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Scanning Tunneling Microscopy Of Iii V Semiconductors
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Book Synopsis Scanning Tunneling Microscopy of III-V Semiconductors by : Stephen Lawrence Skala
Download or read book Scanning Tunneling Microscopy of III-V Semiconductors written by Stephen Lawrence Skala and published by . This book was released on 1994 with total page 166 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy (STM) has been used to study the (100) surface of GaAs and the (110) plane of cross-sectioned GaAs/AlGaAs heterolayers. Observation of the GaAs(100) surface with STM has characterized the c(8x2) reconstruction and shows that the c(8x2) consists of ordered (4x2) subunits. Each (4x2) subunit contains two As and two Ga dimers, contrary to previous descriptions which include only Ga dimers. This model of the c(8x2) reconstruction also agrees well with results from other experimental techniques. The (2x6) reconstruction is observed to be considerably more complex than the c(8x2) and bears little resemblance to either the c(2x8) or c(8x2) reconstructions. STM investigations on vicinal GaAs(100) substrates have clearly shown that steps migrate to form arrays of terraces $sim$175 A wide separated by regions of bunched steps on 2$sp{rm o}$ toward (110) oriented substrates after annealing to a temperature high enough to form a mixed c(8x2) and (2x6) reconstruction. The coexistence of the two reconstructions is critical to step bunching as the c(8x2) is observed to occupy only the terraces while the (2x6) exists predominately across the steps. Bunched step arrays are not observed on 2$sp{rm o}$ toward (110) oriented substrates, and a considerably higher ratio of (2x6) reconstructions is present on these substrates than on the 2$sp{rm o}$ toward (110) oriented substrates. STM results on cross-sectioned GaAs/AlGaAs heterolayers show differences in current contrast between p- and n-type layers which can be explained by band bending caused by charged oxygen adsorbates on AlGaAs.
Book Synopsis Scanning Tunneling Microscopy of III-V Semiconductors by : John D. Dow
Download or read book Scanning Tunneling Microscopy of III-V Semiconductors written by John D. Dow and published by . This book was released on 1992* with total page 7 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy and theory were combined to create novel depressive quantum dots at room temperature on the (110) surfaces of InSb --- dots which merit further exploration as potential nanopixels for tiny-device lithography; develop a strained-layer superlattice model of high-temperature superconductivity; image, understand, and make models of single-atom-high steps on III-V surfaces; invent and exploit a new kind of spectroscopy of surface states of semiconductors, called tipology; develop phenomenological models of variety of surface phenomena.
Book Synopsis Scanning tunneling microscopy of III-V compound semiconductor (001) surfaces by : Qi-Kun Xue
Download or read book Scanning tunneling microscopy of III-V compound semiconductor (001) surfaces written by Qi-Kun Xue and published by . This book was released on 1997 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Tunneling Microscopy of III-V Semiconductors by :
Download or read book Scanning Tunneling Microscopy of III-V Semiconductors written by and published by . This book was released on 1994 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy and theory were combined to create novel depressive quantum dots at room temperature on the (110) surfaces of InSb --- dots which merit further exploration as potential nanopixels for tiny-device lithography; develop a strained-layer superlattice model of high-temperature superconductivity; image, understand, and make models of single-atom-high steps on III-V surfaces; invent and exploit a new kind of spectroscopy of surface states of semiconductors, called tipology; develop phenomenological models of variety of surface phenomena.
Book Synopsis Heavily Doped III-V Semiconductors Studied by Low-temperature Scanning Tunneling Microscopy by : Randy de Kort
Download or read book Heavily Doped III-V Semiconductors Studied by Low-temperature Scanning Tunneling Microscopy written by Randy de Kort and published by . This book was released on 2007 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Tunneling Microscopy Studies of Nano-scale Properties of III/V Semiconductor Heterostructures by : Songlin Zuo
Download or read book Scanning Tunneling Microscopy Studies of Nano-scale Properties of III/V Semiconductor Heterostructures written by Songlin Zuo and published by . This book was released on 2001 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Cross Sectional Scanning Tunneling Microscopy of Au Contacts on GaAs(110) by : Thilo Reusch
Download or read book Cross Sectional Scanning Tunneling Microscopy of Au Contacts on GaAs(110) written by Thilo Reusch and published by Cuvillier Verlag. This book was released on 2004 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Tunneling Microscopy of III-IV Compound Semiconductor (001) Surfaces by : Qi-Kun Xue
Download or read book Scanning Tunneling Microscopy of III-IV Compound Semiconductor (001) Surfaces written by Qi-Kun Xue and published by . This book was released on 1997 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Advances in Scanning Probe Microscopy by : T. Sakurai
Download or read book Advances in Scanning Probe Microscopy written by T. Sakurai and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.
Book Synopsis Application of Scanning Tunnelling Microscopy to in Situ III-V Semiconductor Growth and Processing by : Stuart James Brown
Download or read book Application of Scanning Tunnelling Microscopy to in Situ III-V Semiconductor Growth and Processing written by Stuart James Brown and published by . This book was released on 1996 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Tunneling Microscopy and Spectroscopy on 3-5 Semiconductor Compounds and Their Interfaces by : O. Albrektsen
Download or read book Scanning Tunneling Microscopy and Spectroscopy on 3-5 Semiconductor Compounds and Their Interfaces written by O. Albrektsen and published by . This book was released on 1990 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Atomic Scale Images of Acceptors in III-V Semiconductors by : Sebastian Loth
Download or read book Atomic Scale Images of Acceptors in III-V Semiconductors written by Sebastian Loth and published by Universitätsverlag Göttingen. This book was released on 2008 with total page 189 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Probe Force Microscopy of III-V Semiconductor Structures by : Christian Kameni Boumenou
Download or read book Scanning Probe Force Microscopy of III-V Semiconductor Structures written by Christian Kameni Boumenou and published by . This book was released on 2017 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Tunneling Microscopy by : Joseph A. Stroscio
Download or read book Scanning Tunneling Microscopy written by Joseph A. Stroscio and published by Academic Press. This book was released on 2013-10-22 with total page 481 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy (STM) and its extensions have become revolutionary tools in the fields of physics, materials science, chemistry, and biology. These new microscopies have evolved from their beginnings asresearch aids to their current use as commercial tools in the laboratory and on the factory floor. New wonders continue to unfold as STM delivers atomic scale imaging and electrical characterization of the newly emerging nanometer world. This volume in the METHODS OF EXPERIMENTAL PHYSICS Series describes the basics of scanning tunneling microscopy, provides a fundamental theoretical understanding of the technique and a thorough description of the instrumentation, and examines numerous examples and applications. Written by the pioneers of the field, this volume is an essential handbook for researchers and users of STM, as well as a valuable resource for libraries.
Book Synopsis Scanning Tunneling Microscopy of Semiconductors by : Jun Fei Zheng
Download or read book Scanning Tunneling Microscopy of Semiconductors written by Jun Fei Zheng and published by . This book was released on 1994 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Growth and Scanning Probe Microscopy of III-V Semiconductor Alloys by : Huajie Chen
Download or read book Growth and Scanning Probe Microscopy of III-V Semiconductor Alloys written by Huajie Chen and published by . This book was released on 2000 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Tunneling Microscopy III by : Roland Wiesendanger
Download or read book Scanning Tunneling Microscopy III written by Roland Wiesendanger and published by Springer Science & Business Media. This book was released on 2013-03-07 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods. The different theoretical concepts developed in the past are outlined, and the implications of the theoretical results for the interpretation of experimental data are discussed in detail. Therefore, this book serves as a most useful guide for experimentalists as well as for theoreticians working in the field of local probe methods. In this second edition the text has been updated and new methods are discussed.
