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Author : Robert G. Picard
Publisher :
ISBN 13 :
Total Pages : 24 pages
Book Rating : 4.3/5 (91 download)
Download or read book Studies on the Structure of Thin Metallic Films by Means of the Electron Microscope written by Robert G. Picard and published by . This book was released on 1943 with total page 24 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Henry Levinstein
Publisher :
ISBN 13 :
Total Pages : 20 pages
Book Rating : 4.3/5 (91 download)
Download or read book The Growth and Structure of Thin Metallic Films written by Henry Levinstein and published by . This book was released on 1949 with total page 20 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Marsden S. Blois
Publisher :
ISBN 13 :
Total Pages : 138 pages
Book Rating : 4.F/5 ( download)
Download or read book Studies on the Structure of Thin Evaporated Metallic Films written by Marsden S. Blois and published by . This book was released on 1950 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : HENRY LEVINSTEIN
Publisher :
ISBN 13 :
Total Pages : 194 pages
Book Rating : 4.3/5 (91 download)
Download or read book A STUDY OF THE GROWTH AND STRUCTURE OF THIN METALLIC FILMS. written by HENRY LEVINSTEIN and published by . This book was released on 1947 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : G. H. Haas
Publisher :
ISBN 13 :
Total Pages : 15 pages
Book Rating : 4.:/5 (227 download)
Download or read book Studies on the Structure and Behavior of Thin Evaporated Films of Silver, Aluminum, Silicon, and Germanium written by G. H. Haas and published by . This book was released on 1947 with total page 15 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin films, produced by evaporation in high vacuum, are applied today in many scientific and technical fields. For those who work with the optical, electrical, and chemical qualities of such films, an exact investigation of their microstructure is important. It was the purpose of the following investigations to determine the structure and behavior of silver, aluminum, silicon, and germanium films produced under different conditions. Films of various thicknesses were condensed on collodion or aluminum oxide support layers at different temperatures and studied by electron diffraction and electron microscopy. The aluminum oxide support layers, which are structureless up to about 700 C., and hence, are quite suitable for investigations at higher temperatures, were prepared by anodizing aluminum in an ammonium tartrate bath. The thickness of the support layers is only 200 A (angstrom units). The results obtained from investigations of the structure of the evaporated films contribute to the explanation of certain of their properties. The oxidation of aluminum and silicon in air at different temperatures was investigated by means of electron diffraction, and by optical and electrical methods.
Author : D. B. Barker
Publisher :
ISBN 13 :
Total Pages : 16 pages
Book Rating : 4.3/5 (91 download)
Download or read book Electrical Properties of Thin Metallic Films written by D. B. Barker and published by . This book was released on 1952 with total page 16 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Rinehart Baron
Publisher :
ISBN 13 :
Total Pages : 190 pages
Book Rating : 4.E/5 ( download)
Download or read book An Exploratory Study of the Density of Metallic Films Several Hundred Angstroms in Thickness written by Rinehart Baron and published by . This book was released on 1957 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : Academic Press
ISBN 13 : 0080577628
Total Pages : 919 pages
Book Rating : 4.0/5 (85 download)
Download or read book The Growth of Electron Microscopy written by and published by Academic Press. This book was released on 1996-08-05 with total page 919 pages. Available in PDF, EPUB and Kindle. Book excerpt: As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Author : G. Ritter
Publisher : Elsevier Science
ISBN 13 : 9780444205131
Total Pages : 0 pages
Book Rating : 4.2/5 (51 download)
Download or read book Recent Developments in Thin Film Research: Epitaxial Growth and Nanostructures, Electron Microscopy and X-Ray Diffraction written by G. Ritter and published by Elsevier Science. This book was released on 1998-08-26 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The ICAM'97 symposium on "Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures" was presented at the combined 1997 International Conference on Applied Materials/European Materials Research Society Spring meeting (ICAM'97/E-MRS'97) held in Strasbourg (France) from 16-20 June 1997. . More than 60 participants representing 10 countries met to discuss the recent developments related to the study of crystalline structure of thin films: first stages of growth, morphology, strains and their relaxation. The aim of this symposium was to discuss the applications of both electron microscopy and X-ray diffraction in thin film studies. X-ray diffraction is a non-destructive method giving very accurate information in reciprocal space for the determination of crystalline data. Many of the contributions were concerned with following such growth processes such as epitaxy of metals and semiconducting materials, measuring the average strain and the structure and the morphology of the films. The electron microscopy investigations allow the study of microstructures and crystalline defects. The main handicap is the necessity for the destruction of the specimens. Electron microscopy is useful for studying the randomly distributed failures in periodicity of crystalline structures.
Author : Marsden S. Blois
Publisher :
ISBN 13 :
Total Pages : 328 pages
Book Rating : 4.F/5 ( download)
Download or read book Properties of Thin Evaporated Metallic Films written by Marsden S. Blois and published by . This book was released on 1951 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : V. Durga Nageswar Rao
Publisher :
ISBN 13 :
Total Pages : 150 pages
Book Rating : 4.:/5 (182 download)
Download or read book Transmission Electron Microscopy of Thin Metallic Films written by V. Durga Nageswar Rao and published by . This book was released on 1964 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Katayun Barmak
Publisher : Woodhead Publishing
ISBN 13 : 085709629X
Total Pages : 671 pages
Book Rating : 4.8/5 (57 download)
Download or read book Metallic Films for Electronic, Optical and Magnetic Applications written by Katayun Barmak and published by Woodhead Publishing. This book was released on 2014-02-13 with total page 671 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metallic films play an important role in modern technologies such as integrated circuits, information storage, displays, sensors, and coatings. Metallic Films for Electronic, Optical and Magnetic Applications reviews the structure, processing and properties of metallic films. Part one explores the structure of metallic films using characterization methods such as x-ray diffraction and transmission electron microscopy. This part also encompasses the processing of metallic films, including structure formation during deposition and post-deposition reactions and phase transformations. Chapters in part two focus on the properties of metallic films, including mechanical, electrical, magnetic, optical, and thermal properties. Metallic Films for Electronic, Optical and Magnetic Applications is a technical resource for electronics components manufacturers, scientists, and engineers working in the semiconductor industry, product developers of sensors, displays, and other optoelectronic devices, and academics working in the field. Explores the structure of metallic films using characterization methods such as x-ray diffraction and transmission electron microscopy Discusses processing of metallic films, including structure formation during deposition and post-deposition reactions and phase transformations Focuses on the properties of metallic films, including mechanical, electrical, magnetic, optical, and thermal properties
Author :
Publisher : UM Libraries
ISBN 13 :
Total Pages : 1154 pages
Book Rating : 4.3/5 (91 download)
Download or read book University of Michigan Official Publication written by and published by UM Libraries. This book was released on 1945 with total page 1154 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 790 pages
Book Rating : 4.3/5 (91 download)
Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1953 with total page 790 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Klaus Wetzig
Publisher : Wiley-VCH
ISBN 13 : 9783527406500
Total Pages : 0 pages
Book Rating : 4.4/5 (65 download)
Download or read book Metal Based Thin Films for Electronics written by Klaus Wetzig and published by Wiley-VCH. This book was released on 2006-07-21 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This up-to-date handbook covers the main topics of preparation, characterization and properties of complex metal-based layer systems. The authors -- an outstanding group of researchers -- discuss advanced methods for structure, chemical and electronic state characterization with reference to the properties of thin functional layers. This second edition has been completely revised and updated to reflect the rapid progress taking place in the field, including, for example, investigations of the interface between barrier layer and dielectrics in metallization systems, spin-torque induced magnetic switching in spintronics, the development of new metallization technologies for migration-resistant SAW devices, and advancements in the nanoanalytics of thin functional layers. In addition, several new sections and chapters highlight new and timely research topics, with a whole chapter now devoted to photovoltaics. As such, the book addresses materials specialists in industry, especially in microelectronics, as well as scientists, while also recommended for advanced studies in materials science, analytics, surface and solid state science.
Author : Robert B. Owen
Publisher :
ISBN 13 :
Total Pages : 116 pages
Book Rating : 4.:/5 (31 download)
Download or read book A Study of the Microstructure and Optical Properties of Thin Lead-dielectric Cermet Films written by Robert B. Owen and published by . This book was released on 1972 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt: A transmission electron microscopy study involving direct and replicating techniques is directed to a definition of the microstructure of radio frequency-sputtered, thin lead-dielectric cermet films. Once defined, this microstructure is used to obtain theoretical film refractive indices. The Maxwell Garnett theory provides a basis for the theoretical results. Measurements of film transmission and reflectivity are used to obtain rough experimental values for film refractive indices by the Tekucheva method. More exact values are obtained via ellipsometry. The rough Tekucheva values are used to determine the range over which computer calculations interpreting the ellipsometric results must be made. This technique yields accurate values for the film refractive indices. The films are radio frequency-sputtered from lead glass targets with varying amounts of lead attached to their faces. Three different targets are used, resulting in three sets of films, each containing a different percentage of lead. The lead content of the films is measured by microprobe analysis as well as visual inspection of micrographs. The lower content lead films are seen to consist of tiny balls of lead embedded in the dielectric, as are the intermediate lead content films; but the higher lead content films form metallic with the predictions of the Maxwell Garnett theory; but the higher lead content films, whose structure fails to conform to the Maxwell Garnett configuration, have indices whose values diverge from the Maxwell Garnett predictions. It is thus shown that the theory of Maxwell Garnett is valid for thin cermet films whose structure consists of tiny metal balls embedded in a dielectric medium.
Author :
Publisher :
ISBN 13 :
Total Pages : 406 pages
Book Rating : 4.:/5 (31 download)
Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1953 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
