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Semiconductor Measurements And Instrumentation
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Book Synopsis Semiconductor Measurements and Instrumentation by : W. R. Runyan
Download or read book Semiconductor Measurements and Instrumentation written by W. R. Runyan and published by McGraw Hill Professional. This book was released on 1998 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: A reference on semiconductor characterization tools, this volume offers explanations of the advanced and traditional techniques for evaluating different criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type.
Book Synopsis Semiconductor Measurements and Instrumentation by : W. R. Runyan
Download or read book Semiconductor Measurements and Instrumentation written by W. R. Runyan and published by McGraw-Hill Companies. This book was released on 1975 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystal orientation. Crystallographic defects and their observation. Resistivity and carrier-concentration measurements. Lifetime. Mobility, hall, and type measurements. Thickness measurements. Preparation of samples for microscopic examination. Microscopy and photography. The electron microscope and other analytical instruments.
Book Synopsis Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization by : Richard Haight
Download or read book Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization written by Richard Haight and published by World Scientific. This book was released on 2012 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
Book Synopsis Semiconductor Measurement Technology by : United States. National Bureau of Standards
Download or read book Semiconductor Measurement Technology written by United States. National Bureau of Standards and published by . This book was released on 1982 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Measurement and Instrumentation by : Alan S. Morris
Download or read book Measurement and Instrumentation written by Alan S. Morris and published by Academic Press. This book was released on 2015-08-13 with total page 727 pages. Available in PDF, EPUB and Kindle. Book excerpt: Measurement and Instrumentation: Theory and Application, Second Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. This updated edition provides new coverage of the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces, also featuring chapters on data acquisition and signal processing with LabVIEW from Dr. Reza Langari. Written clearly and comprehensively, this text provides students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application. Provides early coverage of measurement system design to facilitate a better framework for understanding the importance of studying measurement and instrumentation Covers the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces Includes significant material on data acquisition and signal processing with LabVIEW Extensive coverage of measurement uncertainty aids students’ ability to determine the accuracy of instruments and measurement systems
Book Synopsis Semiconductor Measurement Technology by : National Institute of Standards and Technology (U.S.)
Download or read book Semiconductor Measurement Technology written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1990 with total page 140 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Book Synopsis Methods of Measurement for Semiconductor Materials, Process Control, and Devices; Quarterly Report by : United States. National Bureau of Standards
Download or read book Methods of Measurement for Semiconductor Materials, Process Control, and Devices; Quarterly Report written by United States. National Bureau of Standards and published by . This book was released on 1969 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Meteorological Measurements and Instrumentation by : Giles Harrison
Download or read book Meteorological Measurements and Instrumentation written by Giles Harrison and published by John Wiley & Sons. This book was released on 2015-01-20 with total page 291 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the fundamental scientific principles underlying high quality instrumentation used for environmental measurements. It discusses a wide range of in situ sensors employed in practical environmental monitoring and, in particular, those used in surface based measurement systems. It also considers the use of weather balloons to provide a wealth of upper atmosphere data. To illustrate the technologies in use it includes many examples of real atmospheric measurements in typical and unusual circumstances, with a discussion of the electronic signal conditioning, data acquisition considerations and data processing principles necessary for reliable measurements. This also allows the long history of atmospheric measurements to be placed in the context of the requirements of modern climate science, by building the physical science appreciation of the instrumental record and looking forward to new and emerging sensor and recording technologies.
Book Synopsis Methods of Measurement for Semiconductor Materials, Process Control, and Devices by : W. Murray Bullis
Download or read book Methods of Measurement for Semiconductor Materials, Process Control, and Devices written by W. Murray Bullis and published by . This book was released on 1969 with total page 44 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Introduction to Instrumentation and Measurements by : Robert B. Northrop
Download or read book Introduction to Instrumentation and Measurements written by Robert B. Northrop and published by CRC Press. This book was released on 2018-09-03 with total page 952 pages. Available in PDF, EPUB and Kindle. Book excerpt: Weighing in on the growth of innovative technologies, the adoption of new standards, and the lack of educational development as it relates to current and emerging applications, the third edition of Introduction to Instrumentation and Measurements uses the authors’ 40 years of teaching experience to expound on the theory, science, and art of modern instrumentation and measurements (I&M). What’s New in This Edition: This edition includes material on modern integrated circuit (IC) and photonic sensors, micro-electro-mechanical (MEM) and nano-electro-mechanical (NEM) sensors, chemical and radiation sensors, signal conditioning, noise, data interfaces, and basic digital signal processing (DSP), and upgrades every chapter with the latest advancements. It contains new material on the designs of micro-electro-mechanical (MEMS) sensors, adds two new chapters on wireless instrumentation and microsensors, and incorporates extensive biomedical examples and problems. Containing 13 chapters, this third edition: Describes sensor dynamics, signal conditioning, and data display and storage Focuses on means of conditioning the analog outputs of various sensors Considers noise and coherent interference in measurements in depth Covers the traditional topics of DC null methods of measurement and AC null measurements Examines Wheatstone and Kelvin bridges and potentiometers Explores the major AC bridges used to measure inductance, Q, capacitance, and D Presents a survey of sensor mechanisms Includes a description and analysis of sensors based on the giant magnetoresistive effect (GMR) and the anisotropic magnetoresistive (AMR) effect Provides a detailed analysis of mechanical gyroscopes, clinometers, and accelerometers Contains the classic means of measuring electrical quantities Examines digital interfaces in measurement systems Defines digital signal conditioning in instrumentation Addresses solid-state chemical microsensors and wireless instrumentation Introduces mechanical microsensors (MEMS and NEMS) Details examples of the design of measurement systems Introduction to Instrumentation and Measurements is written with practicing engineers and scientists in mind, and is intended to be used in a classroom course or as a reference. It is assumed that the reader has taken core EE curriculum courses or their equivalents.
Book Synopsis Methods of Measurement for Semiconductor Materials, Process Control, and Devices by : W. Murray Bullis
Download or read book Methods of Measurement for Semiconductor Materials, Process Control, and Devices written by W. Murray Bullis and published by . This book was released on 1969 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Basic Electronic Instrument Handbook by : Clyde F. Coombs
Download or read book Basic Electronic Instrument Handbook written by Clyde F. Coombs and published by McGraw-Hill Companies. This book was released on 1972 with total page 874 pages. Available in PDF, EPUB and Kindle. Book excerpt: Introduction to instrumentation. Fundamentals of electronic-measurement instruments. Fundamentals of signal-generation instruments. Using electronic instruments. Instrumentation systems. Current- and voltage-measurement devices. Circuit-element measuring instruments. Signal-generation instruments. Frequency- and time-measurement instruments. Recording instruments. Special-function instruments. Microwave passive devices.
Book Synopsis The Electrical Characterization of Semiconductors by : John Wilfred Orton
Download or read book The Electrical Characterization of Semiconductors written by John Wilfred Orton and published by . This book was released on 1990 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials. By concentrating on the physical principles of each technique and enumerating its inherent limitations the authors have produced a text that will be helpful in solving a variety of problems in semiconductor characterization and one that will not be quickly outdated by developments in the materials themselves. Emphasizes the physics and theory underlying the experimental characterization of semicondutors**Deals with the measurement of minority lifetimes and diffusion length**Discusses electrical and optical methods***INCLUDED IN PHYSICS TODAY, SEPT 90***INCLUDED IN MRS BULLETIN, NOVEMBER 90***INCLUDED IN JRNL OF VACUUM SCI, DECEMBER 90***INCLUDED IN PHYSICS TODAY, FEBRUARY 91
Book Synopsis An Instrument for the Measurement of Semiconductor Properties by : Francis R. Yester
Download or read book An Instrument for the Measurement of Semiconductor Properties written by Francis R. Yester and published by . This book was released on 1968 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Methods of Measurement for Semiconductor Materials, Process Control, and Devices by : W. Murray Bullis
Download or read book Methods of Measurement for Semiconductor Materials, Process Control, and Devices written by W. Murray Bullis and published by . This book was released on 1970 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Semiconductor Measurement Technology by : Institute for Applied Technology (U.S.). Electronic Technology Division
Download or read book Semiconductor Measurement Technology written by Institute for Applied Technology (U.S.). Electronic Technology Division and published by . This book was released on 1974 with total page 70 pages. Available in PDF, EPUB and Kindle. Book excerpt:
