Scanning Probe Microscopy For Energy Research Materials Devices And Applications

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Scanning Probe Microscopy For Energy Research: Materials, Devices, And Applications

Author : Dawn Bonnell
Publisher : World Scientific
ISBN 13 : 9814434728
Total Pages : 640 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis Scanning Probe Microscopy For Energy Research: Materials, Devices, And Applications by : Dawn Bonnell

Download or read book Scanning Probe Microscopy For Energy Research: Materials, Devices, And Applications written by Dawn Bonnell and published by World Scientific. This book was released on 2013-03-26 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Scanning Probe Microscopy for Energy Research

Author : Dawn A. Bonnell
Publisher : World Scientific
ISBN 13 : 981443471X
Total Pages : 640 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis Scanning Probe Microscopy for Energy Research by : Dawn A. Bonnell

Download or read book Scanning Probe Microscopy for Energy Research written by Dawn A. Bonnell and published by World Scientific. This book was released on 2013 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Author : Paula M. Vilarinho
Publisher : Springer Science & Business Media
ISBN 13 : 1402030193
Total Pages : 503 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials by : Paula M. Vilarinho

Download or read book Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials written by Paula M. Vilarinho and published by Springer Science & Business Media. This book was released on 2006-06-15 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Scanning Probe Microscopy

Author : Ernst Meyer
Publisher : Springer Science & Business Media
ISBN 13 : 3662098016
Total Pages : 215 pages
Book Rating : 4.6/5 (62 download)

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Book Synopsis Scanning Probe Microscopy by : Ernst Meyer

Download or read book Scanning Probe Microscopy written by Ernst Meyer and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 215 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Scanning Probe Microscopy

Author : Nikodem Tomczak
Publisher : World Scientific
ISBN 13 : 9814324760
Total Pages : 277 pages
Book Rating : 4.8/5 (143 download)

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Book Synopsis Scanning Probe Microscopy by : Nikodem Tomczak

Download or read book Scanning Probe Microscopy written by Nikodem Tomczak and published by World Scientific. This book was released on 2011 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries. The rising importance of SPM demands a concise treatment in the form of a book which is accessible to interdisciplinary practitioners. This book highlights recent advances in the field of SPM with sufficient depth and breadth to provide an intellectually stimulating overview of the current state of the art. The book is based on a set of carefully selected original works from renowned contributors on topics that range from atom technology, scanning tunneling spectroscopy of self-assembled nanostructures, SPM probe fabrication, scanning force microscopy applications in biology and materials science down to the single molecule level, novel scanning probe techniques, and nanolithography. The variety of topics underlines the strong interdisciplinary character of SPM related research and the combined expertise of the contributors gives us a unique opportunity to discuss possible future trends in SPM related research. This makes the book not merely a collection of already published material but an enlightening insight into cutting edge research and global SPM research trends.

Advances in Scanning Probe Microscopy

Author : T. Sakurai
Publisher : Springer Science & Business Media
ISBN 13 : 3642569498
Total Pages : 352 pages
Book Rating : 4.6/5 (425 download)

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Book Synopsis Advances in Scanning Probe Microscopy by : T. Sakurai

Download or read book Advances in Scanning Probe Microscopy written by T. Sakurai and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.

Atomic Force Microscopy for Energy Research

Author : Cai Shen
Publisher : CRC Press
ISBN 13 : 1000577872
Total Pages : 457 pages
Book Rating : 4.0/5 (5 download)

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Book Synopsis Atomic Force Microscopy for Energy Research by : Cai Shen

Download or read book Atomic Force Microscopy for Energy Research written by Cai Shen and published by CRC Press. This book was released on 2022-04-26 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: Details the use of advanced AFMs and addresses all types of functional AFMs First book to focus on application of AFM for energy research Enables readers to operate an AFM successfully and to understand the data obtained Covers new achievements in AFM instruments, including higher speed and resolution, automatic and deep learning AFM, and how AFM is being combined with other new methods like IR and Raman microscopy

Impact of Electron and Scanning Probe Microscopy on Materials Research

Author : David G. Rickerby
Publisher : Springer Science & Business Media
ISBN 13 : 9401144516
Total Pages : 503 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Impact of Electron and Scanning Probe Microscopy on Materials Research by : David G. Rickerby

Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Kelvin Probe Force Microscopy

Author : Sascha Sadewasser
Publisher :
ISBN 13 : 9783319756882
Total Pages : 521 pages
Book Rating : 4.7/5 (568 download)

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Book Synopsis Kelvin Probe Force Microscopy by : Sascha Sadewasser

Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by . This book was released on 2018 with total page 521 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

Scanning Probe Microscopy

Author : Sergei V. Kalinin
Publisher : Springer Science & Business Media
ISBN 13 : 0387286683
Total Pages : 1002 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Scanning Probe Microscopy by : Sergei V. Kalinin

Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Roadmap of Scanning Probe Microscopy

Author : Seizo Morita
Publisher : Springer Science & Business Media
ISBN 13 : 3540343156
Total Pages : 207 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Roadmap of Scanning Probe Microscopy by : Seizo Morita

Download or read book Roadmap of Scanning Probe Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2006-12-30 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 3642104975
Total Pages : 823 pages
Book Rating : 4.6/5 (421 download)

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Book Synopsis Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 by : Bharat Bhushan

Download or read book Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2010-12-17 with total page 823 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 3642254144
Total Pages : 634 pages
Book Rating : 4.6/5 (422 download)

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Book Synopsis Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 by : Bharat Bhushan

Download or read book Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2012-10-24 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Applied Scanning Probe Methods XIII

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 354085049X
Total Pages : 284 pages
Book Rating : 4.5/5 (48 download)

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Book Synopsis Applied Scanning Probe Methods XIII by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods XIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-29 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy and Spectroscopy

Author : Dawn Bonnell
Publisher : John Wiley & Sons
ISBN 13 : 047124824X
Total Pages : 520 pages
Book Rating : 4.4/5 (712 download)

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Book Synopsis Scanning Probe Microscopy and Spectroscopy by : Dawn Bonnell

Download or read book Scanning Probe Microscopy and Spectroscopy written by Dawn Bonnell and published by John Wiley & Sons. This book was released on 2000-12-05 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.

Applied Scanning Probe Methods I

Author : Bharat Bhushan
Publisher : Springer Science & Business Media
ISBN 13 : 364235792X
Total Pages : 485 pages
Book Rating : 4.6/5 (423 download)

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Book Synopsis Applied Scanning Probe Methods I by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods I written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2014-02-26 with total page 485 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.

Scanning Probe Microscopy¿in Industrial Applications

Author : Dalia G. Yablon
Publisher : John Wiley & Sons
ISBN 13 : 111872304X
Total Pages : 337 pages
Book Rating : 4.1/5 (187 download)

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Book Synopsis Scanning Probe Microscopy¿in Industrial Applications by : Dalia G. Yablon

Download or read book Scanning Probe Microscopy¿in Industrial Applications written by Dalia G. Yablon and published by John Wiley & Sons. This book was released on 2013-10-24 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.