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Author :
Publisher :
ISBN 13 :
Total Pages : 526 pages
Book Rating : 4.3/5 (91 download)
Download or read book Asian Test Symposium written by and published by . This book was released on 2005 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780769519517
Total Pages : 544 pages
Book Rating : 4.5/5 (195 download)
Download or read book ATS 2003 written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 : 9780769511221
Total Pages : 458 pages
Book Rating : 4.5/5 (112 download)
Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author : Tejinder Gandhi
Publisher : ASM International
ISBN 13 : 1627082468
Total Pages : 719 pages
Book Rating : 4.6/5 (27 download)
Download or read book Microelectronics Fialure Analysis Desk Reference, Seventh Edition written by Tejinder Gandhi and published by ASM International. This book was released on 2019-11-01 with total page 719 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Author : Jagdish C. Bansal
Publisher : Springer Science & Business Media
ISBN 13 : 8132210387
Total Pages : 559 pages
Book Rating : 4.1/5 (322 download)
Download or read book Proceedings of Seventh International Conference on Bio-Inspired Computing: Theories and Applications (BIC-TA 2012) written by Jagdish C. Bansal and published by Springer Science & Business Media. This book was released on 2012-12-04 with total page 559 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is a collection of high quality peer reviewed research papers presented in Seventh International Conference on Bio-Inspired Computing (BIC-TA 2012) held at ABV-IIITM Gwalior, India. These research papers provide the latest developments in the broad area of "Computational Intelligence". The book discusses wide variety of industrial, engineering and scientific applications of nature/bio-inspired computing and presents invited papers from the inventors/originators of novel computational techniques.
Author : Edwin Sha
Publisher : Springer
ISBN 13 : 3540366814
Total Pages : 1192 pages
Book Rating : 4.5/5 (43 download)
Download or read book Embedded and Ubiquitous Computing written by Edwin Sha and published by Springer. This book was released on 2006-10-06 with total page 1192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the International Conference on Embedded and Ubiquitous Computing, EUC 2006, held in Seoul, Korea, August 2006. The book presents 113 revised full papers together with 3 keynote articles, organized in topical sections on power aware computing, security and fault tolerance, agent and distributed computing, wireless communications, real-time systems, embedded systems, multimedia and data management, mobile computing, network protocols, middleware and P2P, and more.
Author : Patrick Girard
Publisher : Springer Science & Business Media
ISBN 13 : 1441909281
Total Pages : 376 pages
Book Rating : 4.4/5 (419 download)
Download or read book Power-Aware Testing and Test Strategies for Low Power Devices written by Patrick Girard and published by Springer Science & Business Media. This book was released on 2010-03-11 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author : Krishnendu Chakrabarty
Publisher : Springer Science & Business Media
ISBN 13 : 1475765274
Total Pages : 202 pages
Book Rating : 4.4/5 (757 download)
Download or read book SOC (System-on-a-Chip) Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Author : Mohammad Tehranipoor
Publisher : Springer Science & Business Media
ISBN 13 : 3319008161
Total Pages : 236 pages
Book Rating : 4.3/5 (19 download)
Download or read book Integrated Circuit Authentication written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2013-10-04 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes techniques to verify the authenticity of integrated circuits (ICs). It focuses on hardware Trojan detection and prevention and counterfeit detection and prevention. The authors discuss a variety of detection schemes and design methodologies for improving Trojan detection techniques, as well as various attempts at developing hardware Trojans in IP cores and ICs. While describing existing Trojan detection methods, the authors also analyze their effectiveness in disclosing various types of Trojans, and demonstrate several architecture-level solutions.
Author : Hiren Kumar Deva Sarma
Publisher : Springer Nature
ISBN 13 : 9811642443
Total Pages : 466 pages
Book Rating : 4.8/5 (116 download)
Download or read book Contemporary Issues in Communication, Cloud and Big Data Analytics written by Hiren Kumar Deva Sarma and published by Springer Nature. This book was released on 2021-11-30 with total page 466 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the outcomes of the First International Conference on Communication, Cloud, and Big Data (CCB) held on December 18–19, 2020, at Sikkim Manipal Institute of Technology, Majitar, Sikkim, India. This book contains research papers and articles in the latest topics related to the fields like communication networks, cloud computing, big data analytics, and on various computing techniques. Research papers addressing security issues in above-mentioned areas are also included in the book. The research papers and articles discuss latest issues in the above-mentioned topics. The book is very much helpful and useful for the researchers, engineers, practitioners, research students, and interested readers.
Author : Luciano Lavagno
Publisher : CRC Press
ISBN 13 : 1482254638
Total Pages : 644 pages
Book Rating : 4.4/5 (822 download)
Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author : Mohammad Tehranipoor
Publisher : Springer Science & Business Media
ISBN 13 : 1441982973
Total Pages : 228 pages
Book Rating : 4.4/5 (419 download)
Download or read book Test and Diagnosis for Small-Delay Defects written by Mohammad Tehranipoor and published by Springer Science & Business Media. This book was released on 2011-09-08 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Author : Paul D. Franzon
Publisher : John Wiley & Sons
ISBN 13 : 3527697047
Total Pages : 492 pages
Book Rating : 4.5/5 (276 download)
Download or read book Handbook of 3D Integration, Volume 4 written by Paul D. Franzon and published by John Wiley & Sons. This book was released on 2019-01-25 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fourth volume of the landmark handbook focuses on the design, testing, and thermal management of 3D-integrated circuits, both from a technological and materials science perspective. Edited and authored by key contributors from top research institutions and high-tech companies, the first part of the book provides an overview of the latest developments in 3D chip design, including challenges and opportunities. The second part focuses on the test methods used to assess the quality and reliability of the 3D-integrated circuits, while the third and final part deals with thermal management and advanced cooling technologies and their integration.
Author : Sandeep K. Goel
Publisher : CRC Press
ISBN 13 : 1439829411
Total Pages : 266 pages
Book Rating : 4.4/5 (398 download)
Download or read book Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits written by Sandeep K. Goel and published by CRC Press. This book was released on 2013-10-25 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Author : Brajesh Kumar Kaushik
Publisher : Springer
ISBN 13 : 9811074704
Total Pages : 820 pages
Book Rating : 4.8/5 (11 download)
Download or read book VLSI Design and Test written by Brajesh Kumar Kaushik and published by Springer. This book was released on 2017-12-21 with total page 820 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Author : Rodolfo Dufo-López
Publisher : CRC Press
ISBN 13 : 1000617432
Total Pages : 888 pages
Book Rating : 4.0/5 (6 download)
Download or read book Emerging Developments in the Power and Energy Industry written by Rodolfo Dufo-López and published by CRC Press. This book was released on 2019-10-29 with total page 888 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power and Energy Engineering are important and pressing topics globally, covering issues such as shifting paradigms of energy generation and consumption, intelligent grids, green energy and environmental protection. The 11th Asia-Pacific Power and Energy Engineering Conference (APPEEC 2019) was held in Xiamen, China from April 19 to 21, 2019. APPEEC has been an annual conference since 2009 and has been successfully held in Wuhan (2009 & 2011), Chengdu (2010 & 2017), Shanghai (2012 & 2014), Beijing (2013 & 2015), Suzhou (2016) and Guilin (2018), China. The objective of APPEEC 2019 was to provide scientific and professional interactions for the advancement of the fields of power and energy engineering. APPEEC 2019 facilitated the exchange of insights and innovations between industry and academia. A group of excellent speakers have delivered keynote speeches on emerging technologies in the field of power and energy engineering. Attendees were given the opportunity to give oral and poster presentations and to interface with invited experts.
Author : Stephan Eggersglüß
Publisher : Springer Science & Business Media
ISBN 13 : 1441999760
Total Pages : 208 pages
Book Rating : 4.4/5 (419 download)
Download or read book High Quality Test Pattern Generation and Boolean Satisfiability written by Stephan Eggersglüß and published by Springer Science & Business Media. This book was released on 2012-02-01 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
