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Author : E. M. Murt
Publisher :
ISBN 13 :
Total Pages : 226 pages
Book Rating : 4.3/5 (91 download)
Download or read book Physical Measurement and Analysis of Thin Films written by E. M. Murt and published by . This book was released on 1969 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : William G. Guldner
Publisher :
ISBN 13 :
Total Pages : 194 pages
Book Rating : 4.:/5 (916 download)
Download or read book Physical Measurement and analysis of thin films written by William G. Guldner and published by . This book was released on 1969 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Edward M. Murt
Publisher :
ISBN 13 :
Total Pages : 194 pages
Book Rating : 4.:/5 (251 download)
Download or read book Physical Measurements and Analysis of Thin Films written by Edward M. Murt and published by . This book was released on 1969 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : EM Murt (ed)
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (985 download)
Download or read book Physical Measurement and Analysis of Thin Films (Progress in Analytical Chemistry, Volume 2). written by EM Murt (ed) and published by . This book was released on 1969 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book PHYSICAL MEASUREMENT AND ANALYSIS OF THIN FILMS- PRESENTED AT THE EASTERN ANALYTICAL SYMPOSIUM- PROGRESS IN ANALYTICAL CHEMISTRY written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Bertram Schwartz
Publisher :
ISBN 13 :
Total Pages : 376 pages
Book Rating : 4.3/5 (91 download)
Download or read book Measurement Techniques for Thin Films written by Bertram Schwartz and published by . This book was released on 1967 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : H. Oechsner
Publisher : Springer Science & Business Media
ISBN 13 : 3642464998
Total Pages : 214 pages
Book Rating : 4.6/5 (424 download)
Download or read book Thin Film and Depth Profile Analysis written by H. Oechsner and published by Springer Science & Business Media. This book was released on 2013-03-08 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.
Author : Orlando Auciello
Publisher : John Wiley & Sons
ISBN 13 : 9780471241416
Total Pages : 282 pages
Book Rating : 4.2/5 (414 download)
Download or read book In Situ Real-Time Characterization of Thin Films written by Orlando Auciello and published by John Wiley & Sons. This book was released on 2001 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Author : E. M. Murt
Publisher :
ISBN 13 :
Total Pages : 194 pages
Book Rating : 4.:/5 (552 download)
Download or read book Progress in Analytical Chemistry, Volume 2: Physical Measurement and Analysis of Thin Films written by E. M. Murt and published by . This book was released on 1969 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Joseph Chapman Anderson
Publisher :
ISBN 13 :
Total Pages : 576 pages
Book Rating : 4.:/5 (34 download)
Download or read book The Use of Thin Films in Physical Investigations written by Joseph Chapman Anderson and published by . This book was released on 1966 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Harland G. Tompkins
Publisher : Momentum Press
ISBN 13 : 1606507281
Total Pages : 138 pages
Book Rating : 4.6/5 (65 download)
Download or read book Spectroscopic Ellipsometry written by Harland G. Tompkins and published by Momentum Press. This book was released on 2015-12-16 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Author : Gernot Friedbacher
Publisher : John Wiley & Sons
ISBN 13 : 3527636943
Total Pages : 558 pages
Book Rating : 4.5/5 (276 download)
Download or read book Surface and Thin Film Analysis written by Gernot Friedbacher and published by John Wiley & Sons. This book was released on 2011-03-31 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Author : Michael Quinten
Publisher : John Wiley & Sons
ISBN 13 : 3527664351
Total Pages : 212 pages
Book Rating : 4.5/5 (276 download)
Download or read book A Practical Guide to Optical Metrology for Thin Films written by Michael Quinten and published by John Wiley & Sons. This book was released on 2012-09-24 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.
Author : Leon I. Maissel
Publisher : CRC Press
ISBN 13 : 9780677028408
Total Pages : 314 pages
Book Rating : 4.0/5 (284 download)
Download or read book An Introduction to Thin Films written by Leon I. Maissel and published by CRC Press. This book was released on 1973 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Markys G. Cain
Publisher : Springer
ISBN 13 : 140209311X
Total Pages : 283 pages
Book Rating : 4.4/5 (2 download)
Download or read book Characterisation of Ferroelectric Bulk Materials and Thin Films written by Markys G. Cain and published by Springer. This book was released on 2014-06-02 with total page 283 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a comprehensive review of the most important methods used in the characterisation of piezoelectric, ferroelectric and pyroelectric materials. It covers techniques for the analysis of bulk materials and thick and thin film materials and devices. There is a growing demand by industry to adapt and integrate piezoelectric materials into ever smaller devices and structures. Such applications development requires the joint development of reliable, robust, accurate and – most importantly – relevant and applicable measurement and characterisation methods and models. In the past few years there has been a rapid development of new techniques to model and measure the variety of properties that are deemed important for applications development engineers and scientists. The book has been written by the leaders in the field and many chapters represent established measurement best practice, with a strong emphasis on application of the methods via worked examples and detailed experimental procedural descriptions. Each chapter contains numerous diagrams, images, and measurement data, all of which are fully referenced and indexed. The book is intended to occupy space in the research or technical lab, and will be a valuable and practical resource for students, materials scientists, engineers, and lab technicians.
Author : Kash L. Mittal
Publisher : CRC Press
ISBN 13 : 1466562234
Total Pages : 352 pages
Book Rating : 4.4/5 (665 download)
Download or read book Adhesion Measurement of Films and Coatings written by Kash L. Mittal and published by CRC Press. This book was released on 2014-07-30 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book documents the proceedings of the Second International Symposium on Adhesion Measurement of Films and Coatings, held in Newark, NJ, October 25-27, 1999. Since the First Symposium (Boston 1992) there had been considerable activity in devising new, more reliable and more efficient ways to measure adhesion of films and coatings, which resulte
Author : K. Vedam
Publisher : Academic Press
ISBN 13 : 1483288935
Total Pages : 345 pages
Book Rating : 4.4/5 (832 download)
Download or read book Optical Characterization of Real Surfaces and Films written by K. Vedam and published by Academic Press. This book was released on 2013-10-22 with total page 345 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
