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Author : Evstratios Vandris
Publisher :
ISBN 13 :
Total Pages : 304 pages
Book Rating : 4.:/5 (319 download)
Download or read book Switch-level Fault Simulation of MOS VLSI Circuits written by Evstratios Vandris and published by . This book was released on 1991 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : G. Russell
Publisher : Springer Science & Business Media
ISBN 13 : 9780747600015
Total Pages : 406 pages
Book Rating : 4.6/5 ( download)
Download or read book Advanced Simulation and Test Methodologies for VLSI Design written by G. Russell and published by Springer Science & Business Media. This book was released on 1989-02-28 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Alexander Miczo
Publisher : John Wiley & Sons
ISBN 13 : 0471457779
Total Pages : 697 pages
Book Rating : 4.4/5 (714 download)
Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by John Wiley & Sons. This book was released on 2003-10-24 with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt: Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Author : Manoj Sachdev
Publisher : Springer Science & Business Media
ISBN 13 : 1475749260
Total Pages : 317 pages
Book Rating : 4.4/5 (757 download)
Download or read book Defect Oriented Testing for CMOS Analog and Digital Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal
Author : Parag K. Lala
Publisher : Academic Press
ISBN 13 : 9780124343306
Total Pages : 222 pages
Book Rating : 4.3/5 (433 download)
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Author : Ravi Shankar
Publisher : Academic Press
ISBN 13 : 1483217841
Total Pages : 502 pages
Book Rating : 4.4/5 (832 download)
Download or read book VLSI and Computer Architecture written by Ravi Shankar and published by Academic Press. This book was released on 2014-12-01 with total page 502 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI Electronics Microstructure Science, Volume 20: VLSI and Computer Architecture reviews the approaches in design principles and techniques and the architecture for computer systems implemented in VLSI. This volume is divided into two parts. The first section is concerned with system design. Chapters under this section focus on the discussion of such topics as the evolution of VLSI; system performance and processor design considerations; and VLSI system design and processing tools. Part II of the book focuses on the architectural possibilities that have become cost effective with the development of VLSI circuits. Topics on architectural requirements and various architectures such as the Reduced Instruction Set, Extended Von Neumann, Language-Oriented, and Microprogrammable architectures are elaborated in detail. Also included are chapters that discuss the evaluation of architecture, multiprocessing configurations, and the future of VLSI. Computer designers, those evaluating computer systems, researchers, and students of computer architecture will find the book very useful.
Author : John B. Gosling
Publisher : Cambridge University Press
ISBN 13 : 9780521426725
Total Pages : 302 pages
Book Rating : 4.4/5 (267 download)
Download or read book Simulation in the Design of Digital Electronic Systems written by John B. Gosling and published by Cambridge University Press. This book was released on 1993-10-29 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorithms for digital electronic system simulators, together with timing verification as well as structural limitations and problems.
Author : F. Lombardi
Publisher : Springer Science & Business Media
ISBN 13 : 9400914172
Total Pages : 531 pages
Book Rating : 4.4/5 (9 download)
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Author : George W. Zobrist
Publisher : Praeger
ISBN 13 :
Total Pages : 216 pages
Book Rating : 4.3/5 (91 download)
Download or read book VLSI Fault Modeling and Testing Techniques written by George W. Zobrist and published by Praeger. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : Vazgen Melikyan
Publisher : Springer
ISBN 13 : 3319716379
Total Pages : 371 pages
Book Rating : 4.3/5 (197 download)
Download or read book Simulation and Optimization of Digital Circuits written by Vazgen Melikyan and published by Springer. This book was released on 2018-04-12 with total page 371 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes new, fuzzy logic-based mathematical apparatus, which enable readers to work with continuous variables, while implementing whole circuit simulations with speed, similar to gate-level simulators and accuracy, similar to circuit-level simulators. The author demonstrates newly developed principles of digital integrated circuit simulation and optimization that take into consideration various external and internal destabilizing factors, influencing the operation of digital ICs. The discussion includes factors including radiation, ambient temperature, electromagnetic fields, and climatic conditions, as well as non-ideality of interconnects and power rails.
Author : Jeong-Taek Kong
Publisher : Springer Science & Business Media
ISBN 13 : 1461523214
Total Pages : 276 pages
Book Rating : 4.4/5 (615 download)
Download or read book Digital Timing Macromodeling for VLSI Design Verification written by Jeong-Taek Kong and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.
Author : Juan J. Becerra
Publisher : Springer Science & Business Media
ISBN 13 : 1461561019
Total Pages : 153 pages
Book Rating : 4.4/5 (615 download)
Download or read book Analog Design Issues in Digital VLSI Circuits and Systems written by Juan J. Becerra and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analog Design Issues in Digital VLSI Circuits and Systems brings together in one place important contributions and up-to-date research results in this fast moving area. Analog Design Issues in Digital VLSI Circuits and Systems serves as an excellent reference, providing insight into some of the most challenging research issues in the field.
Author : Mukund Sivaraman
Publisher : Springer Science & Business Media
ISBN 13 : 1441985786
Total Pages : 164 pages
Book Rating : 4.4/5 (419 download)
Download or read book A Unified Approach for Timing Verification and Delay Fault Testing written by Mukund Sivaraman and published by Springer Science & Business Media. This book was released on 2012-09-17 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.
Author : Ernst G. Ulrich
Publisher : Springer Science & Business Media
ISBN 13 : 1461527384
Total Pages : 199 pages
Book Rating : 4.4/5 (615 download)
Download or read book Concurrent and Comparative Discrete Event Simulation written by Ernst G. Ulrich and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 199 pages. Available in PDF, EPUB and Kindle. Book excerpt: Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no individual has contrib uted more than Ernst Ulrich to the development of digital logic simulation. For concurrent simulation, one may say that Ernst has contributed more than the rest of the world. We would find such a claim difficult to dispute. The unique experience of the authors con fers a special character to this book: It is authoritative, inspired, and focused on what is conceptually important. Another unique aspect of this book, perhaps the one that will be the most surprising for many readers, is that it is strongly projected towards the future. Concurrent simulation is presented as a general experimentation methodology and new intriguing applications are analyzed. The discussion of multi-domain concurrent simulation-- recent work of Karen Panetta Lentz and Ernst Ulrich---is fascinat ing.
Author : Norman G. Einspruch
Publisher : Academic Press
ISBN 13 : 1483217809
Total Pages : 213 pages
Book Rating : 4.4/5 (832 download)
Download or read book VLSI Design written by Norman G. Einspruch and published by Academic Press. This book was released on 2014-12-01 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt: VLSI Electronics Microstructure Science, Volume 14: VLSI Design presents a comprehensive exposition and assessment of the developments and trends in VLSI (Very Large Scale Integration) electronics. This volume covers topics that range from microscopic aspects of materials behavior and device performance to the comprehension of VLSI in systems applications. Each article is prepared by a recognized authority. The subjects discussed in this book include VLSI processor design methodology; the RISC (Reduced Instruction Set Computer); the VLSI testing program; silicon compilers for VLSI; and specialized silicon compiler and programmable chip for language recognition. Scientists, engineers, researchers, device designers, and systems architects will find the book very useful.
Author : Allen Kent
Publisher : CRC Press
ISBN 13 : 9780824727185
Total Pages : 216 pages
Book Rating : 4.7/5 (271 download)
Download or read book Encyclopedia of Microcomputers written by Allen Kent and published by CRC Press. This book was released on 1997-05-21 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: Visual Fidelity: Designing Multimedia Interfaces for Active Learning to Xerox Corporation
