Modeling Nanoscale Imaging in Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 146142190X
Total Pages : 190 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Modeling Nanoscale Imaging in Electron Microscopy by : Thomas Vogt

Download or read book Modeling Nanoscale Imaging in Electron Microscopy written by Thomas Vogt and published by Springer Science & Business Media. This book was released on 2012-03-02 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Modeling Nanoscale Imaging in Electron Microscopy

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1461421918
Total Pages : 190 pages
Book Rating : 4.4/5 (614 download)

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Book Synopsis Modeling Nanoscale Imaging in Electron Microscopy by : Thomas Vogt

Download or read book Modeling Nanoscale Imaging in Electron Microscopy written by Thomas Vogt and published by Springer Science & Business Media. This book was released on 2012-03-02 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Monte Carlo Modeling for Electron Microscopy and Microanalysis

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Publisher : Oxford University Press
ISBN 13 : 0195358465
Total Pages : 225 pages
Book Rating : 4.1/5 (953 download)

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Book Synopsis Monte Carlo Modeling for Electron Microscopy and Microanalysis by : David C. Joy

Download or read book Monte Carlo Modeling for Electron Microscopy and Microanalysis written by David C. Joy and published by Oxford University Press. This book was released on 1995-04-13 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.

Scanning Probe Microscopy of Functional Materials

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Publisher : Springer Science & Business Media
ISBN 13 : 144197167X
Total Pages : 563 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Probe Microscopy of Functional Materials by : Sergei V. Kalinin

Download or read book Scanning Probe Microscopy of Functional Materials written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2010-12-13 with total page 563 pages. Available in PDF, EPUB and Kindle. Book excerpt: The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Scanning Transmission Electron Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 1441972005
Total Pages : 762 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Scanning Transmission Electron Microscopy by : Stephen J. Pennycook

Download or read book Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and published by Springer Science & Business Media. This book was released on 2011-03-24 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Liquid Cell Electron Microscopy

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Publisher : Cambridge University Press
ISBN 13 : 1107116570
Total Pages : 529 pages
Book Rating : 4.1/5 (71 download)

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Book Synopsis Liquid Cell Electron Microscopy by : Frances M. Ross

Download or read book Liquid Cell Electron Microscopy written by Frances M. Ross and published by Cambridge University Press. This book was released on 2017 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2.6.2 Electrodes for Electrochemistry

Electron Nano-Imaging

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Publisher : Springer
ISBN 13 : 4431565027
Total Pages : 333 pages
Book Rating : 4.4/5 (315 download)

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Book Synopsis Electron Nano-Imaging by : Nobuo Tanaka

Download or read book Electron Nano-Imaging written by Nobuo Tanaka and published by Springer. This book was released on 2017-04-04 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Scanning Probe Microscopy of Functional Materials

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Publisher : Springer
ISBN 13 : 9781493939473
Total Pages : 576 pages
Book Rating : 4.9/5 (394 download)

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Book Synopsis Scanning Probe Microscopy of Functional Materials by : Sergei V Kalinin

Download or read book Scanning Probe Microscopy of Functional Materials written by Sergei V Kalinin and published by Springer. This book was released on 2016-04-01 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Principles of Electron Optics, Volume 4

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Publisher : Academic Press
ISBN 13 : 0323916473
Total Pages : 665 pages
Book Rating : 4.3/5 (239 download)

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Book Synopsis Principles of Electron Optics, Volume 4 by : Peter W. Hawkes

Download or read book Principles of Electron Optics, Volume 4 written by Peter W. Hawkes and published by Academic Press. This book was released on 2022-05-10 with total page 665 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. Includes authoritative coverage of many recent developments in wave electron optics Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope

Progress in Nanoscale Characterization and Manipulation

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Publisher : Springer
ISBN 13 : 9811304548
Total Pages : 508 pages
Book Rating : 4.8/5 (113 download)

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Book Synopsis Progress in Nanoscale Characterization and Manipulation by : Rongming Wang

Download or read book Progress in Nanoscale Characterization and Manipulation written by Rongming Wang and published by Springer. This book was released on 2018-08-30 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

Handbook On Big Data And Machine Learning In The Physical Sciences (In 2 Volumes)

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Publisher : World Scientific
ISBN 13 : 9811204586
Total Pages : 1001 pages
Book Rating : 4.8/5 (112 download)

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Book Synopsis Handbook On Big Data And Machine Learning In The Physical Sciences (In 2 Volumes) by :

Download or read book Handbook On Big Data And Machine Learning In The Physical Sciences (In 2 Volumes) written by and published by World Scientific. This book was released on 2020-03-10 with total page 1001 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium provides a comprehensive collection of the emergent applications of big data, machine learning, and artificial intelligence technologies to present day physical sciences ranging from materials theory and imaging to predictive synthesis and automated research. This area of research is among the most rapidly developing in the last several years in areas spanning materials science, chemistry, and condensed matter physics.Written by world renowned researchers, the compilation of two authoritative volumes provides a distinct summary of the modern advances in instrument — driven data generation and analytics, establishing the links between the big data and predictive theories, and outlining the emerging field of data and physics-driven predictive and autonomous systems.

Quantitative Atomic-Resolution Electron Microscopy

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Publisher : Academic Press
ISBN 13 : 0323850936
Total Pages : 296 pages
Book Rating : 4.3/5 (238 download)

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Book Synopsis Quantitative Atomic-Resolution Electron Microscopy by :

Download or read book Quantitative Atomic-Resolution Electron Microscopy written by and published by Academic Press. This book was released on 2021-03-31 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

Nanometrology Using the Transmission Electron Microscope

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Publisher : Morgan & Claypool Publishers
ISBN 13 : 1681741202
Total Pages : 69 pages
Book Rating : 4.6/5 (817 download)

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Book Synopsis Nanometrology Using the Transmission Electron Microscope by : Vlad Stolojan

Download or read book Nanometrology Using the Transmission Electron Microscope written by Vlad Stolojan and published by Morgan & Claypool Publishers. This book was released on 2015-10-12 with total page 69 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

Scanning Microscopy for Nanotechnology

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Publisher : Springer Science & Business Media
ISBN 13 : 0387396209
Total Pages : 533 pages
Book Rating : 4.3/5 (873 download)

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Book Synopsis Scanning Microscopy for Nanotechnology by : Weilie Zhou

Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Springer Handbook of Microscopy

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Publisher : Springer Nature
ISBN 13 : 3030000699
Total Pages : 1561 pages
Book Rating : 4.0/5 (3 download)

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Book Synopsis Springer Handbook of Microscopy by : Peter W. Hawkes

Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

TMS 2014 143rd Annual Meeting & Exhibition, Annual Meeting Supplemental Proceedings

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Publisher : Springer
ISBN 13 : 3319482378
Total Pages : 1152 pages
Book Rating : 4.3/5 (194 download)

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Book Synopsis TMS 2014 143rd Annual Meeting & Exhibition, Annual Meeting Supplemental Proceedings by : The Minerals, Metals & Materials Society (TMS)

Download or read book TMS 2014 143rd Annual Meeting & Exhibition, Annual Meeting Supplemental Proceedings written by The Minerals, Metals & Materials Society (TMS) and published by Springer. This book was released on 2016-12-16 with total page 1152 pages. Available in PDF, EPUB and Kindle. Book excerpt: These papers present advancements in all aspects of high temperature electrochemistry, from the fundamental to the empirical and from the theoretical to the applied. Topics involving the application of electrochemistry to the nuclear fuel cycle, chemical sensors, energy storage, materials synthesis, refractory metals and their alloys, and alkali and alkaline earth metals are included. Also included are papers that discuss various technical, economic, and environmental issues associated with plant operations and industrial practices.

Field Emission Scanning Electron Microscopy

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Publisher : Springer
ISBN 13 : 9811044333
Total Pages : 137 pages
Book Rating : 4.8/5 (11 download)

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Book Synopsis Field Emission Scanning Electron Microscopy by : Nicolas Brodusch

Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 137 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage