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Author : Frank F. Tsui
Publisher : McGraw-Hill Companies
ISBN 13 :
Total Pages : 730 pages
Book Rating : 4.3/5 (91 download)
Download or read book LSI/VLSI Testability Design written by Frank F. Tsui and published by McGraw-Hill Companies. This book was released on 1987 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : John Turino
Publisher : Springer Science & Business Media
ISBN 13 : 9401160449
Total Pages : 334 pages
Book Rating : 4.4/5 (11 download)
Download or read book Design to Test written by John Turino and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.
Author : Wayne M. Needham
Publisher : Springer Science & Business Media
ISBN 13 : 9780442002213
Total Pages : 336 pages
Book Rating : 4.0/5 (22 download)
Download or read book Designer's Guide to Testable Asic Devices written by Wayne M. Needham and published by Springer Science & Business Media. This book was released on 1991-01-10 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyrighted by Book News, Inc., Portland, OR
Author : Erik Larsson
Publisher : Springer Science & Business Media
ISBN 13 : 0387256245
Total Pages : 397 pages
Book Rating : 4.3/5 (872 download)
Download or read book Introduction to Advanced System-on-Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author : P. Antognetti
Publisher : Springer Science & Business Media
ISBN 13 : 9401180067
Total Pages : 543 pages
Book Rating : 4.4/5 (11 download)
Download or read book Computer Design Aids for VLSI Circuits written by P. Antognetti and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Nato Advanced Study Institute on "Computer Design Aids for VLSI Circuits" was held from July 21 to August 1, 1980 at Sogesta, Urbino, Italy. Sixty-three carefully chosen profes sionals were invited to participate in this institute together with 12 lecturers and 7 assistants. The 63 participants were selected from a group of almost 140 applicants. Each had the background to learn effectively the set of computer IC design aids which were presented. Each also had individual expertise in at least one of the topics of the Institute. The Institute was designed to provide hands-on type of experience rather than consisting of solely lecture and discussion. Each morning, detailed presentations were made concerning the critical algorithms that are used in the various types of computer IC design aids. Each afternoon a lengthy period was used to provide the participants with direct access to the computer programs. In addition to using the programs, the individual could, if his expertise was sufficient, make modifications of and extensions to the programs, or establish limitations of these present aids. The interest in this hands-on activity was very high and many participants worked with the programs every free hour. The editors would like to thank the Direction of SOGESTA for the excellent facilities, ~1r. R. Riccioni of the SOGESTA Computer Center and Mr. 11. Vanzi of the University of Genova for enabling all the programs to run smoothly on the set date. P.Antognetti D.O.Pederson Urbino, Summer 1980.
Author : Egon Hörbst
Publisher : Springer Science & Business Media
ISBN 13 : 3642955258
Total Pages : 328 pages
Book Rating : 4.6/5 (429 download)
Download or read book Design of VLSI Circuits written by Egon Hörbst and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microelectronics are certainly one of the key-technologies of our time. They are a key factor of technological and economic progress. They effect the fields of automation, information and communication, leading to the development of new applications and markets. Attention should be focused on three areas of development: • process and production technology, • test technology, • design technology. Clearly, because of the development of new application fields, the skill ~f design ing integrated circuits should not be limited to a few, highly specialized experts Rather, this ability should be made available to all system aDd design engineers as a new application technology - just like nrogramrning technology for software. For this reason, design procedures havt: to be developed which, supported by appropriate CAD systems, provide the desIgn englIl~I' with tools for representaltop effective instruments for design and reliable ·tools for verificatibn, ensuring simpre, proper and easily controllable interfaces for the manufacturing and test processes. Such CAD systems are called standard design systems. They open the way to fast and safe design of integrated circuits. First, this book demonstrates basic principles with an example of the Siemens design system VENUS, gives a general introduction to the method of designing integrated circuits, familiarizes the reader with basic semiconductor and circuit tech nologies, shows the various methods of layout design, and presents necessary con cepts and strategies of test technology.
Author :
Publisher :
ISBN 13 :
Total Pages : 892 pages
Book Rating : 4.:/5 (31 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 892 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Dirk Jansen
Publisher : Springer Science & Business Media
ISBN 13 : 0387735437
Total Pages : 672 pages
Book Rating : 4.3/5 (877 download)
Download or read book The Electronic Design Automation Handbook written by Dirk Jansen and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt: When I attended college we studied vacuum tubes in our junior year. At that time an average radio had ?ve vacuum tubes and better ones even seven. Then transistors appeared in 1960s. A good radio was judged to be one with more thententransistors. Latergoodradioshad15–20transistors and after that everyone stopped counting transistors. Today modern processors runing personal computers have over 10milliontransistorsandmoremillionswillbeaddedevery year. The difference between 20 and 20M is in complexity, methodology and business models. Designs with 20 tr- sistors are easily generated by design engineers without any tools, whilst designs with 20M transistors can not be done by humans in reasonable time without the help of Prof. Dr. Gajski demonstrates the Y-chart automation. This difference in complexity introduced a paradigm shift which required sophisticated methods and tools, and introduced design automation into design practice. By the decomposition of the design process into many tasks and abstraction levels the methodology of designing chips or systems has also evolved. Similarly, the business model has changed from vertical integration, in which one company did all the tasks from product speci?cation to manufacturing, to globally distributed, client server production in which most of the design and manufacturing tasks are outsourced.
Author : Fevzi Belli
Publisher : Springer Science & Business Media
ISBN 13 : 3642456286
Total Pages : 401 pages
Book Rating : 4.6/5 (424 download)
Download or read book Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems written by Fevzi Belli and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dieser Band enthält die 38 Beiträge der 3. GI/ITG/GMA-Fachtagung über "Fehlertolerierende Rechensysteme". Unter den 10 aus dem Ausland eingegangenen Beiträgen sind 4 eingeladene Vorträge. Insgesamt dokumentiert dieser Tagungsband die Entwicklung der Konzeption und Implementierung fehlertoleranter Systeme in den letzten drei Jahren vor allem in Europa. Sämtliche Beiträge sind neue Forschungs- oder Entwicklungsergebnisse, die vom Programmausschuß der Tagung aus 70 eingereichten Beiträgen ausgewählt wurden.
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : M. Abadir
Publisher : Springer Science & Business Media
ISBN 13 : 147575048X
Total Pages : 181 pages
Book Rating : 4.4/5 (757 download)
Download or read book Economics of Electronic Design, Manufacture and Test written by M. Abadir and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 181 pages. Available in PDF, EPUB and Kindle. Book excerpt: The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.
Author :
Publisher :
ISBN 13 :
Total Pages : 644 pages
Book Rating : 4.:/5 (39 download)
Download or read book Research in Progress written by and published by . This book was released on 1983 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. Army Research Office
Publisher :
ISBN 13 :
Total Pages : 284 pages
Book Rating : 4.3/5 (91 download)
Download or read book Research in Progress written by United States. Army Research Office and published by . This book was released on 1984 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vols. for 1977- consist of two parts: Chemistry, biological sciences, engineering sciences, metallurgy and materials science (issued in the spring); and Physics, electronics, mathematics, geosciences (issued in the fall).
Author : Hurst
Publisher : CRC Press
ISBN 13 : 9780824773021
Total Pages : 394 pages
Book Rating : 4.7/5 (73 download)
Download or read book Custom-Specific Integrated Circuits written by Hurst and published by CRC Press. This book was released on 1985-03-27 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the semiconductor industry, cutting basic design time of microelectronics is by far the most cost-effective measure for keeping production budgets in line. Custom-Specific Integrated Circuits thoroughly considers the various methods available to reduce the design time of a microelectronic circuit to fit a specialized requirement! This important work explores the principles of both bipolar and MOS technologies, and provides in-depth coverage of the many avenues which enable system designers to incorporate specific needs into an integrated-circuit form. Comprehensive and up-to-date, this reference compares and contrasts all the techniques of custom an semicustom design and fabrication, including programmable arrays, masterslice arrays, cell libraries, and full custom ... examines the principles of placement and routing of regular structures ... presents convenient chapter summaries for quick review of essential material ... and offers physics fundamentals for basic understanding while concentrating on practical system design. Ideal for both the practicing engineer and graduate-level engineering student, this outstanding book gives electrical, electronic, design, computer, mechanical, and control engineers, as well as electrical, electronic, and computer science engineering students, the contemporary, "hands-on" coverage needed to master Custom-Specific Integrated Circuits. Book jacket.
Author : Daniel Siewiorek
Publisher : Digital Press
ISBN 13 : 1483297438
Total Pages : 929 pages
Book Rating : 4.4/5 (832 download)
Download or read book Reliable Computer Systems written by Daniel Siewiorek and published by Digital Press. This book was released on 2014-06-28 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Author : George W. Zobrist
Publisher : Praeger
ISBN 13 :
Total Pages : 216 pages
Book Rating : 4.3/5 (91 download)
Download or read book VLSI Fault Modeling and Testing Techniques written by George W. Zobrist and published by Praeger. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.
Author : Samiha Mourad
Publisher : John Wiley & Sons
ISBN 13 : 9780471319313
Total Pages : 444 pages
Book Rating : 4.3/5 (193 download)
Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references
