Scanning Transmission Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 1441972005
Total Pages : 764 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 764 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Quantitative Scanning Transmission Electron Microscopy

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Publisher :
ISBN 13 :
Total Pages : 153 pages
Book Rating : 4.:/5 (96 download)

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Book Synopsis Quantitative Scanning Transmission Electron Microscopy by : James Michael LeBeau

Download or read book Quantitative Scanning Transmission Electron Microscopy written by James Michael LeBeau and published by . This book was released on 2010 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic resolution electron microscopy ranks as one of the most important characterization methods in materials science. Example applications range from investigating single defects to determining detailed interface reconstructions. In recent years, high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) has become the technique of choice because the image intensities are considered to be intuitively interpretable and depend sensitively upon the atomic species present. The combination of experiment with electron scattering theory would thus enable the extraction of chemical information directly from the images without the need for calibration standards. However, theoretical predictions of contrast in atomic resolution electron microscopy images have never agreed quantitatively with experiments, raising questions as to whether the current understanding of image formation in the electron microscope is adequate.

Scanning Transmission Electron Microscopy

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Publisher :
ISBN 13 : 9780367197360
Total Pages : 146 pages
Book Rating : 4.1/5 (973 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Alina Bruma

Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by . This book was released on 2020-12 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials. It explains and exemplifies how to use these methods in order to interpret STEM images and extract suitable information in order to reveal material properties at the nanoscale"--

Quantitative Image Simulation for Scanning Transmission Electron Microscopy

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (958 download)

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Book Synopsis Quantitative Image Simulation for Scanning Transmission Electron Microscopy by :

Download or read book Quantitative Image Simulation for Scanning Transmission Electron Microscopy written by and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Introduction to Scanning Transmission Electron Microscopy

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Publisher : Routledge
ISBN 13 : 1351436619
Total Pages : 127 pages
Book Rating : 4.3/5 (514 download)

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Book Synopsis Introduction to Scanning Transmission Electron Microscopy by : Dr Robert Keyse

Download or read book Introduction to Scanning Transmission Electron Microscopy written by Dr Robert Keyse and published by Routledge. This book was released on 2018-12-19 with total page 127 pages. Available in PDF, EPUB and Kindle. Book excerpt: 1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Scanning Electron Microscopy and X-Ray Microanalysis

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Publisher : Springer Science & Business Media
ISBN 13 : 1461332737
Total Pages : 679 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph Goldstein

Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Model-based Quantitative Scanning Transmission Electron Microscopy for Measuring Dynamic Structural Changes at the Atomic Scale

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Publisher :
ISBN 13 :
Total Pages : 146 pages
Book Rating : 4.:/5 (128 download)

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Book Synopsis Model-based Quantitative Scanning Transmission Electron Microscopy for Measuring Dynamic Structural Changes at the Atomic Scale by : Annelies De wael

Download or read book Model-based Quantitative Scanning Transmission Electron Microscopy for Measuring Dynamic Structural Changes at the Atomic Scale written by Annelies De wael and published by . This book was released on 2021 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Field Emission Scanning Electron Microscopy

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Publisher : Springer
ISBN 13 : 9811044333
Total Pages : 143 pages
Book Rating : 4.8/5 (11 download)

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Book Synopsis Field Emission Scanning Electron Microscopy by : Nicolas Brodusch

Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Electron Microscopy in Science and Engineering

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Publisher : Springer Nature
ISBN 13 : 9811651019
Total Pages : 153 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Electron Microscopy in Science and Engineering by : Krishanu Biswas

Download or read book Electron Microscopy in Science and Engineering written by Krishanu Biswas and published by Springer Nature. This book was released on 2022-02-09 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.

Practical Scanning Electron Microscopy

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Publisher : Springer
ISBN 13 : 9781461344230
Total Pages : 582 pages
Book Rating : 4.3/5 (442 download)

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Book Synopsis Practical Scanning Electron Microscopy by : Joseph Goldstein

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer. This book was released on 2011-11-10 with total page 582 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-slice Image Simulations

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (112 download)

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Book Synopsis Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-slice Image Simulations by : Pirmin Kükelhan

Download or read book Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-slice Image Simulations written by Pirmin Kükelhan and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electron Microscopy And Analysis

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Publisher : CRC Press
ISBN 13 : 9780850664140
Total Pages : 248 pages
Book Rating : 4.6/5 (641 download)

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Book Synopsis Electron Microscopy And Analysis by : Peter J. Goodhew

Download or read book Electron Microscopy And Analysis written by Peter J. Goodhew and published by CRC Press. This book was released on 1988-04-25 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.

Transmission Electron Microscopy

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Publisher : Springer
ISBN 13 : 3319266519
Total Pages : 543 pages
Book Rating : 4.3/5 (192 download)

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Book Synopsis Transmission Electron Microscopy by : C. Barry Carter

Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

The Applications of Quantitative Scanning Transmission Electron Microscopy to the Analysis of Intracellular Elemental Distributions

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (131 download)

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Book Synopsis The Applications of Quantitative Scanning Transmission Electron Microscopy to the Analysis of Intracellular Elemental Distributions by : Amy Alexandra Sheader

Download or read book The Applications of Quantitative Scanning Transmission Electron Microscopy to the Analysis of Intracellular Elemental Distributions written by Amy Alexandra Sheader and published by . This book was released on 2021 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scanning Electron Microscopy

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ISBN 13 :
Total Pages : 424 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Scanning Electron Microscopy by :

Download or read book Scanning Electron Microscopy written by and published by . This book was released on 1985 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.

Transmission Electron Microscopy in Micro-nanoelectronics

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Publisher : John Wiley & Sons
ISBN 13 : 1118579054
Total Pages : 280 pages
Book Rating : 4.1/5 (185 download)

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Book Synopsis Transmission Electron Microscopy in Micro-nanoelectronics by : Alain Claverie

Download or read book Transmission Electron Microscopy in Micro-nanoelectronics written by Alain Claverie and published by John Wiley & Sons. This book was released on 2013-01-29 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs. This book presents in a simple and practical way the new quantitative techniques based on TEM which have recently been invented or developed to address most of the main challenging issues scientists and process engineers have to face to develop or optimize semiconductor layers and devices. Several of these techniques are based on electron holography; others take advantage of the possibility of focusing intense beams within nanoprobes. Strain measurements and mappings, dopant activation and segregation, interfacial reactions at the nanoscale, defect identification and specimen preparation by FIB are among the topics presented in this book. After a brief presentation of the underlying theory, each technique is illustrated through examples from the lab or fab.

Quantitative Electron Microscopy,

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Publisher : CRC Press
ISBN 13 :
Total Pages : 472 pages
Book Rating : 4.:/5 (44 download)

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Book Synopsis Quantitative Electron Microscopy, by : J. N. Chapman

Download or read book Quantitative Electron Microscopy, written by J. N. Chapman and published by CRC Press. This book was released on 1984 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: