Reliability Prediction For Microelectronics

Download Reliability Prediction For Microelectronics full books in PDF, epub, and Kindle. Read online Reliability Prediction For Microelectronics ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!

Reliability Prediction for Microelectronics

Author : Joseph B. Bernstein
Publisher : John Wiley & Sons
ISBN 13 : 1394210957
Total Pages : 404 pages
Book Rating : 4.3/5 (942 download)

DOWNLOAD NOW!

Book Synopsis Reliability Prediction for Microelectronics by : Joseph B. Bernstein

Download or read book Reliability Prediction for Microelectronics written by Joseph B. Bernstein and published by John Wiley & Sons. This book was released on 2024-02-13 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.

Reliability Prediction for Microelectronics

Author : Joseph B. Bernstein
Publisher : John Wiley & Sons
ISBN 13 : 1394210930
Total Pages : 404 pages
Book Rating : 4.3/5 (942 download)

DOWNLOAD NOW!

Book Synopsis Reliability Prediction for Microelectronics by : Joseph B. Bernstein

Download or read book Reliability Prediction for Microelectronics written by Joseph B. Bernstein and published by John Wiley & Sons. This book was released on 2024-02-20 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.

Solder Joint Reliability Prediction for Multiple Environments

Author : Andrew E. Perkins
Publisher : Springer Science & Business Media
ISBN 13 : 0387793941
Total Pages : 202 pages
Book Rating : 4.3/5 (877 download)

DOWNLOAD NOW!

Book Synopsis Solder Joint Reliability Prediction for Multiple Environments by : Andrew E. Perkins

Download or read book Solder Joint Reliability Prediction for Multiple Environments written by Andrew E. Perkins and published by Springer Science & Business Media. This book was released on 2008-12-16 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: Solder Joint Reliability Prediction for Multiple Environments will provide industry engineers, graduate students and academic researchers, and reliability experts with insights and useful tools for evaluating solder joint reliability of ceramic area array electronic packages under multiple environments. The material presented here is not limited to ceramic area array packages only, it can also be used as a methodology for relating numerical simulations and experimental data into an easy-to-use equation that captures the essential information needed to predict solder joint reliability. Such a methodology is often needed to relate complex information in a simple manner to managers and non-experts in solder joint who work with computer server applications as well as for harsh environments such as those found in the defense, space, and automotive industries.

Physics-of-Failure Based Handbook of Microelectronic Systems

Author : Shahrzad Salemi
Publisher : RIAC
ISBN 13 : 1933904291
Total Pages : 271 pages
Book Rating : 4.9/5 (339 download)

DOWNLOAD NOW!

Book Synopsis Physics-of-Failure Based Handbook of Microelectronic Systems by : Shahrzad Salemi

Download or read book Physics-of-Failure Based Handbook of Microelectronic Systems written by Shahrzad Salemi and published by RIAC. This book was released on 2008 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Prediction from Burn-In Data Fit to Reliability Models

Author : Joseph Bernstein
Publisher : Academic Press
ISBN 13 : 0128008199
Total Pages : 108 pages
Book Rating : 4.1/5 (28 download)

DOWNLOAD NOW!

Book Synopsis Reliability Prediction from Burn-In Data Fit to Reliability Models by : Joseph Bernstein

Download or read book Reliability Prediction from Burn-In Data Fit to Reliability Models written by Joseph Bernstein and published by Academic Press. This book was released on 2014-03-06 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. The ability to include reliability calculations and test results in their product design The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions Have accurate failure rate calculations for calculating warrantee period replacement costs

Reliability Prediction of Electronic Equipment

Author : United States. Department of Defense
Publisher :
ISBN 13 :
Total Pages : 528 pages
Book Rating : 4.F/5 ( download)

DOWNLOAD NOW!

Book Synopsis Reliability Prediction of Electronic Equipment by : United States. Department of Defense

Download or read book Reliability Prediction of Electronic Equipment written by United States. Department of Defense and published by . This book was released on 1982 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Practical Electronic Reliability Engineering

Author : Jerome Klion
Publisher : Springer Science & Business Media
ISBN 13 : 9401169705
Total Pages : 616 pages
Book Rating : 4.4/5 (11 download)

DOWNLOAD NOW!

Book Synopsis Practical Electronic Reliability Engineering by : Jerome Klion

Download or read book Practical Electronic Reliability Engineering written by Jerome Klion and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended for the engineer or engineering student with little or no prior background in reliability. Its purpose is to provide the background material and guidance necessary to comprehend and carry out all the tasks associated with a reliability program from specification generation to final demonstration of reliability achieved. Most available texts on reliability concentrate on the mathematics and statistics used for reliability analysis, evaluation, and demonstration. They are more often suited more for the professional with a heavier mathematical background that most engineers have, and more often than not, ignore or pay short-shrift to basic engineering design and organizational efforts associated with a reliability program. A reliability engineer must be familiar with both the mathematics and engineering aspects of a reliability program. This text: 1. Describes the mathematics needed for reliability analysis, evaluation, and demonstration commensurate with an engineer's background. 2. Provides background material, guidance, and references necessary to the structure and implementation of a reliability program including: • identification of the reliability standards in most common use • how to generate and respond to a reliability specification • how reliability can be increased • the tasks which make up a reliability program and how to judge the need and scope of each; how each is commonly performed; caution and comments about their application.

Reliability Prediction and Testing Textbook

Author : Lev M. Klyatis
Publisher : John Wiley & Sons
ISBN 13 : 1119411882
Total Pages : 270 pages
Book Rating : 4.1/5 (194 download)

DOWNLOAD NOW!

Book Synopsis Reliability Prediction and Testing Textbook by : Lev M. Klyatis

Download or read book Reliability Prediction and Testing Textbook written by Lev M. Klyatis and published by John Wiley & Sons. This book was released on 2018-11-20 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: This textbook reviews the methodologies of reliability prediction as currently used in industries such as electronics, automotive, aircraft, aerospace, off-highway, farm machinery, and others. It then discusses why these are not successful; and, presents methods developed by the authors for obtaining accurate information for successful prediction. The approach is founded on approaches that accurately duplicate the real world use of the product. Their approach is based on two fundamental components needed for successful reliability prediction; first, the methodology necessary; and, second, use of accelerated reliability and durability testing as a source of the necessary data. Applicable to all areas of engineering, this textbook details the newest techniques and tools to achieve successful reliabilityprediction and testing. It demonstrates practical examples of the implementation of the approaches described. This book is a tool for engineers, managers, researchers, in industry, teachers, and students. The reader will learn the importance of the interactions of the influencing factors and the interconnections of safety and human factors in product prediction and testing.

Reliability, Yield, and Stress Burn-In

Author : Way Kuo
Publisher : Springer Science & Business Media
ISBN 13 : 1461556716
Total Pages : 407 pages
Book Rating : 4.4/5 (615 download)

DOWNLOAD NOW!

Book Synopsis Reliability, Yield, and Stress Burn-In by : Way Kuo

Download or read book Reliability, Yield, and Stress Burn-In written by Way Kuo and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Author : Jacopo Franco
Publisher : Springer Science & Business Media
ISBN 13 : 9400776632
Total Pages : 187 pages
Book Rating : 4.4/5 (7 download)

DOWNLOAD NOW!

Book Synopsis Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications by : Jacopo Franco

Download or read book Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications written by Jacopo Franco and published by Springer Science & Business Media. This book was released on 2013-10-19 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a showstopper for further scaled technology nodes. Although several groups have already demonstrated functional Si channel devices with aggressively scaled Equivalent Oxide Thickness (EOT) down to 5Å, a 10 year reliable device operation cannot be guaranteed anymore due to severe Negative Bias Temperature Instability. This book focuses on the reliability of the novel (Si)Ge channel quantum well pMOSFET technology. This technology is being considered for possible implementation in next CMOS technology nodes, thanks to its benefit in terms of carrier mobility and device threshold voltage tuning. We observe that it also opens a degree of freedom for device reliability optimization. By properly tuning the device gate stack, sufficiently reliable ultra-thin EOT devices with a 10 years lifetime at operating conditions are demonstrated. The extensive experimental datasets collected on a variety of processed 300mm wafers and presented here show the reliability improvement to be process - and architecture-independent and, as such, readily transferable to advanced device architectures as Tri-Gate (finFET) devices. We propose a physical model to understand the intrinsically superior reliability of the MOS system consisting of a Ge-based channel and a SiO2/HfO2 dielectric stack. The improved reliability properties here discussed strongly support (Si)Ge technology as a clear frontrunner for future CMOS technology nodes.

Reliability and Quality in Microelectronic Manufacturing

Author : A. Christou
Publisher : RIAC
ISBN 13 : 1933904151
Total Pages : 410 pages
Book Rating : 4.9/5 (339 download)

DOWNLOAD NOW!

Book Synopsis Reliability and Quality in Microelectronic Manufacturing by : A. Christou

Download or read book Reliability and Quality in Microelectronic Manufacturing written by A. Christou and published by RIAC. This book was released on 2006 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Reliability Growth

Author : Panel on Reliability Growth Methods for Defense Systems
Publisher : National Academy Press
ISBN 13 : 9780309314749
Total Pages : 235 pages
Book Rating : 4.3/5 (147 download)

DOWNLOAD NOW!

Book Synopsis Reliability Growth by : Panel on Reliability Growth Methods for Defense Systems

Download or read book Reliability Growth written by Panel on Reliability Growth Methods for Defense Systems and published by National Academy Press. This book was released on 2015-03-01 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: A high percentage of defense systems fail to meet their reliability requirements. This is a serious problem for the U.S. Department of Defense (DOD), as well as the nation. Those systems are not only less likely to successfully carry out their intended missions, but they also could endanger the lives of the operators. Furthermore, reliability failures discovered after deployment can result in costly and strategic delays and the need for expensive redesign, which often limits the tactical situations in which the system can be used. Finally, systems that fail to meet their reliability requirements are much more likely to need additional scheduled and unscheduled maintenance and to need more spare parts and possibly replacement systems, all of which can substantially increase the life-cycle costs of a system. Beginning in 2008, DOD undertook a concerted effort to raise the priority of reliability through greater use of design for reliability techniques, reliability growth testing, and formal reliability growth modeling, by both the contractors and DOD units. To this end, handbooks, guidances, and formal memoranda were revised or newly issued to reduce the frequency of reliability deficiencies for defense systems in operational testing and the effects of those deficiencies. "Reliability Growth" evaluates these recent changes and, more generally, assesses how current DOD principles and practices could be modified to increase the likelihood that defense systems will satisfy their reliability requirements. This report examines changes to the reliability requirements for proposed systems; defines modern design and testing for reliability; discusses the contractor's role in reliability testing; and summarizes the current state of formal reliability growth modeling. The recommendations of "Reliability Growth" will improve the reliability of defense systems and protect the health of the valuable personnel who operate them.

Prediction Technologies for Improving Engineering Product Efficiency

Author : Lev M. Klyatis
Publisher : Springer Nature
ISBN 13 : 3031166558
Total Pages : 281 pages
Book Rating : 4.0/5 (311 download)

DOWNLOAD NOW!

Book Synopsis Prediction Technologies for Improving Engineering Product Efficiency by : Lev M. Klyatis

Download or read book Prediction Technologies for Improving Engineering Product Efficiency written by Lev M. Klyatis and published by Springer Nature. This book was released on 2023-01-03 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is aimed at readers who need to learn the latest solutions for interconnected simulation, testing, and prediction technologies that improve engineering product efficiency, including reliability, safety, quality, durability, maintainability, life-cycle costing and profit. It provides a detailed analysis of technologies now being used in industries such as electronics, automotive, aircraft, aerospace, off-highway, farm machinery, and others. It includes clear examples, charts, and illustrations. This book provides analyses of the simulation, testing, and prediction approaches and methodologies with descriptive, negative trends in their development. The author discusses why many current methods of simulation, testing, and prediction are not successful and describes novel techniques and tools developed for eliminating these problems. This book is a tool for engineers, managers, researches in industry, teachers, and students. Lev Klyatis, Hab. Dr.-Ing., ScD., PhD, Senior Advisor SoHaR, Inc., has been a professor at Moscow State Agricultural Engineering University, research leader and chairman of State Enterprise TESTMASH, and served on the US Technical Advisory Group for the International Electrotechnical Commission (IEC), the ISO/IEC Join Study Group in Safety Aspects of Risk Assessment, the United Nations European Economical Commission, and US-USSR Trade and Economic Council. He is presently a member of World Quality Council, the Elmer A. Sperry Board of Award, SAE International G-41 Reliability Committee, the Integrated Design and Manufacturing Committee and session chairman of SAE International World Congresses in Detroit since 2012. His vast experience and innovation enable him to create a new direction for the successful prediction of product efficiency during any given time, including accurate simulation of real-world conditions, accelerated reliability and durability testing technology, and reducing recalls. His approach has been verified in various industries, primarily automotive, farm machinery, aerospace, and aircraft industries. He has shared his new direction working as the seminar instructor and consultant to Ford, DaimlerChrysler, Nissan, Toyota, Jatko Ltd., Thermo King, Black an Dekker, NASA Research Centers, Karl Schenck, and many others. He holds over 30 patents worldwide and is the author of over 300 publications, including 15 books.

Applied Reliability Engineering and Risk Analysis

Author : Ilia B. Frenkel
Publisher : John Wiley & Sons
ISBN 13 : 1118701895
Total Pages : 449 pages
Book Rating : 4.1/5 (187 download)

DOWNLOAD NOW!

Book Synopsis Applied Reliability Engineering and Risk Analysis by : Ilia B. Frenkel

Download or read book Applied Reliability Engineering and Risk Analysis written by Ilia B. Frenkel and published by John Wiley & Sons. This book was released on 2013-08-22 with total page 449 pages. Available in PDF, EPUB and Kindle. Book excerpt: This complete resource on the theory and applications of reliability engineering, probabilistic models and risk analysis consolidates all the latest research, presenting the most up-to-date developments in this field. With comprehensive coverage of the theoretical and practical issues of both classic and modern topics, it also provides a unique commemoration to the centennial of the birth of Boris Gnedenko, one of the most prominent reliability scientists of the twentieth century. Key features include: expert treatment of probabilistic models and statistical inference from leading scientists, researchers and practitioners in their respective reliability fields detailed coverage of multi-state system reliability, maintenance models, statistical inference in reliability, systemability, physics of failures and reliability demonstration many examples and engineering case studies to illustrate the theoretical results and their practical applications in industry Applied Reliability Engineering and Risk Analysis is one of the first works to treat the important areas of degradation analysis, multi-state system reliability, networks and large-scale systems in one comprehensive volume. It is an essential reference for engineers and scientists involved in reliability analysis, applied probability and statistics, reliability engineering and maintenance, logistics, and quality control. It is also a useful resource for graduate students specialising in reliability analysis and applied probability and statistics. Dedicated to the Centennial of the birth of Boris Gnedenko, renowned Russian mathematician and reliability theorist

Reliability of Electronic Components

Author : Titu I. Bajenescu
Publisher : Springer Science & Business Media
ISBN 13 : 3642585051
Total Pages : 547 pages
Book Rating : 4.6/5 (425 download)

DOWNLOAD NOW!

Book Synopsis Reliability of Electronic Components by : Titu I. Bajenescu

Download or read book Reliability of Electronic Components written by Titu I. Bajenescu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 547 pages. Available in PDF, EPUB and Kindle. Book excerpt: This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.

Reliability of Organic Compounds in Microelectronics and Optoelectronics

Author : Willem Dirk van Driel
Publisher : Springer Nature
ISBN 13 : 3030815765
Total Pages : 552 pages
Book Rating : 4.0/5 (38 download)

DOWNLOAD NOW!

Book Synopsis Reliability of Organic Compounds in Microelectronics and Optoelectronics by : Willem Dirk van Driel

Download or read book Reliability of Organic Compounds in Microelectronics and Optoelectronics written by Willem Dirk van Driel and published by Springer Nature. This book was released on 2022-01-31 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.

Semiconductor Device Reliability

Author : A. Christou
Publisher : Springer Science & Business Media
ISBN 13 : 9400924828
Total Pages : 571 pages
Book Rating : 4.4/5 (9 download)

DOWNLOAD NOW!

Book Synopsis Semiconductor Device Reliability by : A. Christou

Download or read book Semiconductor Device Reliability written by A. Christou and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 571 pages. Available in PDF, EPUB and Kindle. Book excerpt: This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.