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Author :
Publisher :
ISBN 13 :
Total Pages : 448 pages
Book Rating : 4.F/5 ( download)
Download or read book Electrical Overstress/Electrostatic Discharge Symposium Proceedings written by and published by . This book was released on 2004 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Steven H. Voldman
Publisher : John Wiley & Sons
ISBN 13 : 1118703332
Total Pages : 368 pages
Book Rating : 4.1/5 (187 download)
Download or read book Electrical Overstress (EOS) written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2013-08-27 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.
Author : Steven H. Voldman
Publisher : John Wiley & Sons
ISBN 13 : 0470030062
Total Pages : 412 pages
Book Rating : 4.4/5 (7 download)
Download or read book ESD written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2006-02-03 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena. ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD. With an emphasis on examples, this text: explains ESD buffering, ballasting, current distribution, design segmentation, feedback, coupling, and de-coupling ESD design methods; outlines the fundamental analytical models and experimental results for the ESD design of MOSFETs and diode semiconductor device elements, with a focus on CMOS, silicon on insulator (SOI), and Silicon Germanium (SiGe) technology; focuses on the ESD design, optimization, integration and synthesis of these elements and concepts into ESD networks, as well as applying within the off-chip driver networks, and on-chip receivers; and highlights state-of-the-art ESD input circuits, as well as ESD power clamps networks. Continuing the author’s series of books on ESD, this book will be an invaluable reference for the professional semiconductor chip and system ESD engineer. Semiconductor device and process development, quality, reliability and failure analysis engineers will also find it an essential tool. In addition, both senior undergraduate and graduate students in microelectronics and IC design will find its numerous examples useful.
Author : Steven H. Voldman
Publisher : John Wiley & Sons
ISBN 13 : 1119233100
Total Pages : 1168 pages
Book Rating : 4.1/5 (192 download)
Download or read book The ESD Handbook written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2021-03-02 with total page 1168 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.
Author : Terje A. Skotheim
Publisher : CRC Press
ISBN 13 : 9780824700508
Total Pages : 1130 pages
Book Rating : 4.7/5 (5 download)
Download or read book Handbook of Conducting Polymers, Second Edition, written by Terje A. Skotheim and published by CRC Press. This book was released on 1997-11-24 with total page 1130 pages. Available in PDF, EPUB and Kindle. Book excerpt: Discussing theory and transport, synthesis, processing, properties, and applications, this second edition of a standard resource covers advances in the field of electrically conducting polymers and contains more than 1500 drawings, photographs, tables, and equations. Maintaining the style of presentation and depth of coverage that made the first edition so popular, it contains the authoritative contributions of an interdisciplinary team of world-renowned experts encompassing the fields of chemistry, physics, materials science, and engineering. The Handbook of Conducting Polymers highlights progress, delineates improvements, and examines novel tools for polymer and materials scientists..
Author : Juin J. Liou
Publisher : CRC Press
ISBN 13 : 1482255898
Total Pages : 304 pages
Book Rating : 4.4/5 (822 download)
Download or read book Electrostatic Discharge Protection written by Juin J. Liou and published by CRC Press. This book was released on 2017-12-19 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.
Author : Steven H. Voldman
Publisher : John Wiley & Sons
ISBN 13 : 1118707141
Total Pages : 328 pages
Book Rating : 4.1/5 (187 download)
Download or read book ESD Testing written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2016-10-07 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.
Author :
Publisher :
ISBN 13 :
Total Pages : 1860 pages
Book Rating : 4.3/5 (243 download)
Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 1860 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Dr. Reinaldo J. Perez
Publisher : John Wiley & Sons
ISBN 13 : 1119082781
Total Pages : 768 pages
Book Rating : 4.1/5 (19 download)
Download or read book Handbook of Aerospace Electromagnetic Compatibility written by Dr. Reinaldo J. Perez and published by John Wiley & Sons. This book was released on 2018-11-30 with total page 768 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive resource that explores electromagnetic compatibility (EMC) for aerospace systems Handbook of Aerospace Electromagnetic Compatibility is a groundbreaking book on EMC for aerospace systems that addresses both aircraft and space vehicles. With contributions from an international panel of aerospace EMC experts, this important text deals with the testing of spacecraft components and subsystems, analysis of crosstalk and field coupling, aircraft communication systems, and much more. The text also includes information on lightning effects and testing, as well as guidance on design principles and techniques for lightning protection. The book offers an introduction to E3 models and techniques in aerospace systems and explores EMP effects on and technology for aerospace systems. Filled with the most up-to-date information, illustrative examples, descriptive figures, and helpful scenarios, Handbook of Aerospace Electromagnetic Compatibility is designed to be a practical information source. This vital guide to electromagnetic compatibility: • Provides information on a range of topics including grounding, coupling, test procedures, standards, and requirements • Offers discussions on standards for aerospace applications • Addresses aerospace EMC through the use of testing and theoretical approaches Written for EMC engineers and practitioners, Handbook of Aerospace Electromagnetic Compatibility is a critical text for understanding EMC for aerospace systems.
Author : John R. Barnes
Publisher : Springer Science & Business Media
ISBN 13 : 9781402077371
Total Pages : 1356 pages
Book Rating : 4.0/5 (773 download)
Download or read book Robust Electronic Design Reference Book: no special title written by John R. Barnes and published by Springer Science & Business Media. This book was released on 2004 with total page 1356 pages. Available in PDF, EPUB and Kindle. Book excerpt: If you design electronics for a living, you need Robust Electronic Design Reference Book. Written by a working engineer, who has put over 115 electronic products into production at Sycor, IBM, and Lexmark, Robust Electronic Design Reference covers all the various aspects of designing and developing electronic devices and systems that: -Work. -Are safe and reliable. -Can be manufactured, tested, repaired, and serviced. -May be sold and used worldwide. -Can be adapted or enhanced to meet new and changing requirements.
Author : Steven H. Voldman
Publisher : John Wiley & Sons
ISBN 13 : 9780470516164
Total Pages : 472 pages
Book Rating : 4.5/5 (161 download)
Download or read book Latchup written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2008-04-15 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interest in latchup is being renewed with the evolution of complimentary metal-oxide semiconductor (CMOS) technology, metal-oxide-semiconductor field-effect transistor (MOSFET) scaling, and high-level system-on-chip (SOC) integration. Clear methodologies that grant protection from latchup, with insight into the physics, technology and circuit issues involved, are in increasing demand. This book describes CMOS and BiCMOS semiconductor technology and their sensitivity to present day latchup phenomena, from basic over-voltage and over-current conditions, single event latchup (SEL) and cable discharge events (CDE), to latchup domino phenomena. It contains chapters focusing on bipolar physics, latchup theory, latchup and guard ring characterization structures, characterization testing, product level test systems, product level testing and experimental results. Discussions on state-of-the-art semiconductor processes, design layout, and circuit level and system level latchup solutions are also included, as well as: latchup semiconductor process solutions for both CMOS to BiCMOS, such as shallow trench, deep trench, retrograde wells, connecting implants, sub-collectors, heavily-doped buried layers, and buried grids – from single- to triple-well CMOS; practical latchup design methods, automated and bench-level latchup testing methods and techniques, latchup theory of logarithm resistance space, generalized alpha (a) space, beta (b) space, new latchup design methods– connecting the theoretical to the practical analysis, and; examples of latchup computer aided design (CAD) methodologies, from design rule checking (DRC) and logical-to-physical design, to new latchup CAD methodologies that address latchup for internal and external latchup on a local as well as global design level. Latchup acts as a companion text to the author’s series of books on ESD (electrostatic discharge) protection, serving as an invaluable reference for the professional semiconductor chip and system-level ESD engineer. Semiconductor device, process and circuit designers, and quality, reliability and failure analysis engineers will find it informative on the issues that confront modern CMOS technology. Practitioners in the automotive and aerospace industries will also find it useful. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, computer aided design and design integration.
Author :
Publisher : Conference
ISBN 13 :
Total Pages : 1032 pages
Book Rating : 4.:/5 (318 download)
Download or read book Proceedings, International Test Conference 1995 written by and published by Conference. This book was released on 1995 with total page 1032 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : Jeffrey Frank Jones
ISBN 13 :
Total Pages : 8380 pages
Book Rating : 4./5 ( download)
Download or read book Manuals Combined: Nondestructive Testing (NDT) And Inspection (NDI) written by and published by Jeffrey Frank Jones. This book was released on with total page 8380 pages. Available in PDF, EPUB and Kindle. Book excerpt: Over 8,300 pages .... Just a SAMPLE of the CONTENTS: NONDESTRUCTIVE INSPECTION METHODS. Published by the Departments of the Army, Navy and Air Force on 1 March 2000 - 771 pages and June 2005 - 762 pages; Metallic Materials and Elements for Aerospace Vehicle Structures 1,733 pages Designing and Developing Maintainable Products and Systems - Revision A 719 pages Sampling Procedures and Tables for Inspection by Attributes 75 pages Nondestructive Testing Acceptance Criteria 88 pages Environmental Stress Screening Process for Electronic Equipment 49 pages Handbook for Reliability Test Methods, Plans, and Environments for Engineering, Development, Qualification, and Production - Revision A 411 pages Human Engineering - Revision F 219 pages Sampling Procedures and Tables for Life and Reliability Testing (Based on Exponential Distribution) 77 pages Test Method Standard: Electronic and Electrical Component Parts 191 pages Reliability Testing for Engineering Development, Qualification and Production - Revision D 47 pages Electroexplosive Subsystem Safety Requirements and Test Methods for Space Systems (150 pages, 8.64 MB) Reliability Prediction of Electronic Equipment- Notice F 205 pages Reliability Program for Systems and Equipment Development and Production - Revision B 88 pages Electronic Discharge Control Handbook for Protection of Electrical and Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive Devices) - Revision B 171 pages Electrical Grounding for Aircraft Safety 290 pages Fuze and Fuze Components, Environmental and Performance Tests for - Revision C 295 pages Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and Equipment - Revision E 253 pages Maintainability Verification/Demonstration/Evaluation - Revision A 64 pages Failure Rate Sampling Plans and Procedures - Revision C 41 pages Maintainability Prediction 176 pages Definition of Terms for Reliability and Maintainability - Revision C 18 pages Semiconductor Devices 730 pages Reliability Modeling and Prediction - Revision B 85 pages Established Reliability and High Reliability Qualified Products List (QPL) Systems For Electrical, Electronic, and Fiber Optic Parts Specifications - Revision F 17 pages Environmental Test Methods and Engineering Guidelines 416 pages) Test Methods for Electrical Connectors - Revision A 129 pages Environmental Engineering Considerations and Laboratory Tests - Revision F 539 pages System Safety Program Requirements 117 pages Test Method Standard Microcircuits - Revision E 705 pages Test Method Standard Microcircuits - Revision F 708 pages Procedures for Performing a Failure Mode Effects and Criticality Analysis - Revision A 54 pages
Author : James E. Vinson
Publisher : Springer Science & Business Media
ISBN 13 : 1461503213
Total Pages : 214 pages
Book Rating : 4.4/5 (615 download)
Download or read book ESD Design and Analysis Handbook written by James E. Vinson and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts.
Author : Charvaka Duvvury
Publisher : John Wiley & Sons
ISBN 13 : 1118861884
Total Pages : 436 pages
Book Rating : 4.1/5 (188 download)
Download or read book System Level ESD Co-Design written by Charvaka Duvvury and published by John Wiley & Sons. This book was released on 2017-05-05 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt: An effective and cost efficient protection of electronic system against ESD stress pulses specified by IEC 61000-4-2 is paramount for any system design. This pioneering book presents the collective knowledge of system designers and system testing experts and state-of-the-art techniques for achieving efficient system-level ESD protection, with minimum impact on the system performance. All categories of system failures ranging from 'hard' to 'soft' types are considered to review simulation and tool applications that can be used. The principal focus of System Level ESD Co-Design is defining and establishing the importance of co-design efforts from both IC supplier and system builder perspectives. ESD designers often face challenges in meeting customers' system-level ESD requirements and, therefore, a clear understanding of the techniques presented here will facilitate effective simulation approaches leading to better solutions without compromising system performance. With contributions from Robert Ashton, Jeffrey Dunnihoo, Micheal Hopkins, Pratik Maheshwari, David Pomerenke, Wolfgang Reinprecht, and Matti Usumaki, readers benefit from hands-on experience and in-depth knowledge in topics ranging from ESD design and the physics of system ESD phenomena to tools and techniques to address soft failures and strategies to design ESD-robust systems that include mobile and automotive applications. The first dedicated resource to system-level ESD co-design, this is an essential reference for industry ESD designers, system builders, IC suppliers and customers and also Original Equipment Manufacturers (OEMs). Key features: Clarifies the concept of system level ESD protection. Introduces a co-design approach for ESD robust systems. Details soft and hard ESD fail mechanisms. Detailed protection strategies for both mobile and automotive applications. Explains simulation tools and methodology for system level ESD co-design and overviews available test methods and standards. Highlights economic benefits of system ESD co-design.
Author : Pradeep Lall
Publisher : CRC Press
ISBN 13 : 0429611110
Total Pages : 327 pages
Book Rating : 4.4/5 (296 download)
Download or read book Influence of Temperature on Microelectronics and System Reliability written by Pradeep Lall and published by CRC Press. This book was released on 2020-07-09 with total page 327 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The
Author : Faiz Mohammad
Publisher : I. K. International Pvt Ltd
ISBN 13 : 8188237655
Total Pages : 602 pages
Book Rating : 4.1/5 (882 download)
Download or read book Specialty Polymers written by Faiz Mohammad and published by I. K. International Pvt Ltd. This book was released on 2007 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: The synthetic counterparts of natural polymeric materials are now finding applications as light weight, mechanically strong, and environmentally stable sheets, fibers, films, adhesives, paints, and foams have replaced most of the commodity and structural materials. The systematic research on the preparation, characterization, and utilization of plastics resulted in creation of polymers often containing a set of several desirable properties in a single polymer. The polymers have established their place in engineering applications as well. Although the bulk of plastics production focuses on relatively simple commodity polymers, the proportion of specially designed and tailor-made plastics for specific and sophisticated applications is also increasing at a great pace. The specialty plastics, as well as their use in specific and sophisticated applications, are the key to the continued scientific growth and technological advances in the new millennium. This book thoroughly covers today's rapidly growing field of specialty polymers and their applications in more sophisticated and specialized areas. It gives the most recent in-depth knowledge and extremely comprehensive details of the chemistry, physics, material science, technology, and device applications of specialty polymers. This comprehensive book containing 16 chapters is the result of the untiring efforts of 35 most renowned experts from the national and international scientific community. This book is thought-provoking to the researchers working in the fields of chemistry, biochemistry, biotechnology, medicine, polymer chemistry, semiconductor physics, material science, electrochemistry, biology, electronics, photonics, material science, solid state physics, nanotechnology, electrical and electronics engineering, optical engineering, device engineering, data storage, etc.
