Resonance Ultrasonic Vibrations and Photoluminescence Mapping for Crack Detection in Crystalline Silicon Wafers and Solar Cells

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Book Synopsis Resonance Ultrasonic Vibrations and Photoluminescence Mapping for Crack Detection in Crystalline Silicon Wafers and Solar Cells by : Andrii Monastyrskyi

Download or read book Resonance Ultrasonic Vibrations and Photoluminescence Mapping for Crack Detection in Crystalline Silicon Wafers and Solar Cells written by Andrii Monastyrskyi and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: ABSTRACT: The solar energy, or photovoltaic (PV) industry, driven by economic competition with traditional fossil energy sources, strives to produce solar panels of the highest conversion efficiency and best reliability at the lowest production cost. Solar cells based on crystalline silicon are currently the dominant commercial PV technology by a large margin, and they are likely to remain dominant for at least one decade. The problem of improvement mechanical stability of silicon wafers and finished solar cell is one of the most critical for entire PV industry. Mechanical defects in wafer and cells in the form of periphery or internal cracks can be initiated at various steps of the manufacturing process and becomes the trigger for the fracture. There are a limited number of characterization methods for crack detection but only a few of those are able to satisfy PV industry needs in sensitivity of the crack detection incorporated with the analysis time. The most promising are a Resonance Ultrasonic Vibrations (RUV) technique and Photoluminescence (PL) imaging. The RUV method was further developed in this thesis project for fast non-destructive crack detection in full-size silicon wafers and solar cells. The RUV methodology relies on deviations of the resonance frequency response curve measured on a wafer with peripheral or bulk millimeter-length crack when it is compared with identical non-cracked wafers. It was observed that statistical variations of the RUV parameters on a similarly processed silicon wafers/cells with the same geometry lead to false positive events reducing accuracy of the RUV method. A new statistical approach using three independent RUV crack detection criteria was developed and applied to resolve this issue. This approach was validated experimentally. Crack detection using RUV technique was applied to a set of production-grade Cz-Si wafers and finished solar cells from the Isofoton's S.A. (Spain) production line. Cracked solar cells rejected by the RUV method using the statistical approach were imaged with room temperature PL mapping and independently controlled with Scanning Acoustic Microscopy (SAM). A comparison of three independent techniques for crack detection, RUV, PL and SAM, was performed on selected samples. A high accuracy and selectivity of the RUV method to identify mm-size cracks in wafers and cells was confirmed.

Resonance Ultrasonic Vibrations (RUV) for Crack Detection in Silicon Wafers for Solar Cells

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Book Rating : 4.:/5 (189 download)

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Book Synopsis Resonance Ultrasonic Vibrations (RUV) for Crack Detection in Silicon Wafers for Solar Cells by : William Dallas

Download or read book Resonance Ultrasonic Vibrations (RUV) for Crack Detection in Silicon Wafers for Solar Cells written by William Dallas and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: ABSTRACT: The photovoltaic industry provides a pathway to allow renewable energy to meet world wide consumer energy needs. Past and present research and development on silicon based solar cells have helped make them the dominant player in the photovoltaic industry accounting for over 75% in 2005 as accounted by the US Department of Energy. One of the current technological problems is to identify and eliminate sources of mechanical defects such as thermo-elastic stress and cracks leading to the loss of wafer integrity and ultimately breakage of as-grown and processed Si wafers and cells. The RUV method, developed at the University of South Florida, enables fast and accurate crack detection with simple criteria for wafer rejection from solar cell production lines. The RUV system relies on variation of modal vibration characteristics due to physical variations in the wafers caused by cracks. Ultrasonic vibrations are introduced into the wafer using a vacuum coupled transducer and received by an acoustic probe mounted along the periphery of the wafer. Cracks are detected by monitoring shifts in the resonance peak's frequency, bandwidth, and amplitude. In Cz-Si wafers it has been shown that increased crack length leads to a decrease in peak frequency and an increase in peak bandwidth and decreasing peak amplitude. Minimum crack length sensitivity is related to the uniformity of the RUV parameters from wafer to wafer within a batch as well as system characteristics. Typically the RUV system is capable of detecting sub-millimeter length cracks. The use of auto loading and unloading allows the RUV system to achieve mass production level speeds of approximately two seconds per wafer. The RUV system has been successful in detecting cracks in single crystalline and multi-crystalline silicon wafers. Further development of the RUV system would solidify its place in manufacturing plants for non-destructive crack detection in PV cells. The contributing work of the author toward the further development of the RUV crack detection method will be examined in this thesis.

Detection of Cracks in Single-crystalline Silicon Wafers Using Impact Testing

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Book Synopsis Detection of Cracks in Single-crystalline Silicon Wafers Using Impact Testing by : Christina Hilmersson

Download or read book Detection of Cracks in Single-crystalline Silicon Wafers Using Impact Testing written by Christina Hilmersson and published by . This book was released on 2006 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: ABSTRACT: This thesis is about detection of cracks in single-crystalline silicon wafers by using a vibration method in the form of an impact test. The goal to detect cracks from vibration measurements introduced by striking the silicon wafer with an impact hammer. Such a method would reduce costs in the production of solar cells. It is an inexpensive, relatively simple method which if commercialized could be used as an efficient in-line production quality test. A hammer is used as the actuator and a microphone as the response sensor. A signal analyzer is used to collect the data and to compute frequency response. Parameters of interest are audible natural frequencies, peak magnitudes, damping ratio and coherence. The data reveals that there are differences in frequency between the cracked silicon wafers and the non-cracked silicon wafers. The resonant peaks in the defective wafers were not as sharp (i.e., lightly damped) and occurred at lower frequencies (i.e., lower stiffness) with a lower magnitude and a higher damping ratio. These differences could be used to detect damaged product in a solar cell production line.

Crack Detection in Silicon Wafers Using Shearography

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ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (11 download)

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Book Synopsis Crack Detection in Silicon Wafers Using Shearography by : Ramak Motamedi

Download or read book Crack Detection in Silicon Wafers Using Shearography written by Ramak Motamedi and published by . This book was released on 2008 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defects in silicon wafers affect their mechanical stability considerably during their processing and handling. In the new generation of thin silicon wafers, in addition to subsurface defects, cracks are also one of the most important defects that need to be evaluated. A comprehensive review of literature suggests the use of different techniques for non destructive evaluation (NDE) of silicon wafers. Among the few NDE techniques that can be used for both sub-surface and crack detection, Shearography has the advantage of being a whole field technique that can be utilized as a non-contact method for online inspection. Although, recently shearography has been used for sub-surface defect detection in silicon wafers, the capability of this technique to identify and detect cracks has not been investigated yet. In this work, a shearography system has been developed for nondestructive evaluation of silicon wafers. The optical set-up was arranged and several experiments were carried out to optimize its performance. Batch of perfect wafers, wafers with sub-surface defects and cracked wafers of 500?m thickness were qualitatively evaluated using the developed system. Two different loading mechanisms were used to stress the silicon wafer and the advantage of uniform thermal loading over concentrated force loading for crack and sub-surface defect detection has been discussed. In addition to crack detection, the unique potential of the developed system for detection of crack propagation has been discussed.

Detection of Residual Stress in Multi-crystalline Silicon Wafers Using Swept-sne Frequency Response Data

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Book Synopsis Detection of Residual Stress in Multi-crystalline Silicon Wafers Using Swept-sne Frequency Response Data by : Shawn R. Best

Download or read book Detection of Residual Stress in Multi-crystalline Silicon Wafers Using Swept-sne Frequency Response Data written by Shawn R. Best and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: ABSTRACT: This thesis presents audible vibratory mode data obtained by mechanically exciting acoustic modes in mc-Si wafers grown by EFG technique with various levels and distributions of residual stress. Stress maps obtained using scanning infrared polariscopy are presented, illustrating the variation of residual stress. Modal analyses of the wafers are performed using the finite element method and are in remarkably good agreement with the measured frequency response data. The calculated mode shapes were further validated through classic Chladni type patterns. The vibratory data is found to correlate with the residual stress measurements. The data is fit with both linear and quadratic models with correlation coefficients of 0.8. The results reveal a dependence of wafer audible mode frequencies on residual stress level that may be useful for solar cell mechanical quality control and breakage inspection.

Crystal Growth and Evaluation of Silicon for VLSI and ULSI

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Publisher : CRC Press
ISBN 13 : 1482232812
Total Pages : 432 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Crystal Growth and Evaluation of Silicon for VLSI and ULSI by : Golla Eranna

Download or read book Crystal Growth and Evaluation of Silicon for VLSI and ULSI written by Golla Eranna and published by CRC Press. This book was released on 2014-12-08 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is difficult to separate from its chemical compounds because of its reactivity. As a solid, silicon is chemically inert and stable, but growing it as a single crystal creates many technological challenges. Crystal Growth and Evaluation of Silicon for VLSI and ULSI is one of the first books to cover the systematic growth of silicon single crystals and the complete evaluation of silicon, from sand to useful wafers for device fabrication. Written for engineers and researchers working in semiconductor fabrication industries, this practical text: Describes different techniques used to grow silicon single crystals Explains how grown single-crystal ingots become a complete silicon wafer for integrated-circuit fabrication Reviews different methods to evaluate silicon wafers to determine suitability for device applications Analyzes silicon wafers in terms of resistivity and impurity concentration mapping Examines the effect of intentional and unintentional impurities Explores the defects found in regular silicon-crystal lattice Discusses silicon wafer preparation for VLSI and ULSI processing Crystal Growth and Evaluation of Silicon for VLSI and ULSI is an essential reference for different approaches to the selection of the basic silicon-containing compound, separation of silicon as metallurgical-grade pure silicon, subsequent purification, single-crystal growth, and defects and evaluation of the deviations within the grown crystals.

Handbook of Photovoltaic Silicon

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Publisher : Springer
ISBN 13 : 9783662564714
Total Pages : 0 pages
Book Rating : 4.5/5 (647 download)

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Book Synopsis Handbook of Photovoltaic Silicon by : Deren Yang

Download or read book Handbook of Photovoltaic Silicon written by Deren Yang and published by Springer. This book was released on 2019-11-28 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The utilization of sun light is one of the hottest topics in sustainable energy research. To efficiently convert sun power into a reliable energy – electricity – for consumption and storage, silicon and its derivatives have been widely studied and applied in solar cell systems. This handbook covers the photovoltaics of silicon materials and devices, providing a comprehensive summary of the state of the art of photovoltaic silicon sciences and technologies. This work is divided into various areas including but not limited to fundamental principles, design methodologies, wafering techniques/fabrications, characterizations, applications, current research trends and challenges. It offers the most updated and self-explanatory reference to all levels of students and acts as a quick reference to the experts from the fields of chemistry, material science, physics, chemical engineering, electrical engineering, solar energy, etc..

Solar Cells

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Publisher : Academic Press
ISBN 13 : 0123869641
Total Pages : 655 pages
Book Rating : 4.1/5 (238 download)

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Book Synopsis Solar Cells by : Tom Markvart

Download or read book Solar Cells written by Tom Markvart and published by Academic Press. This book was released on 2012-10-26 with total page 655 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enormous leaps forward in the efficiency and the economy of solar cells are being made at a furious pace. New materials and manufacturing processes have opened up new realms of possibility for the application of solar cells. Crystalline silicon cells are increasingly making way for thin film cells, which are spawning experimentation with third-generation high-efficiency multijunction cells, carbon-nanotube based cells, UV light for voltage enhancement, and the use of the infrared spectrum for night-time operation, to name only a few recent advances. This thoroughly updated new edition of Markvart and Castaner's Solar Cells, extracted from their industry standard Practical Handbook of Photovoltaics, is the definitive reference covering the science and operation, materials and manufacture of solar cells. It is essential reading for engineers, installers, designers, and policy-makers who need to understand the science behind the solar cells of today, and tomorrow, in order to take solar energy to the next level. A thorough update to the definitive reference to solar cells, created by a cast of international experts from industry and academia to ensure the highest quality information from multiple perspectives Covers the whole spectrum of solar cell information, from basic scientific background, to the latest advances in materials, to manufacturing issues, to testing and calibration. Case studies, practical examples and reports on the latest advances take the new edition of this amazing resource beyond a simple amalgamation of a vast amount of knowledge, into the realm of real world applications

The Physics of Semiconductor Devices

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Publisher : Springer
ISBN 13 : 3319976044
Total Pages : 1299 pages
Book Rating : 4.3/5 (199 download)

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Book Synopsis The Physics of Semiconductor Devices by : R. K. Sharma

Download or read book The Physics of Semiconductor Devices written by R. K. Sharma and published by Springer. This book was released on 2019-01-31 with total page 1299 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book disseminates the current knowledge of semiconductor physics and its applications across the scientific community. It is based on a biennial workshop that provides the participating research groups with a stimulating platform for interaction and collaboration with colleagues from the same scientific community. The book discusses the latest developments in the field of III-nitrides; materials & devices, compound semiconductors, VLSI technology, optoelectronics, sensors, photovoltaics, crystal growth, epitaxy and characterization, graphene and other 2D materials and organic semiconductors.

International Aerospace Abstracts

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ISBN 13 :
Total Pages : 1044 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis International Aerospace Abstracts by :

Download or read book International Aerospace Abstracts written by and published by . This book was released on 1999 with total page 1044 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Converging Technologies for Improving Human Performance

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Publisher : Springer Science & Business Media
ISBN 13 : 9401703590
Total Pages : 477 pages
Book Rating : 4.4/5 (17 download)

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Book Synopsis Converging Technologies for Improving Human Performance by : Mihail C. Roco

Download or read book Converging Technologies for Improving Human Performance written by Mihail C. Roco and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 477 pages. Available in PDF, EPUB and Kindle. Book excerpt: M. C. Roco and W.S. Bainbridge In the early decades of the 21st century, concentrated efforts can unify science based on the unity of nature, thereby advancing the combination of nanotechnology, biotechnology, information technology, and new technologies based in cognitive science. With proper attention to ethical issues and societal needs, converging in human abilities, societal technologies could achieve a tremendous improvement outcomes, the nation's productivity, and the quality of life. This is a broad, cross cutting, emerging and timely opportunity of interest to individuals, society and humanity in the long term. The phrase "convergent technologies" refers to the synergistic combination of four major "NBIC" (nano-bio-info-cogno) provinces of science and technology, each of which is currently progressing at a rapid rate: (a) nanoscience and nanotechnology; (b) biotechnology and biomedicine, including genetic engineering; (c) information technology, including advanced computing and communications; (d) cognitive science, including cognitive neuroscience. Timely and Broad Opportunity. Convergence of diverse technologies is based on material unity at the nanoscale and on technology integration from that scale.

Crystalline Silicon Solar Cells

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ISBN 13 : 9780733406454
Total Pages : 335 pages
Book Rating : 4.4/5 (64 download)

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Book Synopsis Crystalline Silicon Solar Cells by : Armin G. Aberle

Download or read book Crystalline Silicon Solar Cells written by Armin G. Aberle and published by . This book was released on 1999 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Halide Perovskites

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Publisher : John Wiley & Sons
ISBN 13 : 3527341110
Total Pages : 312 pages
Book Rating : 4.5/5 (273 download)

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Book Synopsis Halide Perovskites by : Tze-Chien Sum

Download or read book Halide Perovskites written by Tze-Chien Sum and published by John Wiley & Sons. This book was released on 2019-03-25 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: Real insight from leading experts in the field into the causes of the unique photovoltaic performance of perovskite solar cells, describing the fundamentals of perovskite materials and device architectures. The authors cover materials research and development, device fabrication and engineering methodologies, as well as current knowledge extending beyond perovskite photovoltaics, such as the novel spin physics and multiferroic properties of this family of materials. Aimed at a better and clearer understanding of the latest developments in the hybrid perovskite field, this is a must-have for material scientists, chemists, physicists and engineers entering or already working in this booming field.

Rhythms of the Brain

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Publisher : Oxford University Press
ISBN 13 : 019804125X
Total Pages : 466 pages
Book Rating : 4.1/5 (98 download)

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Book Synopsis Rhythms of the Brain by : Gyorgy Buzsaki

Download or read book Rhythms of the Brain written by Gyorgy Buzsaki and published by Oxford University Press. This book was released on 2006-08-03 with total page 466 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides eloquent support for the idea that spontaneous neuron activity, far from being mere noise, is actually the source of our cognitive abilities. In a sequence of "cycles," György Buzsáki guides the reader from the physics of oscillations through neuronal assembly organization to complex cognitive processing and memory storage. His clear, fluid writing-accessible to any reader with some scientific knowledge-is supplemented by extensive footnotes and references that make it just as gratifying and instructive a read for the specialist. The coherent view of a single author who has been at the forefront of research in this exciting field, this volume is essential reading for anyone interested in our rapidly evolving understanding of the brain.

Lab-on-Fiber Technology

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Publisher : Springer
ISBN 13 : 3319069985
Total Pages : 377 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Lab-on-Fiber Technology by : Andrea Cusano

Download or read book Lab-on-Fiber Technology written by Andrea Cusano and published by Springer. This book was released on 2014-07-29 with total page 377 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on a research field that is rapidly emerging as one of the most promising ones for the global optics and photonics community: the “lab-on-fiber” technology. Inspired by the well-established "lab on-a-chip" concept, this new technology essentially envisages novel and highly functionalized devices completely integrated into a single optical fiber for both communication and sensing applications. Based on the R&D experience of some of the world's leading authorities in the fields of optics, photonics, nanotechnology, and material science, this book provides a broad and accurate description of the main developments and achievements in the lab-on-fiber technology roadmap, also highlighting the new perspectives and challenges to be faced. This book is essential for scientists interested in the cutting-edge fiber optic technology, but also for graduate students.

Luminescence

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Publisher : BoD – Books on Demand
ISBN 13 : 1789841313
Total Pages : 144 pages
Book Rating : 4.7/5 (898 download)

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Book Synopsis Luminescence by : Sergei Pyshkin

Download or read book Luminescence written by Sergei Pyshkin and published by BoD – Books on Demand. This book was released on 2020-06-24 with total page 144 pages. Available in PDF, EPUB and Kindle. Book excerpt: Luminescence - OLED Technology and Applications is a collection of reviewed and relevant research chapters offering a comprehensive overview of recent developments in the field of organic light-emitting diode (OLED) materials and devices. The book comprises chapters authored by various researchers and is edited by an expert in the field. It provides a thorough overview of the latest technologies and applications in this field and opens new possible research paths for further novel developments.

Crystal Growth Technology

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Publisher : John Wiley & Sons
ISBN 13 : 0470491108
Total Pages : 695 pages
Book Rating : 4.4/5 (74 download)

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Book Synopsis Crystal Growth Technology by : Hans J. Scheel

Download or read book Crystal Growth Technology written by Hans J. Scheel and published by John Wiley & Sons. This book was released on 2009-07-31 with total page 695 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume deals with the technologies of crystal fabrication, of crystal machining, and of epilayer production and is the first book on industrial and scientific aspects of crystal and layer production. The major industrial crystals are treated: Si, GaAs, GaP, InP, CdTe, sapphire, oxide and halide scintillator crystals, crystals for optical, piezoelectric and microwave applications and more. Contains 29 contributions from leading crystal technologists covering the following topics: * General aspects of crystal growth technology * Silicon * Compound semiconductors * Oxides and halides * Crystal machining * Epitaxy and layer deposition Scientific and technological problems of production and machining of industrial crystals are discussed by top experts, most of them from the major growth industries and crystal growth centers. In addition, it will be useful for the users of crystals, for teachers and graduate students in materials sciences, in electronic and other functional materials, chemical and metallurgical engineering, micro-and optoelectronics including nanotechnology, mechanical engineering and precision-machining, microtechnology, and in solid-state sciences.