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Author : Alfred Benninghoven
Publisher :
ISBN 13 :
Total Pages : 963 pages
Book Rating : 4.:/5 (658 download)
Download or read book Secondary Ion Mass Spectrometry written by Alfred Benninghoven and published by . This book was released on 1990 with total page 963 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher : Wiley
ISBN 13 : 9780471927389
Total Pages : 1002 pages
Book Rating : 4.9/5 (273 download)
Download or read book Secondary Ion Mass Spectrometry: SIMS VII written by A. Benninghoven and published by Wiley. This book was released on 1990-06-28 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: Based on the proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, held in Monterey, California, September 3-8, 1989. Covers fundamental, complementary and enhancement techniques, comparative SIMS, geology, biology, polymers, metallurgy, profiling and semiconductors. Describes a valuable methodology (SIMS) for characterizing solid surfaces and presents numerous analytical applications.
Author : A. Benninghoven
Publisher : Wiley
ISBN 13 : 9780471927389
Total Pages : 992 pages
Book Rating : 4.9/5 (273 download)
Download or read book Secondary Ion Mass Spectrometry: SIMS VII written by A. Benninghoven and published by Wiley. This book was released on 1990-06-28 with total page 992 pages. Available in PDF, EPUB and Kindle. Book excerpt: Based on the proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, held in Monterey, California, September 3-8, 1989. Covers fundamental, complementary and enhancement techniques, comparative SIMS, geology, biology, polymers, metallurgy, profiling and semiconductors. Describes a valuable methodology (SIMS) for characterizing solid surfaces and presents numerous analytical applications.
Author : Paul van der Heide
Publisher : John Wiley & Sons
ISBN 13 : 1118916778
Total Pages : 412 pages
Book Rating : 4.1/5 (189 download)
Download or read book Secondary Ion Mass Spectrometry written by Paul van der Heide and published by John Wiley & Sons. This book was released on 2014-08-19 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Author : Fred Stevie
Publisher : Momentum Press
ISBN 13 : 1606505890
Total Pages : 233 pages
Book Rating : 4.6/5 (65 download)
Download or read book Secondary Ion Mass Spectrometry written by Fred Stevie and published by Momentum Press. This book was released on 2015-09-15 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Author :
Publisher :
ISBN 13 :
Total Pages : 963 pages
Book Rating : 4.:/5 (886 download)
Download or read book Secondary Ion Mass Spectrometry : Sims VII written by and published by . This book was released on 1990 with total page 963 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Alfred Benninghoven
Publisher :
ISBN 13 :
Total Pages : 963 pages
Book Rating : 4.:/5 (83 download)
Download or read book Secondary ion mass spectrometry written by Alfred Benninghoven and published by . This book was released on 1990 with total page 963 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : G. Gillen
Publisher : Wiley
ISBN 13 : 9780471978268
Total Pages : 1150 pages
Book Rating : 4.9/5 (782 download)
Download or read book Secondary Ion Mass Spectrometry SIMS XI written by G. Gillen and published by Wiley. This book was released on 1998-03-06 with total page 1150 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains 252 contributions presented as plenary,invited and contributed poster and oral presentations at the 11thInternational Conference on Secondary Ion Mass Spectrometry (SIMSXI) held at the Hilton Hotel, Walt Disney World Village, Orlando,Florida, 7 12 September, 1997. The book covers a diverse range ofresearch, reflecting the rapid growth in advanced semiconductorcharacterization, ultra shallow depth profiling, TOF-SIMS and thenew areas in which SIMS techniques are being used, for example inbiological sciences and organic surface characterization. Papersare presented under the following categories: * Isotopic SIMS * Biological SIMS * Semiconductor Characterization Techniques and Applications * Ultra Shallow Depth Profiling * Depth Profiling Fundamental/Modelling and Diffusion * Sputter-Induced Topography * Fundamentals of Molecular Desorption * Organic Materials * Practical TOF-SIMS * Polyatomic Primary Ions * Materials/Surface Analysis * Postionization * Instrumentation * Geological SIMS * Imaging * Fundamentals of Sputtering * Ion Formation and Cluster Formation * Quantitative Analysis Environmental/ParticleCharacterization * Related Techniques These proceedings provide an invaluable source of reference forboth newcomers to the field and experienced SIMS users.
Author :
Publisher :
ISBN 13 :
Total Pages : 1016 pages
Book Rating : 4.F/5 ( download)
Download or read book Secondary Ion Mass Spectrometry, SIMS IX written by and published by . This book was released on 1994 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Alfred Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642827241
Total Pages : 578 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS V written by Alfred Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 578 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author : J. C. Vickerman
Publisher : Oxford University Press, USA
ISBN 13 :
Total Pages : 368 pages
Book Rating : 4.3/5 (91 download)
Download or read book Secondary Ion Mass Spectrometry written by J. C. Vickerman and published by Oxford University Press, USA. This book was released on 1989 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Author : Robert G. Wilson
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 392 pages
Book Rating : 4.3/5 (91 download)
Download or read book Secondary Ion Mass Spectrometry written by Robert G. Wilson and published by Wiley-Interscience. This book was released on 1989-11-16 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.
Author : Christine M. Mahoney
Publisher : John Wiley & Sons
ISBN 13 : 1118589246
Total Pages : 325 pages
Book Rating : 4.1/5 (185 download)
Download or read book Cluster Secondary Ion Mass Spectrometry written by Christine M. Mahoney and published by John Wiley & Sons. This book was released on 2013-04-17 with total page 325 pages. Available in PDF, EPUB and Kindle. Book excerpt: Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Author : A. Benninghoven
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (593 download)
Download or read book Secondary Ion Mass Spectrometry written by A. Benninghoven and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : A. Benninghoven
Publisher : Springer Science & Business Media
ISBN 13 : 3642822568
Total Pages : 518 pages
Book Rating : 4.6/5 (428 download)
Download or read book Secondary Ion Mass Spectrometry SIMS IV written by A. Benninghoven and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.
Author : Lucille A. Giannuzzi
Publisher : Springer Science & Business Media
ISBN 13 : 038723313X
Total Pages : 362 pages
Book Rating : 4.3/5 (872 download)
Download or read book Introduction to Focused Ion Beams written by Lucille A. Giannuzzi and published by Springer Science & Business Media. This book was released on 2006-05-18 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Author : A. Benninghoven
Publisher : Elsevier Science & Technology
ISBN 13 :
Total Pages : 1092 pages
Book Rating : 4.F/5 ( download)
Download or read book Secondary Ion Mass Spectrometry written by A. Benninghoven and published by Elsevier Science & Technology. This book was released on 2000 with total page 1092 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.
