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Author : Reliability Physics
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (14 download)
Download or read book Reliability Physics (28th Annual Proceedings 1990) written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (476 download)
Download or read book 28th Annual Proceedings, Reliability Physics 1990 written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
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ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (916 download)
Download or read book Reliability physics 1990 written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 279 pages
Book Rating : 4.:/5 (826 download)
Download or read book Reliability Physics 1987 written by and published by . This book was released on 1987 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 28th Annual Proceedings, Reliability Physics 1990 written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1990 written by and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 : 9789991038421
Total Pages : pages
Book Rating : 4.0/5 (384 download)
Download or read book Reliability Physics, 1990 written by and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
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ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (692 download)
Download or read book Reliability Physics 1990 written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (636 download)
Download or read book Reliability Physics written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Institute of Electrical and Electronics Engineers
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (756 download)
Download or read book Reliability Physics Symposium, 1990. 28th Annual Proceedings., International written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (913 download)
Download or read book 1990 IEEE International Reliability Physics Symposium Proceedings written by and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : IEEE Electron Devices Society
Publisher :
ISBN 13 :
Total Pages : 322 pages
Book Rating : 4.:/5 (472 download)
Download or read book Reliability Physics written by IEEE Electron Devices Society and published by . This book was released on 1990 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Physics 1990 written by and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Electromigration / failure analysis / reliability assessment / gallium arsenide / charge trapping and breakdown in oxide and nitride dielectrics / stress-induced voiding / ferroelectrics / device and packaging / thermal breakdown of VLSI.
Author : Milton Ohring
Publisher : Academic Press
ISBN 13 : 0080575528
Total Pages : 759 pages
Book Rating : 4.0/5 (85 download)
Download or read book Reliability and Failure of Electronic Materials and Devices written by Milton Ohring and published by Academic Press. This book was released on 2014-10-14 with total page 759 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author : International Reliability Physics Symposium
Publisher :
ISBN 13 :
Total Pages : 766 pages
Book Rating : 4.:/5 (31 download)
Download or read book IEEE International Reliability Physics Symposium Proceedings written by International Reliability Physics Symposium and published by . This book was released on 2004 with total page 766 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Reliability Physics
Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (14 download)
Download or read book Reliability Physics (23rd Annual Proceedings 1985) Orlando, March 26-28, 1985 written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Franklin Richard Nash, Ph.D.
Publisher : CRC Press
ISBN 13 : 1498719201
Total Pages : 784 pages
Book Rating : 4.4/5 (987 download)
Download or read book Reliability Assessments written by Franklin Richard Nash, Ph.D. and published by CRC Press. This book was released on 2017-07-12 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.
