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Author : VLSI Test Symposium
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (247 download)
Download or read book Special Issue on 16th IEEE VLSI Test Symposium (VTS 98) written by VLSI Test Symposium and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michael Nicolaidis
Publisher :
ISBN 13 :
Total Pages : 205 pages
Book Rating : 4.:/5 (247 download)
Download or read book Special Issue on the 16th IEEE VLSI Test Symposium (VTS 98) written by Michael Nicolaidis and published by . This book was released on 1999 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 205 pages
Book Rating : 4.:/5 (454 download)
Download or read book Special Issue on the 16th IEEE VLSI Test Symposium (VTS 98) written by and published by . This book was released on 1999 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : IEEE, Society Staff
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (131 download)
Download or read book VLSI Test Symposium (VTS, `98), 16th IEEE. written by IEEE, Society Staff and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : VLSI Test Symposium
Publisher : I E E E
ISBN 13 : 9780818684364
Total Pages : 472 pages
Book Rating : 4.6/5 (843 download)
Download or read book Proceedings written by VLSI Test Symposium and published by I E E E. This book was released on 1998 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.
Author :
Publisher :
ISBN 13 : 9780818684364
Total Pages : 520 pages
Book Rating : 4.6/5 (843 download)
Download or read book 16th IEEE VLSI Test Symposium written by and published by . This book was released on 1998 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Les Coustumes générales de toute la conté d'Artois written by and published by . This book was released on 1726 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 498 pages
Book Rating : 4.3/5 (91 download)
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Symposium on VLSI Circuits
Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.:/5 (633 download)
Download or read book Special Issue on the ... VLSI Circuits Symposium written by Symposium on VLSI Circuits and published by . This book was released on 1999 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 802 pages
Book Rating : 4.:/5 (318 download)
Download or read book Proceedings of the 2000 Congress on Evolutionary Computation written by and published by . This book was released on 2000 with total page 802 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Julian Miller
Publisher : Springer Science & Business Media
ISBN 13 : 3540673385
Total Pages : 296 pages
Book Rating : 4.5/5 (46 download)
Download or read book Evolvable Systems: From Biology to Hardware written by Julian Miller and published by Springer Science & Business Media. This book was released on 2000-03-29 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware, ICES 2000, held in Edinburgh, Scotland, UK, in April 2000. The 27 revised full papers presented were carefully reviewed and selected for inclusion in the proceedings. Among the topics covered are evaluation of digital systems, evolution of analog systems, embryonic electronics, bio-inspired systems, artificial neural networks, adaptive robotics, adaptive hardware platforms, molecular computing, reconfigurable systems, immune systems, and self-repair.
Author : Julian F. Miller
Publisher : Springer
ISBN 13 : 3540464069
Total Pages : 296 pages
Book Rating : 4.5/5 (44 download)
Download or read book Evolvable Systems: From Biology to Hardware written by Julian F. Miller and published by Springer. This book was released on 2003-06-29 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware, ICES 2000, held in Edinburgh, Scotland, UK, in April 2000. The 27 revised full papers presented were carefully reviewed and selected for inclusion in the proceedings. Among the topics covered are evaluation of digital systems, evolution of analog systems, embryonic electronics, bio-inspired systems, artificial neural networks, adaptive robotics, adaptive hardware platforms, molecular computing, reconfigurable systems, immune systems, and self-repair.
Author : British Library. Document Supply Centre
Publisher :
ISBN 13 :
Total Pages : 890 pages
Book Rating : 4.3/5 (91 download)
Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 1998 with total page 890 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 550 pages
Book Rating : 4.3/5 (91 download)
Download or read book Asian Test Symposium written by and published by . This book was released on 2003 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Robert Aitken
Publisher :
ISBN 13 : 9780769522418
Total Pages : 524 pages
Book Rating : 4.5/5 (224 download)
Download or read book Defect and Fault Tolerance in VLSI Systems written by Robert Aitken and published by . This book was released on 2004 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Author : Mohammad Tehranipoor
Publisher : Springer Science & Business Media
ISBN 13 : 1441980806
Total Pages : 429 pages
Book Rating : 4.4/5 (419 download)
Download or read book Introduction to Hardware Security and Trust written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2011-09-22 with total page 429 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the foundations for understanding hardware security and trust, which have become major concerns for national security over the past decade. Coverage includes security and trust issues in all types of electronic devices and systems such as ASICs, COTS, FPGAs, microprocessors/DSPs, and embedded systems. This serves as an invaluable reference to the state-of-the-art research that is of critical significance to the security of, and trust in, modern society’s microelectronic-supported infrastructures.
Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
ISBN 13 : 1475760698
Total Pages : 152 pages
Book Rating : 4.4/5 (757 download)
Download or read book On-Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
