Novel Techniques For Nanoscale Characterization Of Thin Film Materials

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Fundamentals of Nanoscale Film Analysis

Author : Terry L. Alford
Publisher : Springer Science & Business Media
ISBN 13 : 0387292608
Total Pages : 349 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Fundamentals of Nanoscale Film Analysis by : Terry L. Alford

Download or read book Fundamentals of Nanoscale Film Analysis written by Terry L. Alford and published by Springer Science & Business Media. This book was released on 2007-02-16 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.

In Situ Characterization of Thin Film Growth

Author : Gertjan Koster
Publisher : Elsevier
ISBN 13 : 0857094955
Total Pages : 295 pages
Book Rating : 4.8/5 (57 download)

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Book Synopsis In Situ Characterization of Thin Film Growth by : Gertjan Koster

Download or read book In Situ Characterization of Thin Film Growth written by Gertjan Koster and published by Elsevier. This book was released on 2011-10-05 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research.Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth.With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. - Chapters review electron diffraction techniques, including the methodology for observations and measurements - Discusses the principles and applications of photoemission techniques - Examines alternative in situ characterisation techniques

Nanoscale Phenomena in Ferroelectric Thin Films

Author : Seungbum Hong
Publisher : Springer Science & Business Media
ISBN 13 : 1441990445
Total Pages : 294 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Nanoscale Phenomena in Ferroelectric Thin Films by : Seungbum Hong

Download or read book Nanoscale Phenomena in Ferroelectric Thin Films written by Seungbum Hong and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.

In-situ Materials Characterization

Author : Alexander Ziegler
Publisher : Springer Science & Business Media
ISBN 13 : 3642451527
Total Pages : 265 pages
Book Rating : 4.6/5 (424 download)

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Book Synopsis In-situ Materials Characterization by : Alexander Ziegler

Download or read book In-situ Materials Characterization written by Alexander Ziegler and published by Springer Science & Business Media. This book was released on 2014-04-01 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Glancing Angle Deposition of Thin Films

Author : Matthew M. Hawkeye
Publisher : John Wiley & Sons
ISBN 13 : 1118847334
Total Pages : 435 pages
Book Rating : 4.1/5 (188 download)

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Book Synopsis Glancing Angle Deposition of Thin Films by : Matthew M. Hawkeye

Download or read book Glancing Angle Deposition of Thin Films written by Matthew M. Hawkeye and published by John Wiley & Sons. This book was released on 2014-07-03 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a highly practical treatment of Glancing Angle Deposition (GLAD), a thin film fabrication technology optimized to produce precise nanostructures from a wide range of materials. GLAD provides an elegant method for fabricating arrays of nanoscale helices, chevrons, columns, and other porous thin film architectures using physical vapour deposition processes such as sputtering or evaporation. The book gathers existing procedures, methodologies, and experimental designs into a single, cohesive volume which will be useful both as a ready reference for those in the field and as a definitive guide for those entering it. It covers: Development and description of GLAD techniques for nanostructuring thin films Properties and characterization of nanohelices, nanoposts, and other porous films Design and engineering of optical GLAD films including fabrication and testing, and chiral films Post-deposition processing and integration to optimize film behaviour and structure Deposition systems and requirements for GLAD fabrication A patent survey, extensive relevant literature, and a survey of GLAD's wide range of material properties and diverse applications.

Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons

Author : Sunil K Sinha
Publisher : World Scientific
ISBN 13 : 9811231524
Total Pages : 430 pages
Book Rating : 4.8/5 (112 download)

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Book Synopsis Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons by : Sunil K Sinha

Download or read book Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons written by Sunil K Sinha and published by World Scientific. This book was released on 2021-03-23 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.

Microstructure and Properties of Micro- and Nanoscale Materials, Films, and Coatings (NAP 2019)

Author : Alexander D. Pogrebnjak
Publisher : Springer Nature
ISBN 13 : 9811517428
Total Pages : 407 pages
Book Rating : 4.8/5 (115 download)

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Book Synopsis Microstructure and Properties of Micro- and Nanoscale Materials, Films, and Coatings (NAP 2019) by : Alexander D. Pogrebnjak

Download or read book Microstructure and Properties of Micro- and Nanoscale Materials, Films, and Coatings (NAP 2019) written by Alexander D. Pogrebnjak and published by Springer Nature. This book was released on 2020-01-28 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the findings of experimental and theoretical (including first-principles molecular dynamics simulation) studies of nanostructured and nanocomposite metal-based materials, and nanoscale multilayer coatings fabricated by physical or chemical vapor deposition, magnetron sputtering, electrospark alloying, ionic layer absorption, contact melting, and high-current electron beam irradiation. It also discusses novel methods of nanocomposite formation, as well as the structure of the deposited films, coatings and other nanoscale materials, their elemental and phase composition, and their physical–mechanical, tribological, magnetic and electrical properties. Lastly, it explores the influence of a various surface modification methods, such as thermal annealing, pulsed laser modification, and thermomechanical and ultrasonic treatment, as well as different properties of nanostructured films.

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization

Author : Richard Haight
Publisher : World Scientific
ISBN 13 : 9814322849
Total Pages : 346 pages
Book Rating : 4.8/5 (143 download)

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Book Synopsis Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization by : Richard Haight

Download or read book Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization written by Richard Haight and published by World Scientific. This book was released on 2012 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.

Materials Characterization Techniques

Author : Sam Zhang
Publisher : CRC Press
ISBN 13 : 1420042955
Total Pages : 344 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Materials Characterization Techniques by : Sam Zhang

Download or read book Materials Characterization Techniques written by Sam Zhang and published by CRC Press. This book was released on 2008-12-22 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche

Microscopy Methods in Nanomaterials Characterization

Author : Sabu Thomas
Publisher : Elsevier
ISBN 13 : 0323461476
Total Pages : 434 pages
Book Rating : 4.3/5 (234 download)

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Book Synopsis Microscopy Methods in Nanomaterials Characterization by : Sabu Thomas

Download or read book Microscopy Methods in Nanomaterials Characterization written by Sabu Thomas and published by Elsevier. This book was released on 2017-05-17 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. - Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique - Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques - Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each

Thin Film Solar Cells

Author : Jef Poortmans
Publisher : John Wiley & Sons
ISBN 13 : 0470091266
Total Pages : 504 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Thin Film Solar Cells by : Jef Poortmans

Download or read book Thin Film Solar Cells written by Jef Poortmans and published by John Wiley & Sons. This book was released on 2006-10-16 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin-film solar cells are either emerging or about to emerge from the research laboratory to become commercially available devices finding practical various applications. Currently no textbook outlining the basic theoretical background, methods of fabrication and applications currently exist. Thus, this book aims to present for the first time an in-depth overview of this topic covering a broad range of thin-film solar cell technologies including both organic and inorganic materials, presented in a systematic fashion, by the scientific leaders in the respective domains. It covers a broad range of related topics, from physical principles to design, fabrication, characterization, and applications of novel photovoltaic devices.

Dissertation Abstracts International

Author :
Publisher :
ISBN 13 :
Total Pages : 946 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Dissertation Abstracts International by :

Download or read book Dissertation Abstracts International written by and published by . This book was released on 2008 with total page 946 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Introduction to Spectroscopic Ellipsometry of Thin Film Materials

Author : Andrew Thye Shen Wee
Publisher : John Wiley & Sons
ISBN 13 : 3527349510
Total Pages : 213 pages
Book Rating : 4.5/5 (273 download)

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Book Synopsis Introduction to Spectroscopic Ellipsometry of Thin Film Materials by : Andrew Thye Shen Wee

Download or read book Introduction to Spectroscopic Ellipsometry of Thin Film Materials written by Andrew Thye Shen Wee and published by John Wiley & Sons. This book was released on 2022-04-11 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

Handbook of Thin Films, Five-Volume Set

Author : Hari Singh Nalwa
Publisher : Academic Press
ISBN 13 : 0125129084
Total Pages : 661 pages
Book Rating : 4.1/5 (251 download)

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Book Synopsis Handbook of Thin Films, Five-Volume Set by : Hari Singh Nalwa

Download or read book Handbook of Thin Films, Five-Volume Set written by Hari Singh Nalwa and published by Academic Press. This book was released on 2001-10-29 with total page 661 pages. Available in PDF, EPUB and Kindle. Book excerpt: This five-volume handbook focuses on processing techniques, characterization methods, and physical properties of thin films (thin layers of insulating, conducting, or semiconductor material). The editor has composed five separate, thematic volumes on thin films of metals, semimetals, glasses, ceramics, alloys, organics, diamonds, graphites, porous materials, noncrystalline solids, supramolecules, polymers, copolymers, biopolymers, composites, blends, activated carbons, intermetallics, chalcogenides, dyes, pigments, nanostructured materials, biomaterials, inorganic/polymer composites, organoceramics, metallocenes, disordered systems, liquid crystals, quasicrystals, and layered structures. Thin films is a field of the utmost importance in today's materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices. Advanced, high-performance computers, high-definition TV, digital camcorders, sensitive broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are but a few examples of miniaturized device technologies that depend the utilization of thin film materials. The Handbook of Thin Films Materials is a comprehensive reference focusing on processing techniques, characterization methods, and physical properties of these thin film materials.

Nanostructured Thin Films

Author : Maria Benelmekki
Publisher : Elsevier
ISBN 13 : 0081025734
Total Pages : 336 pages
Book Rating : 4.0/5 (81 download)

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Book Synopsis Nanostructured Thin Films by : Maria Benelmekki

Download or read book Nanostructured Thin Films written by Maria Benelmekki and published by Elsevier. This book was released on 2019-08-25 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanostructured Thin Films: Fundamentals and Applications presents an overview of the synthesis and characterization of thin films and their nanocomposites. Both vapor phase and liquid phase approaches are discussed, along with the methods that are sufficiently attractive for large-scale production. Examples of applications in clean energy, sensors, biomedicine, anticorrosion and surface modification are also included. As the applications of thin films in nanomedicine, cell phones, solar cell-powered devices, and in the protection of structural materials continues to grow, this book presents an important research reference for anyone seeking an informed overview on their structure and applications. - Shows how thin films are being used to create more efficient devices in the fields of medicine and energy harvesting - Discusses how to alter the design of nanostructured thin films by vapor phase and liquid phase methods - Explores how modifying the structure of thin films for specific applications enhances their performance

Nanostructured Materials and Their Applications

Author : Stergios Logothetidis
Publisher : Springer
ISBN 13 : 9783642448218
Total Pages : 0 pages
Book Rating : 4.4/5 (482 download)

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Book Synopsis Nanostructured Materials and Their Applications by : Stergios Logothetidis

Download or read book Nanostructured Materials and Their Applications written by Stergios Logothetidis and published by Springer. This book was released on 2014-02-22 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gives an overview of nanostructures and nanomaterials applied in the fields of energy and organic electronics. It combines the knowledge from advanced deposition and processing methods of nanomaterials such as laser-based growth and nanopatterning and state-of-the-art characterization techniques with special emphasis on the optical, electrical, morphological, surface and mechanical properties. Furthermore it contains theoretical and experimental aspects for different types of nanomaterials such as nanoparticles, nanotubes and thin films for organic electronics applications. The international group of authors specifically chosen for their distinguished expertise belong to the academic and industrial world in order to provide a broader perspective. The authors take an interdisciplinary approach of physics, chemistry, engineering, materials science and nanotechnology. It appeals to researchers and graduate students.

Nanoscale Ferroelectrics and Multiferroics

Author : Miguel Alguero
Publisher : John Wiley & Sons
ISBN 13 : 1118935756
Total Pages : 994 pages
Book Rating : 4.1/5 (189 download)

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Book Synopsis Nanoscale Ferroelectrics and Multiferroics by : Miguel Alguero

Download or read book Nanoscale Ferroelectrics and Multiferroics written by Miguel Alguero and published by John Wiley & Sons. This book was released on 2016-05-31 with total page 994 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dieses Buch beleuchtet die wichtigsten Aspekte der Verarbeitung und Charakterisierung von Ferroelektrika und Multiferroika auf Nanoebene, präsentiert eine umfassende Beschreibung der jeweiligen Eigenschaften und legt dabei den Schwerpunkt auf die Unterscheidung von Größeneffekten bei extrinsischen Eigenschaften wie Rand- oder Interface-Effekte. Eingegangen wird auch auf neuartige Nanoebene. Das Fachbuch ist in drei Abschnitte unterteilt und beschreibt die Verarbeitung (Nanostrukturierung), Charakterisierung (nanostrukturierter Materialien) und Nanoeffekte. Unter Rückgriff auf die Synergien zwischen Nano-Ferroelektrika und -Multiferroika werden Materialien behandelt, die auf allen Ebenen einer Nanostrukturierung unterzogen werden, von Technologien für keramische Materialien wie ferroelektrische Nanopulver, nanostrukturierte Keramiken und Dickschichten sowie magnetoelektrische Nanokomposit-Materialien bis hin zu freistehenden Nanoobjekten mit spezifischen Geometrien wie Nanodrähte und Nanoröhren auf verschiedenen Entwicklungsstufen. Grundlage des Buches ist die europäische Wissensplattform im Wissenschaftsbereich innerhalb der Aktion von COST (Europäische Zusammenarbeit in Wissenschaft und Technik) zu ein- und mehrphasigen Ferroika und Multiferroika mit begrenzten Geometrien (SIMUFER, Ref. MP0904). Die Autoren der Kapitelbeiträge wurden sorgfältig ausgewählt, haben allesamt ganz wesentlich zur Wissensbasis für das jeweilige Thema beigetragen und gehören vor allem zu den renommiertesten Wissenschaftlern des Fachgebiets.