, EPUB and Kindle. Book excerpt: Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF‐SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a more time-efficient collection of the input data. This includes the optimal selection of the number of replicate measurements, the selection of input data and guidelines for the selection appropriate data preprocessing methods. Second, strategies for more efficient analysis of MVA results are presented. About the Author: Danica Heller-Krippendorf did her research and dissertation at the University of Siegen, Germany, in collaboration with a German analytical service company. Now she is engineer in analytics at a DAX company.
Book Synopsis Microbeam and Nanobeam Analysis by : Daniele Benoit
Download or read book Microbeam and Nanobeam Analysis written by Daniele Benoit and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.
Book Synopsis Cleaning Technology in Semiconductor Device Manufacturing by :
Download or read book Cleaning Technology in Semiconductor Device Manufacturing written by and published by The Electrochemical Society. This book was released on 2000 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Cells, Proteins and Materials by : Heather Sheardown
Download or read book Cells, Proteins and Materials written by Heather Sheardown and published by BRILL. This book was released on 2003-05-31 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proteins, Cells and Materials contains a collection of articles, which constitute together the complete Festschrift in honor of the 65th birthday of Dr. John L. Brash. For the first time these articles - published previously in several special issues of the Journal of Biomaterials Science Polymer Edition - have been compiled into one comprehensive volume.Over the past 40 years John Brash, a member of the Editorial Board of the Journal of Biomaterials Science Polymer Edition, has distinguished himself in the field of biomaterials. Much of his efforts have focused on detailed studies of blood–surface interactions, particularly those of plasma proteins. His multi-faceted approach recognises the importance of hemodynamics, transport and surface phenomena in the gross effects that result from blood–surface contact. In this book articles on the most recent development in these areas are collected and will thus provide a wealth of information of current research to specialists in the above-mentioned fields.
Book Synopsis Secondary Ion Mass Spectrometry SIMS XI by : G. Gillen
Download or read book Secondary Ion Mass Spectrometry SIMS XI written by G. Gillen and published by Wiley. This book was released on 1998-03-06 with total page 1150 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains 252 contributions presented as plenary,invited and contributed poster and oral presentations at the 11thInternational Conference on Secondary Ion Mass Spectrometry (SIMSXI) held at the Hilton Hotel, Walt Disney World Village, Orlando,Florida, 7 12 September, 1997. The book covers a diverse range ofresearch, reflecting the rapid growth in advanced semiconductorcharacterization, ultra shallow depth profiling, TOF-SIMS and thenew areas in which SIMS techniques are being used, for example inbiological sciences and organic surface characterization. Papersare presented under the following categories: * Isotopic SIMS * Biological SIMS * Semiconductor Characterization Techniques and Applications * Ultra Shallow Depth Profiling * Depth Profiling Fundamental/Modelling and Diffusion * Sputter-Induced Topography * Fundamentals of Molecular Desorption * Organic Materials * Practical TOF-SIMS * Polyatomic Primary Ions * Materials/Surface Analysis * Postionization * Instrumentation * Geological SIMS * Imaging * Fundamentals of Sputtering * Ion Formation and Cluster Formation * Quantitative Analysis Environmental/ParticleCharacterization * Related Techniques These proceedings provide an invaluable source of reference forboth newcomers to the field and experienced SIMS users.
Book Synopsis Secondary Ion Mass Spectrometry by : Paul van der Heide
Download or read book Secondary Ion Mass Spectrometry written by Paul van der Heide and published by John Wiley & Sons. This book was released on 2014-08-19 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: Serves as a practical reference for those involved in Secondary IonMass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields(Chemistry, Physics, Geology and Biology) to it is applied using upto date illustrations • Introduces the accepted fundamentals and pertinentmodels associated with elemental and molecular sputtering and ionemission • Covers the theory and modes of operation of theinstrumentation used in the various forms of SIMS (Static vsDynamic vs Cluster ion SIMS) • Details how data collection/processing can be carriedout, with an emphasis placed on how to recognize and avoid commonlyoccurring analysis induced distortions • Presented as concisely as believed possible with Allsections prepared such that they can be read independently of eachother
Author :Bernd O. Kolbesen (Chemiker.) Publisher :The Electrochemical Society ISBN 13 :9781566772396 Total Pages :568 pages Book Rating :4.7/5 (723 download)
Book Synopsis Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes by : Bernd O. Kolbesen (Chemiker.)
Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes written by Bernd O. Kolbesen (Chemiker.) and published by The Electrochemical Society. This book was released on 1999 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Inorganic Mass Spectrometry by : Sabine Becker
Download or read book Inorganic Mass Spectrometry written by Sabine Becker and published by John Wiley & Sons. This book was released on 2008-02-28 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing an exhaustive review of this topic, Inorganic Mass Spectrometry: Principles and Applications provides details on all aspects of inorganic mass spectrometry, from a historical overview of the topic to the principles and functions of mass separation and ion detection systems. Offering a comprehensive treatment of inorganic mass spectrometry, topics covered include: Recent developments in instrumentation Developing analytical techniques for measurements of trace and ultratrace impurities in different materials This broad textbook in inorganic mass spectrometry, presents the most important mass spectrometric techniques used in all fields of analytical chemistry. By covering recent developments and advances in all fields of inorganic mass spectrometry, this text provides researchers and students with information to answer any questions on this topic as well as providing the basic fundamentals for understanding this potentially complex, but increasingly relevant subject.
Book Synopsis Organic Mass Spectrometry in Art and Archaeology by : Prof Maria Perla Colombini
Download or read book Organic Mass Spectrometry in Art and Archaeology written by Prof Maria Perla Colombini and published by John Wiley & Sons. This book was released on 2009-07-28 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offers an overview of the analysis of art and archaeological materials using techniques based on mass spectrometry Illustrates basic principles, procedures and applications of mass spectrometric techniques. Fills a gap in the field of application on destructive methods in the analysis of museum objects Edited by a world-wide respected specialists with extensive experience of the GC/MS analysis of art objects Such a handbook has been long-awaited by scientists, restorers and other experts in the analysis of art objects
Book Synopsis Developing Integrated TOF-SIMS/MALDI IMS System in Studying Biological Systems by : Ligang Wu
Download or read book Developing Integrated TOF-SIMS/MALDI IMS System in Studying Biological Systems written by Ligang Wu and published by . This book was released on 2009 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Polymer Reference Book by : Thomas Roy Crompton
Download or read book Polymer Reference Book written by Thomas Roy Crompton and published by iSmithers Rapra Publishing. This book was released on 2006 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of this book is to familiarise the reader with all aspects of the techniques used in the examination of polymers, covering chemical, physiochemical and purely physical methods of examination. The types of techniques available to the polymer chemist and technician are described, and their capabilities, limitations and applications are discussed. The book is intended, for all staff who are concerned with instrumentation and methodology in the polymer laboratory including laboratory designers, engineers and chemists, and also those concerned with the implementation of analytical specifications and process control limits.
Book Synopsis Cluster Secondary Ion Mass Spectrometry by : Christine M. Mahoney
Download or read book Cluster Secondary Ion Mass Spectrometry written by Christine M. Mahoney and published by John Wiley & Sons. This book was released on 2013-04-17 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Book Synopsis Mass Spectrometry Handbook by : Mike S. Lee
Download or read book Mass Spectrometry Handbook written by Mike S. Lee and published by John Wiley & Sons. This book was released on 2012-04-16 with total page 1362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.
