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Practical Materials Characterization
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Book Synopsis Practical Materials Characterization by : Mauro Sardela
Download or read book Practical Materials Characterization written by Mauro Sardela and published by Springer. This book was released on 2014-07-10 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.
Book Synopsis Encyclopedia of Materials Characterization by : Charles A. Evans
Download or read book Encyclopedia of Materials Characterization written by Charles A. Evans and published by Gulf Professional Publishing. This book was released on 1992 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.
Book Synopsis Handbook of Materials Characterization by : Surender Kumar Sharma
Download or read book Handbook of Materials Characterization written by Surender Kumar Sharma and published by Springer. This book was released on 2018-09-18 with total page 612 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
Book Synopsis X-ray Characterization of Materials by : Eric Lifshin
Download or read book X-ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Book Synopsis Materials Characterization Techniques by : Sam Zhang
Download or read book Materials Characterization Techniques written by Sam Zhang and published by CRC Press. This book was released on 2008-12-22 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche
Book Synopsis Practical Guide to Materials Characterization by : Khalid Sultan
Download or read book Practical Guide to Materials Characterization written by Khalid Sultan and published by John Wiley & Sons. This book was released on 2022-09-13 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Guide to Materials Characterization Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner. To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements. Specific sample topics covered in the remaining seven chapters include: Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM) With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.
Book Synopsis Advanced Techniques for Materials Characterization by : A.K. Tyagi
Download or read book Advanced Techniques for Materials Characterization written by A.K. Tyagi and published by Trans Tech Publications Ltd. This book was released on 2009-01-02 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.
Book Synopsis Principles of Materials Characterization and Metrology by : Kannan M. Krishnan
Download or read book Principles of Materials Characterization and Metrology written by Kannan M. Krishnan and published by Oxford University Press. This book was released on 2021-05-07 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Book Synopsis Chemical Analysis and Material Characterization by Spectrophotometry by : Bhim Prasad Kaflé
Download or read book Chemical Analysis and Material Characterization by Spectrophotometry written by Bhim Prasad Kaflé and published by Elsevier. This book was released on 2019-11-29 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Chemical Analysis and Material Characterization by Spectrophotometry integrates and presents the latest known information and examples from the most up-to-date literature on the use of this method for chemical analysis or materials characterization. Accessible to various levels of expertise, everyone from students, to practicing analytical and industrial chemists, the book covers both the fundamentals of spectrophotometry and instrumental procedures for quantitative analysis with spectrophotometric techniques. It contains a wealth of examples and focuses on the latest research, such as the investigation of optical properties of nanomaterials and thin solid films. Covers the basic analytical theory that is essential for understanding spectrophotometry Emphasizes minor/trace chemical component analysis Includes the spectrophotometric analysis of nanomaterials and thin solid films Thoroughly describes methods and uses easy-to-follow, practical examples and experiments
Book Synopsis Microstructural Characterization of Materials by : David Brandon
Download or read book Microstructural Characterization of Materials written by David Brandon and published by John Wiley & Sons. This book was released on 2013-03-21 with total page 517 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Book Synopsis Materials Characterization by : Yang Leng
Download or read book Materials Characterization written by Yang Leng and published by John Wiley & Sons. This book was released on 2009-03-04 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Book Synopsis Spectroscopic Ellipsometry by : Harland G. Tompkins
Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Book Synopsis Practical Guide to Materials Characterization by : Khalid Sultan
Download or read book Practical Guide to Materials Characterization written by Khalid Sultan and published by John Wiley & Sons. This book was released on 2022-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Practical Guide to Materials Characterization Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner. To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements. Specific sample topics covered in the remaining seven chapters include: Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM) With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.
Book Synopsis Materials Chemistry by : Bradley D. Fahlman
Download or read book Materials Chemistry written by Bradley D. Fahlman and published by Springer. This book was released on 2018-08-28 with total page 817 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 3rd edition of this successful textbook continues to build on the strengths that were recognized by a 2008 Textbook Excellence Award from the Text and Academic Authors Association (TAA). Materials Chemistry addresses inorganic-, organic-, and nano-based materials from a structure vs. property treatment, providing a suitable breadth and depth coverage of the rapidly evolving materials field — in a concise format. The 3rd edition offers significant updates throughout, with expanded sections on sustainability, energy storage, metal-organic frameworks, solid electrolytes, solvothermal/microwave syntheses, integrated circuits, and nanotoxicity. Most appropriate for Junior/Senior undergraduate students, as well as first-year graduate students in chemistry, physics, or engineering fields, Materials Chemistry may also serve as a valuable reference to industrial researchers. Each chapter concludes with a section that describes important materials applications, and an updated list of thought-provoking questions.
Book Synopsis Transmission Electron Microscopy and Diffractometry of Materials by : Brent Fultz
Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2012-10-14 with total page 775 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Book Synopsis Spectroscopy for Materials Characterization by : Simonpietro Agnello
Download or read book Spectroscopy for Materials Characterization written by Simonpietro Agnello and published by John Wiley & Sons. This book was released on 2021-09-08 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt: SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Book Synopsis Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization by : Richard Haight
Download or read book Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization written by Richard Haight and published by World Scientific. This book was released on 2012 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
