Radiation Induced Soft Errors In Digital Circuit Designs

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Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits

Author : Hsiao-Heng Kelin Lee
Publisher : Stanford University
ISBN 13 :
Total Pages : 156 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits by : Hsiao-Heng Kelin Lee

Download or read book Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits written by Hsiao-Heng Kelin Lee and published by Stanford University. This book was released on 2011 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt: Radiation-induced soft errors are a major concern for modern digital circuits, especially memory elements. Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. latches and flip-flops, is challenging. Traditional techniques for designing soft-error-resilient sequential elements generally address single node errors, or Single Event Upsets (SEUs). However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing a new soft error resilience layout design principle called LEAP, or Layout Design through Error-Aware Transistor Positioning. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. We compare the soft error performance of SEU-immune flip-flops with the LEAP-DICE flip-flop using a test chip in 180nm CMOS under 200-MeV proton radiation and conclude that 1) our LEAP-DICE flip-flop encounters on average 2,000X and 5X fewer errors compared to a conventional D flip-flop and our reference DICE flip-flop, respectively; 2) our LEAP-DICE flip-flop has the best soft error performance among all existing SEU-immune flip-flops; 3) In the evaluation of our design framework, we also discovered new soft error effects related to operating conditions such as voltage scaling, clock frequency setting and radiation dose.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

Author : Ronald Donald Schrimpf
Publisher : World Scientific
ISBN 13 : 9812389407
Total Pages : 349 pages
Book Rating : 4.8/5 (123 download)

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Book Synopsis Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices by : Ronald Donald Schrimpf

Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Ronald Donald Schrimpf and published by World Scientific. This book was released on 2004 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Soft Errors

Author : Jean-Luc Autran
Publisher : CRC Press
ISBN 13 : 146659084X
Total Pages : 432 pages
Book Rating : 4.4/5 (665 download)

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Book Synopsis Soft Errors by : Jean-Luc Autran

Download or read book Soft Errors written by Jean-Luc Autran and published by CRC Press. This book was released on 2017-12-19 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Architecture Design for Soft Errors

Author : Shubu Mukherjee
Publisher : Morgan Kaufmann
ISBN 13 : 0080558321
Total Pages : 361 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Architecture Design for Soft Errors by : Shubu Mukherjee

Download or read book Architecture Design for Soft Errors written by Shubu Mukherjee and published by Morgan Kaufmann. This book was released on 2011-08-29 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. - Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors - Shows readers how to quantify their soft error reliability - Provides state-of-the-art techniques to protect against soft errors

Analysis and Design of Resilient VLSI Circuits

Author : Rajesh Garg
Publisher : Springer
ISBN 13 : 9781441909329
Total Pages : 0 pages
Book Rating : 4.9/5 (93 download)

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Book Synopsis Analysis and Design of Resilient VLSI Circuits by : Rajesh Garg

Download or read book Analysis and Design of Resilient VLSI Circuits written by Rajesh Garg and published by Springer. This book was released on 2010-04-29 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Author : Alexandra Zimpeck
Publisher : Springer Nature
ISBN 13 : 3030683680
Total Pages : 131 pages
Book Rating : 4.0/5 (36 download)

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Book Synopsis Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs by : Alexandra Zimpeck

Download or read book Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs written by Alexandra Zimpeck and published by Springer Nature. This book was released on 2021-03-10 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.

Soft Error Reliability of VLSI Circuits

Author : Behnam Ghavami
Publisher : Springer Nature
ISBN 13 : 3030516105
Total Pages : 119 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Soft Error Reliability of VLSI Circuits by : Behnam Ghavami

Download or read book Soft Error Reliability of VLSI Circuits written by Behnam Ghavami and published by Springer Nature. This book was released on 2020-10-13 with total page 119 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

Soft Error Mechanisms, Modeling and Mitigation

Author : Selahattin Sayil
Publisher : Springer
ISBN 13 : 3319306073
Total Pages : 112 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Soft Error Mechanisms, Modeling and Mitigation by : Selahattin Sayil

Download or read book Soft Error Mechanisms, Modeling and Mitigation written by Selahattin Sayil and published by Springer. This book was released on 2016-02-25 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

Analysis and Design of Resilient VLSI Circuits

Author : Rajesh Garg
Publisher : Springer Science & Business Media
ISBN 13 : 1441909311
Total Pages : 224 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Analysis and Design of Resilient VLSI Circuits by : Rajesh Garg

Download or read book Analysis and Design of Resilient VLSI Circuits written by Rajesh Garg and published by Springer Science & Business Media. This book was released on 2009-10-22 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

Integrated Circuit Design for Radiation Environments

Author : Stephen J. Gaul
Publisher : John Wiley & Sons
ISBN 13 : 1119966345
Total Pages : 404 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Integrated Circuit Design for Radiation Environments by : Stephen J. Gaul

Download or read book Integrated Circuit Design for Radiation Environments written by Stephen J. Gaul and published by John Wiley & Sons. This book was released on 2019-12-31 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today’s space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips. Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena. Describes the fundamentals of radiation environments and their effects on electronic components Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications Covers natural and man-made radiation environments, space systems and commercial terrestrial applications Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume Includes questions and answers for the reader to test their knowledge Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.

Innovative Applications of Nanowires for Circuit Design

Author : Raj, Balwinder
Publisher : IGI Global
ISBN 13 : 1799864693
Total Pages : 263 pages
Book Rating : 4.7/5 (998 download)

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Book Synopsis Innovative Applications of Nanowires for Circuit Design by : Raj, Balwinder

Download or read book Innovative Applications of Nanowires for Circuit Design written by Raj, Balwinder and published by IGI Global. This book was released on 2020-11-20 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanowires are an important sector of circuit design whose applications in very-large-scale integration design (VLSI) have huge impacts for bringing revolutionary advancements in nanoscale devices, circuits, and systems due to improved electronic properties of the nanowires. Nanowires are potential devices for VLSI circuits and system applications and are highly preferred in novel nanoscale devices due to their high mobility and high-driving capacity. Although the knowledge and resources for the fabrication of nanowires is currently limited, it is predicted that, with the advancement of technology, conventional fabrication flow can be used for nanoscale devices, specifically nanowires. Innovative Applications of Nanowires for Circuit Design provides relevant theoretical frameworks that include device physics, modeling, circuit design, and the latest developments in experimental fabrication in the field of nanotechnology. The book covers advanced modeling concepts of nanowires along with their role as a key enabler for innovation in GLSI devices, circuits, and systems. While highlighting topics such as design, simulation, types and applications, and performance analysis of nanowires, this book is ideally intended for engineers, practitioners, stakeholders, academicians, researchers, and students interested in electronics engineering, nanoscience, and nanotechnology.

Handbook of Thin Film Deposition

Author : Krishna Seshan
Publisher : William Andrew
ISBN 13 : 0128123125
Total Pages : 472 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Handbook of Thin Film Deposition by : Krishna Seshan

Download or read book Handbook of Thin Film Deposition written by Krishna Seshan and published by William Andrew. This book was released on 2018-02-23 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Handbook of Thin Film Deposition, Fourth Edition, is a comprehensive reference focusing on thin film technologies and applications used in the semiconductor industry and the closely related areas of thin film deposition, thin film micro properties, photovoltaic solar energy applications, materials for memory applications and methods for thin film optical processes. The book is broken up into three sections: scaling, equipment and processing, and applications. In this newly revised edition, the handbook will also explore the limits of thin film applications, most notably as they relate to applications in manufacturing, materials, design and reliability. - Offers a practical survey of thin film technologies aimed at engineers and managers involved in all stages of the process: design, fabrication, quality assurance, applications and the limitations faced by those processes - Covers core processes and applications in the semiconductor industry and new developments within the photovoltaic and optical thin film industries - Features a new chapter discussing Gates Dielectrics

Radiation Effects in Semiconductors

Author : Krzysztof Iniewski
Publisher : CRC Press
ISBN 13 : 1439826951
Total Pages : 432 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Radiation Effects in Semiconductors by : Krzysztof Iniewski

Download or read book Radiation Effects in Semiconductors written by Krzysztof Iniewski and published by CRC Press. This book was released on 2018-09-03 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.

Handbook of Integrated Circuit Industry

Author : Yangyuan Wang
Publisher : Springer Nature
ISBN 13 : 9819928362
Total Pages : 2006 pages
Book Rating : 4.8/5 (199 download)

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Book Synopsis Handbook of Integrated Circuit Industry by : Yangyuan Wang

Download or read book Handbook of Integrated Circuit Industry written by Yangyuan Wang and published by Springer Nature. This book was released on 2023-12-29 with total page 2006 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by hundreds experts who have made contributions to both enterprise and academics research, these excellent reference books provide all necessary knowledge of the whole industrial chain of integrated circuits, and cover topics related to the technology evolution trends, fabrication, applications, new materials, equipment, economy, investment, and industrial developments of integrated circuits. Especially, the coverage is broad in scope and deep enough for all kind of readers being interested in integrated circuit industry. Remarkable data collection, update marketing evaluation, enough working knowledge of integrated circuit fabrication, clear and accessible category of integrated circuit products, and good equipment insight explanation, etc. can make general readers build up a clear overview about the whole integrated circuit industry. This encyclopedia is designed as a reference book for scientists and engineers actively involved in integrated circuit research and development field. In addition, this book provides enough guide lines and knowledges to benefit enterprisers being interested in integrated circuit industry.

Microelectronics, Circuits and Systems

Author : Abhijit Biswas
Publisher : Springer Nature
ISBN 13 : 9811615705
Total Pages : 251 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Microelectronics, Circuits and Systems by : Abhijit Biswas

Download or read book Microelectronics, Circuits and Systems written by Abhijit Biswas and published by Springer Nature. This book was released on 2021-08-03 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a collection of peer-reviewed articles from the 7th International Conference on Microelectronics, Circuits, and Systems – Micro 2020. The volume covers the latest development and emerging research topics of material sciences, devices, microelectronics, circuits, nanotechnology, system design and testing, simulation, sensors, photovoltaics, optoelectronics, and its different applications. This book also deals with several tools and techniques to match the theme of the conference. It will be a valuable resource for researchers, professionals, Ph.D. scholars, undergraduate and postgraduate students working in Electronics, Microelectronics, Electrical, and Computer Engineering.

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Author : Xiaowei Li
Publisher : Springer Nature
ISBN 13 : 9811985510
Total Pages : 318 pages
Book Rating : 4.8/5 (119 download)

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Book Synopsis Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design by : Xiaowei Li

Download or read book Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design written by Xiaowei Li and published by Springer Nature. This book was released on 2023-03-01 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.

Low-Power Electronics Design

Author : Christian Piguet
Publisher : CRC Press
ISBN 13 : 1420039555
Total Pages : 896 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Low-Power Electronics Design by : Christian Piguet

Download or read book Low-Power Electronics Design written by Christian Piguet and published by CRC Press. This book was released on 2018-10-03 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt: The power consumption of integrated circuits is one of the most problematic considerations affecting the design of high-performance chips and portable devices. The study of power-saving design methodologies now must also include subjects such as systems on chips, embedded software, and the future of microelectronics. Low-Power Electronics Design covers all major aspects of low-power design of ICs in deep submicron technologies and addresses emerging topics related to future design. This volume explores, in individual chapters written by expert authors, the many low-power techniques born during the past decade. It also discusses the many different domains and disciplines that impact power consumption, including processors, complex circuits, software, CAD tools, and energy sources and management. The authors delve into what many specialists predict about the future by presenting techniques that are promising but are not yet reality. They investigate nanotechnologies, optical circuits, ad hoc networks, e-textiles, as well as human powered sources of energy. Low-Power Electronics Design delivers a complete picture of today's methods for reducing power, and also illustrates the advances in chip design that may be commonplace 10 or 15 years from now.