Design To Test

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Design to Test

Author : John Turino
Publisher : Springer Science & Business Media
ISBN 13 : 9401160449
Total Pages : 368 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Design to Test by : John Turino

Download or read book Design to Test written by John Turino and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.

A Practitioner's Guide to Software Test Design

Author : Lee Copeland
Publisher : Artech House
ISBN 13 : 9781580537322
Total Pages : 328 pages
Book Rating : 4.5/5 (373 download)

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Book Synopsis A Practitioner's Guide to Software Test Design by : Lee Copeland

Download or read book A Practitioner's Guide to Software Test Design written by Lee Copeland and published by Artech House. This book was released on 2004 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.

Design Driven Testing

Author : Matt Stephens
Publisher : Apress
ISBN 13 : 1430229446
Total Pages : 359 pages
Book Rating : 4.4/5 (32 download)

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Book Synopsis Design Driven Testing by : Matt Stephens

Download or read book Design Driven Testing written by Matt Stephens and published by Apress. This book was released on 2011-01-11 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: The groundbreaking book Design Driven Testing brings sanity back to the software development process by flipping around the concept of Test Driven Development (TDD)—restoring the concept of using testing to verify a design instead of pretending that unit tests are a replacement for design. Anyone who feels that TDD is “Too Damn Difficult” will appreciate this book. Design Driven Testing shows that, by combining a forward-thinking development process with cutting-edge automation, testing can be a finely targeted, business-driven, rewarding effort. In other words, you’ll learn how to test smarter, not harder. Applies a feedback-driven approach to each stage of the project lifecycle. Illustrates a lightweight and effective approach using a core subset of UML. Follows a real-life example project using Java and Flex/ActionScript. Presents bonus chapters for advanced DDTers covering unit-test antipatterns (and their opposite, “test-conscious” design patterns), and showing how to create your own test transformation templates in Enterprise Architect.

Practical Test Design

Author : Istvan Forgacs
Publisher : BCS, The Chartered Institute for IT
ISBN 13 : 9781780174723
Total Pages : 336 pages
Book Rating : 4.1/5 (747 download)

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Book Synopsis Practical Test Design by : Istvan Forgacs

Download or read book Practical Test Design written by Istvan Forgacs and published by BCS, The Chartered Institute for IT. This book was released on 2019-08-28 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the key test design techniques, in line with ISTQB, and explains the why and when of using them, with practical examples and code snippets. How and why the techniques can be combined is covered, as are automated test design methods. Tips and exercises are included throughout the book.

VLSI Test Principles and Architectures

Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 9780080474793
Total Pages : 808 pages
Book Rating : 4.4/5 (747 download)

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Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Essential Software Test Design

Author : Torbjörn Ryber
Publisher :
ISBN 13 : 9789185699032
Total Pages : 292 pages
Book Rating : 4.6/5 (99 download)

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Book Synopsis Essential Software Test Design by : Torbjörn Ryber

Download or read book Essential Software Test Design written by Torbjörn Ryber and published by . This book was released on 2007-12-01 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: The author is a true test enthusiast who has spoken to several thousand people about testing. The book is the result from many years of teaching test design with the goal of creating a highly useful testbook. It is full of examples from the real world and contains exercises for most of the techniques described. It can be used as class-material or for self studies. From the forewords: This book focuses on test design, and I am glad it does. Design is the intellectual part of testing. It is the puzzle solving part. (James Bach) In this book Torbjorn Ryber has managed to produce a text that is not only useful, but also concise and to-the-point. dEspite beeing kept to a sensible length it still manages to include guest chapters and material from renowned experts in areas such as exploratory testing and combinatorial testing, and understanding is greatly enhanced by the widespreaduse of examples that clearly demonstrates the application of the techniques. (Stuart Reid)

Linear Models for Optimal Test Design

Author : Wim J. van der Linden
Publisher : Springer Science & Business Media
ISBN 13 : 0387290540
Total Pages : 421 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Linear Models for Optimal Test Design by : Wim J. van der Linden

Download or read book Linear Models for Optimal Test Design written by Wim J. van der Linden and published by Springer Science & Business Media. This book was released on 2006-01-01 with total page 421 pages. Available in PDF, EPUB and Kindle. Book excerpt: Wim van der Linden was just given a lifetime achievement award by the National Council on Measurement in Education. There is no one more prominent in the area of educational testing. There are hundreds of computer-based credentialing exams in areas such as accounting, real estate, nursing, and securities, as well as the well-known admissions exams for college, graduate school, medical school, and law school - there is great need on the theory of testing. This book presents the statistical theory and practice behind constructing good tests e.g., how is the first test item selected, how are the next items selected, and when do you have enough items.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Author : Jose Luis Huertas Díaz
Publisher : Springer Science & Business Media
ISBN 13 : 0387235213
Total Pages : 310 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Test and Design-for-Testability in Mixed-Signal Integrated Circuits by : Jose Luis Huertas Díaz

Download or read book Test and Design-for-Testability in Mixed-Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Digital System Test and Testable Design

Author : Zainalabedin Navabi
Publisher : Springer Science & Business Media
ISBN 13 : 1441975489
Total Pages : 435 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Digital System Test and Testable Design by : Zainalabedin Navabi

Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Author : Brandon Noia
Publisher : Springer Science & Business Media
ISBN 13 : 3319023780
Total Pages : 245 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs by : Brandon Noia

Download or read book Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs written by Brandon Noia and published by Springer Science & Business Media. This book was released on 2013-11-19 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

VLSI Design and Test for Systems Dependability

Author : Shojiro Asai
Publisher : Springer
ISBN 13 : 4431565949
Total Pages : 800 pages
Book Rating : 4.4/5 (315 download)

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Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai

Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Introduction to Advanced System-on-Chip Test Design and Optimization

Author : Erik Larsson
Publisher : Springer Science & Business Media
ISBN 13 : 0387256245
Total Pages : 388 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Introduction to Advanced System-on-Chip Test Design and Optimization by : Erik Larsson

Download or read book Introduction to Advanced System-on-Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

High Performance Memory Testing

Author : R. Dean Adams
Publisher : Springer Science & Business Media
ISBN 13 : 0306479729
Total Pages : 250 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis High Performance Memory Testing by : R. Dean Adams

Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Performance Assessments for Adult Education

Author : National Research Council
Publisher : National Academies Press
ISBN 13 : 0309084539
Total Pages : 132 pages
Book Rating : 4.3/5 (9 download)

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Book Synopsis Performance Assessments for Adult Education by : National Research Council

Download or read book Performance Assessments for Adult Education written by National Research Council and published by National Academies Press. This book was released on 2002-08-01 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the United States, the nomenclature of adult education includes adult literacy, adult secondary education, and English for speakers of other languages (ESOL) services provided to undereducated and limited English proficient adults. Those receiving adult education services have diverse reasons for seeking additional education. With the passage of the WIA, the assessment of adult education students became mandatory-regardless of their reasons for seeking services. The law does allow the states and local programs flexibility in selecting the most appropriate assessment for the student. The purpose of the NRC's workshop was to explore issues related to efforts to measure learning gains in adult basic education programs, with a focus on performance-based assessments.

Rapid Test

Author : Laura Anfossi
Publisher : BoD – Books on Demand
ISBN 13 : 178923901X
Total Pages : 104 pages
Book Rating : 4.7/5 (892 download)

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Book Synopsis Rapid Test by : Laura Anfossi

Download or read book Rapid Test written by Laura Anfossi and published by BoD – Books on Demand. This book was released on 2018-09-26 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rapid tests, also known as point-of-care tests, have been in use for decades in the clinical and medical area and have become increasingly popular as an efficient screening method for conducting on-site analysis thanks to their simplicity, speed, specificity and sensitivity. Nowadays, rapid tests are widely applied for clinical, drug, food, forensic and environmental analysis and fields of application are rapidly increasing together with advances in the technology. The growing interest in rapid tests and their expanding application in diverse fields, together with requirements of improved sensitivity, reliability, multiple detection capacity and robustness, are prompting innovation in the design of novel platforms, and in the exploitation of innovative detection strategies. The book covers advances in materials, technology and test design.

Design and Test Technology for Dependable Systems-on-chip

Author : Raimund Ubar
Publisher : IGI Global
ISBN 13 : 9781609602123
Total Pages : 0 pages
Book Rating : 4.6/5 (21 download)

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Book Synopsis Design and Test Technology for Dependable Systems-on-chip by : Raimund Ubar

Download or read book Design and Test Technology for Dependable Systems-on-chip written by Raimund Ubar and published by IGI Global. This book was released on 2011 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

System-on-Chip Test Architectures

Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 9780080556802
Total Pages : 896 pages
Book Rating : 4.5/5 (568 download)

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Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang

Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.