Vlsi Design And Test

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VLSI Design and Test for Systems Dependability

Author : Shojiro Asai
Publisher : Springer
ISBN 13 : 4431565949
Total Pages : 800 pages
Book Rating : 4.4/5 (315 download)

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Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai

Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

VLSI Test Principles and Architectures

Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 9780080474793
Total Pages : 808 pages
Book Rating : 4.4/5 (747 download)

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Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

VLSI Design and Test

Author : Anirban Sengupta
Publisher : Springer
ISBN 13 : 9813297670
Total Pages : 775 pages
Book Rating : 4.8/5 (132 download)

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Book Synopsis VLSI Design and Test by : Anirban Sengupta

Download or read book VLSI Design and Test written by Anirban Sengupta and published by Springer. This book was released on 2019-08-17 with total page 775 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

VLSI Design and Test

Author : Brajesh Kumar Kaushik
Publisher : Springer
ISBN 13 : 9811074704
Total Pages : 815 pages
Book Rating : 4.8/5 (11 download)

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Book Synopsis VLSI Design and Test by : Brajesh Kumar Kaushik

Download or read book VLSI Design and Test written by Brajesh Kumar Kaushik and published by Springer. This book was released on 2017-12-21 with total page 815 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Advanced VLSI Design and Testability Issues

Author : Suman Lata Tripathi
Publisher : CRC Press
ISBN 13 : 1000168158
Total Pages : 379 pages
Book Rating : 4.0/5 (1 download)

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Book Synopsis Advanced VLSI Design and Testability Issues by : Suman Lata Tripathi

Download or read book Advanced VLSI Design and Testability Issues written by Suman Lata Tripathi and published by CRC Press. This book was released on 2020-08-18 with total page 379 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Design to Test

Author : John Turino
Publisher : Springer Science & Business Media
ISBN 13 : 9401160449
Total Pages : 368 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Design to Test by : John Turino

Download or read book Design to Test written by John Turino and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 368 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.

System-on-Chip Test Architectures

Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 9780080556802
Total Pages : 896 pages
Book Rating : 4.5/5 (568 download)

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Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang

Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

IDDQ Testing of VLSI Circuits

Author : Ravi K. Gulati
Publisher : Springer Science & Business Media
ISBN 13 : 1461531462
Total Pages : 121 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis IDDQ Testing of VLSI Circuits by : Ravi K. Gulati

Download or read book IDDQ Testing of VLSI Circuits written by Ravi K. Gulati and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

Delay Fault Testing for VLSI Circuits

Author : Angela Krstic
Publisher : Springer Science & Business Media
ISBN 13 : 1461555973
Total Pages : 201 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Delay Fault Testing for VLSI Circuits by : Angela Krstic

Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

VLSI Design and Test

Author : Manoj Singh Gaur
Publisher : Springer
ISBN 13 : 3642420249
Total Pages : 403 pages
Book Rating : 4.6/5 (424 download)

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Book Synopsis VLSI Design and Test by : Manoj Singh Gaur

Download or read book VLSI Design and Test written by Manoj Singh Gaur and published by Springer. This book was released on 2013-12-13 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Digital VLSI Design with Verilog

Author : John Williams
Publisher : Springer Science & Business Media
ISBN 13 : 1402084463
Total Pages : 447 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Digital VLSI Design with Verilog by : John Williams

Download or read book Digital VLSI Design with Verilog written by John Williams and published by Springer Science & Business Media. This book was released on 2008-06-06 with total page 447 pages. Available in PDF, EPUB and Kindle. Book excerpt: Verilog and its usage has come a long way since its original invention in the mid-80s by Phil Moorby. At the time the average design size was around ten thousand gates, and simulation to validate the design was its primary usage. But between then and now designs have increased dramatically in size, and automatic logic synthesis from RTL has become the standard design ?ow for most design. Indeed, the language has evolved and been re-standardized too. Overtheyears,manybookshavebeenwrittenaboutVerilog.Myown,coauthored with Phil Moorby, had the goal of de?ning the language and its usage, providing - amples along the way. It has been updated with ?ve new editions as the language and its usage evolved. However this new book takes a very different and unique view; that of the designer. John Michael Williams has a long history of working and teaching in the ?eld of IC and ASIC design. He brings an indepth presentation of Verilog and how to use it with logic synthesis tools; no other Verilog book has dealt with this topic as deeply as he has. If you need to learn Verilog and get up to speed quickly to use it for synthesis, this book is for you. It is sectioned around a set of lessons including presentation and explanation of new concepts and approaches to design, along with lab sessions.

Digital VLSI Design with Verilog

Author : John Michael Williams
Publisher : Springer
ISBN 13 : 3319047892
Total Pages : 553 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Digital VLSI Design with Verilog by : John Michael Williams

Download or read book Digital VLSI Design with Verilog written by John Michael Williams and published by Springer. This book was released on 2014-06-17 with total page 553 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is structured as a step-by-step course of study along the lines of a VLSI integrated circuit design project. The entire Verilog language is presented, from the basics to everything necessary for synthesis of an entire 70,000 transistor, full-duplex serializer-deserializer, including synthesizable PLLs. The author includes everything an engineer needs for in-depth understanding of the Verilog language: Syntax, synthesis semantics, simulation and test. Complete solutions for the 27 labs are provided in the downloadable files that accompany the book. For readers with access to appropriate electronic design tools, all solutions can be developed, simulated, and synthesized as described in the book. A partial list of design topics includes design partitioning, hierarchy decomposition, safe coding styles, back annotation, wrapper modules, concurrency, race conditions, assertion-based verification, clock synchronization, and design for test. A concluding presentation of special topics includes System Verilog and Verilog-AMS.

2020 24th International Symposium on VLSI Design and Test (VDAT).

Author :
Publisher :
ISBN 13 : 9781728193694
Total Pages : pages
Book Rating : 4.1/5 (936 download)

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Book Synopsis 2020 24th International Symposium on VLSI Design and Test (VDAT). by :

Download or read book 2020 24th International Symposium on VLSI Design and Test (VDAT). written by and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Testing and Diagnosis of VLSI and ULSI

Author : F. Lombardi
Publisher : Springer Science & Business Media
ISBN 13 : 9400914172
Total Pages : 531 pages
Book Rating : 4.4/5 (9 download)

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Book Synopsis Testing and Diagnosis of VLSI and ULSI by : F. Lombardi

Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.

Modern VLSI Design

Author : Wayne Wolf
Publisher : Pearson Education
ISBN 13 : 0132441845
Total Pages : 703 pages
Book Rating : 4.1/5 (324 download)

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Book Synopsis Modern VLSI Design by : Wayne Wolf

Download or read book Modern VLSI Design written by Wayne Wolf and published by Pearson Education. This book was released on 2002-01-14 with total page 703 pages. Available in PDF, EPUB and Kindle. Book excerpt: For Electrical Engineering and Computer Engineering courses that cover the design and technology of very large scale integrated (VLSI) circuits and systems. May also be used as a VLSI reference for professional VLSI design engineers, VLSI design managers, and VLSI CAD engineers. Modern VSLI Design provides a comprehensive “bottom-up” guide to the design of VSLI systems, from the physical design of circuits through system architecture with focus on the latest solution for system-on-chip (SOC) design. Because VSLI system designers face a variety of challenges that include high performance, interconnect delays, low power, low cost, and fast design turnaround time, successful designers must understand the entire design process. The Third Edition also provides a much more thorough discussion of hardware description languages, with introduction to both Verilog and VHDL. For that reason, this book presents the entire VSLI design process in a single volume.

Progress in VLSI Design and Test

Author : Hafizur Rahaman
Publisher : Springer
ISBN 13 : 3642314945
Total Pages : 427 pages
Book Rating : 4.6/5 (423 download)

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Book Synopsis Progress in VLSI Design and Test by : Hafizur Rahaman

Download or read book Progress in VLSI Design and Test written by Hafizur Rahaman and published by Springer. This book was released on 2012-06-26 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.