Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits

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Publisher : Stanford University
ISBN 13 :
Total Pages : 156 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits by : Hsiao-Heng Kelin Lee

Download or read book Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits written by Hsiao-Heng Kelin Lee and published by Stanford University. This book was released on 2011 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt: Radiation-induced soft errors are a major concern for modern digital circuits, especially memory elements. Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. latches and flip-flops, is challenging. Traditional techniques for designing soft-error-resilient sequential elements generally address single node errors, or Single Event Upsets (SEUs). However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing a new soft error resilience layout design principle called LEAP, or Layout Design through Error-Aware Transistor Positioning. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. We compare the soft error performance of SEU-immune flip-flops with the LEAP-DICE flip-flop using a test chip in 180nm CMOS under 200-MeV proton radiation and conclude that 1) our LEAP-DICE flip-flop encounters on average 2,000X and 5X fewer errors compared to a conventional D flip-flop and our reference DICE flip-flop, respectively; 2) our LEAP-DICE flip-flop has the best soft error performance among all existing SEU-immune flip-flops; 3) In the evaluation of our design framework, we also discovered new soft error effects related to operating conditions such as voltage scaling, clock frequency setting and radiation dose.

Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (747 download)

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Book Synopsis Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits by : Hsiao-Heng Kelin Lee

Download or read book Circuit and Layout Techniques for Soft-error-resilient Digital CMOS Circuits written by Hsiao-Heng Kelin Lee and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Radiation-induced soft errors are a major concern for modern digital circuits, especially memory elements. Unlike large Random Access Memories that can be protected using error-correcting codes and bit interleaving, soft error protection of sequential elements, i.e. latches and flip-flops, is challenging. Traditional techniques for designing soft-error-resilient sequential elements generally address single node errors, or Single Event Upsets (SEUs). However, with technology scaling, the charge deposited by a single particle strike can be simultaneously collected and shared by multiple circuit nodes, resulting in Single Event Multiple Upsets (SEMUs). In this work, we target SEMUs by presenting a design framework for soft-error-resilient sequential cell design with an overview of existing circuit and layout techniques for soft error mitigation, and introducing a new soft error resilience layout design principle called LEAP, or Layout Design through Error-Aware Transistor Positioning. We then discuss our application of LEAP to the SEU-immune Dual Interlocked Storage Cell (DICE) by implementing a new sequential element layout called LEAP-DICE, retaining the original DICE circuit topology. We compare the soft error performance of SEU-immune flip-flops with the LEAP-DICE flip-flop using a test chip in 180nm CMOS under 200-MeV proton radiation and conclude that 1) our LEAP-DICE flip-flop encounters on average 2,000X and 5X fewer errors compared to a conventional D flip-flop and our reference DICE flip-flop, respectively; 2) our LEAP-DICE flip-flop has the best soft error performance among all existing SEU-immune flip-flops; 3) In the evaluation of our design framework, we also discovered new soft error effects related to operating conditions such as voltage scaling, clock frequency setting and radiation dose.

Soft Error Reliability of VLSI Circuits

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Author :
Publisher : Springer Nature
ISBN 13 : 3030516105
Total Pages : 114 pages
Book Rating : 4.0/5 (35 download)

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Book Synopsis Soft Error Reliability of VLSI Circuits by : Behnam Ghavami

Download or read book Soft Error Reliability of VLSI Circuits written by Behnam Ghavami and published by Springer Nature. This book was released on 2020-10-13 with total page 114 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

CMOS

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Publisher : John Wiley & Sons
ISBN 13 : 0470229411
Total Pages : 1074 pages
Book Rating : 4.4/5 (72 download)

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Book Synopsis CMOS by : R. Jacob Baker

Download or read book CMOS written by R. Jacob Baker and published by John Wiley & Sons. This book was released on 2008 with total page 1074 pages. Available in PDF, EPUB and Kindle. Book excerpt: This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.

Circuit Design for CMOS VLSI

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Publisher : Springer Science & Business Media
ISBN 13 : 1461536200
Total Pages : 461 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Circuit Design for CMOS VLSI by : John P. Uyemura

Download or read book Circuit Design for CMOS VLSI written by John P. Uyemura and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 461 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last decade, CMOS has become increasingly attractive as a basic integrated circuit technology due to its low power (at moderate frequencies), good scalability, and rail-to-rail operation. There are now a variety of CMOS circuit styles, some based on static complementary con ductance properties, but others borrowing from earlier NMOS techniques and the advantages of using clocking disciplines for precharge-evaluate se quencing. In this comprehensive book, the reader is led systematically through the entire range of CMOS circuit design. Starting with the in dividual MOSFET, basic circuit building blocks are described, leading to a broad view of both combinatorial and sequential circuits. Once these circuits are considered in the light of CMOS process technologies, impor tant topics in circuit performance are considered, including characteristics of interconnect, gate delay, device sizing, and I/O buffering. Basic circuits are then composed to form macro elements such as multipliers, where the reader acquires a unified view of architectural performance through par allelism, and circuit performance through careful attention to circuit-level and layout design optimization. Topics in analog circuit design reflect the growing tendency for both analog and digital circuit forms to be combined on the same chip, and a careful treatment of BiCMOS forms introduces the reader to the combination of both FET and bipolar technologies on the same chip to provide improved performance.

Analysis and Design of Resilient VLSI Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 1441909311
Total Pages : 224 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Analysis and Design of Resilient VLSI Circuits by : Rajesh Garg

Download or read book Analysis and Design of Resilient VLSI Circuits written by Rajesh Garg and published by Springer Science & Business Media. This book was released on 2009-10-22 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

Integrated Circuit Design and Technology

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Publisher : Springer
ISBN 13 : 148997198X
Total Pages : 199 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Integrated Circuit Design and Technology by : M. J. Morant

Download or read book Integrated Circuit Design and Technology written by M. J. Morant and published by Springer. This book was released on 2013-12-01 with total page 199 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Extreme Environment Electronics

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Publisher : CRC Press
ISBN 13 : 1351832808
Total Pages : 1044 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Extreme Environment Electronics by : John D. Cressler

Download or read book Extreme Environment Electronics written by John D. Cressler and published by CRC Press. This book was released on 2017-12-19 with total page 1044 pages. Available in PDF, EPUB and Kindle. Book excerpt: Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space. The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Testing and Reliable Design of CMOS Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 1461315255
Total Pages : 239 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Testing and Reliable Design of CMOS Circuits by : Niraj K. Jha

Download or read book Testing and Reliable Design of CMOS Circuits written by Niraj K. Jha and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 239 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

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Publisher : John Wiley & Sons
ISBN 13 : 1118479297
Total Pages : 292 pages
Book Rating : 4.1/5 (184 download)

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Book Synopsis Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by : Eishi H. Ibe

Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2015-03-02 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

Resilient Computer System Design

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Publisher : Springer
ISBN 13 : 3319150693
Total Pages : 271 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis Resilient Computer System Design by : Victor Castano

Download or read book Resilient Computer System Design written by Victor Castano and published by Springer. This book was released on 2015-04-15 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a paradigm for designing new generation resilient and evolving computer systems, including their key concepts, elements of supportive theory, methods of analysis and synthesis of ICT with new properties of evolving functioning, as well as implementation schemes and their prototyping. The book explains why new ICT applications require a complete redesign of computer systems to address challenges of extreme reliability, high performance, and power efficiency. The authors present a comprehensive treatment for designing the next generation of computers, especially addressing safety critical, autonomous, real time, military, banking, and wearable health care systems.

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

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Publisher : Springer Science & Business Media
ISBN 13 : 1402083017
Total Pages : 237 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis ESD Protection Device and Circuit Design for Advanced CMOS Technologies by : Oleg Semenov

Download or read book ESD Protection Device and Circuit Design for Advanced CMOS Technologies written by Oleg Semenov and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.

Digital CMOS Circuit Design

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Publisher : Springer Science & Business Media
ISBN 13 : 1461322855
Total Pages : 367 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Digital CMOS Circuit Design by : Silvia Annaratone

Download or read book Digital CMOS Circuit Design written by Silvia Annaratone and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt:

CMOS, Circuit Design, Layout, and Simulation

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Publisher : Wiley-IEEE Press
ISBN 13 : 9780780334168
Total Pages : 944 pages
Book Rating : 4.3/5 (341 download)

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Book Synopsis CMOS, Circuit Design, Layout, and Simulation by : R. Jacob Baker

Download or read book CMOS, Circuit Design, Layout, and Simulation written by R. Jacob Baker and published by Wiley-IEEE Press. This book was released on 1997-08-22 with total page 944 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This exceptionally comprehensive tutorial presentation of complementary metal oxide semiconductor (CMOS) integrated circuits will guide you through the process of implementing a chip from the physical definition through the design and simulation of the finished chip. CMOS: CIRCUIT DESIGN, LAYOUT, AND SIMULATION provides an important contemporary view of a wide range of circuit blocks, the BSIM model, data converter architectures, and much more. Outstanding features of this text include: * Phase- and delay-locked loops, mixed-signal circuits, and data converters * More than 1,000 figures, 200 examples, and over 500 end-of-chapter problems * In-depth coverage of both analog and digital circuit-level design techniques * Real-world process parameters and design rules * Information on MOSIS fabrication procedures, and other key topics of interest * Information and directions on submitting chips of MOSIS * Tutorial presentation of material suitable for self study or as a university textbook * Numerous examples and homework problems For more information and links related to CMOS design, go to http://cmosedu.com. Professors: To request an examination copy simply e-mail [email protected]." Sponsored by: IEEE Solid-State Circuits Council/Society, IEEE Circuits and Systems Society.

CMOS Digital Integrated Circuits

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Publisher : McGraw-Hill Science, Engineering & Mathematics
ISBN 13 :
Total Pages : 698 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis CMOS Digital Integrated Circuits by : Sung-Mo Kang

Download or read book CMOS Digital Integrated Circuits written by Sung-Mo Kang and published by McGraw-Hill Science, Engineering & Mathematics. This book was released on 1999 with total page 698 pages. Available in PDF, EPUB and Kindle. Book excerpt: The second edition of this comprehensive text contains extensive revisions to reflect recent advances in technology and in circuit design practices. Recognizing that the area of digital integrated circuit design is evolving at an increasingly fast pace, every effort has been made to present state-of-the-art material on all subjects covered in the book. This book is primarily designed as a comprehensive text for senior level and first-year graduate level digital circuit design classes, as well as a reference for practicing engineers in the areas of IC design and VLSI.

CMOS Digital Integrated Circuits

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Publisher :
ISBN 13 : 9780071243421
Total Pages : 655 pages
Book Rating : 4.2/5 (434 download)

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Book Synopsis CMOS Digital Integrated Circuits by : Sung-Mo Kang

Download or read book CMOS Digital Integrated Circuits written by Sung-Mo Kang and published by . This book was released on 2002 with total page 655 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fourth edition of CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehensive coverage of digital CMOS circuit design, as well as addressing state-of-the-art technology issues highlighted by the widespread use of nanometer-scale CMOS technologies. In this latest edition, virtually all chapters have been re-written, the transistor model equations and device parameters have been revised to reflect the sigificant changes that must be taken into account for new technology generations, and the material has been reinforced with up-to-date examples. The broad-ranging coverage of this textbook starts with the fundamentals of CMOS process technology, and continues with MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, arithmetic building blocks, clock and I/O circuits, low power design techniques, design for manufacturability and design for testability.

Analogue IC Design

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Publisher : Presbyterian Publishing Corp
ISBN 13 : 9780863412158
Total Pages : 674 pages
Book Rating : 4.4/5 (121 download)

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Book Synopsis Analogue IC Design by : Chris Toumazou

Download or read book Analogue IC Design written by Chris Toumazou and published by Presbyterian Publishing Corp. This book was released on 1990-01-01 with total page 674 pages. Available in PDF, EPUB and Kindle. Book excerpt: Drawing together contributions from the world's most eminent analogue circuit designers, this text includes material on advances in integrated circuit technology, such as CMOS VLSI, which allows the mixture of analogue and digital circuits.