Quality Conformance and Qualification of Microelectronic Packages and Interconnects

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 9780471594369
Total Pages : 498 pages
Book Rating : 4.5/5 (943 download)

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Book Synopsis Quality Conformance and Qualification of Microelectronic Packages and Interconnects by : Michael Pecht

Download or read book Quality Conformance and Qualification of Microelectronic Packages and Interconnects written by Michael Pecht and published by John Wiley & Sons. This book was released on 1994-12-13 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt: All packaging engineers and technologists who want to ensure thatthey give their customers the highest quality, most cost-effectiveproducts should know that the paradigm has shifted. It has shiftedaway from the MIL-STDs and other government standards and testprocedures that don't cost-effectively address potential failuremechanisms or the manufacturing processes of the product. It hasshifted decisively towards tackling the root causes of failure andthe appropriate implementation of cost-effective process controls,qualityscreens, and tests. This book's groundbreaking, science-based approach to developingqualification and quality assurance programs helps engineers reacha new level of reliability in today's high-performancemicroelectronics. It does this with powerful... * Techniques for identifying and modeling failure mechanismsearlier in the design cycle, breaking the need to rely on fielddata * Physics-of-failure product reliability assessment methods thatcan be proactively implemented throughout the design andmanufacture of the product * Process controls that decrease variabilities in the end productand reduce end-of-line screening and testing A wide range of microelectronic package and interconnectconfigurations for both single-and multi-chip modules is examined,including chip and wire-bonds, tape-automated (TAB), flip-TAB,flip-chip bonds, high-density interconnects, chip-on-board designs(COB), MCM, 3-D stack, and many more. The remaining packageelements, such as die attachment, case and lid, leads, and lid andlead seals are also discussed in detail. The product of a distinguished team of authors and editors, thisbook's guidelines for avoiding potential high-risk manufacturingand qualification problems, as well as for implementing ongoingquality assurance, are sure to prove invaluable to both studentsand practicing professionals. For the professional engineer involved in the design andmanufacture of products containing electronic components, here is acomprehensive handbook to the theory and methods surrounding theassembly of microelectronic and electronic components. The bookfocuses on computers and consumer electronic products with internalsubsystems that reflect mechanical design constraints, costlimitations, and aesthetic and ergonomic concerns. Taking a totalsystem approach to packaging, the book systematically examines:basic chip and computer architecture; design and layout;interassembly and interconnections; cooling scheme; materialsselection, including ceramics, glasses, and metals; stress,vibration, and acoustics; and manufacturing and assemblytechnology. 1994 (0-471-53299-1) 800 pp. INTEGRATED CIRCUIT, HYBRID, AND MULTICHIP MODULE PACKAGE DESIGNGUIDELINES: A Focus on Reliability --Michael Pecht This comprehensive guide features a uniquely organized time-phasedapproach to design, development, qualification, manufacture, andin-service management. It provides step-by-step instructions on howto define realistic system requirements, define the system usageenvironment, identify potential failure modes, characterizematerials and processes by the key control label factors, and useexperiment, step-stress, and accelerated methods to ensure optimumdesign before production begins. Topics covered include: detaileddesign guidelines for substrate...wire and wire, tape automated,and flip-chip bonding...element attachment and case, lead, lead andlid seals--incorporating dimensional and geometric configurationsof package elements, manufacturing and assembly conditions,materials selection, and loading conditions. 1993 (0-471-59446-6)454 pp.

Reliability Physics 1986

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Publisher :
ISBN 13 :
Total Pages : 304 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Reliability Physics 1986 by :

Download or read book Reliability Physics 1986 written by and published by . This book was released on 1986 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:

MEMS Reliability

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Publisher : Springer Science & Business Media
ISBN 13 : 144196018X
Total Pages : 300 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis MEMS Reliability by : Allyson L. Hartzell

Download or read book MEMS Reliability written by Allyson L. Hartzell and published by Springer Science & Business Media. This book was released on 2010-11-02 with total page 300 pages. Available in PDF, EPUB and Kindle. Book excerpt: The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.

Reliability Prediction for Microelectronics

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Publisher : John Wiley & Sons
ISBN 13 : 1394210930
Total Pages : 404 pages
Book Rating : 4.3/5 (942 download)

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Book Synopsis Reliability Prediction for Microelectronics by : Joseph B. Bernstein

Download or read book Reliability Prediction for Microelectronics written by Joseph B. Bernstein and published by John Wiley & Sons. This book was released on 2024-02-20 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.

Proceedings

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Publisher :
ISBN 13 :
Total Pages : 692 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Proceedings by :

Download or read book Proceedings written by and published by . This book was released on with total page 692 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advanced Interconnects for ULSI Technology

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Publisher : John Wiley & Sons
ISBN 13 : 1119966868
Total Pages : 616 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Advanced Interconnects for ULSI Technology by : Mikhail Baklanov

Download or read book Advanced Interconnects for ULSI Technology written by Mikhail Baklanov and published by John Wiley & Sons. This book was released on 2012-02-17 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: Finding new materials for copper/low-k interconnects is critical to the continuing development of computer chips. While copper/low-k interconnects have served well, allowing for the creation of Ultra Large Scale Integration (ULSI) devices which combine over a billion transistors onto a single chip, the increased resistance and RC-delay at the smaller scale has become a significant factor affecting chip performance. Advanced Interconnects for ULSI Technology is dedicated to the materials and methods which might be suitable replacements. It covers a broad range of topics, from physical principles to design, fabrication, characterization, and application of new materials for nano-interconnects, and discusses: Interconnect functions, characterisations, electrical properties and wiring requirements Low-k materials: fundamentals, advances and mechanical properties Conductive layers and barriers Integration and reliability including mechanical reliability, electromigration and electrical breakdown New approaches including 3D, optical, wireless interchip, and carbon-based interconnects Intended for postgraduate students and researchers, in academia and industry, this book provides a critical overview of the enabling technology at the heart of the future development of computer chips.

Dependability Engineering

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Publisher : BoD – Books on Demand
ISBN 13 : 1789232589
Total Pages : 236 pages
Book Rating : 4.7/5 (892 download)

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Book Synopsis Dependability Engineering by : Fausto Pedro García Márquez

Download or read book Dependability Engineering written by Fausto Pedro García Márquez and published by BoD – Books on Demand. This book was released on 2018-06-06 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: The new technology and system communication advances are being employed in any system, being more complex. The system dependability considers the technical complexity, size, and interdependency of the system. The stochastic characteristic together with the complexity of the systems as dependability requires to be under control the Reliability, Availability, Maintainability, and Safety (RAMS). The dependability contemplates, therefore, the faults/failures, downtimes, stoppages, worker errors, etc. Dependability also refers to emergent properties, i.e., properties generated indirectly from other systems by the system analyzed. Dependability, understood as general description of system performance, requires advanced analytics that are considered in this book. Dependability management and engineering are covered with case studies and best practices. The diversity of the issues will be covered from algorithms, mathematical models, and software engineering, by design methodologies and technical or practical solutions. This book intends to provide the reader with a comprehensive overview of the current state of the art, case studies, hardware and software solutions, analytics, and data science in dependability engineering.

Recent Advances in PMOS Negative Bias Temperature Instability

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Publisher : Springer Nature
ISBN 13 : 9811661200
Total Pages : 322 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Recent Advances in PMOS Negative Bias Temperature Instability by : Souvik Mahapatra

Download or read book Recent Advances in PMOS Negative Bias Temperature Instability written by Souvik Mahapatra and published by Springer Nature. This book was released on 2021-11-25 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices areas. NBTI continues to remain as an important reliability issue for CMOS transistors and circuits. Development of NBTI resilient technology relies on utilizing suitable stress conditions, artifact free measurements and accurate physics-based models for the reliable determination of degradation at end-of-life, as well as understanding the process, material and device architectural impacts. This book discusses: Ultra-fast measurements and modelling of parametric drift due to NBTI in different transistor architectures: planar bulk and FDSOI p-MOSFETs, p-FinFETs and GAA-SNS p-FETs, with Silicon and Silicon Germanium channels. BTI Analysis Tool (BAT), a comprehensive physics-based framework, to model the measured time kinetics of parametric drift during and after DC and AC stress, at different stress and recovery biases and temperature, as well as pulse duty cycle and frequency. The Reaction Diffusion (RD) model is used for generated interface traps, Transient Trap Occupancy Model (TTOM) for charge occupancy of the generated interface traps and their contribution, Activated Barrier Double Well Thermionic (ABDWT) model for hole trapping in pre-existing bulk gate insulator traps, and Reaction Diffusion Drift (RDD) model for bulk trap generation in the BAT framework; NBTI parametric drift is due to uncorrelated contributions from the trap generation (interface, bulk) and trapping processes. Analysis and modelling of Nitrogen incorporation into the gate insulator, Germanium incorporation into the channel, and mechanical stress effects due to changes in the transistor layout or device dimensions; similarities and differences of (100) surface dominated planar and GAA MOSFETs and (110) sidewall dominated FinFETs are analysed.

Nano-Semiconductors

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Publisher : CRC Press
ISBN 13 : 1351833359
Total Pages : 602 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Nano-Semiconductors by : Krzysztof Iniewski

Download or read book Nano-Semiconductors written by Krzysztof Iniewski and published by CRC Press. This book was released on 2018-09-03 with total page 602 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions from top international experts from both industry and academia, Nano-Semiconductors: Devices and Technology is a must-read for anyone with a serious interest in future nanofabrication technologies. Taking into account the semiconductor industry’s transition from standard CMOS silicon to novel device structures—including carbon nanotubes (CNT), graphene, quantum dots, and III-V materials—this book addresses the state of the art in nano devices for electronics. It provides an all-encompassing, one-stop resource on the materials and device structures involved in the evolution from micro- to nanoelectronics. The book is divided into three parts that address: Semiconductor materials (i.e., carbon nanotubes, memristors, and spin organic devices) Silicon devices and technology (i.e., BiCMOS, SOI, various 3D integration and RAM technologies, and solar cells) Compound semiconductor devices and technology This reference explores the groundbreaking opportunities in emerging materials that will take system performance beyond the capabilities of traditional CMOS-based microelectronics. Contributors cover topics ranging from electrical propagation on CNT to GaN HEMTs technology and applications. Approaching the trillion-dollar nanotech industry from the perspective of real market needs and the repercussions of technological barriers, this resource provides vital information about elemental device architecture alternatives that will lead to massive strides in future development.

Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 9400761961
Total Pages : 91 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits by : Martin Wirnshofer

Download or read book Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits written by Martin Wirnshofer and published by Springer Science & Business Media. This book was released on 2013-02-15 with total page 91 pages. Available in PDF, EPUB and Kindle. Book excerpt: Increasing performance demands in integrated circuits, together with limited energy budgets, force IC designers to find new ways of saving power. One innovative way is the presented adaptive voltage scaling scheme, which tunes the supply voltage according to the present process, voltage and temperature variations as well as aging. The voltage is adapted “on the fly” by means of in-situ delay monitors to exploit unused timing margin, produced by state-of-the-art worst-case designs. This book discusses the design of the enhanced in-situ delay monitors and the implementation of the complete control-loop comprising the monitors, a control-logic and an on-chip voltage regulator. An analytical Markov-based model of the control-loop is derived to analyze its robustness and stability. Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits provides an in-depth assessment of the proposed voltage scaling scheme when applied to an arithmetic and an image processing circuit. This book is written for engineers interested in adaptive techniques for low-power CMOS circuits.

ISTFA 2012

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Publisher : ASM International
ISBN 13 : 1615039953
Total Pages : 643 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis ISTFA 2012 by : ASM International

Download or read book ISTFA 2012 written by ASM International and published by ASM International. This book was released on 2012 with total page 643 pages. Available in PDF, EPUB and Kindle. Book excerpt:

CRC Handbook of Thermal Engineering

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Publisher : CRC Press
ISBN 13 : 149871529X
Total Pages : 1649 pages
Book Rating : 4.4/5 (987 download)

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Book Synopsis CRC Handbook of Thermal Engineering by : Raj P. Chhabra

Download or read book CRC Handbook of Thermal Engineering written by Raj P. Chhabra and published by CRC Press. This book was released on 2017-11-08 with total page 1649 pages. Available in PDF, EPUB and Kindle. Book excerpt: The CRC Handbook of Thermal Engineering, Second Edition, is a fully updated version of this respected reference work, with chapters written by leading experts. Its first part covers basic concepts, equations and principles of thermodynamics, heat transfer, and fluid dynamics. Following that is detailed coverage of major application areas, such as bioengineering, energy-efficient building systems, traditional and renewable energy sources, food processing, and aerospace heat transfer topics. The latest numerical and computational tools, microscale and nanoscale engineering, and new complex-structured materials are also presented. Designed for easy reference, this new edition is a must-have volume for engineers and researchers around the globe.

Handbook of Electronic Package Design

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Publisher : CRC Press
ISBN 13 : 1351838415
Total Pages : 904 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Handbook of Electronic Package Design by : Michael Pecht

Download or read book Handbook of Electronic Package Design written by Michael Pecht and published by CRC Press. This book was released on 2018-10-24 with total page 904 pages. Available in PDF, EPUB and Kindle. Book excerpt: Both a handbook for practitioners and a text for use in teaching electronic packaging concepts, guidelines, and techniques. The treatment begins with an overview of the electronics design process and proceeds to examine the levels of electronic packaging and the fundamental issues in the development

Integrated Circuit Quality and Reliability

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Publisher : CRC Press
ISBN 13 : 1482277719
Total Pages : 809 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Integrated Circuit Quality and Reliability by : Eugene R. Hnatek

Download or read book Integrated Circuit Quality and Reliability written by Eugene R. Hnatek and published by CRC Press. This book was released on 2018-10-03 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

3D Flash Memories

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Publisher : Springer
ISBN 13 : 9401775125
Total Pages : 391 pages
Book Rating : 4.4/5 (17 download)

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Book Synopsis 3D Flash Memories by : Rino Micheloni

Download or read book 3D Flash Memories written by Rino Micheloni and published by Springer. This book was released on 2016-05-26 with total page 391 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book walks the reader through the next step in the evolution of NAND flash memory technology, namely the development of 3D flash memories, in which multiple layers of memory cells are grown within the same piece of silicon. It describes their working principles, device architectures, fabrication techniques and practical implementations, and highlights why 3D flash is a brand new technology. After reviewing market trends for both NAND and solid state drives (SSDs), the book digs into the details of the flash memory cell itself, covering both floating gate and emerging charge trap technologies. There is a plethora of different materials and vertical integration schemes out there. New memory cells, new materials, new architectures (3D Stacked, BiCS and P-BiCS, 3D FG, 3D VG, 3D advanced architectures); basically, each NAND manufacturer has its own solution. Chapter 3 to chapter 7 offer a broad overview of how 3D can materialize. The 3D wave is impacting emerging memories as well and chapter 8 covers 3D RRAM (resistive RAM) crosspoint arrays. Visualizing 3D structures can be a challenge for the human brain: this is way all these chapters contain a lot of bird’s-eye views and cross sections along the 3 axes. The second part of the book is devoted to other important aspects, such as advanced packaging technology (i.e. TSV in chapter 9) and error correction codes, which have been leveraged to improve flash reliability for decades. Chapter 10 describes the evolution from legacy BCH to the most recent LDPC codes, while chapter 11 deals with some of the most recent advancements in the ECC field. Last but not least, chapter 12 looks at 3D flash memories from a system perspective. Is 14nm the last step for planar cells? Can 100 layers be integrated within the same piece of silicon? Is 4 bit/cell possible with 3D? Will 3D be reliable enough for enterprise and datacenter applications? These are some of the questions that this book helps answering by providing insights into 3D flash memory design, process technology and applications.

New Algorithms, Architectures and Applications for Reconfigurable Computing

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Publisher : Springer Science & Business Media
ISBN 13 : 9781402031274
Total Pages : 340 pages
Book Rating : 4.0/5 (312 download)

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Book Synopsis New Algorithms, Architectures and Applications for Reconfigurable Computing by : Patrick Lysaght

Download or read book New Algorithms, Architectures and Applications for Reconfigurable Computing written by Patrick Lysaght and published by Springer Science & Business Media. This book was released on 2005-07-01 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt: New Algorithms, Architectures and Applications for Reconfigurable Computing consists of a collection of contributions from the authors of some of the best papers from the Field Programmable Logic conference (FPL’03) and the Design and Test Europe conference (DATE’03). In all, seventy-nine authors, from research teams from all over the world, were invited to present their latest research in the extended format permitted by this special volume. The result is a valuable book that is a unique record of the state of the art in research into field programmable logic and reconfigurable computing. The contributions are organized into twenty-four chapters and are grouped into three main categories: architectures, tools and applications. Within these three broad areas the most strongly represented themes are coarse-grained architectures; dynamically reconfigurable and multi-context architectures; tools for coarse-grained and reconfigurable architectures; networking, security and encryption applications. Field programmable logic and reconfigurable computing are exciting research disciplines that span the traditional boundaries of electronic engineering and computer science. When the skills of both research communities are combined to address the challenges of a single research discipline they serve as a catalyst for innovative research. The work reported in the chapters of this book captures that spirit of that innovation.

Future Energy Conferences and Symposia

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Publisher :
ISBN 13 :
Total Pages : 838 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Future Energy Conferences and Symposia by :

Download or read book Future Energy Conferences and Symposia written by and published by . This book was released on 1989 with total page 838 pages. Available in PDF, EPUB and Kindle. Book excerpt: