Recent Advances In X Ray Characterization Of Materials

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X-ray Characterization of Materials

Author : Eric Lifshin
Publisher : John Wiley & Sons
ISBN 13 : 3527613757
Total Pages : 277 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis X-ray Characterization of Materials by : Eric Lifshin

Download or read book X-ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Advanced X-ray Characterization Techniques

Author : Zainal Arifin Ahmad
Publisher : Trans Tech Publication
ISBN 13 : 9783037855607
Total Pages : 523 pages
Book Rating : 4.8/5 (556 download)

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Book Synopsis Advanced X-ray Characterization Techniques by : Zainal Arifin Ahmad

Download or read book Advanced X-ray Characterization Techniques written by Zainal Arifin Ahmad and published by Trans Tech Publication. This book was released on 2013 with total page 523 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.

X-Ray Line Profile Analysis in Materials Science

Author : Gubicza, Jen?
Publisher : IGI Global
ISBN 13 : 1466658533
Total Pages : 359 pages
Book Rating : 4.4/5 (666 download)

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Book Synopsis X-Ray Line Profile Analysis in Materials Science by : Gubicza, Jen?

Download or read book X-Ray Line Profile Analysis in Materials Science written by Gubicza, Jen? and published by IGI Global. This book was released on 2014-03-31 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

X-Ray Diffraction for Materials Research

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Author : Myeongkyu Lee
Publisher : CRC Press
ISBN 13 : 1315361973
Total Pages : 302 pages
Book Rating : 4.3/5 (153 download)

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Book Synopsis X-Ray Diffraction for Materials Research by : Myeongkyu Lee

Download or read book X-Ray Diffraction for Materials Research written by Myeongkyu Lee and published by CRC Press. This book was released on 2017-03-16 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Thin Film Analysis by X-Ray Scattering

Author : Mario Birkholz
Publisher : John Wiley & Sons
ISBN 13 : 3527607048
Total Pages : 378 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Thin Film Analysis by X-Ray Scattering by : Mario Birkholz

Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition

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Author : Vitalij Pecharsky
Publisher : Springer Science & Business Media
ISBN 13 : 0387095799
Total Pages : 751 pages
Book Rating : 4.3/5 (87 download)

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Book Synopsis Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition by : Vitalij Pecharsky

Download or read book Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition written by Vitalij Pecharsky and published by Springer Science & Business Media. This book was released on 2008-11-24 with total page 751 pages. Available in PDF, EPUB and Kindle. Book excerpt: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .

Advances in X-Ray Analysis

Author : Charles Barrett
Publisher : Springer
ISBN 13 : 9780306381140
Total Pages : 574 pages
Book Rating : 4.3/5 (811 download)

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Book Synopsis Advances in X-Ray Analysis by : Charles Barrett

Download or read book Advances in X-Ray Analysis written by Charles Barrett and published by Springer. This book was released on 1971-01-01 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Author : Gerhard Huebschen
Publisher : Woodhead Publishing
ISBN 13 : 008100057X
Total Pages : 322 pages
Book Rating : 4.0/5 (81 download)

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Book Synopsis Materials Characterization Using Nondestructive Evaluation (NDE) Methods by : Gerhard Huebschen

Download or read book Materials Characterization Using Nondestructive Evaluation (NDE) Methods written by Gerhard Huebschen and published by Woodhead Publishing. This book was released on 2016-03-23 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

Advanced X-ray Techniques in Research and Industry

Author : Ashok Kumar Singh
Publisher : IOS Press
ISBN 13 : 9781586035372
Total Pages : 604 pages
Book Rating : 4.0/5 (353 download)

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Book Synopsis Advanced X-ray Techniques in Research and Industry by : Ashok Kumar Singh

Download or read book Advanced X-ray Techniques in Research and Industry written by Ashok Kumar Singh and published by IOS Press. This book was released on 2005 with total page 604 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers presented at the seminar held in Defence Metallurgical Research Laboratory, Hyderabad India in 2003.

Advances in X-ray Tomography for Geomaterials

Author : Jacques Desrues
Publisher : John Wiley & Sons
ISBN 13 : 0470394846
Total Pages : 454 pages
Book Rating : 4.4/5 (73 download)

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Book Synopsis Advances in X-ray Tomography for Geomaterials by : Jacques Desrues

Download or read book Advances in X-ray Tomography for Geomaterials written by Jacques Desrues and published by John Wiley & Sons. This book was released on 2010-01-05 with total page 454 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book brings together a total of 48 contributions (including 5 keynote papers) which were presented at the 2nd International Workshop on the Application of X-ray CT for Geomaterials (GeoX 2006) held in Aussois, France, on 4-7 October, 2006. The contributions cover a wide range of topics, from fundamental characterization of material behavior to applications in geotechnical and geoenvironmental engineering. Recent advances of X-ray technology, hardware and software are also discussed. As such, this will be valuable reading for anyone interested in the application of X-ray CT to geomaterials from both fundamental and applied perspectives.

X-Ray Diffraction by Polycrystalline Materials

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Author : René Guinebretière
Publisher : John Wiley & Sons
ISBN 13 : 1118613953
Total Pages : 290 pages
Book Rating : 4.1/5 (186 download)

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Book Synopsis X-Ray Diffraction by Polycrystalline Materials by : René Guinebretière

Download or read book X-Ray Diffraction by Polycrystalline Materials written by René Guinebretière and published by John Wiley & Sons. This book was released on 2013-03-01 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

X-Ray Diffraction Crystallography

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Author : Yoshio Waseda
Publisher : Springer Science & Business Media
ISBN 13 : 3642166350
Total Pages : 320 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda

Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Characterization of Crystal Growth Defects by X-Ray Methods

Author : B.K. Tanner
Publisher : Springer Science & Business Media
ISBN 13 : 1475711263
Total Pages : 615 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Characterization of Crystal Growth Defects by X-Ray Methods by : B.K. Tanner

Download or read book Characterization of Crystal Growth Defects by X-Ray Methods written by B.K. Tanner and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 615 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

Two-dimensional X-ray Diffraction

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Author : Bob B. He
Publisher : John Wiley & Sons
ISBN 13 : 1119356067
Total Pages : 492 pages
Book Rating : 4.1/5 (193 download)

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Book Synopsis Two-dimensional X-ray Diffraction by : Bob B. He

Download or read book Two-dimensional X-ray Diffraction written by Bob B. He and published by John Wiley & Sons. This book was released on 2018-05-18 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt: An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.

Advances in X-ray Absorption Fine Structure Analysis

Author : Zhongrui (jerry) Li
Publisher :
ISBN 13 : 9781925823882
Total Pages : 400 pages
Book Rating : 4.8/5 (238 download)

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Book Synopsis Advances in X-ray Absorption Fine Structure Analysis by : Zhongrui (jerry) Li

Download or read book Advances in X-ray Absorption Fine Structure Analysis written by Zhongrui (jerry) Li and published by . This book was released on 2020-11-15 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD). This book may serve as a reference book for researchers and technicians taking up synchrotron radiation application research and postgraduates majoring in the X-ray absorption spectroscopy field. It will provide the beginners with all the necessary information in the field of XAFS. Also, experienced users active in particular subfields of XAFS spectroscopies will learn in this book about the enormous potential of XAFS for other applications in physics, chemistry, biology, materials science and engineering, geo- and environmental science, etc. For more details, please visit https: //centralwestpublishing.com s book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD).

Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons

Author : Sunil K Sinha
Publisher : World Scientific
ISBN 13 : 9811231524
Total Pages : 430 pages
Book Rating : 4.8/5 (112 download)

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Book Synopsis Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons by : Sunil K Sinha

Download or read book Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons written by Sunil K Sinha and published by World Scientific. This book was released on 2021-03-23 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.

X-Ray Diffraction

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Author : Oliver H. Seeck
Publisher : CRC Press
ISBN 13 : 9814303607
Total Pages : 438 pages
Book Rating : 4.8/5 (143 download)

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Book Synopsis X-Ray Diffraction by : Oliver H. Seeck

Download or read book X-Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.