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Evolution Of Surface And Thin Film Microstructure
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Book Synopsis Evolution of Surface and Thin Film Microstructure: Volume 280 by : Harry A. Atwater
Download or read book Evolution of Surface and Thin Film Microstructure: Volume 280 written by Harry A. Atwater and published by Mrs Proceedings. This book was released on 1993-10-27 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Evolution of Thin Film Morphology by : Matthew Pelliccione
Download or read book Evolution of Thin Film Morphology written by Matthew Pelliccione and published by Springer Science & Business Media. This book was released on 2008-01-29 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt: The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes.
Book Synopsis Evolution of Thin Film and Surface Microstructure: Volume 202 by : C. V. Thompson
Download or read book Evolution of Thin Film and Surface Microstructure: Volume 202 written by C. V. Thompson and published by . This book was released on 1991-05-31 with total page 770 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Evolution Of Thin-film And Surface Microstructure (symposium Proceedings)/202 by : C.V. Thompson
Download or read book Evolution Of Thin-film And Surface Microstructure (symposium Proceedings)/202 written by C.V. Thompson and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures: by : John Sanchez, Jr
Download or read book Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures: written by John Sanchez, Jr and published by Cambridge University Press. This book was released on 2014-06-05 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: A wide variety of materials systems and deposition strategies have been developed to produce epitaxial and polycrystalline thin films. In particular, controlling the morphology and microstructure of metal films at the nanometer and/or micron scale has become crucial for applications such as giant magnetoresistive devices, contacts and diffusion barriers in integrated circuits and photovoltaics, and multilayer X-ray mirrors. This book, first published in 2001, focuses on the interactions between different mechanisms of microstructure evolution and film-growth conditions. Two sections of the volume, including a joint effort with Symposium R, Morphology and Dynamics of Crystal Surfaces in Molecular and Colloid Systems, highlight the fundamental mechanisms of epitaxial growth. Additional topics include: multilayers - stress in thin films; early stages of film growth - mechanical properties; texture in polycrystalline films; grain growth - barrier layers; and silicides and organic thin films - pulsed laser deposition.
Book Synopsis Correlation Between Microstructure and Surface Structure Evolution in Polycrystalline Films by : Adriana Eleni Lita
Download or read book Correlation Between Microstructure and Surface Structure Evolution in Polycrystalline Films written by Adriana Eleni Lita and published by . This book was released on 2000 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures: Volume 672 by : Jacques G. Amar
Download or read book Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures: Volume 672 written by Jacques G. Amar and published by . This book was released on 2001-11-12 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2001, focuses on the interactions between different mechanisms of microstructure evolution and film-growth conditions.
Book Synopsis Workshop on Thin Film Physics and Technology by : IAEA.
Download or read book Workshop on Thin Film Physics and Technology written by IAEA. and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Simulation of Thin Film Deposition, Microstructure Evolution, and Properties in Complex Oxide Systems by : Christopher Paul Burmester
Download or read book Simulation of Thin Film Deposition, Microstructure Evolution, and Properties in Complex Oxide Systems written by Christopher Paul Burmester and published by . This book was released on 1996 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Evolution of Thin-Film and Surface Structure and Morphology: Volume 355 by : B. G. Demczyk
Download or read book Evolution of Thin-Film and Surface Structure and Morphology: Volume 355 written by B. G. Demczyk and published by . This book was released on 1995-07-18 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Nanoscale structure forming processes by : Viktor Elofsson
Download or read book Nanoscale structure forming processes written by Viktor Elofsson and published by Linköping University Electronic Press. This book was released on 2016-11-30 with total page 92 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin film growth from the vapor phase has for a long time intrigued researchers endeavouring to unravel and understand atomistic surface processes that govern film formation. Their motivation has not been purely scientific, but also driven by numerous applications where this understanding is paramount to knowledge-based design of novel film materials with tailored properties. Within the above framework, this thesis investigates growth of metal films on weakly bonding substrates, a combination of great relevance for applications concerning e.g., catalysis, graphene metallization and architectural glazing. When metal vapor condenses on weakly bonding substrates three dimensional islands nucleate, grow and coalesce prior to forming a continuous film. The combined effect of these initial growth stages on film formation and morphology evolution is studied using pulsed vapor fluxes for the model system Ag/SiO2. It is shown that the competition between island growth and coalescence completion determines structure evolution. The effect of the initial growth stages on film formation is also examined for the tilted columnar microstructure obtained when vapor arrives at an angle that deviates from the substrate surface normal. This is done using two metals with distinctly different nucleation behaviour, and the findings suggest that the column tilt angle is set by nucleation conditions in conjunction with shadowing of the vapor flux by adjacent islands. Vapor arriving at an angle can in addition result in films that exhibit preferred crystallographic orientations, both out-of-plane and in-plane. Their emergence is commonly described by an evolutionary growth model, which for some materials predict a double in-plane alignment that has not been observed experimentally. Here, an experiment is designed to replicate the model’s growth conditions, confirming the existence of double in-plane alignment. New and added film functionalities can further be unlocked by alloying. Properties are then largely set by chemistry and atomic arrangement, where the latter can be affected by thermodynamics, kinetics and vapor flux modulation. Their combined effect on atomic arrangement is here unravelled by presenting a research methodology that encompasses high resolution vapor flux modulation, nanoscale structure v vi probes and growth simulations. The methodology is deployed to study the immiscible Ag-Cu and miscible Ag-Au model systems, for which it is shown that capping of Cu by Ag atoms via near surface diffusion processes and rough morphology of the Ag-Au growth front are the decisive structure forming processes in each respective system. The results generated in this thesis are of relevance for tuning structure of metal films grown on weakly bonding substrates. They also indicate that improved growth models are required to accurately describe structure evolution and emergence of a preferred in-plane orientation in films where vapor arrives at an angle that deviates from the substrate surface normal. In addition, this thesis presents a methodology that can be used to identify and understand structure forming processes in multicomponent films, which may enable tailoring of atomic arrangement and related properties in technologically relevant material systems.
Book Synopsis Phase-field Models for Simulating Physical Vapor Deposition and Microstructure Evolution of Thin Films by : James A. Stewart (Jr)
Download or read book Phase-field Models for Simulating Physical Vapor Deposition and Microstructure Evolution of Thin Films written by James A. Stewart (Jr) and published by . This book was released on 2016 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: The focus of this research is to develop, implement, and utilize phase-field models to study microstructure evolution in thin films during physical vapor deposition (PVD). There are four main goals to this dissertation. First, a phase-field model is developed to simulate PVD of a single-phase polycrystalline material by coupling previous modeling efforts on deposition of single-phase materials and grain evolution in polycrystalline materials. Second, a phase-field model is developed to simulate PVD of a polymorphic material by coupling previous modeling efforts on PVD of a single-phase material, evolution in multiphase materials, and phase nucleation. Third, a novel free energy functional is proposed that incorporates appropriate energetics and dynamics for simultaneous modeling of PVD and grain evolution in single-phase polycrystalline materials. Finally, these phase-field models are implemented into custom simulation codes and utilized to illustrate these models' capabilities in capturing PVD thin film growth, grain and grain boundary (GB) evolution, phase evolution and nucleation, and temperature evolution. In general, these simulations show: grain coarsening through grain rotation and GB migration such that grains tend to align with the thin film surface features and GBs migrate to locations between these features so that each surface feature has a distinct grain and orientation; the incident vapor flux rate controls the density of the thin film and the formation of surface and subsurface features; the substrate phase distribution initially acts as a template for the growing microstructure until the thin film becomes sufficiently thick; latent heat released during PVD increases the surface temperature of the thin film creating a temperature gradient within the thin film influencing phase evolution and nucleation; and temperature distributions lead to regions within the thin film that allow for multiple phases to be stable and coexist. Further, this work shows the sequential approach for coupling phase-field models, described in goals (i) and (ii) is sufficient to capture first-order features of the growth process, such as the stagnation of GBs at the valleys of the surface roughness, but to capture higher-order features, such as orientation gradients within columnar grains, the single free energy functional approach developed in goal (iii) is necessary.
Book Synopsis Thin Film Materials by : L. B. Freund
Download or read book Thin Film Materials written by L. B. Freund and published by Cambridge University Press. This book was released on 2004-01-08 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
Book Synopsis Microstructural Evolution in Thin Films by : Atwater
Download or read book Microstructural Evolution in Thin Films written by Atwater and published by . This book was released on 1998-12-01 with total page 450 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Nano- and mesoscale morphology evolution of metal films on weakly-interacting surfaces by : Bo Lü
Download or read book Nano- and mesoscale morphology evolution of metal films on weakly-interacting surfaces written by Bo Lü and published by Linköping University Electronic Press. This book was released on 2018-01-11 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin films are structures consisting of one or several nanoscale atomic layers of material that are used to either functionalize a surface or constitute components in more complex devices. Many properties of a film are closely related to its microstructure, which allows films to be tailored to meet specific technological requirements. Atom-by-atom film growth from the vapor phase involves a multitude of atomic processes that may not be easily studied experimentally in real-time because they occur in small length- (? Å) and timescales (? ns). Therefore, different types of computer simulation methods have been developed in order to test theoretical models of thin film growth and unravel what experiments cannot show. In order to compare simulated and experimental results, the simulations must be able to model events on experimental time-scales, i.e. on the order of microseconds to seconds. This is achievable with the kinetic Monte Carlo (kMC) method. In this work, the initial growth stages of metal deposition on weakly-interacting substrates is studied using both kMC simulations as well as experiments whereby growth was monitored using in situ probes. Such film/substrate material combinations are widely encountered in technological applications including low-emissivity window coatings to parts of microelectronics components. In the first part of this work, a kMC algorithm was developed to model the growth processes of island nucleation, growth and coalescence when these are functions of deposition parameters such as the vapor deposition rate and substrate temperature. The dynamic interplay between these growth processes was studied in terms of the scaling behavior of the film thickness at the elongation transition, for both continuous and pulsed deposition fluxes, and revealed in both cases two distinct growth regimes in which coalescence is either active or frozen out during deposition. These growth regimes were subsequently confirmed in growth experiments of Ag on SiO2, again for both pulsed and continuous deposition, by measuring the percolation thickness as well as the continuous film formation thickness. However, quantitative agreement with regards to scaling exponents in the two growth regimes was not found between simulations and experiments, and this prompted the development of a method to determine the elongation transition thickness experimentally. Using this method, the elongation transition of Ag on SiO2 was measured, with scaling exponents found in much better agreement with the simulation results. Further, these measurement data also allowed the calculation of surface properties such as the terrace diffusion barrier of Ag on SiO2 and the average island coalescence rate. In the second part of this thesis, pioneering work is done to develop a fully atomistic, on-lattice model which describes the growth of Ag on weakly-interacting substrates. Simulations performed using this model revealed several key atomic-scale processes occurring at the film/substrate interface and on islands which govern island shape evolution, thereby contributing to a better understanding of how 3D island growth occurs at the atomic scale for a wide class of materials. The latter provides insights into the directed growth of metal nanostructures with controlled shapes on weakly-interacting substrates, including twodimensional crystals for use in catalytic and nano-electronic applications.
Book Synopsis Growth, Evolution and Properties of Surfaces, Thin Films, and Self Organized Structure: Volume 648 by : Steven C. Moss
Download or read book Growth, Evolution and Properties of Surfaces, Thin Films, and Self Organized Structure: Volume 648 written by Steven C. Moss and published by . This book was released on 2001-09-20 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt: A significant portion of these papers from a winter 2000 symposium examine materials and devices at the nano-scale, with work on self- organized structures as well as nano-patterned thin-film structures. Materials research in three-, two-, one-, and zero-dimensional objects is addressed. Other major themes include pattern formation on surfaces, magnetism in films, thin film nucleation and alloy formation, and diffusion and morphological evolution of surfaces and thin films. Quantum dots and quantum size effects, metal/silicon and germanium/silicon epitaxy, metal on semiconductor and semiconductor thin films, and semiconductor epitaxy are also discussed. Annotation copyrighted by Book News Inc., Portland, OR.
Book Synopsis Morphological and Compositional Evolution of Thin Films: Volume 749 by : Michael J. Aziz
Download or read book Morphological and Compositional Evolution of Thin Films: Volume 749 written by Michael J. Aziz and published by Mrs Proceedings. This book was released on 2003 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: "The papers compiled in this volume were presented in Symposium W, 'Morphological and Compositional Evolution of Thin Films, ' held December 2-5 at the 2002 MRS Fall Meeting in Boston Massachusetts. They are organized in the order that they were presented."--P. xiii.
