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Publisher :
ISBN 13 :
Total Pages : 2540 pages
Book Rating : 4.3/5 (91 download)
Download or read book Chemical Abstracts written by and published by . This book was released on 2002 with total page 2540 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1948 pages
Book Rating : 4.3/5 (243 download)
Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 1948 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : IEEE Electron Devices Society
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 392 pages
Book Rating : 4.X/5 (4 download)
Download or read book 2000 22nd International Conference on Microelectronics written by IEEE Electron Devices Society and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: The papers in this volume are a partial selection from the International Conference on Microelectronic 1999 which provides a forum for the presentation and discussion of the recent developments and future trends in the field of microelectronics."
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ISBN 13 :
Total Pages : 980 pages
Book Rating : 4.3/5 (243 download)
Download or read book Science Abstracts written by and published by . This book was released on 1993 with total page 980 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 2264 pages
Book Rating : 4.:/5 (319 download)
Download or read book The Engineering Index Annual written by and published by . This book was released on 1992 with total page 2264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.
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ISBN 13 :
Total Pages : 1108 pages
Book Rating : 4.X/5 (6 download)
Download or read book JJAP written by and published by . This book was released on 2000 with total page 1108 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1286 pages
Book Rating : 4.3/5 (91 download)
Download or read book Physics Briefs written by and published by . This book was released on 1990 with total page 1286 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 1130 pages
Book Rating : 4.3/5 (91 download)
Download or read book F&S Index United States Annual written by and published by . This book was released on 1996 with total page 1130 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Zhong Yuan Chong
Publisher : Springer Science & Business Media
ISBN 13 : 9780792390961
Total Pages : 234 pages
Book Rating : 4.3/5 (99 download)
Download or read book Low-Noise Wide-Band Amplifiers in Bipolar and CMOS Technologies written by Zhong Yuan Chong and published by Springer Science & Business Media. This book was released on 1990-11-30 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analog circuit design has grown in importance because so many circuits cannot be realized with digital techniques. Examples are receiver front-ends, particle detector circuits, etc. Actually, all circuits which require high precision, high speed and low power consumption need analog solutions. High precision also needs low noise. Much has been written already on low noise design and optimization for low noise. Very little is available however if the source is not resistive but capacitive or inductive as is the case with antennas or semiconductor detectors. This book provides design techniques for these types of optimization. This book is thus intended firstly for engineers on senior or graduate level who have already designed their first operational amplifiers and want to go further. It is especially for engineers who do not want just a circuit but the best circuit. Design techniques are given that lead to the best performance within a certain technology. Moreover, this is done for all important technologies such as bipolar, CMOS and BiCMOS. Secondly, this book is intended for engineers who want to understand what they are doing. The design techniques are intended to provide insight. In this way, the design techniques can easily be extended to other circuits as well. Also, the design techniques form a first step towards design automation. Thirdly, this book is intended for analog design engineers who want to become familiar with both bipolar and CMOS technologies and who want to learn more about which transistor to choose in BiCMOS.
Author : Yuan Taur
Publisher : Cambridge University Press
ISBN 13 : 9781107635715
Total Pages : 0 pages
Book Rating : 4.6/5 (357 download)
Download or read book Fundamentals of Modern VLSI Devices written by Yuan Taur and published by Cambridge University Press. This book was released on 2013-05-02 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data, making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments, such as MOSFET scale length theory, high-field transport model and SiGe-base bipolar devices.
Author : Ramesh Senthinathan
Publisher : Springer Science & Business Media
ISBN 13 : 1461532043
Total Pages : 213 pages
Book Rating : 4.4/5 (615 download)
Download or read book Simultaneous Switching Noise of CMOS Devices and Systems written by Ramesh Senthinathan and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported in this monograph was partially supported by the grant from Semiconductor Research Corporation (SRC Contract No. 92-MP-086).
Author : Jan M. Rabaey
Publisher : Springer Science & Business Media
ISBN 13 : 1461523079
Total Pages : 373 pages
Book Rating : 4.4/5 (615 download)
Download or read book Low Power Design Methodologies written by Jan M. Rabaey and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 373 pages. Available in PDF, EPUB and Kindle. Book excerpt: Low Power Design Methodologies presents the first in-depth coverage of all the layers of the design hierarchy, ranging from the technology, circuit, logic and architectural levels, up to the system layer. The book gives insight into the mechanisms of power dissipation in digital circuits and presents state of the art approaches to power reduction. Finally, it introduces a global view of low power design methodologies and how these are being captured in the latest design automation environments. The individual chapters are written by the leading researchers in the area, drawn from both industry and academia. Extensive references are included at the end of each chapter. Audience: A broad introduction for anyone interested in low power design. Can also be used as a text book for an advanced graduate class. A starting point for any aspiring researcher.
Author : E. Ajith Amerasekera
Publisher : John Wiley & Sons
ISBN 13 :
Total Pages : 434 pages
Book Rating : 4.3/5 (91 download)
Download or read book ESD in Silicon Integrated Circuits written by E. Ajith Amerasekera and published by John Wiley & Sons. This book was released on 2002-05-22 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: * Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits. * Provides guidance on the implementation of circuit protection measures. * Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts. * Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.
Author : Daniel Nenni
Publisher : Createspace Independent Publishing Platform
ISBN 13 : 9781497525047
Total Pages : 0 pages
Book Rating : 4.5/5 (25 download)
Download or read book Fabless written by Daniel Nenni and published by Createspace Independent Publishing Platform. This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this book is to illustrate the magnificence of the fabless semiconductor ecosystem, and to give credit where credit is due. We trace the history of the semiconductor industry from both a technical and business perspective. We argue that the development of the fabless business model was a key enabler of the growth in semiconductors since the mid-1980s. Because business models, as much as the technology, are what keep us thrilled with new gadgets year after year, we focus on the evolution of the electronics business. We also invited key players in the industry to contribute chapters. These "In Their Own Words" chapters allow the heavyweights of the industry to tell their corporate history for themselves, focusing on the industry developments (both in technology and business models) that made them successful, and how they in turn drive the further evolution of the semiconductor industry.
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ISBN 13 :
Total Pages : 1586 pages
Book Rating : 4.E/5 ( download)
Download or read book Government Reports Announcements & Index written by and published by . This book was released on 1994-02 with total page 1586 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Institute of Electrical and Electronics Engineers
Publisher :
ISBN 13 :
Total Pages : 848 pages
Book Rating : 4.3/5 (91 download)
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1990 with total page 848 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues for 1973- cover the entire IEEE technical literature.
Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
