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Author : Jay N. Zemel
Publisher :
ISBN 13 :
Total Pages : 782 pages
Book Rating : 4.:/5 (636 download)
Download or read book Nondestructive Evaluation of Semiconductor Materials and Devices written by Jay N. Zemel and published by . This book was released on 1979 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zemel JN Ed
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (985 download)
Download or read book Nondestructive Evaluation of Semiconductor Materials and Devices written by Zemel JN Ed and published by . This book was released on 1979 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Zemel
Publisher : Springer Science & Business Media
ISBN 13 : 1475713525
Total Pages : 791 pages
Book Rating : 4.4/5 (757 download)
Download or read book Nondestructive Evaluation of Semiconductor Materials and Devices written by J. Zemel and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 791 pages. Available in PDF, EPUB and Kindle. Book excerpt: From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
Author : J. N. Zemel
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (5 download)
Download or read book Non-destructive Evaluation of Semiconductor Materials and Devices written by J. N. Zemel and published by . This book was released on 1978 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : R. D. Larrabee
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (951 download)
Download or read book Nondestructive Evaluation Activities in the Semiconductor Materials and Processes Division written by R. D. Larrabee and published by . This book was released on 1986 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : George G. Harman
Publisher :
ISBN 13 :
Total Pages : 80 pages
Book Rating : 4.:/5 (31 download)
Download or read book Nondestructive Tests Used to Insure the Integrity of Semiconductor Devices, with Emphasis on Acoustic Emission Techniques written by George G. Harman and published by . This book was released on 1979 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Joseph S. Heyman
Publisher : Elsevier
ISBN 13 : 0815517009
Total Pages : 145 pages
Book Rating : 4.8/5 (155 download)
Download or read book Electronics Reliability and Measurement Technology written by Joseph S. Heyman and published by Elsevier. This book was released on 1998-12-31 with total page 145 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Author :
Publisher :
ISBN 13 :
Total Pages : 684 pages
Book Rating : 4.F/5 ( download)
Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 684 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 572 pages
Book Rating : 4.:/5 (31 download)
Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1980 with total page 572 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 548 pages
Book Rating : 4.3/5 (91 download)
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 548 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 680 pages
Book Rating : 4.:/5 (31 download)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1981 with total page 680 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : 国立国会図書館 (Japan)
Publisher :
ISBN 13 :
Total Pages : 672 pages
Book Rating : 4.F/5 ( download)
Download or read book 国立国会図書館所蔵科学技術関係欧文会議錄目錄 written by 国立国会図書館 (Japan) and published by . This book was released on 1972 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Bernd O. Kolbesen (Chemiker.)
Publisher : The Electrochemical Society
ISBN 13 : 9781566772396
Total Pages : 568 pages
Book Rating : 4.7/5 (723 download)
Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes written by Bernd O. Kolbesen (Chemiker.) and published by The Electrochemical Society. This book was released on 1999 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 540 pages
Book Rating : 4.:/5 (42 download)
Download or read book Publications of the National Bureau of Standards ... Catalog written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : R S Sharpe
Publisher : Butterworth-Heinemann
ISBN 13 : 148316408X
Total Pages : 492 pages
Book Rating : 4.4/5 (831 download)
Download or read book Quality Technology Handbook written by R S Sharpe and published by Butterworth-Heinemann. This book was released on 2017-03-28 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quality Technology Handbook, Fourth Edition offers a wide discussion on technology and its related subtopics. After giving some information on its background, content, and authors, the book then informs the readers about the quality problem check-list and enumerates the questions one has to ask to ensure that a problem will be solved. This part is followed by a discussion on non-destructive testing (NDT) and the several committees formed for it, among which are the British National Committee and the Harwell NDT Center. The book also includes information on two organizations that are closely related to the topic, the Institute of Quality Assurance (IQA) and The Welding Institute (TWI). A directory of international organizations related to quality assurance and non-destructive testing is provided in the latter part of the text. The book serves as valuable reference to undergraduates or postgraduates of courses that are related to science and technology.
Author : Peter J. Shull
Publisher : CRC Press
ISBN 13 : 9780203911068
Total Pages : 880 pages
Book Rating : 4.9/5 (11 download)
Download or read book Nondestructive Evaluation written by Peter J. Shull and published by CRC Press. This book was released on 2002-05-08 with total page 880 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describing NDE issues associated with real-world applications, this comprehensive book details conventional and forthcoming NDE technologies. It instructs on current practices, common techniques and equipment applications, and the potentials and limitations of current NDE methods. Each chapter details a different method, providing an overview, an e
