Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Reliable Integrated Circuits Design And Test At Sub 45nm Technologies
Download Reliable Integrated Circuits Design And Test At Sub 45nm Technologies full books in PDF, epub, and Kindle. Read online Reliable Integrated Circuits Design And Test At Sub 45nm Technologies ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis Embedded Systems: Design, Analysis and Verification by : Gunar Schirner
Download or read book Embedded Systems: Design, Analysis and Verification written by Gunar Schirner and published by Springer. This book was released on 2013-06-13 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, held in Paderborn, Germany, in June 2013. The 22 full revised papers presented together with 8 short papers were carefully reviewed and selected from 42 submissions. The papers have been organized in the following topical sections: design methodologies; non-functional aspects of embedded systems; verification; performance analysis; real-time systems; embedded system applications; and real-time aspects in distributed systems. The book also includes a special chapter dedicated to the BMBF funded ARAMIS project on Automotive, Railway and Avionics Multicore Systems.
Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai
Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
Book Synopsis Circuit Design for Reliability by : Ricardo Reis
Download or read book Circuit Design for Reliability written by Ricardo Reis and published by Springer. This book was released on 2014-11-08 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
Book Synopsis VLSI Design and Test by : Manoj Singh Gaur
Download or read book VLSI Design and Test written by Manoj Singh Gaur and published by Springer. This book was released on 2013-12-13 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Book Synopsis On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits by : Rodrigo Possamai Bastos
Download or read book On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits written by Rodrigo Possamai Bastos and published by Springer Nature. This book was released on 2019-09-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs.
Book Synopsis Predictive Technology Model for Robust Nanoelectronic Design by : Yu Cao
Download or read book Predictive Technology Model for Robust Nanoelectronic Design written by Yu Cao and published by Springer Science & Business Media. This book was released on 2011-07-12 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.
Book Synopsis Device Circuit Co-Design Issues in FETs by : Shubham Tayal
Download or read book Device Circuit Co-Design Issues in FETs written by Shubham Tayal and published by CRC Press. This book was released on 2023-08-22 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of emerging semiconductor devices and their applications in electronic circuits, which form the foundation of electronic devices. Device Circuit Co-Design Issues in FETs provides readers with a better understanding of the ever-growing field of low-power electronic devices and their applications in the wireless, biosensing, and circuit domains. The book brings researchers and engineers from various disciplines of the VLSI domain together to tackle the emerging challenges in the field of engineering and applications of advanced low-power devices in an effort to improve the performance of these technologies. The chapters examine the challenges and scope of FinFET device circuits, 3D FETs, and advanced FET for circuit applications. The book also discusses low-power memory design, neuromorphic computing, and issues related to thermal reliability. The authors provide a good understanding of device physics and circuits, and discuss transistors based on the new channel/dielectric materials and device architectures to achieve low-power dissipation and ultra-high switching speeds to fulfill the requirements of the semiconductor industry. This book is intended for students, researchers, and professionals in the field of semiconductor devices and nanodevices, as well as those working on device-circuit co-design issues.
Book Synopsis Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition by :
Download or read book Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition written by and published by ScholarlyEditions. This book was released on 2013-05-01 with total page 647 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition is a ScholarlyEditions™ book that delivers timely, authoritative, and comprehensive information about Computer Security. The editors have built Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Computer Security in this book to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Information Science—Information Technology, Systems, and Security: 2013 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.
Book Synopsis Managing Temperature Effects in Nanoscale Adaptive Systems by : David Wolpert
Download or read book Managing Temperature Effects in Nanoscale Adaptive Systems written by David Wolpert and published by Springer Science & Business Media. This book was released on 2011-08-31 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability. A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.
Book Synopsis ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis by : ASM International
Download or read book ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2017-12-01 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Book Synopsis Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design by : Xiaowei Li
Download or read book Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design written by Xiaowei Li and published by Springer Nature. This book was released on 2023-03-01 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.
Book Synopsis Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology by : Luciano Lavagno
Download or read book Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology written by Luciano Lavagno and published by CRC Press. This book was released on 2017-02-03 with total page 798 pages. Available in PDF, EPUB and Kindle. Book excerpt: The second of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology thoroughly examines real-time logic (RTL) to GDSII (a file format used to transfer data of semiconductor physical layout) design flow, analog/mixed signal design, physical verification, and technology computer-aided design (TCAD). Chapters contributed by leading experts authoritatively discuss design for manufacturability (DFM) at the nanoscale, power supply network design and analysis, design modeling, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on 3D circuit integration and clock design Offering improved depth and modernity, Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Book Synopsis VLSI-SoC: Technology Advancement on SoC Design by : Victor Grimblatt
Download or read book VLSI-SoC: Technology Advancement on SoC Design written by Victor Grimblatt and published by Springer Nature. This book was released on 2022-09-28 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, held in Singapore, in October 2021*. The 12 full papers included in this volume were carefully reviewed and selected from the 44 papers (out of 75 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like low-power design of RF, analog and mixed-signal circuits, EDA tools for the synthesis and verification of heterogenous SoCs, accelerators for cryptography and deep learning and on-chip Interconnection system, reliability and testing, and integration of 3D-ICs. *The conference was held virtually.
Book Synopsis Circuits and Systems for Security and Privacy by : Farhana Sheikh
Download or read book Circuits and Systems for Security and Privacy written by Farhana Sheikh and published by CRC Press. This book was released on 2017-12-19 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: Circuits and Systems for Security and Privacy begins by introducing the basic theoretical concepts and arithmetic used in algorithms for security and cryptography, and by reviewing the fundamental building blocks of cryptographic systems. It then analyzes the advantages and disadvantages of real-world implementations that not only optimize power, area, and throughput but also resist side-channel attacks. Merging the perspectives of experts from industry and academia, the book provides valuable insight and necessary background for the design of security-aware circuits and systems as well as efficient accelerators used in security applications.
Download or read book Neuromorphic Computing written by and published by BoD – Books on Demand. This book was released on 2023-11-15 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dive into the cutting-edge world of Neuromorphic Computing, a groundbreaking volume that unravels the secrets of brain-inspired computational paradigms. Spanning neuroscience, artificial intelligence, and hardware design, this book presents a comprehensive exploration of neuromorphic systems, empowering both experts and newcomers to embrace the limitless potential of brain-inspired computing. Discover the fundamental principles that underpin neural computation as we journey through the origins of neuromorphic architectures, meticulously crafted to mimic the brain’s intricate neural networks. Unlock the true essence of learning mechanisms – unsupervised, supervised, and reinforcement learning – and witness how these innovations are shaping the future of artificial intelligence.
Book Synopsis Springer Handbook of Semiconductor Devices by : Massimo Rudan
Download or read book Springer Handbook of Semiconductor Devices written by Massimo Rudan and published by Springer Nature. This book was released on 2022-11-10 with total page 1680 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Springer Handbook comprehensively covers the topic of semiconductor devices, embracing all aspects from theoretical background to fabrication, modeling, and applications. Nearly 100 leading scientists from industry and academia were selected to write the handbook's chapters, which were conceived for professionals and practitioners, material scientists, physicists and electrical engineers working at universities, industrial R&D, and manufacturers. Starting from the description of the relevant technological aspects and fabrication steps, the handbook proceeds with a section fully devoted to the main conventional semiconductor devices like, e.g., bipolar transistors and MOS capacitors and transistors, used in the production of the standard integrated circuits, and the corresponding physical models. In the subsequent chapters, the scaling issues of the semiconductor-device technology are addressed, followed by the description of novel concept-based semiconductor devices. The last section illustrates the numerical simulation methods ranging from the fabrication processes to the device performances. Each chapter is self-contained, and refers to related topics treated in other chapters when necessary, so that the reader interested in a specific subject can easily identify a personal reading path through the vast contents of the handbook.
Book Synopsis Circadian Rhythms for Future Resilient Electronic Systems by : Xinfei Guo
Download or read book Circadian Rhythms for Future Resilient Electronic Systems written by Xinfei Guo and published by Springer. This book was released on 2019-06-12 with total page 215 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.
