Materials Characterization

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Materials Characterization

Author : Yang Leng
Publisher : John Wiley & Sons
ISBN 13 : 0470822996
Total Pages : 384 pages
Book Rating : 4.4/5 (78 download)

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Book Synopsis Materials Characterization by : Yang Leng

Download or read book Materials Characterization written by Yang Leng and published by John Wiley & Sons. This book was released on 2009-03-04 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Encyclopedia of Materials Characterization

Author : Charles A. Evans
Publisher : Gulf Professional Publishing
ISBN 13 : 9780750691680
Total Pages : 784 pages
Book Rating : 4.6/5 (916 download)

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Book Synopsis Encyclopedia of Materials Characterization by : Charles A. Evans

Download or read book Encyclopedia of Materials Characterization written by Charles A. Evans and published by Gulf Professional Publishing. This book was released on 1992 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.

Materials Characterization Techniques

Author : Sam Zhang
Publisher : CRC Press
ISBN 13 : 1420042955
Total Pages : 344 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Materials Characterization Techniques by : Sam Zhang

Download or read book Materials Characterization Techniques written by Sam Zhang and published by CRC Press. This book was released on 2008-12-22 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche

Handbook of Materials Characterization

Author : Surender Kumar Sharma
Publisher : Springer
ISBN 13 : 3319929550
Total Pages : 613 pages
Book Rating : 4.3/5 (199 download)

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Book Synopsis Handbook of Materials Characterization by : Surender Kumar Sharma

Download or read book Handbook of Materials Characterization written by Surender Kumar Sharma and published by Springer. This book was released on 2018-09-18 with total page 613 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

In-situ Materials Characterization

Author : Alexander Ziegler
Publisher : Springer Science & Business Media
ISBN 13 : 3642451527
Total Pages : 256 pages
Book Rating : 4.6/5 (424 download)

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Book Synopsis In-situ Materials Characterization by : Alexander Ziegler

Download or read book In-situ Materials Characterization written by Alexander Ziegler and published by Springer Science & Business Media. This book was released on 2014-04-01 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Principles of Materials Characterization and Metrology

Author : Kannan M. Krishnan
Publisher : Oxford University Press
ISBN 13 : 0192566083
Total Pages : 550 pages
Book Rating : 4.1/5 (925 download)

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Book Synopsis Principles of Materials Characterization and Metrology by : Kannan M. Krishnan

Download or read book Principles of Materials Characterization and Metrology written by Kannan M. Krishnan and published by Oxford University Press. This book was released on 2021-05-07 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.

Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Author : Gerhard Huebschen
Publisher : Woodhead Publishing
ISBN 13 : 008100057X
Total Pages : 320 pages
Book Rating : 4.0/5 (81 download)

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Book Synopsis Materials Characterization Using Nondestructive Evaluation (NDE) Methods by : Gerhard Huebschen

Download or read book Materials Characterization Using Nondestructive Evaluation (NDE) Methods written by Gerhard Huebschen and published by Woodhead Publishing. This book was released on 2016-03-23 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

A Guide to Materials Characterization and Chemical Analysis

Author : John P. Sibilia
Publisher : John Wiley & Sons
ISBN 13 : 9780471186335
Total Pages : 404 pages
Book Rating : 4.1/5 (863 download)

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Book Synopsis A Guide to Materials Characterization and Chemical Analysis by : John P. Sibilia

Download or read book A Guide to Materials Characterization and Chemical Analysis written by John P. Sibilia and published by John Wiley & Sons. This book was released on 1996-12-17 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written both for the novice and for the experienced scientist, this miniature encyclopedia concisely describes over one hundred materials methodologies, including evaluation, chemical analysis, and physical testing techniques. Each technique is presented in terms of its use, sample requirements, and the engineering principles behind its methodology. Real life industrial and academic applications are also described to give the reader an understanding of the significance and utilization of technique. There is also a discussion of the limitations of each technique.

X-ray Characterization of Materials

Author : Eric Lifshin
Publisher : John Wiley & Sons
ISBN 13 : 3527613757
Total Pages : 277 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis X-ray Characterization of Materials by : Eric Lifshin

Download or read book X-ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Microstructural Characterization of Materials

Author : David Brandon
Publisher : John Wiley & Sons
ISBN 13 : 1118681487
Total Pages : 517 pages
Book Rating : 4.1/5 (186 download)

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Book Synopsis Microstructural Characterization of Materials by : David Brandon

Download or read book Microstructural Characterization of Materials written by David Brandon and published by John Wiley & Sons. This book was released on 2013-03-21 with total page 517 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.

Semiconductor Material and Device Characterization

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Magnetic Measurement Techniques for Materials Characterization

Author : Victorino Franco
Publisher : Springer Nature
ISBN 13 : 3030704432
Total Pages : 814 pages
Book Rating : 4.0/5 (37 download)

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Book Synopsis Magnetic Measurement Techniques for Materials Characterization by : Victorino Franco

Download or read book Magnetic Measurement Techniques for Materials Characterization written by Victorino Franco and published by Springer Nature. This book was released on 2021-09-28 with total page 814 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the most commonly used techniques for characterizing magnetic material properties and their applications. It provides a comprehensive and easily digestible collection and review of magnetic measurement techniques. It also examines the underlying operating principles and techniques of magnetic measurements, and presents current examples where such measurements and properties are relevant. Given the pervasive nature of magnetic materials in everyday life, this book is a vital resource for both professionals and students wishing to deepen their understanding of the subject.

Materials Characterization by Thermomechanical Analysis

Author : Alan T. Riga
Publisher : ASTM International
ISBN 13 : 0803114346
Total Pages : 198 pages
Book Rating : 4.8/5 (31 download)

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Book Synopsis Materials Characterization by Thermomechanical Analysis by : Alan T. Riga

Download or read book Materials Characterization by Thermomechanical Analysis written by Alan T. Riga and published by ASTM International. This book was released on 1991 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fifteen papers from the symposium held in Philadelphia, March 1990, examine the uses of thermomechanical analysis and thermodilatometry in materials science, addressing instrumentation, techniques, and applications. Annotation copyright Book News, Inc. Portland, Or.

Concise Encyclopedia of Materials Characterization

Author : R.W. Cahn
Publisher : Elsevier
ISBN 13 : 1483287513
Total Pages : 670 pages
Book Rating : 4.4/5 (832 download)

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Book Synopsis Concise Encyclopedia of Materials Characterization by : R.W. Cahn

Download or read book Concise Encyclopedia of Materials Characterization written by R.W. Cahn and published by Elsevier. This book was released on 2016-01-22 with total page 670 pages. Available in PDF, EPUB and Kindle. Book excerpt: To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.

Material Characterization Tests for Objects of Art and Archaeology

Author : Nancy Odegaard
Publisher :
ISBN 13 : 9781904982098
Total Pages : 0 pages
Book Rating : 4.9/5 (82 download)

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Book Synopsis Material Characterization Tests for Objects of Art and Archaeology by : Nancy Odegaard

Download or read book Material Characterization Tests for Objects of Art and Archaeology written by Nancy Odegaard and published by . This book was released on 2000 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Material characterization tests for objects of art and archaeology is not confined to museum professionals. It serves as an excellent and essential companion for conservators of outdoor sculpture, monuments, and buildings. The tests are applicable to a wide range of object classes including metal, textile, leather, paper, plastics and architectural materials. In addition to presenting the detailed methodology for carrying out each tests, the authors have evaluated the effectiveness of each test in order to assist the reader in selecting the most applicable test and interpreting the results.

Synthesis, Modelling and Characterization of 2D Materials and their Heterostructures

Author : Eui-Hyeok Yang
Publisher : Elsevier
ISBN 13 : 0128184760
Total Pages : 502 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Synthesis, Modelling and Characterization of 2D Materials and their Heterostructures by : Eui-Hyeok Yang

Download or read book Synthesis, Modelling and Characterization of 2D Materials and their Heterostructures written by Eui-Hyeok Yang and published by Elsevier. This book was released on 2020-06-19 with total page 502 pages. Available in PDF, EPUB and Kindle. Book excerpt: Synthesis, Modelling and Characterization of 2D Materials and Their Heterostructures provides a detailed discussion on the multiscale computational approach surrounding atomic, molecular and atomic-informed continuum models. In addition to a detailed theoretical description, this book provides example problems, sample code/script, and a discussion on how theoretical analysis provides insight into optimal experimental design. Furthermore, the book addresses the growth mechanism of these 2D materials, the formation of defects, and different lattice mismatch and interlayer interactions. Sections cover direct band gap, Raman scattering, extraordinary strong light matter interaction, layer dependent photoluminescence, and other physical properties. Explains multiscale computational techniques, from atomic to continuum scale, covering different time and length scales Provides fundamental theoretical insights, example problems, sample code and exercise problems Outlines major characterization and synthesis methods for different types of 2D materials

Characterization and Measurement of Magnetic Materials

Author : Fausto Fiorillo
Publisher : Academic Press
ISBN 13 : 0080528929
Total Pages : 667 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Characterization and Measurement of Magnetic Materials by : Fausto Fiorillo

Download or read book Characterization and Measurement of Magnetic Materials written by Fausto Fiorillo and published by Academic Press. This book was released on 2004-12-07 with total page 667 pages. Available in PDF, EPUB and Kindle. Book excerpt: Correct and efficient measurements are vital to the understanding of materials properties and applications. This is especially so for magnetic materials for which in last twenty years, our understanding and use have changed dramatically. New or improved materials have been created and have reached the market. The Soft amorphous alloys, the Fe-based rare-earth magnets and the giant magnetorestrictive and magnetoresistive materials have all posed challenges to measurement. At the same time new digital measurement techniques have forced a change in laboratory and commercial measuring setups. A revision of measuring standards also occurred in the 1990s with the result that there is now a lack of up-to-date works on the measurement of magnetic materials. The basic objective of this work is to provide a comprehensive overview of the properties of the hard and soft magnetic materials relevant to applications and of thoroughly discussing the modern methodologies for employed in the measurement of these properties. The balance of these topics results in a complete text on the topic, which will be invaluable to researchers, students and practitioners in industry. It will be of significant interest not only to scientists working in the fields of power engineering and materials science but also to specialists in measurement who be able to easily find all the information they need. Comprehensive overview of the properties of the hard and soft magnetic materials Provides applications and discusses thoroughly the modern methodologies for employed in the measurement of these properties Provides the latest up-to-date works on the measurement of magnetic materials