Testing and Diagnosis of Analog Circuits and Systems

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Publisher : Springer Science & Business Media
ISBN 13 : 1461597471
Total Pages : 290 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Testing and Diagnosis of Analog Circuits and Systems by : Ruey-wen Liu

Download or read book Testing and Diagnosis of Analog Circuits and Systems written by Ruey-wen Liu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.

Testing and Diagnosis of Analog Circuits and Systems

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Publisher :
ISBN 13 : 9781461597483
Total Pages : 304 pages
Book Rating : 4.5/5 (974 download)

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Book Synopsis Testing and Diagnosis of Analog Circuits and Systems by : 3Island Press

Download or read book Testing and Diagnosis of Analog Circuits and Systems written by 3Island Press and published by . This book was released on 1991-04-30 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fault Diagnosis of Analog Integrated Circuits

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 0387257438
Total Pages : 183 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Fault Diagnosis of Analog Integrated Circuits by : Prithviraj Kabisatpathy

Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits

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Author :
Publisher : IET
ISBN 13 : 0863417450
Total Pages : 411 pages
Book Rating : 4.8/5 (634 download)

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Book Synopsis Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits by : Yichuang Sun

Download or read book Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits written by Yichuang Sun and published by IET. This book was released on 2008-05-30 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

Analog and Mixed-signal Test

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Publisher :
ISBN 13 :
Total Pages : 296 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Analog and Mixed-signal Test by : Bapiraju Vinnakota

Download or read book Analog and Mixed-signal Test written by Bapiraju Vinnakota and published by . This book was released on 1998 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 0387235213
Total Pages : 310 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Test and Design-for-Testability in Mixed-Signal Integrated Circuits by : Jose Luis Huertas Díaz

Download or read book Test and Design-for-Testability in Mixed-Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Electronic Design Automation for IC System Design, Verification, and Testing

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Author :
Publisher : CRC Press
ISBN 13 : 1482254638
Total Pages : 644 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Electronic Design Automation for IC System Design, Verification, and Testing by : Luciano Lavagno

Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

Testing and Diagnosis of VLSI and ULSI

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Publisher : Springer Science & Business Media
ISBN 13 : 9400914172
Total Pages : 531 pages
Book Rating : 4.4/5 (9 download)

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Book Synopsis Testing and Diagnosis of VLSI and ULSI by : F. Lombardi

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Analog and Mixed-Signal Boundary-Scan

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Publisher : Springer Science & Business Media
ISBN 13 : 1475744994
Total Pages : 171 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Analog and Mixed-Signal Boundary-Scan by : Adam Osseiran

Download or read book Analog and Mixed-Signal Boundary-Scan written by Adam Osseiran and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.

Computer-Aided Design of Analog Integrated Circuits and Systems

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 047122782X
Total Pages : 773 pages
Book Rating : 4.4/5 (712 download)

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Book Synopsis Computer-Aided Design of Analog Integrated Circuits and Systems by : Rob A. Rutenbar

Download or read book Computer-Aided Design of Analog Integrated Circuits and Systems written by Rob A. Rutenbar and published by John Wiley & Sons. This book was released on 2002-05-06 with total page 773 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.

DSP-Based Testing of Analog and Mixed-Signal Circuits

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 9780818607851
Total Pages : 272 pages
Book Rating : 4.6/5 (78 download)

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Book Synopsis DSP-Based Testing of Analog and Mixed-Signal Circuits by : Matthew Mahoney

Download or read book DSP-Based Testing of Analog and Mixed-Signal Circuits written by Matthew Mahoney and published by John Wiley & Sons. This book was released on 1987-05-11 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 0792379918
Total Pages : 712 pages
Book Rating : 4.7/5 (923 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2004-12-15 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Research Perspectives and Case Studies in System Test and Diagnosis

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1461555450
Total Pages : 240 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Research Perspectives and Case Studies in System Test and Diagnosis by : John W. Sheppard

Download or read book Research Perspectives and Case Studies in System Test and Diagnosis written by John W. Sheppard and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: "System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is ¿any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge of that science...”. From the Preface

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Analog Circuit Design

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Author :
Publisher : Elsevier
ISBN 13 : 0123851866
Total Pages : 960 pages
Book Rating : 4.1/5 (238 download)

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Book Synopsis Analog Circuit Design by : Bob Dobkin

Download or read book Analog Circuit Design written by Bob Dobkin and published by Elsevier. This book was released on 2011-09-26 with total page 960 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analog circuit and system design today is more essential than ever before. With the growth of digital systems, wireless communications, complex industrial and automotive systems, designers are challenged to develop sophisticated analog solutions. This comprehensive source book of circuit design solutions will aid systems designers with elegant and practical design techniques that focus on common circuit design challenges. The book’s in-depth application examples provide insight into circuit design and application solutions that you can apply in today’s demanding designs. Covers the fundamentals of linear/analog circuit and system design to guide engineers with their design challenges Based on the Application Notes of Linear Technology, the foremost designer of high performance analog products, readers will gain practical insights into design techniques and practice Broad range of topics, including power management tutorials, switching regulator design, linear regulator design, data conversion, signal conditioning, and high frequency/RF design Contributors include the leading lights in analog design, Robert Dobkin, Jim Williams and Carl Nelson, among others

Mixed Signal Built-In Self-Test for Analog Circuits

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Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (464 download)

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Book Synopsis Mixed Signal Built-In Self-Test for Analog Circuits by : Charles E. Stroud

Download or read book Mixed Signal Built-In Self-Test for Analog Circuits written by Charles E. Stroud and published by . This book was released on 1999 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: A Built-In Self-Test architecture was developed for testing analog circuits in mixed-signal systems. The Built-In Self-Test circuitry primarily resides in the digital portion of the mixed-signal system in order to minimize performance impact on the analog circuitry. The test pattern generation portion of the Built-In Self-Test circuitry produces a number of different test waveforms found to be effective in detecting faults in the analog circuitry. The output response analysis function consists of a double-precision accumulator that facilitates determination of the faulty/fault-free status of an analog circuit with acceptable component parameter variations. Ten benchmark circuits were established for the evaluation of analog testing approaches along with acceptable component parameter variations and a standard set of faults and fault models for each benchmark circuit. Finally, an equation was developed for the calculation of analog fault coverage that takes into consideration the probability of potential detection of faults due to component parameter variation. Evaluation of the Built-In Self-Test architecture via analog fault simulation using the benchmark circuits and the fault coverage equation indicates that the approach is effective in detecting catastrophe and parametric faults in a wide variety of analog circuits.

Computer Engineering & Apps

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Author :
Publisher :
ISBN 13 :
Total Pages : 250 pages
Book Rating : 4./5 ( download)

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Book Synopsis Computer Engineering & Apps by :

Download or read book Computer Engineering & Apps written by and published by . This book was released on 2009-07 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: