High Resolution Electron Microscopy of Defects in Materials: Volume 183

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Publisher : Pittsburgh, Pa. : Materials Research Society
ISBN 13 :
Total Pages : 424 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis High Resolution Electron Microscopy of Defects in Materials: Volume 183 by : Materials Research Society

Download or read book High Resolution Electron Microscopy of Defects in Materials: Volume 183 written by Materials Research Society and published by Pittsburgh, Pa. : Materials Research Society. This book was released on 1990-08-10 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

High Resolution Electron Microscopy of Defects in Materials:

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Author :
Publisher : Cambridge University Press
ISBN 13 : 9781107410152
Total Pages : 418 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis High Resolution Electron Microscopy of Defects in Materials: by : Robert Sinclair

Download or read book High Resolution Electron Microscopy of Defects in Materials: written by Robert Sinclair and published by Cambridge University Press. This book was released on 2014-06-05 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Handbook of Microscopy for Nanotechnology

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Publisher : Springer Science & Business Media
ISBN 13 : 9781402080036
Total Pages : 772 pages
Book Rating : 4.0/5 (8 download)

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Book Synopsis Handbook of Microscopy for Nanotechnology by : Nan Yao

Download or read book Handbook of Microscopy for Nanotechnology written by Nan Yao and published by Springer Science & Business Media. This book was released on 2005-03-21 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Stability of Materials

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Publisher : Springer Science & Business Media
ISBN 13 : 1461303850
Total Pages : 742 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Stability of Materials by : A. Gonis

Download or read book Stability of Materials written by A. Gonis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Engineering materials with desirable physical and technological properties requires understanding and predictive capability of materials behavior under varying external conditions, such as temperature and pressure. This immediately brings one face to face with the fundamental difficulty of establishing a connection between materials behavior at a microscopic level, where understanding is to be sought, and macroscopic behavior which needs to be predicted. Bridging the corresponding gap in length scales that separates the ends of this spectrum has been a goal intensely pursued by theoretical physicists, experimentalists, and metallurgists alike. Traditionally, the search for methods to bridge the length scale gap and to gain the needed predictive capability of materials properties has been conducted largely on a trial and error basis, guided by the skill of the metallurgist, large volumes of experimental data, and often ad hoc semi phenomenological models. This situation has persisted almost to this day, and it is only recently that significant changes have begun to take place. These changes have been brought about by a number of developments, some of long standing, others of more recent vintage.

纳米技术中的显微学手册

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Publisher : 清华大学出版社有限公司
ISBN 13 : 9787302097587
Total Pages : 440 pages
Book Rating : 4.0/5 (975 download)

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Book Synopsis 纳米技术中的显微学手册 by :

Download or read book 纳米技术中的显微学手册 written by and published by 清华大学出版社有限公司. This book was released on 2005 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: 本书叙述了电子显微学的内容,共有12个专题。力图使读者对所叙述的方法有一个概念上的理解,而不是只停留在对理论的堆砌上。

High Tc Superconductor Materials

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Publisher : Elsevier
ISBN 13 : 0444596674
Total Pages : 755 pages
Book Rating : 4.4/5 (445 download)

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Book Synopsis High Tc Superconductor Materials by : E. Kaldis

Download or read book High Tc Superconductor Materials written by E. Kaldis and published by Elsevier. This book was released on 2012-12-02 with total page 755 pages. Available in PDF, EPUB and Kindle. Book excerpt: The dynamic developments in high-temperature superconductivity over the last three years has augmented the importance of materials research not only for applications, but also for the understanding of underlying physical phenomena. The discovery of new superconductors has opened up new facets of High Tc research, and the perfection of already known materials has enabled reliable physical measurements to be carried out, providing a foundation for theoretical models. The papers in this volume present an overview of the recent developments in the field of High Tc-materials research. One of the highlights of this meeting was the plenary lecture by the Nobel laureate K. Alex Müller on the importance of the apical oxygen phenomena which are strongly connected with Tc changes.

Proceedings of the Second Symposium on Defects in Silicon

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Publisher :
ISBN 13 :
Total Pages : 716 pages
Book Rating : 4.:/5 (44 download)

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Book Synopsis Proceedings of the Second Symposium on Defects in Silicon by : W. Murray Bullis

Download or read book Proceedings of the Second Symposium on Defects in Silicon written by W. Murray Bullis and published by . This book was released on 1991 with total page 716 pages. Available in PDF, EPUB and Kindle. Book excerpt:

High Resolution Microscopy of Materials: Volume 139

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Publisher :
ISBN 13 :
Total Pages : 426 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis High Resolution Microscopy of Materials: Volume 139 by : William Krakow

Download or read book High Resolution Microscopy of Materials: Volume 139 written by William Krakow and published by . This book was released on 1989-09-12 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

High-Resolution Electron Microscopy

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Publisher : Oxford University Press
ISBN 13 : 0199552754
Total Pages : 425 pages
Book Rating : 4.1/5 (995 download)

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Book Synopsis High-Resolution Electron Microscopy by : John C. H. Spence

Download or read book High-Resolution Electron Microscopy written by John C. H. Spence and published by Oxford University Press. This book was released on 2009 with total page 425 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.

In-situ Electron Microscopy at High Resolution

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Publisher : World Scientific
ISBN 13 : 9812797335
Total Pages : 318 pages
Book Rating : 4.8/5 (127 download)

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Book Synopsis In-situ Electron Microscopy at High Resolution by : Florian Banhart

Download or read book In-situ Electron Microscopy at High Resolution written by Florian Banhart and published by World Scientific. This book was released on 2008 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

Multicomponent and Multilayered Thin Films for Advanced Microtechnologies: Techniques, Fundamentals and Devices

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Publisher : Springer Science & Business Media
ISBN 13 : 9401117276
Total Pages : 625 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Multicomponent and Multilayered Thin Films for Advanced Microtechnologies: Techniques, Fundamentals and Devices by : O. Auciello

Download or read book Multicomponent and Multilayered Thin Films for Advanced Microtechnologies: Techniques, Fundamentals and Devices written by O. Auciello and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 625 pages. Available in PDF, EPUB and Kindle. Book excerpt: The synthesis of multicomponent/multilayered superconducting, conducting, semiconducting and insulating thin films has become the subject of an intensive, worldwide, interdisciplinary research effort. The development of deposition-characterization techniques and the science and technology related to the synthesis of these films are critical for the successful evolution of this interdisciplinary field of research and the implementation of the new materials in a whole new generation of advanced microdevices. This book contains the lectures and contributed papers on various scientific and technological aspects of multicomponent and multilayered thin films presented at a NATO/ASI. Compared to other recent books on thin films, the distinctive character of this book is the interdisciplinary treatment of the various fields of research related to the different thin film materials mentioned above. The wide range of topics discussed in this book include vacuum-deposition techniques, synthesis-processing, characterization, and devices of multicomponent/multilayered oxide high temperature superconducting, ferroelectric, electro-optic, optical, metallic, silicide, and compound semiconductor thin films. The book presents an unusual intedisciplinary exchange of ideas between researchers with cross-disciplinary backgrounds and it will be useful to established investigators as well as postdoctoral and graduate students.

Specimen Preparation for Transmission Electron Microscopy of Materials II

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Publisher :
ISBN 13 : 9781558990883
Total Pages : 384 pages
Book Rating : 4.9/5 (98 download)

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Book Synopsis Specimen Preparation for Transmission Electron Microscopy of Materials II by : Ron M. Anderson

Download or read book Specimen Preparation for Transmission Electron Microscopy of Materials II written by Ron M. Anderson and published by . This book was released on 1990 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in Materials Problem Solving with the Electron Microscope: Volume 589

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Publisher :
ISBN 13 :
Total Pages : 432 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Advances in Materials Problem Solving with the Electron Microscope: Volume 589 by : Jim Bentley

Download or read book Advances in Materials Problem Solving with the Electron Microscope: Volume 589 written by Jim Bentley and published by . This book was released on 2001 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Advanced Tomographic Imaging Methods for the Analysis of Materials: Volume 217

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Publisher : Mrs Proceedings
ISBN 13 :
Total Pages : 250 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Advanced Tomographic Imaging Methods for the Analysis of Materials: Volume 217 by : Jerome L. Ackerman

Download or read book Advanced Tomographic Imaging Methods for the Analysis of Materials: Volume 217 written by Jerome L. Ackerman and published by Mrs Proceedings. This book was released on 1991-08-30 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Fiber-Reinforced Cementitious Materials: Volume 211

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Publisher : Mrs Proceedings
ISBN 13 :
Total Pages : 320 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Fiber-Reinforced Cementitious Materials: Volume 211 by : Sidney Mindess

Download or read book Fiber-Reinforced Cementitious Materials: Volume 211 written by Sidney Mindess and published by Mrs Proceedings. This book was released on 1991-05-31 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Atomic Scale Calculations of Structure in Materials: Volume 193

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Publisher : Mrs Proceedings
ISBN 13 :
Total Pages : 392 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Atomic Scale Calculations of Structure in Materials: Volume 193 by : Murray S. Daw

Download or read book Atomic Scale Calculations of Structure in Materials: Volume 193 written by Murray S. Daw and published by Mrs Proceedings. This book was released on 1990-09-28 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Interfaces in Materials

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Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 552 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Interfaces in Materials by : James M. Howe

Download or read book Interfaces in Materials written by James M. Howe and published by Wiley-Interscience. This book was released on 1997-02-27 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: A thorough exploration of the atomic structures and properties of the essential engineering interfaces—an invaluable resource for students, teachers, and professionals The most up-to-date, accessible guide to solid-vapor, solid-liquid, and solid-solid phase transformations, this innovative book contains the only unified treatment of these three central engineering interfaces. Employing a simple nearest-neighbor broken-bond model, Interfaces in Materials focuses on metal alloys in a straightforward approach that can be easily extended to all types of interfaces and materials. Enhanced with nearly 300 illustrations, along with extensive references and suggestions for further reading, this book provides: A simple, cohesive approach to understanding the atomic structure and properties of interfaces formed between solid, liquid, and vapor phases Self-contained discussions of each interface—allowing separate study of each phase transformation A comparative look at the different interfaces, including atomic structure and crystallography; anisotropy, roughening, and melting; interfacial stability and segregation; continuous and ledge growth models; and atomistic modeling An analysis of nearest-neighbor broken-bond results against thermodynamic and kinetic descriptions of the interfaces Problem sets at the end of each chapter, emphasizing the key concepts detailed in the text Spanning the fields of chemical, electrical and computer engineering, materials science, solid-state physics, and microscopy, Interfaces in Materials bridges a major gap in the literature of surface and interface science.