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Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits
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Book Synopsis Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits by : Yichuang Sun
Download or read book Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits written by Yichuang Sun and published by IET. This book was released on 2008-05-30 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Author :Jose Luis Huertas Díaz Publisher :Springer Science & Business Media ISBN 13 :0387235213 Total Pages :310 pages Book Rating :4.3/5 (872 download)
Book Synopsis Test and Design-for-Testability in Mixed-Signal Integrated Circuits by : Jose Luis Huertas Díaz
Download or read book Test and Design-for-Testability in Mixed-Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Book Synopsis An Introduction to Mixed-signal IC Test and Measurement by : Gordon W. Roberts
Download or read book An Introduction to Mixed-signal IC Test and Measurement written by Gordon W. Roberts and published by . This book was released on 2012 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.
Book Synopsis Analog and Mixed-signal Test by : Bapiraju Vinnakota
Download or read book Analog and Mixed-signal Test written by Bapiraju Vinnakota and published by . This book was released on 1998 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.
Book Synopsis An Introduction to Mixed-signal IC Test and Measurement by : Mark Burns
Download or read book An Introduction to Mixed-signal IC Test and Measurement written by Mark Burns and published by Oxford University Press, USA. This book was released on 2001 with total page 684 pages. Available in PDF, EPUB and Kindle. Book excerpt: Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement.
Book Synopsis Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits by : Gordon W. Roberts
Download or read book Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits written by Gordon W. Roberts and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 125 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
Book Synopsis Mixed-Signal Circuits by : Thomas Noulis
Download or read book Mixed-Signal Circuits written by Thomas Noulis and published by CRC Press. This book was released on 2018-09-03 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mixed-Signal Circuits offers a thoroughly modern treatment of integrated circuit design in the context of mixed-signal applications. Featuring chapters authored by leading experts from industry and academia, this book: Discusses signal integrity and large-scale simulation, verification, and testing Demonstrates advanced design techniques that enable digital circuits and sensitive analog circuits to coexist without any compromise Describes the process technology needed to address the performance challenges associated with developing complex mixed-signal circuits Deals with modeling topics, such as reliability, variability, and crosstalk, that define pre-silicon design methodology and trends, and are the focus of companies involved in wireless applications Develops methods to move analog into the digital domain quickly, minimizing and eliminating common trade-offs between performance, power consumption, simulation time, verification, size, and cost Details approaches for very low-power performances, high-speed interfaces, phase-locked loops (PLLs), voltage-controlled oscillators (VCOs), analog-to-digital converters (ADCs), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self-test (BIST) architectures Mixed-Signal Circuits explores exciting opportunities in wireless communications and beyond. The book is a must for anyone involved in mixed-signal circuit design for future technologies.
Book Synopsis Selected Topics in RF, Analog and Mixed Signal Circuits and Systems by : Kiran Gunnam
Download or read book Selected Topics in RF, Analog and Mixed Signal Circuits and Systems written by Kiran Gunnam and published by CRC Press. This book was released on 2022-09-01 with total page 97 pages. Available in PDF, EPUB and Kindle. Book excerpt: CMOS process technology progress has led to a revolution towards new and innovative integrated circuits and systems. This trend is still moving forward for applications ranging from high-speed wireless and wireline data transfer down to ultra-low-power mobile applications for more interconnected world. The high performance analog and RF circuits and systems are at the heart of all these developments. Selected Topics in RF, Analog and Mixed Signal Circuits and Systems provides an overview and the state of the art developments on several selected topics in RF, analog and mixed signal circuits and system. The topics include ADC conversion and equalization for high-speed links, clock and data recovery for high speed wireline transmission with speeds in several Gb/s, signal generation for terahertz application, oscillator phase noise fundamentals and analog/digital PLL overview. Topics covered in the book include:Overview of Oscillator Phase NoiseClock and Data Recovery in High-Speed Wireline CommunicationPhase Lock Loop Design TechniquesTerahertz and mm-Wave Signal Generation, Synthesis and Amplification: Reaching the Fundamental LimitsEqualization and A/D conversion for high-speed links
Book Synopsis Electronic Design Automation for IC System Design, Verification, and Testing by : Luciano Lavagno
Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Book Synopsis Handbook of Integrated Circuit Industry by : Yangyuan Wang
Download or read book Handbook of Integrated Circuit Industry written by Yangyuan Wang and published by Springer Nature. This book was released on 2023-12-29 with total page 2006 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by hundreds experts who have made contributions to both enterprise and academics research, these excellent reference books provide all necessary knowledge of the whole industrial chain of integrated circuits, and cover topics related to the technology evolution trends, fabrication, applications, new materials, equipment, economy, investment, and industrial developments of integrated circuits. Especially, the coverage is broad in scope and deep enough for all kind of readers being interested in integrated circuit industry. Remarkable data collection, update marketing evaluation, enough working knowledge of integrated circuit fabrication, clear and accessible category of integrated circuit products, and good equipment insight explanation, etc. can make general readers build up a clear overview about the whole integrated circuit industry. This encyclopedia is designed as a reference book for scientists and engineers actively involved in integrated circuit research and development field. In addition, this book provides enough guide lines and knowledges to benefit enterprisers being interested in integrated circuit industry.
Book Synopsis The Fundamentals of Mixed Signal Testing by : Brian Lowe
Download or read book The Fundamentals of Mixed Signal Testing written by Brian Lowe and published by . This book was released on 2002 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Analog and Mixed Signal Test by : Suraj Sindia
Download or read book Analog and Mixed Signal Test written by Suraj Sindia and published by Springer. This book was released on 2015-11-20 with total page 75 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book serves as a “go-to” guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip. The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.
Book Synopsis Foundations of Digital Signal Processing by : Patrick Gaydecki
Download or read book Foundations of Digital Signal Processing written by Patrick Gaydecki and published by IET. This book was released on 2004 with total page 485 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers the basic theoretical, algorithmic and real-time aspects of digital signal processing (DSP). Detailed information is provided on off-line, real-time and DSP programming and the reader is effortlessly guided through advanced topics such as DSP hardware design, FIR and IIR filter design and difference equation manipulation.
Book Synopsis The Switching Function by : C.C. Marouchos
Download or read book The Switching Function written by C.C. Marouchos and published by IET. This book was released on 2006 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This new book demonstrates the usefulness of the switching function in analyzing power electronic circuits in the steady state. A procedure is suggested for the effective application of this method for the analysis of all types of power electronic circuits."--BOOK JACKET.
Book Synopsis Advances in Electronic Testing by : Dimitris Gizopoulos
Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Book Synopsis Wireless Communications Circuits and Systems by : Institution of Electrical Engineers
Download or read book Wireless Communications Circuits and Systems written by Institution of Electrical Engineers and published by IET. This book was released on 2004 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book examines integrated circuits, systems and transceivers for wireless and mobile communications. It covers the most recent developments in key RF, IF, analogue, mixed-signal components and single-chip transceivers in CMOS technology.
Book Synopsis System-on-Chip by : Bashir M. Al-Hashimi
Download or read book System-on-Chip written by Bashir M. Al-Hashimi and published by IET. This book was released on 2006-01-31 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
