Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics: Volume 567

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Publisher :
ISBN 13 :
Total Pages : 650 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics: Volume 567 by : H. R. Huff

Download or read book Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics: Volume 567 written by H. R. Huff and published by . This book was released on 1999-09 with total page 650 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device scaling has been the engine driving the continued pervasiveness of the microelectronics revolution. The SIA roadmap calls for 4-5nm films (oxide equivalent thickness) in 2000, and

Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics: Volume 567

Download Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics: Volume 567 PDF Online Free

Author :
Publisher :
ISBN 13 :
Total Pages : 650 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics: Volume 567 by : H. R. Huff

Download or read book Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics: Volume 567 written by H. R. Huff and published by . This book was released on 1999-09 with total page 650 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device scaling has been the engine driving the continued pervasiveness of the microelectronics revolution. The SIA roadmap calls for 4-5nm films (oxide equivalent thickness) in 2000, and

High-k Gate Dielectrics for CMOS Technology

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Publisher : John Wiley & Sons
ISBN 13 : 3527646361
Total Pages : 560 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis High-k Gate Dielectrics for CMOS Technology by : Gang He

Download or read book High-k Gate Dielectrics for CMOS Technology written by Gang He and published by John Wiley & Sons. This book was released on 2012-08-10 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: A state-of-the-art overview of high-k dielectric materials for advanced field-effect transistors, from both a fundamental and a technological viewpoint, summarizing the latest research results and development solutions. As such, the book clearly discusses the advantages of these materials over conventional materials and also addresses the issues that accompany their integration into existing production technologies. Aimed at academia and industry alike, this monograph combines introductory parts for newcomers to the field as well as advanced sections with directly applicable solutions for experienced researchers and developers in materials science, physics and electrical engineering.

Silicon Materials Science and Technology X

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Publisher : The Electrochemical Society
ISBN 13 : 156677439X
Total Pages : 599 pages
Book Rating : 4.5/5 (667 download)

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Book Synopsis Silicon Materials Science and Technology X by : Howard R. Huff

Download or read book Silicon Materials Science and Technology X written by Howard R. Huff and published by The Electrochemical Society. This book was released on 2006 with total page 599 pages. Available in PDF, EPUB and Kindle. Book excerpt: This was the tenth symposium of the International Symposium on Silcon Material Science and Technology, going back to 1969. This issue provides a unique historical record of the program and will aid in the understanding of silicon materials over the last 35 years.

Silicon Surfaces and Formation of Interfaces

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Publisher : World Scientific
ISBN 13 : 9789810232863
Total Pages : 580 pages
Book Rating : 4.2/5 (328 download)

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Book Synopsis Silicon Surfaces and Formation of Interfaces by : Jarek Dabrowski

Download or read book Silicon Surfaces and Formation of Interfaces written by Jarek Dabrowski and published by World Scientific. This book was released on 2000 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon, the basic material for a multibillion-dollar industry, is the most widely researched and applied semiconductor, and its surfaces are the most thoroughly studied of all semiconductor surfaces. Silicon Surfaces and Formation of Interfaces may be used as an introduction to graduate-level physics and chemical physics. Moreover, it gives a specialized and comprehensive description of the most common faces of silicon crystals as well as their interaction with adsorbates and overlayers. This knowledge is presented in a systematic and easy-to-follow way. Discussion of each system is preceded by a brief overview which categorizes the features and physical mechanisms before the details are presented. The literature is easily available, and the references am numerous and organized in tables, allowing a search without the need to browse through the text. Though this volume focuses on a scientific understanding of physics on the atomistic and mesoscopic levels, it also highlights existing and potential links between basic research in surface science and applications in the silicon industry. It will be valuable to anyone writing a paper, thesis, or proposal in the field of silicon surfaces.

National Semiconductor Metrology Program

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Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.0/5 ( download)

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Book Synopsis National Semiconductor Metrology Program by : National Institute of Standards and Technology (U.S.)

Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

National Semiconductor Metrology Program

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Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.3/5 ( download)

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Book Synopsis National Semiconductor Metrology Program by : National Semiconductor Metrology Program (U.S.)

Download or read book National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000

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Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 by :

Download or read book National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 written by and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

ULSI Process Integration II

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Publisher : The Electrochemical Society
ISBN 13 : 9781566773089
Total Pages : 636 pages
Book Rating : 4.7/5 (73 download)

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Book Synopsis ULSI Process Integration II by : Cor L. Claeys

Download or read book ULSI Process Integration II written by Cor L. Claeys and published by The Electrochemical Society. This book was released on 2001 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Rapid Thermal and Other Short-time Processing Technologies II

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Publisher : The Electrochemical Society
ISBN 13 : 9781566773157
Total Pages : 458 pages
Book Rating : 4.7/5 (731 download)

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Book Synopsis Rapid Thermal and Other Short-time Processing Technologies II by : Dim-Lee Kwong

Download or read book Rapid Thermal and Other Short-time Processing Technologies II written by Dim-Lee Kwong and published by The Electrochemical Society. This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Electronics, Dielectric Science and Technology, and High Temperature Materials Divisions."

Low and High Dielectric Constant Materials

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Publisher : The Electrochemical Society
ISBN 13 : 9781566772709
Total Pages : 262 pages
Book Rating : 4.7/5 (727 download)

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Book Synopsis Low and High Dielectric Constant Materials by : Mark J. Lododa

Download or read book Low and High Dielectric Constant Materials written by Mark J. Lododa and published by The Electrochemical Society. This book was released on 2000 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contains papers from a May 2000 symposium, representing the state of the art in areas of dielectric materials science and process integration. Papers are arranged in sections on low and high dielectric constant materials, covering topics such as ammonia plasma passivation effects on properties of post-CMP low-k HSQ, characterization of ashing effects on low-k dielectric films, and electron beam curing of thin film polymer dielectrics. Other subjects include characterization of high-k dielectrics using the non-contact surface charge profiler method, and processing effects and electrical evaluation of ZrO2 formed by RTP oxidation of Zr. Loboda is affiliated with Dow Corning Corporation. c. Book News Inc.

Rapid Thermal and Other Short-time Processing Technologies

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Publisher : The Electrochemical Society
ISBN 13 : 9781566772747
Total Pages : 482 pages
Book Rating : 4.7/5 (727 download)

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Book Synopsis Rapid Thermal and Other Short-time Processing Technologies by : Fred Roozeboom

Download or read book Rapid Thermal and Other Short-time Processing Technologies written by Fred Roozeboom and published by The Electrochemical Society. This book was released on 2000 with total page 482 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings from this May 2000 symposium illustrate the range of applications in Rapid Thermal Processing (RTP). The refereed papers cover a variety of issues, such as ultra-shallow junctions; contacts for nanoscale CMOS; gate stacks; new applications of RTP, such as for the enhanced crystalization of amorphous silicon thin films; and advances on RTP systems and process monitoring, including optimizing and controlling gas flows in an RTCVD reactor. Most presentations are supported by charts and other graphical data. c. Book News Inc.

Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592

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Publisher : Mrs Proceedings
ISBN 13 :
Total Pages : 408 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 by : D. A. Buchanan

Download or read book Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 written by D. A. Buchanan and published by Mrs Proceedings. This book was released on 2000-10-17 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.

Multifunctional Oxide Heterostructures

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Publisher : Oxford University Press
ISBN 13 : 0199584125
Total Pages : 429 pages
Book Rating : 4.1/5 (995 download)

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Book Synopsis Multifunctional Oxide Heterostructures by : Evgeny Y. Tsymbal

Download or read book Multifunctional Oxide Heterostructures written by Evgeny Y. Tsymbal and published by Oxford University Press. This book was released on 2012-08-30 with total page 429 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume explores the rapidly developing field of oxide thin-films and heterostructures, which exhibit unusual physical properties interesting from the fundamental point of view and for device application. The chapters discuss topics that represent some of the key innovations in the field over recent years.

Chemical Processing of Dielectrics, Insulators and Electronic Ceramics: Volume 606

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Publisher :
ISBN 13 :
Total Pages : 336 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Chemical Processing of Dielectrics, Insulators and Electronic Ceramics: Volume 606 by : Anthony C. Jones

Download or read book Chemical Processing of Dielectrics, Insulators and Electronic Ceramics: Volume 606 written by Anthony C. Jones and published by . This book was released on 2000-08-04 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Thin Films for Optical Waveguide Devices and Materials for Optical Limiting: Volume 597

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Publisher : Mrs Proceedings
ISBN 13 :
Total Pages : 496 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Thin Films for Optical Waveguide Devices and Materials for Optical Limiting: Volume 597 by : Keiichi Nashimoto

Download or read book Thin Films for Optical Waveguide Devices and Materials for Optical Limiting: Volume 597 written by Keiichi Nashimoto and published by Mrs Proceedings. This book was released on 2000-10-02 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Low-dielectric Constant Materials

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Publisher :
ISBN 13 :
Total Pages : 330 pages
Book Rating : 4.3/5 (91 download)

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Download or read book Low-dielectric Constant Materials written by and published by . This book was released on 1999 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: