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Author : Southwest Test Workshop
Publisher :
ISBN 13 :
Total Pages : 400 pages
Book Rating : 4.:/5 (253 download)
Download or read book Southwest Test Workshop written by Southwest Test Workshop and published by . This book was released on 2000 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Southwest Test Workshop
Publisher :
ISBN 13 :
Total Pages : 500 pages
Book Rating : 4.:/5 (253 download)
Download or read book Southwest Test Workshop written by Southwest Test Workshop and published by . This book was released on 2004 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Southwest Test Workshop
Publisher :
ISBN 13 :
Total Pages : 500 pages
Book Rating : 4.:/5 (592 download)
Download or read book Southwest Test Workshop written by Southwest Test Workshop and published by . This book was released on 2003 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Southwest Test Workshop
Publisher :
ISBN 13 :
Total Pages : 350 pages
Book Rating : 4.:/5 (253 download)
Download or read book Southwest Test Workshop written by Southwest Test Workshop and published by . This book was released on 1999 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Southwest Test Workshop
Publisher :
ISBN 13 :
Total Pages : 350 pages
Book Rating : 4.:/5 (253 download)
Download or read book Southwest Test Workshop written by Southwest Test Workshop and published by . This book was released on 2001 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Southwest Test Workshop written by and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : IEEE Test Technology Technical Council, TTTC.
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (253 download)
Download or read book Southwest Test Workshop, June 1-4, 1997, San Diego, CA written by IEEE Test Technology Technical Council, TTTC. and published by . This book was released on 1997 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Southwest Test Workshop
Publisher :
ISBN 13 :
Total Pages : 350 pages
Book Rating : 4.:/5 (253 download)
Download or read book Southwest Test Workshop written by Southwest Test Workshop and published by . This book was released on 2002 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : IEEE Test Technology Technical Council, TTTC.
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (253 download)
Download or read book Southwest Test Workshop, May 31 - June 3, 1998, San Diego, CA, USA written by IEEE Test Technology Technical Council, TTTC. and published by . This book was released on 1998 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : ASM International
Publisher : ASM International
ISBN 13 : 1615030867
Total Pages : 534 pages
Book Rating : 4.6/5 (15 download)
Download or read book Istfa 2003 written by ASM International and published by ASM International. This book was released on 2003-01-01 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 498 pages
Book Rating : 4.3/5 (91 download)
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michel Renovell
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780769514536
Total Pages : 540 pages
Book Rating : 4.5/5 (145 download)
Download or read book International Workshop on Electronic Design, Test and Applications written by Michel Renovell and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2002 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
Author : Ieee
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780769521343
Total Pages : 468 pages
Book Rating : 4.5/5 (213 download)
Download or read book Proceedings written by Ieee and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2004 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
Author :
Publisher :
ISBN 13 :
Total Pages : 298 pages
Book Rating : 4.:/5 (31 download)
Download or read book Proceedings written by and published by . This book was released on 2002 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780769511221
Total Pages : 458 pages
Book Rating : 4.5/5 (112 download)
Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780769506135
Total Pages : 528 pages
Book Rating : 4.5/5 (61 download)
Download or read book 18th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2000 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Author : Bernard Courtois
Publisher : IEEE Computer Society Press
ISBN 13 : 9780769516172
Total Pages : 202 pages
Book Rating : 4.5/5 (161 download)
Download or read book Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing written by Bernard Courtois and published by IEEE Computer Society Press. This book was released on 2002 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation MTDT 2002 explores the state-of-the-art in semiconductor memories. Over the last 10 years, the scope of the Workshop has been expanded to cover the fabrication technology and the memory design, test and reliability.
