Development of High-brightness Ultrafast Electron Microscope for Studying Nanoscale Dynamics Associated with Strongly Correlated Materials

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Publisher :
ISBN 13 : 9781321147537
Total Pages : 300 pages
Book Rating : 4.1/5 (475 download)

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Book Synopsis Development of High-brightness Ultrafast Electron Microscope for Studying Nanoscale Dynamics Associated with Strongly Correlated Materials by : Zhensheng Tao

Download or read book Development of High-brightness Ultrafast Electron Microscope for Studying Nanoscale Dynamics Associated with Strongly Correlated Materials written by Zhensheng Tao and published by . This book was released on 2014 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

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Publisher : Elsevier
ISBN 13 : 0443193258
Total Pages : 252 pages
Book Rating : 4.4/5 (431 download)

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Book Synopsis Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources by : Peter W. Hawkes

Download or read book Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources written by Peter W. Hawkes and published by Elsevier. This book was released on 2023-08-17 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series

Modeling Nanoscale Imaging in Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 146142190X
Total Pages : 190 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Modeling Nanoscale Imaging in Electron Microscopy by : Thomas Vogt

Download or read book Modeling Nanoscale Imaging in Electron Microscopy written by Thomas Vogt and published by Springer Science & Business Media. This book was released on 2012-03-02 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Progress in Nanoscale Characterization and Manipulation

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Publisher : Springer
ISBN 13 : 9811304548
Total Pages : 508 pages
Book Rating : 4.8/5 (113 download)

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Book Synopsis Progress in Nanoscale Characterization and Manipulation by : Rongming Wang

Download or read book Progress in Nanoscale Characterization and Manipulation written by Rongming Wang and published by Springer. This book was released on 2018-08-30 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

High-resolution Transmission Electron Microscopy and Associated Techniques

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Publisher : Oxford University Press, USA
ISBN 13 : 0195042751
Total Pages : 668 pages
Book Rating : 4.1/5 (95 download)

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Book Synopsis High-resolution Transmission Electron Microscopy and Associated Techniques by : Peter Buseck

Download or read book High-resolution Transmission Electron Microscopy and Associated Techniques written by Peter Buseck and published by Oxford University Press, USA. This book was released on 1988 with total page 668 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. This book includes discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, and more.

Impact of Electron and Scanning Probe Microscopy on Materials Research

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Publisher : Springer Science & Business Media
ISBN 13 : 9780792359395
Total Pages : 522 pages
Book Rating : 4.3/5 (593 download)

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Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby

Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 1999-10-31 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.

4d Electron Microscopy: Imaging In Space And Time

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Publisher : World Scientific
ISBN 13 : 1908978430
Total Pages : 359 pages
Book Rating : 4.9/5 (89 download)

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Book Synopsis 4d Electron Microscopy: Imaging In Space And Time by : Ahmed H Zewail

Download or read book 4d Electron Microscopy: Imaging In Space And Time written by Ahmed H Zewail and published by World Scientific. This book was released on 2009-12-24 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electron microscope, as a result of recent revolutionary developments and many evolutionary ones, now yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. It is also poised to contribute much new spatially-resolved and time-resolved insights of central importance in the exploration of most aspects of condensed matter, ranging from the physical to the biological sciences.Whereas in all conventional EM methods, imaging, diffraction, and chemical analyses have been conducted in a static — time-integrated — manner, now it has become possible to unite the time domain with the spatial one, thereby creating four-dimensional (4D) electron microscopy. This advance is based on the fundamental concept of timed, coherent single-electron packets, or electron pulses, which are liberated with femtosecond durations. Structural phase transitions, mechanical deformations, and the embryonic stages of melting and crystallization are examples of phenomena that can now be imaged in unprecedented structural detail with high spatial resolution, and ten orders of magnitude as fast as hitherto.No monograph in existence attempts to cover the revolutionary dimensions that EM in its various modes of operation nowadays makes possible. The authors of this book chart these developments, and also compare the merits of coherent electron waves with those of synchrotron radiation. They judge it prudent to recall some important basic procedural and theoretical aspects of imaging and diffraction so that the reader may better comprehend the significance of the new vistas and applications now afoot.This book is not a vade mecum — numerous other texts are available for the practitioner for that purpose. It is instead an in-depth exposé of the paradigm concepts and the developed techniques that can now be executed to gain new knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time./a

Field Emission Scanning Electron Microscopy

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Publisher : Springer
ISBN 13 : 9811044333
Total Pages : 143 pages
Book Rating : 4.8/5 (11 download)

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Book Synopsis Field Emission Scanning Electron Microscopy by : Nicolas Brodusch

Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Development and Application of a III-V Surface Electron Microscope

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ISBN 13 :
Total Pages : 148 pages
Book Rating : 4.:/5 (11 download)

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Book Synopsis Development and Application of a III-V Surface Electron Microscope by : Changxi Zheng

Download or read book Development and Application of a III-V Surface Electron Microscope written by Changxi Zheng and published by . This book was released on 2012 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt: GaAs based communication and optoelectronic devices are widely used in our daily lives. Applications range from mobile phones and satellite communications to laser pointers, printers, barcode readers and DVD players. The components making up these devices are composed of thin layers of III-V semiconductor material, the thicknesses of which must be finely controlled. This is achieved by growing such layers via molecular beam epitaxy (MBE) with atomic layer precision. In addition to current technologies, the long-term research objective in III-V materials is to utilise variants of MBE to fabricate new quantum structures of nanoscale dimensions for new device applications. However, despite this current and future technological importance, the real-space imaging of III-V MBE surface growth dynamics is restricted by the presence of large incident As flux which restricts the use of conventional imaging techniques. To address this issue, the main goal of this thesis is therefore to develop a unique surface electron microscope to study the surface dynamics of III-V materials in real-time during MBE growth.The thesis begins with the design and development of a III-V low energy electron microscope (LEEM). The incorporation of III-V MBE and a high As flux, in particular, required numerous modifications to a commercial LEEM instrument (Elmitec LEEM III). These are described in detail in Chapter 2.Following the development of the LEEM it is important to understand the contrast associated with quantum structure formation. With this in mind, theories of mirror electron microscopy (MEM) were developed and experimentally verified using Ga droplets and their associated surface trails as convenient test objects. This work resulted in the development of the Laplacian and caustic theories of MEM imaging which is fully described in Chapters 3, 4 and 5.Finally, based on the advances in instrumental development and imaging, proof-of-principle applications were undertaken to confirm that III-V and other materials could be investigated under high As flux. These included the control of the GaAs (001) congruent evaporation temperature by As flux (Chapter 6), the asymmetric coalescence of Ga droplets during Langmuir evaporation (Chapter 7), and the dynamic behaviour of As on Si(111) at high temperatures (Chapter 8).

In-situ Electron Microscopy at High Resolution

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Publisher : World Scientific
ISBN 13 : 9812797335
Total Pages : 318 pages
Book Rating : 4.8/5 (127 download)

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Book Synopsis In-situ Electron Microscopy at High Resolution by : Florian Banhart

Download or read book In-situ Electron Microscopy at High Resolution written by Florian Banhart and published by World Scientific. This book was released on 2008 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

Imaging with Electrons

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (119 download)

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Book Synopsis Imaging with Electrons by : Fariah Hayee

Download or read book Imaging with Electrons written by Fariah Hayee and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: While nanoscaling offers unique tuning knobs for optimizing system performance, it also changes process fundamentals. Ensemble measurements are often convoluted due to system heterogeneity, and lacks spatial resolution into the nanoscale. How do we correlate nano-to-atomic scale structure to the system performance? My work tackles this question for two vital technologies: (1) energy storage like batteries and metal hydrides, and (2) bright single photon sources for quantum optics, communication and sensing. We leverage, modify and develop electron microscopy techniques which let us probe the system performance (H-content and reaction rates for the former, optical emission for the later) and do correlative structural analysis at the nanoscale. At first, we explore how nanoscale dimensionality changes hydrogenation phase-change thermodynamics. We find that, one-dimensional nanorods have very distinct steady-state phase-coexistence in contrast to zero-dimensional nanoparticles. We report a length range beyond which it is more likely to form defects during phase-change. Next, we focus on understanding the effect of shape and surface faceting on reaction dynamics. We develop a technique to visualize the reaction in real-time in-situ using diffraction contrast. Capitalizing on this, we find that the phase-change is a nucleation-growth process. Nuceation always occurs at the corner irrespective of shape, but phase-propagation direction depends on shape. We also do structural analysis of reaction intermediates, and find that while rotational defects are likely to form during phase-transition, the particles 'self-heal' at the end. Next, we focus on developing single photon sources in a van der Waals insulator: hexagonal boron nitride (hBN). The biggest question circumventing technological development of hBN is the origin of spectral variability of emission. We develop a technique to correlate the defects' cathodoluminescence (CL) in a transmission electron microscope and photoluminescence (PL) in an optical microscope. Using this, we localize each defect with 15−20 nm resolution. Based on PL-CL correlation and local strain of the local host environment using electron diffraction, we postulate that there are at least four different atomic defects resulting into the observed spectral variability. Together, our results pushes the field towards direct identification of these defects and achieve 'designer-defect' and emission properties.

Visualizing Chemistry

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Publisher : National Academies Press
ISBN 13 : 030916463X
Total Pages : 222 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Visualizing Chemistry by : National Research Council

Download or read book Visualizing Chemistry written by National Research Council and published by National Academies Press. This book was released on 2006-06-01 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scientists and engineers have long relied on the power of imaging techniques to help see objects invisible to the naked eye, and thus, to advance scientific knowledge. These experts are constantly pushing the limits of technology in pursuit of chemical imagingâ€"the ability to visualize molecular structures and chemical composition in time and space as actual events unfoldâ€"from the smallest dimension of a biological system to the widest expanse of a distant galaxy. Chemical imaging has a variety of applications for almost every facet of our daily lives, ranging from medical diagnosis and treatment to the study and design of material properties in new products. In addition to highlighting advances in chemical imaging that could have the greatest impact on critical problems in science and technology, Visualizing Chemistry reviews the current state of chemical imaging technology, identifies promising future developments and their applications, and suggests a research and educational agenda to enable breakthrough improvements.

Transmission Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 1475725191
Total Pages : 708 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Transmission Electron Microscopy by : David B. Williams

Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Electron Microscopy in Material Science

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Publisher :
ISBN 13 :
Total Pages : 794 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Electron Microscopy in Material Science by : Ugo Valdrè

Download or read book Electron Microscopy in Material Science written by Ugo Valdrè and published by . This book was released on 1971 with total page 794 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Optical Spectroscopy at the Nanoscale

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Publisher :
ISBN 13 :
Total Pages : 85 pages
Book Rating : 4.:/5 (18 download)

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Book Synopsis Optical Spectroscopy at the Nanoscale by : Xiaoping Hong

Download or read book Optical Spectroscopy at the Nanoscale written by Xiaoping Hong and published by . This book was released on 2014 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent advances in material science and fabrication techniques enabled development of nanoscale applications and devices with superior performances and high degree of integration. Exotic physics also emerges at nanoscale where confinement of electrons and phonons leads to drastically different behavior from those in the bulk materials. It is therefore rewarding and interesting to investigate and understand material properties at the nanoscale. Optical spectroscopy, one of the most versatile techniques for studying material properties and light-matter interactions, can provide new insights into the nanomaterials. In this thesis, I explore advanced laser spectroscopic techniques to probe a variety of different nanoscale phenomena. A powerful tool in nanoscience and engineering is scanning tunneling microscopy (STM). Its capability in atomic resolution imaging and spectroscopy unveiled the mystical quantum world of atoms and molecules. However identification of molecular species under investigation is one of the limiting functionalities of the STM. To address this need, we take advantage of the molecular `fingerprints' - vibrational spectroscopy, by combining an infrared light sources with scanning tunneling microscopy. In order to map out sharp molecular resonances, an infrared continuous wave broadly tunable optical parametric oscillator was developed with mode-hop free fine tuning capabilities. We then combine this laser with STM by shooting the beam onto the STM substrate with sub-monolayer diamondoids deposition. Thermal expansion of the substrate is detected by the ultrasensitive tunneling current when infrared frequency is tuned across the molecular vibrational range. Molecular vibrational spectroscopy could be obtained by recording the thermal expansion as a function of the excitation wavelength. Another interesting field of the nanoscience is carbon nanotube, an ideal model of one dimensional physics and applications. Due to the small light absorption with nanometer size, individual carbon nanotube is not visible under any conventional microscopy and characterization of individual nanotube becomes a focused research interest. Although electron microscopies and optical spectroscopies are developed previously to study carbon nanotubes, none of them permitted versatile imaging and spectroscopy of individual nanotube in a non-invasive, high throughput and ambient way. In this thesis a new polarization-based optical microscopy and spectroscopy is developed with exceedingly better contrast for one dimensional nano-materials and capability of individual carbon nanotube imaging and spectroscopy. This development provides a reliable way to measure the absolute absorption cross-section of individual chirality-defined carbon nanotubes. It also enables fast profiling for growth optimization and in situ characterization for functioning carbon nanotube devices. Two dimensional systems constitute another important family of nanomaterials, ranging from semi-metal (graphene), semiconductors (transition metal dichalcogenides) to insulators (h-BN). Despite of their scientific significance, they present a complete set of 2D building blocks for two dimensional electronics and optoelectronics. Heterostructures purely made of 2D thin films hold great promises due to functionality, scalability and ultrathin nature. Understanding the properties of the coupled heterolayers will be important and intriguing for these applications. With the advanced ultrafast laser spectroscopy, we study the dynamics of charge transfer process in two dimensional atomically thin semiconductors heterostructures. An extremely efficient charge transfer process is identified in atomically thin MoS2/WS2 system, which is expected to form a type-II heterojunction. Our discovery would greatly facilitate further studies of 2D materials as a photovoltaic device.

Ultrafast Atomic Force Microscopy

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (18 download)

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Book Synopsis Ultrafast Atomic Force Microscopy by : Rasa Rejali

Download or read book Ultrafast Atomic Force Microscopy written by Rasa Rejali and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "Developing a technique that combines nanometer spatial resolution with sub-femtosecond temporal resolution is a crucial step towards exposing the inner mechanisms of chemical reactions, single molecule motion, electron dynamics in solids, and the effects of defects or trap states on electron motion and behavior, amongst a slew of other questions related to the ultrafast electron dynamics of surfaces. In this work, we integrate a traditional pump-probe spectroscopy scheme into an ultra-high vacuum atomic force microscope to develop the first ultrafast atomic force microscope capable of measuring nanoscale forces with attosecond precision. We use this technique to measure and spatially resolve local changes in electric polarization in a common, and well characterized, nonlinear material: lithium niobate. In particular, we exploit the strong second-order nonlinear susceptibility of lithium niobate to produce an electric polarization proportional to the incoming electric field of two ∼100 fs, 780 nm laser pulses. The induced polarization change in lithium niobate generates an electrostatic force that is detected, and spatially resolved, using non-contact AFM. Furthermore, we use our technique to experimentally verify that the fundamental sensitivity limit of force detection in non-contact AFM, which is determined by the thermal noise, also dictates the minimal temporal resolution that can be achieved. We present a generalization of our time-resolved AFM technique for measuring any light-matter interaction that results in a measurable force." --

Light Scattering in Solids IX

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Publisher : Springer Science & Business Media
ISBN 13 : 3540344365
Total Pages : 435 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Light Scattering in Solids IX by : Manuel Cardona

Download or read book Light Scattering in Solids IX written by Manuel Cardona and published by Springer Science & Business Media. This book was released on 2006-12-15 with total page 435 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume treats new materials (nanotubes and quantum dots) and new techniques (synchrotron radiation scattering and cavity confined scattering). In the past five years, Raman and Brillouin scattering have taken a place among the most important research and characterization methods for carbon nanotubes. Among the novel techniques discussed in this volume are those employing synchrotron radiation as a light source.