Single Electron Transfer Measurements Through Low Temperature Atomic Force Microscopy

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (135 download)

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Book Synopsis Single Electron Transfer Measurements Through Low Temperature Atomic Force Microscopy by : Logan Fairgrieve-Park

Download or read book Single Electron Transfer Measurements Through Low Temperature Atomic Force Microscopy written by Logan Fairgrieve-Park and published by . This book was released on 2022 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Understanding the nature of electron transfer (ET) in quantum dots and single molecules can provide insight into both fundamental physical processes and the development of novel electronic and chemical systems. Traditional ET measurement techniques are not ideal as they either require a fixed probe or can only take an average measurement over a large area, obscuring the variety among individual structures. Single-electron electrostatic force microscopy (e-EFM) is an atomic force microscopy (AFM) technique that utilizes a movable, nanoscale probe to both induce charge transfer and measure transport properties. In this thesis, I provide an overview of the relevant of AFM theory and electron transport theory, including Coloumb and Franck-Condon blockade. I discuss the low temperature atomic force microscope (LT-AFM) used to quantify electron tunneling processes and outline measurements related to the noise and sensitivity of the system. Topographical AFM and e-EFM measurements of two different samples are presented: one consisting of self assembled quantum dots and the other a mixed ferrocene capped alkanethiol self assembled monolayer. This work has better defined the capabilities and performance of the LT-AFM and provides a framework for future measurements on ET pathways in single metalloenyzmes"--

Single-electron Charging Using Atomic Force Microscopy

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (979 download)

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Book Synopsis Single-electron Charging Using Atomic Force Microscopy by : Antoine Roy-Gobeil

Download or read book Single-electron Charging Using Atomic Force Microscopy written by Antoine Roy-Gobeil and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "The ability of nanostructures to confine electrons at discrete energy levels makes them a promising platform for novel applications in chemistry, optics and information processing. However, these new exciting possibilities come with huge challenges associated with accessing and characterizing objects at the nanometer scale. The general objective of this thesis is to extend the use of atomic force microscopy (AFM), a technique known for resolving the force of individual atoms on a surface, to investigate single-electron charging of various nanostructures. My specific goal was to develop a technique to measure the electronics properties of nanostructure through tunnelling rate measurements, starting with (i) large metallic grains, where the charge becomes discrete although the electron energy level spacing is negligible, to (ii) quantum dots (QDs), where the reduced dimensionality leads to clear energy level spacing, and finally to (iii) organometallic molecules, where the system reorganizes to a different configuration upon the addition of an electron. In the first chapters, I review the theoretical background of single-electron charging of a quantum dot electrostatically coupled with a mechanical oscillator and provide an efficient algorithm to calculate the response of the coupled electro-mechanical system using linear response theory. I then show that such system can be realized experimentally by using a low-temperature AFM operating at a temperature of 4K. A simple design using a single-fiber to both excite a cantilever beam and detect its motion by interferometry is proposed. I also show that a calibration of the transfer function of the excitation system is necessary in order to accurately measure forces from measured spectra. Moreover, I demonstrate that nanostructures need to be embedded in a single tunnel junction to adequately examine them with AFM. The description of a low cost, wet lab approach developed to electrically insulate gold nanoparticles from a gold back-electrode by chemisorbing them on a self-assembled monolayer of alkanethiols is also included in this thesis. One of the key contributions of the present work resides in chapter 5. In this chapter, theoretical and experimental studies of the effect of the density of states of a QD on the rate of single-electron tunneling that can be directly measured by electrostatic force microscopy (e-EFM) experiments are then exposed. In e-EFM, the motion of a biased atomic force microscope cantilever tip modulates the charge state of a QD in the Coulomb blockade regime. The charge dynamics of the dot, which is detected through its back-action on the capacitively coupled cantilever, depends on the tunneling rate of the QD to a back-electrode. The density of states of the QD can therefore be measured through its effect on the energy dependence of tunneling rate. Experimental data on individual 5 nm colloidal gold nanoparticles that exhibit a near continuous density of state at 77~K are presented. In contrast, analysis of already published data on self-assembled InAs QDs at 4~K clearly reveals discrete degenerate energy levels.In the last chapter of this thesis, I exhibit early results showing for the first time that the reorganization energy of nanostructures upon charging can be measured through its unique effect on the response of the AFM at different oscillation amplitudes of the cantilever. First experimental accounts of that effect are provided by performing single-electron charging of ferrocene (Fe(C5H)2) molecules." --

Noncontact Atomic Force Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 9783540431176
Total Pages : 468 pages
Book Rating : 4.4/5 (311 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : S. Morita

Download or read book Noncontact Atomic Force Microscopy written by S. Morita and published by Springer Science & Business Media. This book was released on 2002-07-24 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Low Temperature Force Microscopy on a Deeply Embedded Two Dimensional Electron Gas

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (713 download)

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Book Synopsis Low Temperature Force Microscopy on a Deeply Embedded Two Dimensional Electron Gas by : James Augustin Hedberg

Download or read book Low Temperature Force Microscopy on a Deeply Embedded Two Dimensional Electron Gas written by James Augustin Hedberg and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Low Temperature Atomic Force Microscopy

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ISBN 13 : 9781303800863
Total Pages : 88 pages
Book Rating : 4.8/5 (8 download)

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Book Synopsis Low Temperature Atomic Force Microscopy by : Christopher Gregory Dunckle

Download or read book Low Temperature Atomic Force Microscopy written by Christopher Gregory Dunckle and published by . This book was released on 2014 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work encompasses the development of a Low Temperature Atomic Force Microscope capable of reaching 1.6 Kelvin in a sealed cell. The purpose of such a design is to measure piconewton forces associated with quantum phase transitions and general interatomic forces as a function of temperature. This thesis culminates with a measurement of the Electrostatic Casimir Force whereboth boundaries have gone through the superconducting phase transition. Chapter 1 discusses the fundamentals of Atomic Force Microscopy (AFM) including a brief overview of the technology, its implementation and use. A look a the different techniques used to detect cantilever detection, focusing on their advantages and disadvantages in the context of our experimental objectives, follows. The chapter is concludes with a look at the different operational modes along with the necessary electronics and software. Chapter 2 focuses on the cryostat housing the AFM. A diagram of the the cryostat illustrates its construction around a pulse-tube cryocooler that is capable of reaching 4 Kelvin. The addition of a custom4 He evaporation refrigerator to the main cryostat is presented with performance specifications.The refrigerator expands the functional range of the cryostat down to 1.6 K. Chapter 3 looks at the impact of a low temperature environment on an AFM and goes into detail regarding vibration isolation. We review cantilever heating from incident laser light from the displacement detector, and the impact of the thermal gradients in non-isothermal AFM designs from previous work. Such an analysis is crucial given our interest in thermally driven phase behavior and the associated thermal sensitivity of our experiments. We will also look at how AFM cantilevers respond when cooled with respect to thermally-driven resonant frequency, quality factor, and power spectrum density (PSD) for purposes of measuring the spring constant. Vibrational noise can easy become the limiting factor with respect to force sensitivity in normal AFM setups. Vibrations are of particular concern in our setup given the additional contribution of mechanical noise from the pulse-tube cooler. In the last section of this chapter the vibrational noise is quantified and the techniques implemented to overcome it are described. The analysis from Chapter 1 led us to the fabrication of a custom low-noise, fiber optic interferometer compatible with a cryogenic environment. Chapter 4 reviews the experimental specifics of this AFM. The technical and experimental theory behind measurements of the electrostatic Casimir Force provides the necessary background to understand subsequent data measurements of the force at room temperature and below the superconducting transition for two Niobium boundaries. Chapter 5 reviews and contextualizes the contributions of this thesis. The broad summary of the results contained in this thesis are accompanied with a focus on future experiments, suggestions for design improvements, and other information to assist future investigations.

Publications of the National Institute of Standards and Technology ... Catalog

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Publisher :
ISBN 13 :
Total Pages : 1162 pages
Book Rating : 4.3/5 (243 download)

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Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)

Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1994 with total page 1162 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Atomic and Molecular Manipulation

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Publisher : Elsevier
ISBN 13 : 0080963552
Total Pages : 168 pages
Book Rating : 4.0/5 (89 download)

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Book Synopsis Atomic and Molecular Manipulation by : Andrew J. Mayne

Download or read book Atomic and Molecular Manipulation written by Andrew J. Mayne and published by Elsevier. This book was released on 2011-09-02 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: Work with individual atoms and molecules aims to demonstrate that miniaturized electronic, optical, magnetic, and mechanical devices can operate ultimately even at the level of a single atom or molecule. As such, atomic and molecular manipulation has played an emblematic role in the development of the field of nanoscience. New methods based on the use of the scanning tunnelling microscope (STM) have been developed to characterize and manipulate all the degrees of freedom of individual atoms and molecules with an unprecedented precision. In the meantime, new concepts have emerged to design molecules and substrates having specific optical, mechanical and electronic functions, thus opening the way to the fabrication of real nano-machines. Manipulation of individual atoms and molecules has also opened up completely new areas of research and knowledge, raising fundamental questions of "Optics at the atomic scale", "Mechanics at the atomic scale", Electronics at the atomic scale", "Quantum physics at the atomic scale", and "Chemistry at the atomic scale". This book aims to illustrate the main aspects of this ongoing scientific adventure and to anticipate the major challenges for the future in "Atomic and molecular manipulation" from fundamental knowledge to the fabrication of atomic-scale devices. Provides a broad overview of the field to aid those new and entering into this research area Presents a review of the historical development and evolution of the field Offers a clear personalized view of current scanning probe microscopy research from world experts

Noncontact Atomic Force Microscopy

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Publisher : Springer
ISBN 13 : 3319155881
Total Pages : 539 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : Seizo Morita

Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by Springer. This book was released on 2015-05-18 with total page 539 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Oxford Handbook of Nanoscience and Technology

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Publisher : Oxford University Press, USA
ISBN 13 : 0199533067
Total Pages : 931 pages
Book Rating : 4.1/5 (995 download)

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Book Synopsis Oxford Handbook of Nanoscience and Technology by : A.V. Narlikar

Download or read book Oxford Handbook of Nanoscience and Technology written by A.V. Narlikar and published by Oxford University Press, USA. This book was released on 2010-02-11 with total page 931 pages. Available in PDF, EPUB and Kindle. Book excerpt: These three volumes are intended to shape the field of nanoscience and technology and will serve as anessential point of reference for cutting-edge research in the field.

Physics of Semiconductor Devices

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Publisher : Springer Science & Business Media
ISBN 13 : 3319030027
Total Pages : 841 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Physics of Semiconductor Devices by : V. K. Jain

Download or read book Physics of Semiconductor Devices written by V. K. Jain and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 841 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this workshop is to spread the vast amount of information available on semiconductor physics to every possible field throughout the scientific community. As a result, the latest findings, research and discoveries can be quickly disseminated. This workshop provides all participating research groups with an excellent platform for interaction and collaboration with other members of their respective scientific community. This workshop’s technical sessions include various current and significant topics for applications and scientific developments, including • Optoelectronics • VLSI & ULSI Technology • Photovoltaics • MEMS & Sensors • Device Modeling and Simulation • High Frequency/ Power Devices • Nanotechnology and Emerging Areas • Organic Electronics • Displays and Lighting Many eminent scientists from various national and international organizations are actively participating with their latest research works and also equally supporting this mega event by joining the various organizing committees.

Noncontact Atomic Force Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 3642560199
Total Pages : 448 pages
Book Rating : 4.6/5 (425 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : S. Morita

Download or read book Noncontact Atomic Force Microscopy written by S. Morita and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Dissertation Abstracts International

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ISBN 13 :
Total Pages : 902 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Dissertation Abstracts International by :

Download or read book Dissertation Abstracts International written by and published by . This book was released on 2008 with total page 902 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Molecular Design and Applications of Photofunctional Polymers and Materials

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Publisher : Royal Society of Chemistry
ISBN 13 : 184973576X
Total Pages : 511 pages
Book Rating : 4.8/5 (497 download)

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Book Synopsis Molecular Design and Applications of Photofunctional Polymers and Materials by : Wai-Yeung Wong

Download or read book Molecular Design and Applications of Photofunctional Polymers and Materials written by Wai-Yeung Wong and published by Royal Society of Chemistry. This book was released on 2012-09-30 with total page 511 pages. Available in PDF, EPUB and Kindle. Book excerpt: Functional organic and organometallic polymers and materials have gained much attention as versatile materials for energy interconversions and optoelectronic/photonic applications, including electrical energy generation in photovoltaic cells and light generation in organic light-emitting diodes, as they offer a low cost, light weight and simple option for device fabrication. Molecular Design and Applications of Photofunctional Polymers and Materials, presents a critical perspective of the current field, with emphasis on fundamental concepts and current applications in optoelectronics, electronics and nanotechnology. The book also covers photochemically degradable polymers, electrochromic and photochromic materials, biosensing and bioimaging materials, and low- and high-refractive index materials. With contributions from leading experts in the field, this timely book will provide a valuable contribution to the community enabling new synthetic methods to be developed to produce new materials with specific functional roles.

Conductive Atomic Force Microscopy

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Publisher : John Wiley & Sons
ISBN 13 : 3527699791
Total Pages : 497 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Conductive Atomic Force Microscopy by : Mario Lanza

Download or read book Conductive Atomic Force Microscopy written by Mario Lanza and published by John Wiley & Sons. This book was released on 2017-08-03 with total page 497 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

Cold Chemistry

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Publisher : Royal Society of Chemistry
ISBN 13 : 1788013557
Total Pages : 692 pages
Book Rating : 4.7/5 (88 download)

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Book Synopsis Cold Chemistry by : Olivier Dulieu

Download or read book Cold Chemistry written by Olivier Dulieu and published by Royal Society of Chemistry. This book was released on 2017-12-06 with total page 692 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent years have seen tremendous progress in research on cold and controlled molecular collisions, both in theory and in experiment. The advent of techniques to prepare cold and ultracold molecules and ions, to store them in optical lattices or in charged quasicristalline structures, and to use them in crossed or merged beam experiments have opened many new possibilities to study the most fundamental aspects of molecular interactions. At the same time, theoretical work has made progress in tackling these problems and accurately describing quantum effects in complex systems, and in proposing viable options to control chemical reactions at ultralow energies. Through tutorials on both the theoretical and experimental aspects of research in cold and ultracold molecular collisions, this book provides advanced undergraduate students, graduate students and researchers with the foundations needed to understand this exciting field.

Electrical Atomic Force Microscopy for Nanoelectronics

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Publisher : Springer
ISBN 13 : 3030156125
Total Pages : 408 pages
Book Rating : 4.0/5 (31 download)

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Book Synopsis Electrical Atomic Force Microscopy for Nanoelectronics by : Umberto Celano

Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Atomic Force Microscopy

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Publisher : BoD – Books on Demand
ISBN 13 : 9535104144
Total Pages : 272 pages
Book Rating : 4.5/5 (351 download)

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Book Synopsis Atomic Force Microscopy by : Victor Bellitto

Download or read book Atomic Force Microscopy written by Victor Bellitto and published by BoD – Books on Demand. This book was released on 2012-03-23 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.