The Boundary Scan Handbook

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The Boundary-Scan Handbook

Author : Kenneth P. Parker
Publisher : Springer Science & Business Media
ISBN 13 : 1475721420
Total Pages : 273 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis The Boundary-Scan Handbook by : Kenneth P. Parker

Download or read book The Boundary-Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the integrated circuit (IC) level that allow software to alleviate the growing cost of designing and producing digital systems. The primary benefit of the standard is its ability to transform extremely printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily and swiftly deal with. The Boundary-Scan Handbook is for professionals in the electronics industry who are concerned with the practical problems of competing successfully in the face of rapid-fire technological change. Since many of these changes affect our ability to do testing and hence cost-effective production, the advent of the 1149.1 standard is rightly looked upon as a major breakthrough. However, there is a great deal of misunderstanding about what to expect of 1149.1 and how to use it. Because of this, The Boundary-Scan Handbook is not a rehash of the 1149.1 standard, nor does it intend to be a tutorial on the basics of its workings. The standard itself should always be consulted for this, being careful to follow supplements issued by the IEEE that clarify and correct it. Rather, The Boundary-Scan Handbook motivates proper expectations and explains how to use the standard successfully.

The Boundary — Scan Handbook

Author : Kenneth P. Parker
Publisher : Springer Science & Business Media
ISBN 13 : 1461503671
Total Pages : 393 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis The Boundary — Scan Handbook by : Kenneth P. Parker

Download or read book The Boundary — Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 393 pages. Available in PDF, EPUB and Kindle. Book excerpt: In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse group of people who share a vision on solving some of the severe testing problems that exist now and are steadily getting worse. Early in this process, someone asked me if 1 thought that the P1l49.l effort would ever bear fruit. 1 responded somewhat glibly that "it was anyone's guess". Well, it wasn't anyone's guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow. Four of these individuals stand out; they are Harry Bleeker, Colin Maunder, Rodham Tulloss, and Lee Whetsel. In that I am convinced that the 1149.1 standard is the most significant testing development in the last 20 years, I personally feel a debt of gratitude to them and all the people who labored on the various Working Groups in its creation.

The Boundary-Scan Handbook

Author : Kenneth P. Parker
Publisher : Springer Science & Business Media
ISBN 13 : 0306476568
Total Pages : 288 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis The Boundary-Scan Handbook by : Kenneth P. Parker

Download or read book The Boundary-Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.

Boundary-Scan Interconnect Diagnosis

Author : José T. de Sousa
Publisher : Springer Science & Business Media
ISBN 13 : 0306479753
Total Pages : 178 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Boundary-Scan Interconnect Diagnosis by : José T. de Sousa

Download or read book Boundary-Scan Interconnect Diagnosis written by José T. de Sousa and published by Springer Science & Business Media. This book was released on 2005-12-28 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: This pioneering text explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. It takes a new approach, carefully modelling circuit and interconnect faults, and applying graph techniques to solve problems.

Boundary-Scan Test

Author : Harry Bleeker
Publisher : Springer Science & Business Media
ISBN 13 : 9780792392965
Total Pages : 246 pages
Book Rating : 4.3/5 (929 download)

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Book Synopsis Boundary-Scan Test by : Harry Bleeker

Download or read book Boundary-Scan Test written by Harry Bleeker and published by Springer Science & Business Media. This book was released on 1992-12-31 with total page 246 pages. Available in PDF, EPUB and Kindle. Book excerpt: The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.

The In-System Configuration Handbook:

Author : Neil G. Jacobson
Publisher : Springer Science & Business Media
ISBN 13 : 1461504899
Total Pages : 211 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis The In-System Configuration Handbook: by : Neil G. Jacobson

Download or read book The In-System Configuration Handbook: written by Neil G. Jacobson and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 211 pages. Available in PDF, EPUB and Kindle. Book excerpt: This handbook provides design considerations and rules-of-thumb to ensure the functionality you want will work. It brings together all the information needed by systems designers to develop applications that include configurability, from the simplest implementations to the most complicated.

The IoT Hacker's Handbook

Author : Aditya Gupta
Publisher : Apress
ISBN 13 : 1484243005
Total Pages : 330 pages
Book Rating : 4.4/5 (842 download)

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Book Synopsis The IoT Hacker's Handbook by : Aditya Gupta

Download or read book The IoT Hacker's Handbook written by Aditya Gupta and published by Apress. This book was released on 2019-03-30 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: Take a practioner’s approach in analyzing the Internet of Things (IoT) devices and the security issues facing an IoT architecture. You’ll review the architecture's central components, from hardware communication interfaces, such as UARTand SPI, to radio protocols, such as BLE or ZigBee. You'll also learn to assess a device physically by opening it, looking at the PCB, and identifying the chipsets and interfaces. You'll then use that information to gain entry to the device or to perform other actions, such as dumping encryption keys and firmware. As the IoT rises to one of the most popular tech trends, manufactures need to take necessary steps to secure devices and protect them from attackers. The IoT Hacker's Handbook breaks down the Internet of Things, exploits it, and reveals how these devices can be built securely. What You’ll LearnPerform a threat model of a real-world IoT device and locate all possible attacker entry points Use reverse engineering of firmware binaries to identify security issues Analyze,assess, and identify security issues in exploited ARM and MIPS based binariesSniff, capture, and exploit radio communication protocols, such as Bluetooth Low Energy (BLE), and ZigBee Who This Book is For Those interested in learning about IoT security, such as pentesters working in different domains, embedded device developers, or IT people wanting to move to an Internet of Things security role.

The Test Access Port and Boundary-scan Architecture

Author : Colin M. Maunder
Publisher :
ISBN 13 :
Total Pages : 408 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis The Test Access Port and Boundary-scan Architecture by : Colin M. Maunder

Download or read book The Test Access Port and Boundary-scan Architecture written by Colin M. Maunder and published by . This book was released on 1990 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Electrical Engineering Handbook,Second Edition

Author : Richard C. Dorf
Publisher : CRC Press
ISBN 13 : 9781420049763
Total Pages : 2758 pages
Book Rating : 4.0/5 (497 download)

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Book Synopsis The Electrical Engineering Handbook,Second Edition by : Richard C. Dorf

Download or read book The Electrical Engineering Handbook,Second Edition written by Richard C. Dorf and published by CRC Press. This book was released on 1997-09-26 with total page 2758 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1993, the first edition of The Electrical Engineering Handbook set a new standard for breadth and depth of coverage in an engineering reference work. Now, this classic has been substantially revised and updated to include the latest information on all the important topics in electrical engineering today. Every electrical engineer should have an opportunity to expand his expertise with this definitive guide. In a single volume, this handbook provides a complete reference to answer the questions encountered by practicing engineers in industry, government, or academia. This well-organized book is divided into 12 major sections that encompass the entire field of electrical engineering, including circuits, signal processing, electronics, electromagnetics, electrical effects and devices, and energy, and the emerging trends in the fields of communications, digital devices, computer engineering, systems, and biomedical engineering. A compendium of physical, chemical, material, and mathematical data completes this comprehensive resource. Every major topic is thoroughly covered and every important concept is defined, described, and illustrated. Conceptually challenging but carefully explained articles are equally valuable to the practicing engineer, researchers, and students. A distinguished advisory board and contributors including many of the leading authors, professors, and researchers in the field today assist noted author and professor Richard Dorf in offering complete coverage of this rapidly expanding field. No other single volume available today offers this combination of broad coverage and depth of exploration of the topics. The Electrical Engineering Handbook will be an invaluable resource for electrical engineers for years to come.

VLSI Test Principles and Architectures

Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 9780080474793
Total Pages : 808 pages
Book Rating : 4.4/5 (747 download)

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Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0792379918
Total Pages : 712 pages
Book Rating : 4.7/5 (923 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2004-12-15 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Principles of Testing Electronic Systems

Author : Samiha Mourad
Publisher : John Wiley & Sons
ISBN 13 : 9780471319313
Total Pages : 444 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Principles of Testing Electronic Systems by : Samiha Mourad

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Reuse Methodology Manual for System-on-a-Chip Designs

Author : Michael Keating
Publisher : Springer Science & Business Media
ISBN 13 : 1402071418
Total Pages : 306 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Reuse Methodology Manual for System-on-a-Chip Designs by : Michael Keating

Download or read book Reuse Methodology Manual for System-on-a-Chip Designs written by Michael Keating and published by Springer Science & Business Media. This book was released on 2002 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reuse Methodology Manual for System-on-a-Chip Designs, Third Edition outlines a set of best practices for creating reusable designs for use in an SoC design methodology. These practices are based on the authors' experience in developing reusable designs, as well as the experience of design teams in many companies around the world. Silicon and tool technologies move so quickly that many of the details of design-for-reuse will undoubtedly continue to evolve over time. But the fundamental aspects of the methodology described in this book have become widely adopted and are likely to form the foundation of chip design for some time to come. Development methodology necessarily differs between system designers and processor designers, as well as between DSP developers and chipset developers. However, there is a common set of problems facing everyone who is designing complex chips. In response to these problems, design teams have adopted a block-based design approach that emphasizes design reuse. Reusing macros (sometimes called "cores") that have already been designed and verified helps to address all of the problems above. However, in adopting reuse-based design, design teams have run into a significant problem. Reusing blocks that have not been explicitly designed for reuse has often provided little or no benefit to the team. The effort to integrate a pre-existing block into new designs can become prohibitively high, if the block does not provide the right views, the right documentation, and the right functionality. From this experience, design teams have realized that reuse-based design requires an explicit methodology for developing reusable macros that are easy to integrate into SoC designs. This manual focuses on describing these techniques. Features of the Third Edition: Up to date; State of the art; Reuse as a solution for circuit designers; A chronicle of "best practices"; All chapters updated and revised; Generic guidelines - non tool specific; Emphasis on hard IP and physical design.

Reuse Methodology Manual for System-On-A-Chip Designs

Author : Pierre Bricaud
Publisher : Springer Science & Business Media
ISBN 13 : 1475728875
Total Pages : 232 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Reuse Methodology Manual for System-On-A-Chip Designs by : Pierre Bricaud

Download or read book Reuse Methodology Manual for System-On-A-Chip Designs written by Pierre Bricaud and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon technology now allows us to build chips consisting of tens of millions of transistors. This technology promises new levels of system integration onto a single chip, but also presents significant challenges to the chip designer. As a result, many ASIC developers and silicon vendors are re-examining their design methodologies, searching for ways to make effective use of the huge numbers of gates now available. These designers see current design tools and methodologies as inadequate for developing million-gate ASICs from scratch. There is considerable pressure to keep design team size and design schedules constant while design complexities grow. Tools are not providing the productivity gains required to keep pace with the increasing gate counts available from deep submicron technology. Design reuse - the use of pre-designed and pre-verified cores - is the most promising opportunity to bridge the gap between available gate-count and designer productivity. Reuse Methodology Manual for System-On-A-Chip Designs outlines an effective methodology for creating reusable designs for use in a System-on-a-Chip (SoC) design methodology. Silicon and tool technologies move so quickly that no single methodology can provide a permanent solution to this highly dynamic problem. Instead, this manual is an attempt to capture and incrementally improve on current best practices in the industry, and to give a coherent, integrated view of the design process. From the Foreword `Synopsys and Mentor Graphics have joined forces to help make IP reuse a reality. One of the goals of our Design Reuse Partnership is to develop, demonstrate, and document a reuse-based design methodology that works. The Reuse Manual (RMM) is the result of this effort.' Aart J. de Geus, Synopsys, Inc. Walden C. Rhines, Mentor Graphics Corporation

Reuse Methodology Manual

Author : Pierre Bricaud
Publisher : Springer Science & Business Media
ISBN 13 : 1461550378
Total Pages : 302 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Reuse Methodology Manual by : Pierre Bricaud

Download or read book Reuse Methodology Manual written by Pierre Bricaud and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon technology now allows us to build chips consisting of tens of millions of transistors. This technology not only promises new levels of system integration onto a single chip, but also presents significant challenges to the chip designer. As a result, many ASIC developers and silicon vendors are re-examining their design methodologies, searching for ways to make effective use of the huge numbers of gates now available. These designers see current design tools and methodologies as inadequate for developing million-gate ASICs from scratch. There is considerable pressure to keep design team size and design schedules constant even as design complexities grow. Tools are not providing the productivity gains required to keep pace with the increasing gate counts available from deep submicron technology. Design reuse - the use of pre-designed and pre-verified cores - is the most promising opportunity to bridge the gap between available gate-count and designer productivity. Reuse Methodology Manual for System-On-A-Chip Designs, Second Edition outlines an effective methodology for creating reusable designs for use in a System-on-a-Chip (SoC) design methodology. Silicon and tool technologies move so quickly that no single methodology can provide a permanent solution to this highly dynamic problem. Instead, this manual is an attempt to capture and incrementally improve on current best practices in the industry, and to give a coherent, integrated view of the design process. Reuse Methodology Manual for System-On-A-Chip Designs, Second Edition will be updated on a regular basis as a result of changing technology and improved insight into the problems of design reuse and its role in producing high-quality SoC designs.

Test and Measurement: Know It All

Author : Jon S. Wilson
Publisher : Newnes
ISBN 13 : 0080949681
Total Pages : 912 pages
Book Rating : 4.0/5 (89 download)

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Book Synopsis Test and Measurement: Know It All by : Jon S. Wilson

Download or read book Test and Measurement: Know It All written by Jon S. Wilson and published by Newnes. This book was released on 2008-09-26 with total page 912 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf! Field Application engineers need to master a wide area of topics to excel. The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing. A 360-degree view from our best-selling authors Topics include the Technology of Test and Measurement, Measurement System Types, and Instrumentation for Test and Measurement The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume

The Book of R

Author : Tilman M. Davies
Publisher : No Starch Press
ISBN 13 : 1593277792
Total Pages : 833 pages
Book Rating : 4.5/5 (932 download)

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Book Synopsis The Book of R by : Tilman M. Davies

Download or read book The Book of R written by Tilman M. Davies and published by No Starch Press. This book was released on 2016-07-16 with total page 833 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Book of R is a comprehensive, beginner-friendly guide to R, the world’s most popular programming language for statistical analysis. Even if you have no programming experience and little more than a grounding in the basics of mathematics, you’ll find everything you need to begin using R effectively for statistical analysis. You’ll start with the basics, like how to handle data and write simple programs, before moving on to more advanced topics, like producing statistical summaries of your data and performing statistical tests and modeling. You’ll even learn how to create impressive data visualizations with R’s basic graphics tools and contributed packages, like ggplot2 and ggvis, as well as interactive 3D visualizations using the rgl package. Dozens of hands-on exercises (with downloadable solutions) take you from theory to practice, as you learn: –The fundamentals of programming in R, including how to write data frames, create functions, and use variables, statements, and loops –Statistical concepts like exploratory data analysis, probabilities, hypothesis tests, and regression modeling, and how to execute them in R –How to access R’s thousands of functions, libraries, and data sets –How to draw valid and useful conclusions from your data –How to create publication-quality graphics of your results Combining detailed explanations with real-world examples and exercises, this book will provide you with a solid understanding of both statistics and the depth of R’s functionality. Make The Book of R your doorway into the growing world of data analysis.