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Author : Vishwani D. Agrawal
Publisher : IEEE Computer Society Press
ISBN 13 :
Total Pages : 426 pages
Book Rating : 4.3/5 (91 download)
Download or read book Tutorial Test Generation for VLSI Chips written by Vishwani D. Agrawal and published by IEEE Computer Society Press. This book was released on 1988 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sharad C. Seth
Publisher :
ISBN 13 :
Total Pages : 102 pages
Book Rating : 4.F/5 ( download)
Download or read book Tutorial, Test Generation for VLSI Circuits written by Sharad C. Seth and published by . This book was released on 1987 with total page 102 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Charles E. Stroud
Publisher : Springer Science & Business Media
ISBN 13 : 0306475049
Total Pages : 338 pages
Book Rating : 4.3/5 (64 download)
Download or read book A Designer’s Guide to Built-In Self-Test written by Charles E. Stroud and published by Springer Science & Business Media. This book was released on 2005-12-27 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt: A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : Gaynor E. Taylor
Publisher : IET
ISBN 13 : 9780863412677
Total Pages : 298 pages
Book Rating : 4.4/5 (126 download)
Download or read book Algorithmic and Knowledge Based CAD for VLSI written by Gaynor E. Taylor and published by IET. This book was released on 1992 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Samples the present state-of-the-art in CAD for VLSI, covering both newly developed algorithms and applications of techniques from the artificial intelligence community. The material is based on a tutorial course run in conjunction with the 1991 European Conference on Circuit Theory and Design, and should interest engineers involved in the design and testing of integrated circuits and systems. Annotation copyrighted by Book News, Inc., Portland, OR
Author : Hassan K. Reghbati
Publisher :
ISBN 13 :
Total Pages : 630 pages
Book Rating : 4.3/5 (91 download)
Download or read book Tutorial--VLSI Testing & Validation Techniques written by Hassan K. Reghbati and published by . This book was released on 1985 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 0080474799
Total Pages : 809 pages
Book Rating : 4.0/5 (84 download)
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author : Xinghao Chen
Publisher : Springer Science & Business Media
ISBN 13 : 1461313295
Total Pages : 151 pages
Book Rating : 4.4/5 (613 download)
Download or read book Efficient Branch and Bound Search with Application to Computer-Aided Design written by Xinghao Chen and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 151 pages. Available in PDF, EPUB and Kindle. Book excerpt: Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. In many applications, the classic branch-and-bound search methods perform duplications of computations, or rely on the search decision trees which keep track of the branch-and-bound search processes. In CAD and many other technical fields, the computational cost of constructing branch-and-bound search decision trees in solving large scale problems is prohibitive and duplications of computations are intolerable. Efficient branch-and-bound methods are needed to deal with today's computational challenges. Efficient branch-and-bound methods must not duplicate computations. Efficient Branch and Bound Search with Application to Computer-Aided Design describes an efficient branch-and-bound method for logic justification, which is fundamental to automatic test pattern generation (ATPG), redundancy identification, logic synthesis, minimization, verification, and other problems in CAD. The method is called justification equivalence, based on the observation that justification processes may share identical subsequent search decision sequences. With justification equivalence, duplication of computations is avoided in the dynamic branch-and-bound search process without using search decision trees. Efficient Branch and Bound Search with Application to Computer-Aided Design consists of two parts. The first part, containing the first three chapters, provides the theoretical work. The second part deals with applications, particularly ATPG for sequential circuits. This book is particularly useful to readers who are interested in the design and test of digital circuits.
Author : A. F. Schwarz
Publisher : Academic Press
ISBN 13 : 148325805X
Total Pages : 593 pages
Book Rating : 4.4/5 (832 download)
Download or read book Handbook of VLSI Chip Design and Expert Systems written by A. F. Schwarz and published by Academic Press. This book was released on 2014-05-10 with total page 593 pages. Available in PDF, EPUB and Kindle. Book excerpt: Handbook of VLSI Chip Design and Expert Systems provides information pertinent to the fundamental aspects of expert systems, which provides a knowledge-based approach to problem solving. This book discusses the use of expert systems in every possible subtask of VLSI chip design as well as in the interrelations between the subtasks. Organized into nine chapters, this book begins with an overview of design automation, which can be identified as Computer-Aided Design of Circuits and Systems (CADCAS). This text then presents the progress in artificial intelligence, with emphasis on expert systems. Other chapters consider the impact of design automation, which exploits the basic capabilities of computers to perform complex calculations and to handle huge amounts of data with a high speed and accuracy. This book discusses as well the characterization of microprocessors. The final chapter deals with interactive I/O devices. This book is a valuable resource for system design experts, circuit analysts and designers, logic designers, device engineers, technologists, and application-specific designers.
Author : Alberto Bosio
Publisher : Springer Nature
ISBN 13 : 303094705X
Total Pages : 541 pages
Book Rating : 4.0/5 (39 download)
Download or read book Approximate Computing Techniques written by Alberto Bosio and published by Springer Nature. This book was released on 2022-06-10 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book serves as a single-source reference to the latest advances in Approximate Computing (AxC), a promising technique for increasing performance or reducing the cost and power consumption of a computing system. The authors discuss the different AxC design and validation techniques, and their integration. They also describe real AxC applications, spanning from mobile to high performance computing and also safety-critical applications.
Author : Mohammad Karim
Publisher : CRC Press
ISBN 13 : 1420061321
Total Pages : 505 pages
Book Rating : 4.4/5 (2 download)
Download or read book Digital Design written by Mohammad Karim and published by CRC Press. This book was released on 2017-12-19 with total page 505 pages. Available in PDF, EPUB and Kindle. Book excerpt: In today’s digital design environment, engineers must achieve quick turn-around time with ready accesses to circuit synthesis and simulation applications. This type of productivity relies on the principles and practices of computer aided design (CAD). Digital Design: Basic Concepts and Principles addresses the many challenging issues critical to today’s digital design practices such as hazards and logic minimization, finite-state-machine synthesis, cycles and races, and testability theories while providing hands-on experience using one of the industry’s most popular design application, Xilinx Web PACKTM. The authors begin by discussing conventional and unconventional number systems, binary coding theories, and arithmetic as well as logic functions and Boolean algebra. Building upon classic theories of digital systems, the book illustrates the importance of logic minimization using the Karnaugh map technique. It continues by discussing implementation options and examining the pros and cons of each method in addition to an assessment of tradeoffs that often accompany design practices. The book also covers testability, emphasizing that a good digital design must be easy to verify and test with the lowest cost possible. Throughout the text, the authors analyze combinational and sequential logic elements and illustrate the designs of these components in structural, hierarchical, and behavior VHDL descriptions. Coveringfundamentals and best practices, Digital Design: Basic Concepts and Principles provides you with critical knowledge of how each digital component ties together to form a system and develops the skills you need to design and simulate these digital components using modern CAD software.
Author : Paul H. Bardell
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 376 pages
Book Rating : 4.3/5 (91 download)
Download or read book Built In Test for VLSI written by Paul H. Bardell and published by Wiley-Interscience. This book was released on 1987-10-20 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
Author : Veena S. Chakravarthi
Publisher : Springer Nature
ISBN 13 : 3031183630
Total Pages : 355 pages
Book Rating : 4.0/5 (311 download)
Download or read book A Practical Approach to VLSI System on Chip (SoC) Design written by Veena S. Chakravarthi and published by Springer Nature. This book was released on 2022-12-13 with total page 355 pages. Available in PDF, EPUB and Kindle. Book excerpt: Now in a thoroughly revised second edition, this practical practitioner guide provides a comprehensive overview of the SoC design process. It explains end-to-end system on chip (SoC) design processes and includes updated coverage of design methodology, the design environment, EDA tool flow, design decisions, choice of design intellectual property (IP) cores, sign-off procedures, and design infrastructure requirements. The second edition provides new information on SOC trends and updated design cases. Coverage also includes critical advanced guidance on the latest UPF-based low power design flow, challenges of deep submicron technologies, and 3D design fundamentals, which will prepare the readers for the challenges of working at the nanotechnology scale. A Practical Approach to VLSI System on Chip (SoC) Design: A Comprehensive Guide, Second Edition provides engineers who aspire to become VLSI designers with all the necessary information and details of EDA tools. It will be a valuable professional reference for those working on VLSI design and verification portfolios in complex SoC designs
Author : Allen Kent
Publisher : CRC Press
ISBN 13 : 9780824727185
Total Pages : 216 pages
Book Rating : 4.7/5 (271 download)
Download or read book Encyclopedia of Microcomputers written by Allen Kent and published by CRC Press. This book was released on 1997-05-21 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: Visual Fidelity: Designing Multimedia Interfaces for Active Learning to Xerox Corporation
Author : Vikram Iyengar
Publisher : Springer Science & Business Media
ISBN 13 : 1461511135
Total Pages : 234 pages
Book Rating : 4.4/5 (615 download)
Download or read book Test Resource Partitioning for System-on-a-Chip written by Vikram Iyengar and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.
Author : Patrick Girard
Publisher : Springer Science & Business Media
ISBN 13 : 1441909281
Total Pages : 376 pages
Book Rating : 4.4/5 (419 download)
Download or read book Power-Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author : Kenneth P. Parker
Publisher : Springer Science & Business Media
ISBN 13 : 1461503671
Total Pages : 393 pages
Book Rating : 4.4/5 (615 download)
Download or read book The Boundary — Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 393 pages. Available in PDF, EPUB and Kindle. Book excerpt: In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse group of people who share a vision on solving some of the severe testing problems that exist now and are steadily getting worse. Early in this process, someone asked me if 1 thought that the P1l49.l effort would ever bear fruit. 1 responded somewhat glibly that "it was anyone's guess". Well, it wasn't anyone's guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow. Four of these individuals stand out; they are Harry Bleeker, Colin Maunder, Rodham Tulloss, and Lee Whetsel. In that I am convinced that the 1149.1 standard is the most significant testing development in the last 20 years, I personally feel a debt of gratitude to them and all the people who labored on the various Working Groups in its creation.
