System Level Effects Of Soft Errors

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Soft Errors in Modern Electronic Systems

Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
ISBN 13 : 1441969934
Total Pages : 331 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Soft Errors in Modern Electronic Systems by : Michael Nicolaidis

Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Soft Errors

Author : Jean-Luc Autran
Publisher : CRC Press
ISBN 13 : 146659084X
Total Pages : 432 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Soft Errors by : Jean-Luc Autran

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Author : Ronald Donald Schrimpf
Publisher : World Scientific
ISBN 13 : 9812389407
Total Pages : 349 pages
Book Rating : 4.8/5 (123 download)

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Book Synopsis Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by : Ronald Donald Schrimpf

Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Ronald Donald Schrimpf and published by World Scientific. This book was released on 2004 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Dependable Embedded Systems

Author : Jörg Henkel
Publisher : Springer Nature
ISBN 13 : 303052017X
Total Pages : 606 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Dependable Embedded Systems by : Jörg Henkel

Download or read book Dependable Embedded Systems written by Jörg Henkel and published by Springer Nature. This book was released on 2020-12-09 with total page 606 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

Safety and Reliability. Theory and Applications

Author : Marko Cepin
Publisher : CRC Press
ISBN 13 : 1351809733
Total Pages : 3668 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Safety and Reliability. Theory and Applications by : Marko Cepin

Download or read book Safety and Reliability. Theory and Applications written by Marko Cepin and published by CRC Press. This book was released on 2017-06-14 with total page 3668 pages. Available in PDF, EPUB and Kindle. Book excerpt: Safety and Reliability – Theory and Applications contains the contributions presented at the 27th European Safety and Reliability Conference (ESREL 2017, Portorož, Slovenia, June 18-22, 2017). The book covers a wide range of topics, including: • Accident and Incident modelling • Economic Analysis in Risk Management • Foundational Issues in Risk Assessment and Management • Human Factors and Human Reliability • Maintenance Modeling and Applications • Mathematical Methods in Reliability and Safety • Prognostics and System Health Management • Resilience Engineering • Risk Assessment • Risk Management • Simulation for Safety and Reliability Analysis • Structural Reliability • System Reliability, and • Uncertainty Analysis. Selected special sessions include contributions on: the Marie Skłodowska-Curie innovative training network in structural safety; risk approaches in insurance and fi nance sectors; dynamic reliability and probabilistic safety assessment; Bayesian and statistical methods, reliability data and testing; oganizational factors and safety culture; software reliability and safety; probabilistic methods applied to power systems; socio-technical-economic systems; advanced safety assessment methodologies: extended Probabilistic Safety Assessment; reliability; availability; maintainability and safety in railways: theory & practice; big data risk analysis and management, and model-based reliability and safety engineering. Safety and Reliability – Theory and Applications will be of interest to professionals and academics working in a wide range of industrial and governmental sectors including: Aeronautics and Aerospace, Automotive Engineering, Civil Engineering, Electrical and Electronic Engineering, Energy Production and Distribution, Environmental Engineering, Information Technology and Telecommunications, Critical Infrastructures, Insurance and Finance, Manufacturing, Marine Industry, Mechanical Engineering, Natural Hazards, Nuclear Engineering, Offshore Oil and Gas, Security and Protection, Transportation, and Policy Making.

Architecture Design for Soft Errors

Author : Shubu Mukherjee
Publisher : Morgan Kaufmann
ISBN 13 : 0080558321
Total Pages : 361 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Architecture Design for Soft Errors by : Shubu Mukherjee

Download or read book Architecture Design for Soft Errors written by Shubu Mukherjee and published by Morgan Kaufmann. This book was released on 2011-08-29 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. - Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors - Shows readers how to quantify their soft error reliability - Provides state-of-the-art techniques to protect against soft errors

Applied Learning Algorithms for Intelligent IoT

Author : Pethuru Raj Chelliah
Publisher : CRC Press
ISBN 13 : 100046136X
Total Pages : 261 pages
Book Rating : 4.0/5 (4 download)

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Book Synopsis Applied Learning Algorithms for Intelligent IoT by : Pethuru Raj Chelliah

Download or read book Applied Learning Algorithms for Intelligent IoT written by Pethuru Raj Chelliah and published by CRC Press. This book was released on 2021-10-28 with total page 261 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book vividly illustrates all the promising and potential machine learning (ML) and deep learning (DL) algorithms through a host of real-world and real-time business use cases. Machines and devices can be empowered to self-learn and exhibit intelligent behavior. Also, Big Data combined with real-time and runtime data can lead to personalized, prognostic, predictive, and prescriptive insights. This book examines the following topics: Cognitive machines and devices Cyber physical systems (CPS) The Internet of Things (IoT) and industrial use cases Industry 4.0 for smarter manufacturing Predictive and prescriptive insights for smarter systems Machine vision and intelligence Natural interfaces K-means clustering algorithm Support vector machine (SVM) algorithm A priori algorithms Linear and logistic regression Applied Learning Algorithms for Intelligent IoT clearly articulates ML and DL algorithms that can be used to unearth predictive and prescriptive insights out of Big Data. Transforming raw data into information and relevant knowledge is gaining prominence with the availability of data processing and mining, analytics algorithms, platforms, frameworks, and other accelerators discussed in the book. Now, with the emergence of machine learning algorithms, the field of data analytics is bound to reach new heights. This book will serve as a comprehensive guide for AI researchers, faculty members, and IT professionals. Every chapter will discuss one ML algorithm, its origin, challenges, and benefits, as well as a sample industry use case for explaining the algorithm in detail. The book’s detailed and deeper dive into ML and DL algorithms using a practical use case can foster innovative research.

Soft Error Reliability Using Virtual Platforms

Author : Felipe Rocha da Rosa
Publisher : Springer Nature
ISBN 13 : 3030557049
Total Pages : 142 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Soft Error Reliability Using Virtual Platforms by : Felipe Rocha da Rosa

Download or read book Soft Error Reliability Using Virtual Platforms written by Felipe Rocha da Rosa and published by Springer Nature. This book was released on 2020-11-02 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.

Reliability Engineering of BeiDou Navigation Satellite

Author : Hui Yang
Publisher : Springer Nature
ISBN 13 : 9819991307
Total Pages : 464 pages
Book Rating : 4.8/5 (199 download)

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Book Synopsis Reliability Engineering of BeiDou Navigation Satellite by : Hui Yang

Download or read book Reliability Engineering of BeiDou Navigation Satellite written by Hui Yang and published by Springer Nature. This book was released on with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices

Author : Geancarlo Abich
Publisher : Springer Nature
ISBN 13 : 3031185994
Total Pages : 143 pages
Book Rating : 4.0/5 (311 download)

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Book Synopsis Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices by : Geancarlo Abich

Download or read book Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices written by Geancarlo Abich and published by Springer Nature. This book was released on 2023-01-01 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes an extensive and consistent soft error assessment of convolutional neural network (CNN) models from different domains through more than 14.8 million fault injections, considering different precision bit-width configurations, optimization parameters, and processor models. The authors also evaluate the relative performance, memory utilization, and soft error reliability trade-offs analysis of different CNN models considering a compiler-based technique w.r.t. traditional redundancy approaches.

Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits

Author : Hsiao-Heng Kelin Lee
Publisher : Stanford University
ISBN 13 :
Total Pages : 156 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits by : Hsiao-Heng Kelin Lee

Download or read book Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits written by Hsiao-Heng Kelin Lee and published by Stanford University. This book was released on 2011 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt: Radiation-induced soft errors are a major concern for modern digital circuits, especially memory elements. Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. latches and flip-flops, is challenging. Traditional techniques for designing soft-error-resilient sequential elements generally address single node errors, or Single Event Upsets (SEUs). However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing a new soft error resilience layout design principle called LEAP, or Layout Design through Error-Aware Transistor Positioning. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. We compare the soft error performance of SEU-immune flip-flops with the LEAP-DICE flip-flop using a test chip in 180nm CMOS under 200-MeV proton radiation and conclude that 1) our LEAP-DICE flip-flop encounters on average 2,000X and 5X fewer errors compared to a conventional D flip-flop and our reference DICE flip-flop, respectively; 2) our LEAP-DICE flip-flop has the best soft error performance among all existing SEU-immune flip-flops; 3) In the evaluation of our design framework, we also discovered new soft error effects related to operating conditions such as voltage scaling, clock frequency setting and radiation dose.

VLSI-SoC: Research Trends in VLSI and Systems on Chip

Author : Giovanni De Micheli
Publisher : Springer
ISBN 13 : 0387749098
Total Pages : 397 pages
Book Rating : 4.3/5 (877 download)

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Book Synopsis VLSI-SoC: Research Trends in VLSI and Systems on Chip by : Giovanni De Micheli

Download or read book VLSI-SoC: Research Trends in VLSI and Systems on Chip written by Giovanni De Micheli and published by Springer. This book was released on 2010-08-23 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration. This conference provides a forum to exchange ideas and show industrial and academic research results in microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels.

Soft Error Mechanisms, Modeling and Mitigation

Author : Selahattin Sayil
Publisher : Springer
ISBN 13 : 3319306073
Total Pages : 112 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Soft Error Mechanisms, Modeling and Mitigation by : Selahattin Sayil

Download or read book Soft Error Mechanisms, Modeling and Mitigation written by Selahattin Sayil and published by Springer. This book was released on 2016-02-25 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

Long-Term Reliability of Nanometer VLSI Systems

Author : Sheldon Tan
Publisher : Springer Nature
ISBN 13 : 3030261727
Total Pages : 487 pages
Book Rating : 4.0/5 (32 download)

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Book Synopsis Long-Term Reliability of Nanometer VLSI Systems by : Sheldon Tan

Download or read book Long-Term Reliability of Nanometer VLSI Systems written by Sheldon Tan and published by Springer Nature. This book was released on 2019-09-12 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.

Near Threshold Computing

Author : Michael Hübner
Publisher : Springer
ISBN 13 : 3319233890
Total Pages : 105 pages
Book Rating : 4.3/5 (192 download)

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Book Synopsis Near Threshold Computing by : Michael Hübner

Download or read book Near Threshold Computing written by Michael Hübner and published by Springer. This book was released on 2015-11-14 with total page 105 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explores near-threshold computing (NTC), a design-space using techniques to run digital chips (processors) near the lowest possible voltage. Readers will be enabled with specific techniques to design chips that are extremely robust; tolerating variability and resilient against errors. Variability-aware voltage and frequency allocation schemes will be presented that will provide performance guarantees, when moving toward near-threshold manycore chips. · Provides an introduction to near-threshold computing, enabling reader with a variety of tools to face the challenges of the power/utilization wall; · Demonstrates how to design efficient voltage regulation, so that each region of the chip can operate at the most efficient voltage and frequency point; · Investigates how performance guarantees can be ensured when moving towards NTC manycores through variability-aware voltage and frequency allocation schemes.

Wireless and Satellite Systems

Author : Qihui Wu
Publisher : Springer Nature
ISBN 13 : 3030690695
Total Pages : 516 pages
Book Rating : 4.0/5 (36 download)

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Book Synopsis Wireless and Satellite Systems by : Qihui Wu

Download or read book Wireless and Satellite Systems written by Qihui Wu and published by Springer Nature. This book was released on 2021-02-27 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: This two-volume set LNICST 357-358 constitutes the post-conference proceedings of the 11th EAI International Conference on Wireless and Satellite Services, WiSATS 2020, held in Nanjing, China, in September 2020. The 91 full papers and workshop papers were carefully reviewed and selected from 200 submissions. Part I - LNICST 357 - details original research and results of wireless and satellite technology for a smarter global communication architecture. The theme of WISATS 2020 is “Intelligent Wireless and Satellite Communications for Beyond 5G”. Part II – LNICST 358 - presents 6 workshop papers: High Speed Space Communication and Space Information Networks (HSSCSIN); Integrated Space and Onboard Networks (ISON); Intelligent Satellite Operations, Managements, and Applications (ISOMA); Intelligent Satellites in Future Space Networked System (ISFSNS); Satellite Communications, Networking and Applications (SCNA); Satellite Internet of Things; Trusted Data Sharing, Secure Communication (SIOTTDSSC).

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Author : Eishi H. Ibe
Publisher : John Wiley & Sons
ISBN 13 : 1118479297
Total Pages : 292 pages
Book Rating : 4.1/5 (184 download)

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Book Synopsis Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by : Eishi H. Ibe

Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2015-03-02 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.