Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
X Ray Absorption Spectroscopy Of Semiconductors
Download X Ray Absorption Spectroscopy Of Semiconductors full books in PDF, epub, and Kindle. Read online X Ray Absorption Spectroscopy Of Semiconductors ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis X-Ray Absorption Spectroscopy of Semiconductors by : Claudia S. Schnohr
Download or read book X-Ray Absorption Spectroscopy of Semiconductors written by Claudia S. Schnohr and published by Springer. This book was released on 2014-11-05 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
Book Synopsis X-Ray Absorption and X-Ray Emission Spectroscopy by : Jeroen A. van Bokhoven
Download or read book X-Ray Absorption and X-Ray Emission Spectroscopy written by Jeroen A. van Bokhoven and published by John Wiley & Sons. This book was released on 2016-03-21 with total page 940 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X–ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X–ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials
Book Synopsis Characterization of Semiconductor Heterostructures and Nanostructures by : F. Boscherini
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by F. Boscherini and published by Elsevier Inc. Chapters. This book was released on 2013-04-11 with total page 79 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-ray Scattering from Semiconductors by : Paul F. Fewster
Download or read book X-ray Scattering from Semiconductors written by Paul F. Fewster and published by World Scientific. This book was released on 2000 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more.
Book Synopsis Examination of the Local Structure in Composite and Lowdimensional Semiconductor by X-ray Absorption Spectroscopy by :
Download or read book Examination of the Local Structure in Composite and Lowdimensional Semiconductor by X-ray Absorption Spectroscopy written by and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray absorption methods have been successfully used to obtain quantitative information about local atomic composition of two different materials. X-ray Absorption Near Edge Structure analysis and X-Ray Photoelectron Spectroscopy allowed us to determine seven chemical compounds and their concentrations in c-BN composite. Use of Extended X-ray Absorption Fine Structure in combination with Transmission Electron Microscopy enabled us to determine the composition and size of buried Ge quantum dots. It was found that the quantum dots consisted out of pure Ge core covered by 1-2 monolayers of a layer rich in Si.
Book Synopsis X-ray Studies of Microstructures in Semiconductors and Superconducting Materials by :
Download or read book X-ray Studies of Microstructures in Semiconductors and Superconducting Materials written by and published by . This book was released on 1991 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: Several different experimental investigations were carried out during the present report period. These include x-ray studies of semiconductors, high-{Tc} superconductors, and various thin films using synchrotron radiation (especially soft x-ray experiments by means of our new detector) and measurements of some fundamental properties of new superconducting materials made in our laboratory at Buffalo. We have made the first systematic study of electronic structure in the high-{Tc} superconductors La{sub 2-x}Sr(subscript x)CuO4 with x ranging from 0 to 0.15 by x-ray absorption spectroscopy (XAS).
Book Synopsis X-Ray Absorption and X-Ray Emission Spectroscopy by : Jeroen A. van Bokhoven
Download or read book X-Ray Absorption and X-Ray Emission Spectroscopy written by Jeroen A. van Bokhoven and published by John Wiley & Sons. This book was released on 2016-01-14 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last two decades, remarkable and often spectacularprogress has been made in the methodological and instrumentalaspects of x–ray absorption and emission spectroscopy. Thisprogress includes considerable technological improvements in thedesign and production of detectors especially with the developmentand expansion of large-scale synchrotron reactors All this hasresulted in improved analytical performance and new applications,as well as in the perspective of a dramatic enhancement in thepotential of x–ray based analysis techniques for the nearfuture. This comprehensive two-volume treatise features articlesthat explain the phenomena and describe examples of X–rayabsorption and emission applications in several fields, includingchemistry, biochemistry, catalysis, amorphous and liquid systems,synchrotron radiation, and surface phenomena. Contributors explainthe underlying theory, how to set up X–ray absorptionexperiments, and how to analyze the details of the resultingspectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory andApplications: Combines the theory, instrumentation and applications of x-rayabsorption and emission spectroscopies which offer uniquediagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchersacross multi-disciplines since intense beams from modern sourceshave revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers workingon x-rays and related synchrotron sources and applications inmaterials, physics, medicine, environment/geology, andbiomedical materials
Book Synopsis X-ray Studies of Microstructures in Semiconductor and Superconducting Materials . Performance Report by :
Download or read book X-ray Studies of Microstructures in Semiconductor and Superconducting Materials . Performance Report written by and published by . This book was released on 1993 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: A summary of research work performed from 11/1/86 to 4/10/93 is presented. Synchrotron x rays were used to probe the short-range-order (SRO) structures in these materials, especially layered semiconductors and high-{Tc} oxide superconductors. X-ray absorption fine structure spectroscopy, grazing incidence x-ray scattering and fluorescence, and total electron yield as probe for surfaces and interfaces were used. A new soft x-ray detector was developed.
Book Synopsis Introduction to XAFS by : Grant Bunker
Download or read book Introduction to XAFS written by Grant Bunker and published by Cambridge University Press. This book was released on 2010-01-28 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.
Book Synopsis Carrier-driven Disordering in Semiconductors by : Patrick Brian Hillyard
Download or read book Carrier-driven Disordering in Semiconductors written by Patrick Brian Hillyard and published by . This book was released on 2008 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis X-ray Scattering From Semiconductors by : Paul F Fewster
Download or read book X-ray Scattering From Semiconductors written by Paul F Fewster and published by World Scientific. This book was released on 2000-10-27 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors./a
Book Synopsis X-ray Absorption Spectroscopy for the Chemical and Materials Sciences by : John Evans
Download or read book X-ray Absorption Spectroscopy for the Chemical and Materials Sciences written by John Evans and published by John Wiley & Sons. This book was released on 2017-11-23 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.
Book Synopsis X-ray Absorption Fine Structure for Catalysts and Surfaces by : Yasuhiro Iwasawa
Download or read book X-ray Absorption Fine Structure for Catalysts and Surfaces written by Yasuhiro Iwasawa and published by World Scientific. This book was released on 1996 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechanisms for the understanding of catalysts and development of new catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The applications of XAFS have now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book caters to a wide range of researchers and students working in the domain or related topics.
Book Synopsis X-Ray Metrology in Semiconductor Manufacturing by : D. Keith Bowen
Download or read book X-Ray Metrology in Semiconductor Manufacturing written by D. Keith Bowen and published by CRC Press. This book was released on 2018-10-03 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.
Book Synopsis X-Ray Spectroscopy by : Shatendra K Sharma
Download or read book X-Ray Spectroscopy written by Shatendra K Sharma and published by BoD – Books on Demand. This book was released on 2012-02-01 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt: The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.
Book Synopsis Characterization of Semiconductor Heterostructures and Nanostructures by : Giovanni Agostini
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Giovanni Agostini and published by Elsevier. This book was released on 2011-08-11 with total page 501 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. - Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures - Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field - Each chapter starts with a didactic introduction on the technique - The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors
Book Synopsis X-ray Studies of Microstructures in Semiconductors and Superconducting Materials. Annual Technical Progress Report, July 1, 1990--June 30, 1991 by :
Download or read book X-ray Studies of Microstructures in Semiconductors and Superconducting Materials. Annual Technical Progress Report, July 1, 1990--June 30, 1991 written by and published by . This book was released on 1991 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: Several different experimental investigations were carried out during the present report period. These include x-ray studies of semiconductors, high-{Tc} superconductors, and various thin films using synchrotron radiation (especially soft x-ray experiments by means of our new detector) and measurements of some fundamental properties of new superconducting materials made in our laboratory at Buffalo. We have made the first systematic study of electronic structure in the high-{Tc} superconductors La{sub 2-x}Sr(subscript x)CuO4 with x ranging from 0 to 0.15 by x-ray absorption spectroscopy (XAS).
